KR100248258B1 - 제이택을이용한응용주문형집적회로에서의메가셀테스트방법및장치 - Google Patents

제이택을이용한응용주문형집적회로에서의메가셀테스트방법및장치 Download PDF

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Publication number
KR100248258B1
KR100248258B1 KR1019970708528A KR19970708528A KR100248258B1 KR 100248258 B1 KR100248258 B1 KR 100248258B1 KR 1019970708528 A KR1019970708528 A KR 1019970708528A KR 19970708528 A KR19970708528 A KR 19970708528A KR 100248258 B1 KR100248258 B1 KR 100248258B1
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South Korea
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test
input
megacell
circuit
output
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KR19990022049A (ko
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랜달 엘. 주니어 모우트
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윤종용
삼성전자주식회사
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1019970708528A 1995-06-07 1996-06-06 제이택을이용한응용주문형집적회로에서의메가셀테스트방법및장치 Expired - Fee Related KR100248258B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US48048395A 1995-06-07 1995-06-07
US8/480,483 1995-06-07
US52839795A 1995-09-14 1995-09-14
US8/528,397 1995-09-14

Publications (2)

Publication Number Publication Date
KR19990022049A KR19990022049A (ko) 1999-03-25
KR100248258B1 true KR100248258B1 (ko) 2000-03-15

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KR1019970708528A Expired - Fee Related KR100248258B1 (ko) 1995-06-07 1996-06-06 제이택을이용한응용주문형집적회로에서의메가셀테스트방법및장치

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US (1) US5805609A (enExample)
EP (1) EP0834081B1 (enExample)
JP (1) JP3698166B2 (enExample)
KR (1) KR100248258B1 (enExample)
CN (1) CN1089441C (enExample)
AU (1) AU6251896A (enExample)
DE (1) DE69631658T2 (enExample)
IL (2) IL120927A (enExample)
TW (1) TW297096B (enExample)
WO (2) WO1996041205A1 (enExample)

Families Citing this family (62)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6324614B1 (en) * 1997-08-26 2001-11-27 Lee D. Whetsel Tap with scannable control circuit for selecting first test data register in tap or second test data register in tap linking module for scanning data
US6804725B1 (en) * 1996-08-30 2004-10-12 Texas Instruments Incorporated IC with state machine controlled linking module
GB9810512D0 (en) * 1998-05-15 1998-07-15 Sgs Thomson Microelectronics Detecting communication errors across a chip boundary
DE19981944D2 (de) 1998-09-29 2002-08-29 Siemens Ag Anwendungsspezifischer Baustein mit reduziertem Aufwand bei Überarbeitung
EP1135879A1 (en) * 1998-11-30 2001-09-26 Khamsin Technologies, LLC Method and software for user interface device in "last mile" telecommunications cabling
US6496544B1 (en) * 1998-12-14 2002-12-17 Cray Inc. Digital computing system having adaptive communication components
US7657810B2 (en) 2006-02-03 2010-02-02 Texas Instruments Incorporated Scan testing using scan frames with embedded commands
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
JP3966453B2 (ja) * 1999-05-26 2007-08-29 株式会社ルネサステクノロジ 半導体集積回路
JP2001255356A (ja) * 2000-03-08 2001-09-21 Matsushita Electric Ind Co Ltd 半導体集積回路のテストパターン生成方法及びテスト方法
US6754866B1 (en) * 2001-09-28 2004-06-22 Inapac Technology, Inc. Testing of integrated circuit devices
US6732304B1 (en) 2000-09-21 2004-05-04 Inapac Technology, Inc. Chip testing within a multi-chip semiconductor package
US7444575B2 (en) * 2000-09-21 2008-10-28 Inapac Technology, Inc. Architecture and method for testing of an integrated circuit device
US6812726B1 (en) * 2002-11-27 2004-11-02 Inapac Technology, Inc. Entering test mode and accessing of a packaged semiconductor device
US7240254B2 (en) * 2000-09-21 2007-07-03 Inapac Technology, Inc Multiple power levels for a chip within a multi-chip semiconductor package
GB2379524A (en) * 2001-09-06 2003-03-12 Nec Technologies Multiplexing pins on an ASIC
US20040019841A1 (en) * 2002-07-25 2004-01-29 Ong Adrian E. Internally generating patterns for testing in an integrated circuit device
US8166361B2 (en) 2001-09-28 2012-04-24 Rambus Inc. Integrated circuit testing module configured for set-up and hold time testing
US7313740B2 (en) * 2002-07-25 2007-12-25 Inapac Technology, Inc. Internally generating patterns for testing in an integrated circuit device
US8286046B2 (en) 2001-09-28 2012-10-09 Rambus Inc. Integrated circuit testing module including signal shaping interface
US8001439B2 (en) * 2001-09-28 2011-08-16 Rambus Inc. Integrated circuit testing module including signal shaping interface
US7061263B1 (en) 2001-11-15 2006-06-13 Inapac Technology, Inc. Layout and use of bond pads and probe pads for testing of integrated circuits devices
JP4173768B2 (ja) * 2002-05-21 2008-10-29 松下電器産業株式会社 回路装置およびその動作方法
US7219281B2 (en) * 2002-07-29 2007-05-15 Stmicroelectronics Pvt. Ltd. Boundary scan of integrated circuits
KR100500442B1 (ko) * 2002-11-07 2005-07-12 삼성전자주식회사 반도체 메모리 장치 및 이 장치의 테스트 방법
US8063650B2 (en) 2002-11-27 2011-11-22 Rambus Inc. Testing fuse configurations in semiconductor devices
US20050149783A1 (en) * 2003-12-11 2005-07-07 International Business Machines Corporation Methods and apparatus for testing an IC
US7284172B2 (en) * 2004-04-30 2007-10-16 International Business Machines Corporation Access method for embedded JTAG TAP controller instruction registers
US7814377B2 (en) * 2004-07-09 2010-10-12 Sandisk Corporation Non-volatile memory system with self test capability
DE102004043063B4 (de) * 2004-09-06 2008-10-23 Infineon Technologies Ag Verfahren zum Betreiben eines Halbleiter-Bauelements mit einem Test-Modul
CN100365423C (zh) * 2004-10-20 2008-01-30 华为技术有限公司 一种jtag链自动连接系统及其实现方法
US7589648B1 (en) * 2005-02-10 2009-09-15 Lattice Semiconductor Corporation Data decompression
FR2888433A1 (fr) * 2005-07-05 2007-01-12 St Microelectronics Sa Protection d'une quantite numerique contenue dans un circuit integre comportant une interface jtag
US7274203B2 (en) * 2005-10-25 2007-09-25 Freescale Semiconductor, Inc. Design-for-test circuit for low pin count devices
WO2007069097A1 (en) * 2005-11-02 2007-06-21 Nxp B.V. Ic testing methods and apparatus
CN100442242C (zh) * 2006-02-28 2008-12-10 环达电脑(上海)有限公司 用于测试主板插槽的设备、系统及方法
US7511641B1 (en) 2006-09-19 2009-03-31 Lattice Semiconductor Corporation Efficient bitstream compression
WO2008042403A2 (en) 2006-10-03 2008-04-10 Inapac Technologies, Inc. Memory accessing circuit system
US20080114772A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Method for connecting to a network location associated with content
US20080112562A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Methods for linking content with license
US8079071B2 (en) 2006-11-14 2011-12-13 SanDisk Technologies, Inc. Methods for accessing content based on a session ticket
US20080114693A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Method for allowing content protected by a first DRM system to be accessed by a second DRM system
US8763110B2 (en) * 2006-11-14 2014-06-24 Sandisk Technologies Inc. Apparatuses for binding content to a separate memory device
US8327454B2 (en) * 2006-11-14 2012-12-04 Sandisk Technologies Inc. Method for allowing multiple users to access preview content
CN101102566B (zh) * 2007-06-25 2010-12-08 中兴通讯股份有限公司 一种手机jtag调试接口信号设计方法及其调试方法
US7657805B2 (en) * 2007-07-02 2010-02-02 Sun Microsystems, Inc. Integrated circuit with blocking pin to coordinate entry into test mode
US8051338B2 (en) * 2007-07-19 2011-11-01 Cray Inc. Inter-asic data transport using link control block manager
US7902865B1 (en) 2007-11-15 2011-03-08 Lattice Semiconductor Corporation Compression and decompression of configuration data using repeated data frames
US8621125B2 (en) * 2009-10-13 2013-12-31 Intellitech Corporation System and method of sending and receiving data and commands using the TCK and TMS of IEEE 1149.1
CN102236066B (zh) * 2010-04-22 2015-07-01 上海华虹集成电路有限责任公司 实现芯片功能故障快速调试定位的方法及调试电路
US8694844B2 (en) 2010-07-29 2014-04-08 Texas Instruments Incorporated AT speed TAP with dual port router and command circuit
CN103097902B (zh) * 2010-07-29 2015-12-09 德克萨斯仪器股份有限公司 改进全速测试访问端口操作
CN102778645B (zh) * 2011-05-09 2014-09-17 京微雅格（北京）科技有限公司 一种jtag主控制器及其实现方法
CN104899123B (zh) * 2015-04-24 2017-06-06 英业达科技有限公司 一种主板上dimm插槽的地址设置信号的连接测试装置与方法
KR20160139496A (ko) * 2015-05-27 2016-12-07 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
US9791505B1 (en) * 2016-04-29 2017-10-17 Texas Instruments Incorporated Full pad coverage boundary scan
CN108957283B (zh) * 2017-05-19 2021-08-03 龙芯中科技术股份有限公司 辐照实验板、监控终端、asic芯片辐照实验系统
CN107843828A (zh) * 2017-10-26 2018-03-27 电子科技大学 一种基于fpga的数字电路边界扫描控制系统
CN109917277B (zh) * 2019-05-16 2019-08-23 上海燧原智能科技有限公司 虚拟测试方法、装置、设备及存储介质
US10746798B1 (en) 2019-05-31 2020-08-18 Nvidia Corp. Field adaptable in-system test mechanisms
US11204849B2 (en) 2020-03-13 2021-12-21 Nvidia Corporation Leveraging low power states for fault testing of processing cores at runtime
CN113938125B (zh) * 2021-10-19 2023-02-24 浙江大学 多通道可配置可测试与修调的数字信号隔离器

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4855669A (en) * 1987-10-07 1989-08-08 Xilinx, Inc. System for scan testing of logic circuit networks
JP2513762B2 (ja) * 1988-01-29 1996-07-03 株式会社東芝 論理回路
US4947395A (en) * 1989-02-10 1990-08-07 Ncr Corporation Bus executed scan testing method and apparatus
US5115435A (en) * 1989-10-19 1992-05-19 Ncr Corporation Method and apparatus for bus executed boundary scanning
JP2627464B2 (ja) * 1990-03-29 1997-07-09 三菱電機株式会社 集積回路装置
JP2705326B2 (ja) * 1991-02-19 1998-01-28 日本電気株式会社 光磁気ヘッド装置
JP2741119B2 (ja) * 1991-09-17 1998-04-15 三菱電機株式会社 バイパススキャンパスおよびそれを用いた集積回路装置
US5329533A (en) * 1991-12-26 1994-07-12 At&T Bell Laboratories Partial-scan built-in self-test technique
US5448576A (en) * 1992-10-29 1995-09-05 Bull Hn Information Systems Inc. Boundary scan architecture extension
US5442640A (en) * 1993-01-19 1995-08-15 International Business Machines Corporation Test and diagnosis of associated output logic for products having embedded arrays
US5418470A (en) * 1993-10-22 1995-05-23 Tektronix, Inc. Analog multi-channel probe system
US5497378A (en) * 1993-11-02 1996-03-05 International Business Machines Corporation System and method for testing a circuit network having elements testable by different boundary scan standards
US5809036A (en) * 1993-11-29 1998-09-15 Motorola, Inc. Boundary-scan testable system and method
GB2288666B (en) * 1994-04-12 1997-06-25 Advanced Risc Mach Ltd Integrated circuit control
US5617431A (en) * 1994-08-02 1997-04-01 Advanced Micro Devices, Inc. Method and apparatus to reuse existing test patterns to test a single integrated circuit containing previously existing cores
US5596585A (en) * 1995-06-07 1997-01-21 Advanced Micro Devices, Inc. Performance driven BIST technique

Also Published As

Publication number Publication date
EP0834081B1 (en) 2004-02-25
WO1996041205A1 (en) 1996-12-19
CN1187244A (zh) 1998-07-08
DE69631658T2 (de) 2004-12-16
KR19990022049A (ko) 1999-03-25
JP3698166B2 (ja) 2005-09-21
DE69631658D1 (de) 2004-04-01
WO1996041206A1 (en) 1996-12-19
IL120927A0 (en) 1997-09-30
AU6251896A (en) 1996-12-30
US5805609A (en) 1998-09-08
EP0834081A1 (en) 1998-04-08
IL120927A (en) 2000-06-01
JPH11506833A (ja) 1999-06-15
EP0834081A4 (en) 1999-03-24
TW297096B (enExample) 1997-02-01
CN1089441C (zh) 2002-08-21

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