JP3698166B2 - Ｊｔａｇを用してａｓｉｃ内のメガセルを試験する方法と装置 - Google Patents

Ｊｔａｇを用してａｓｉｃ内のメガセルを試験する方法と装置 Download PDF

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Publication number
JP3698166B2
JP3698166B2 JP50112397A JP50112397A JP3698166B2 JP 3698166 B2 JP3698166 B2 JP 3698166B2 JP 50112397 A JP50112397 A JP 50112397A JP 50112397 A JP50112397 A JP 50112397A JP 3698166 B2 JP3698166 B2 JP 3698166B2
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test
input
megacell
output
circuit
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Japanese (ja)
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JPH11506833A (ja
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エル．，ジュニア モート，ランドール
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サムスン エレクトロニクス カンパニー，リミテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP50112397A 1995-06-07 1996-06-06 Ｊｔａｇを用してａｓｉｃ内のメガセルを試験する方法と装置 Expired - Fee Related JP3698166B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US48048395A 1995-06-07 1995-06-07
US08/480,483 1995-06-07
US52839795A 1995-09-14 1995-09-14
US08/528,397 1995-09-14
PCT/US1996/008576 WO1996041205A1 (en) 1995-06-07 1996-06-06 Method and apparatus for testing a megacell in an asic using jtag

Publications (2)

Publication Number Publication Date
JPH11506833A JPH11506833A (ja) 1999-06-15
JP3698166B2 true JP3698166B2 (ja) 2005-09-21

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JP50112397A Expired - Fee Related JP3698166B2 (ja) 1995-06-07 1996-06-06 Ｊｔａｇを用してａｓｉｃ内のメガセルを試験する方法と装置

Country Status (10)

Country Link
US (1) US5805609A (enExample)
EP (1) EP0834081B1 (enExample)
JP (1) JP3698166B2 (enExample)
KR (1) KR100248258B1 (enExample)
CN (1) CN1089441C (enExample)
AU (1) AU6251896A (enExample)
DE (1) DE69631658T2 (enExample)
IL (2) IL120927A (enExample)
TW (1) TW297096B (enExample)
WO (2) WO1996041205A1 (enExample)

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US7657805B2 (en) * 2007-07-02 2010-02-02 Sun Microsystems, Inc. Integrated circuit with blocking pin to coordinate entry into test mode
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US8621125B2 (en) * 2009-10-13 2013-12-31 Intellitech Corporation System and method of sending and receiving data and commands using the TCK and TMS of IEEE 1149.1
CN102236066B (zh) * 2010-04-22 2015-07-01 上海华虹集成电路有限责任公司 实现芯片功能故障快速调试定位的方法及调试电路
US8694844B2 (en) 2010-07-29 2014-04-08 Texas Instruments Incorporated AT speed TAP with dual port router and command circuit
CN103097902B (zh) * 2010-07-29 2015-12-09 德克萨斯仪器股份有限公司 改进全速测试访问端口操作
CN102778645B (zh) * 2011-05-09 2014-09-17 京微雅格（北京）科技有限公司 一种jtag主控制器及其实现方法
CN104899123B (zh) * 2015-04-24 2017-06-06 英业达科技有限公司 一种主板上dimm插槽的地址设置信号的连接测试装置与方法
KR20160139496A (ko) * 2015-05-27 2016-12-07 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
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CN108957283B (zh) * 2017-05-19 2021-08-03 龙芯中科技术股份有限公司 辐照实验板、监控终端、asic芯片辐照实验系统
CN107843828A (zh) * 2017-10-26 2018-03-27 电子科技大学 一种基于fpga的数字电路边界扫描控制系统
CN109917277B (zh) * 2019-05-16 2019-08-23 上海燧原智能科技有限公司 虚拟测试方法、装置、设备及存储介质
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Also Published As

Publication number Publication date
EP0834081B1 (en) 2004-02-25
WO1996041205A1 (en) 1996-12-19
CN1187244A (zh) 1998-07-08
DE69631658T2 (de) 2004-12-16
KR19990022049A (ko) 1999-03-25
DE69631658D1 (de) 2004-04-01
WO1996041206A1 (en) 1996-12-19
IL120927A0 (en) 1997-09-30
AU6251896A (en) 1996-12-30
US5805609A (en) 1998-09-08
EP0834081A1 (en) 1998-04-08
IL120927A (en) 2000-06-01
JPH11506833A (ja) 1999-06-15
EP0834081A4 (en) 1999-03-24
TW297096B (enExample) 1997-02-01
CN1089441C (zh) 2002-08-21
KR100248258B1 (ko) 2000-03-15

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