ID27920A - Modul khusus penerapan dengan upaya modifikasi yang berkurang - Google Patents

Modul khusus penerapan dengan upaya modifikasi yang berkurang

Info

Publication number
ID27920A
ID27920A IDW20010702A ID20010702A ID27920A ID 27920 A ID27920 A ID 27920A ID W20010702 A IDW20010702 A ID W20010702A ID 20010702 A ID20010702 A ID 20010702A ID 27920 A ID27920 A ID 27920A
Authority
ID
Indonesia
Prior art keywords
application
special module
reduce modification
modification efforts
efforts
Prior art date
Application number
IDW20010702A
Other languages
English (en)
Indonesian (id)
Inventor
Ghameshlu Majid
Krause Karlheinz
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of ID27920A publication Critical patent/ID27920A/id

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G01R31/318538—Topological or mechanical aspects
IDW20010702A 1998-09-29 1999-09-01 Modul khusus penerapan dengan upaya modifikasi yang berkurang ID27920A (id)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19844731 1998-09-29

Publications (1)

Publication Number Publication Date
ID27920A true ID27920A (id) 2001-05-03

Family

ID=7882710

Family Applications (1)

Application Number Title Priority Date Filing Date
IDW20010702A ID27920A (id) 1998-09-29 1999-09-01 Modul khusus penerapan dengan upaya modifikasi yang berkurang

Country Status (5)

Country Link
US (1) US6742150B1 (de)
CN (1) CN1145040C (de)
DE (1) DE19981944D2 (de)
ID (1) ID27920A (de)
WO (1) WO2000019223A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7174340B1 (en) * 2000-08-17 2007-02-06 Oracle International Corporation Interval-based adjustment data includes computing an adjustment value from the data for a pending adjustment in response to retrieval of an adjusted data value from a database
US9201117B2 (en) 2013-05-06 2015-12-01 International Business Machines Corporation Managing redundancy repair using boundary scans

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5412260A (en) * 1991-05-03 1995-05-02 Lattice Semiconductor Corporation Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device
JP2616410B2 (ja) 1993-11-29 1997-06-04 日本電気株式会社 バウンダリスキャン用回路を具備する半導体集積回路
US5544174A (en) 1994-03-17 1996-08-06 The United States Of America As Represented By The Secretary Of The Air Force Programmable boundary scan and input output parameter device for testing integrated circuits
JP3698166B2 (ja) 1995-06-07 2005-09-21 サムスン エレクトロニクス カンパニー，リミテッド Ｊｔａｇを用してａｓｉｃ内のメガセルを試験する方法と装置

Also Published As

Publication number Publication date
WO2000019223A1 (de) 2000-04-06
DE19981944D2 (de) 2002-08-29
CN1145040C (zh) 2004-04-07
CN1320215A (zh) 2001-10-31
US6742150B1 (en) 2004-05-25

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