DE19981944D2 - Anwendungsspezifischer Baustein mit reduziertem Aufwand bei Überarbeitung - Google Patents

Anwendungsspezifischer Baustein mit reduziertem Aufwand bei Überarbeitung

Info

Publication number
DE19981944D2
DE19981944D2 DE19981944T DE19981944T DE19981944D2 DE 19981944 D2 DE19981944 D2 DE 19981944D2 DE 19981944 T DE19981944 T DE 19981944T DE 19981944 T DE19981944 T DE 19981944T DE 19981944 D2 DE19981944 D2 DE 19981944D2
Authority
DE
Germany
Prior art keywords
revision
application
specific module
reduced effort
effort
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19981944T
Other languages
English (en)
Inventor
Majid Ghameshlu
Karlheinz Krause
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19981944T priority Critical patent/DE19981944D2/de
Application granted granted Critical
Publication of DE19981944D2 publication Critical patent/DE19981944D2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G01R31/318538—Topological or mechanical aspects

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
DE19981944T 1998-09-29 1999-09-01 Anwendungsspezifischer Baustein mit reduziertem Aufwand bei Überarbeitung Expired - Fee Related DE19981944D2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19981944T DE19981944D2 (de) 1998-09-29 1999-09-01 Anwendungsspezifischer Baustein mit reduziertem Aufwand bei Überarbeitung

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19844731 1998-09-29
PCT/DE1999/002733 WO2000019223A1 (de) 1998-09-29 1999-09-01 Anwendungsspezifischer baustein mit reduziertem aufwand bei überarbeitung
DE19981944T DE19981944D2 (de) 1998-09-29 1999-09-01 Anwendungsspezifischer Baustein mit reduziertem Aufwand bei Überarbeitung

Publications (1)

Publication Number Publication Date
DE19981944D2 true DE19981944D2 (de) 2002-08-29

Family

ID=7882710

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19981944T Expired - Fee Related DE19981944D2 (de) 1998-09-29 1999-09-01 Anwendungsspezifischer Baustein mit reduziertem Aufwand bei Überarbeitung

Country Status (5)

Country Link
US (1) US6742150B1 (de)
CN (1) CN1145040C (de)
DE (1) DE19981944D2 (de)
ID (1) ID27920A (de)
WO (1) WO2000019223A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7174340B1 (en) * 2000-08-17 2007-02-06 Oracle International Corporation Interval-based adjustment data includes computing an adjustment value from the data for a pending adjustment in response to retrieval of an adjusted data value from a database
US9201117B2 (en) 2013-05-06 2015-12-01 International Business Machines Corporation Managing redundancy repair using boundary scans

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5412260A (en) * 1991-05-03 1995-05-02 Lattice Semiconductor Corporation Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device
JP2616410B2 (ja) 1993-11-29 1997-06-04 日本電気株式会社 バウンダリスキャン用回路を具備する半導体集積回路
US5544174A (en) 1994-03-17 1996-08-06 The United States Of America As Represented By The Secretary Of The Air Force Programmable boundary scan and input output parameter device for testing integrated circuits
JP3698166B2 (ja) 1995-06-07 2005-09-21 サムスン エレクトロニクス カンパニー，リミテッド Ｊｔａｇを用してａｓｉｃ内のメガセルを試験する方法と装置

Also Published As

Publication number Publication date
WO2000019223A1 (de) 2000-04-06
ID27920A (id) 2001-05-03
CN1145040C (zh) 2004-04-07
CN1320215A (zh) 2001-10-31
US6742150B1 (en) 2004-05-25

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Legal Events

Date Code Title Description
8139 Disposal/non-payment of the annual fee