AU6251896A - Method and apparatus for testing a megacell in an asic using JTAG - Google Patents

Method and apparatus for testing a megacell in an asic using JTAG

Info

Publication number
AU6251896A
AU6251896A AU62518/96A AU6251896A AU6251896A AU 6251896 A AU6251896 A AU 6251896A AU 62518/96 A AU62518/96 A AU 62518/96A AU 6251896 A AU6251896 A AU 6251896A AU 6251896 A AU6251896 A AU 6251896A
Authority
AU
Australia
Prior art keywords
megacell
jtag
asic
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU62518/96A
Other languages
English (en)
Inventor
Randall L. Mote Jr.
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
AST Research Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AST Research Inc filed Critical AST Research Inc
Publication of AU6251896A publication Critical patent/AU6251896A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
AU62518/96A 1995-06-07 1996-06-06 Method and apparatus for testing a megacell in an asic using JTAG Abandoned AU6251896A (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US48048395A 1995-06-07 1995-06-07
US480483 1995-06-07
US52839795A 1995-09-14 1995-09-14
US528397 1995-09-14
PCT/US1996/008576 WO1996041205A1 (en) 1995-06-07 1996-06-06 Method and apparatus for testing a megacell in an asic using jtag

Publications (1)

Publication Number Publication Date
AU6251896A true AU6251896A (en) 1996-12-30

Family

ID=27046602

Family Applications (1)

Application Number Title Priority Date Filing Date
AU62518/96A Abandoned AU6251896A (en) 1995-06-07 1996-06-06 Method and apparatus for testing a megacell in an asic using JTAG

Country Status (10)

Country Link
US (1) US5805609A (enExample)
EP (1) EP0834081B1 (enExample)
JP (1) JP3698166B2 (enExample)
KR (1) KR100248258B1 (enExample)
CN (1) CN1089441C (enExample)
AU (1) AU6251896A (enExample)
DE (1) DE69631658T2 (enExample)
IL (2) IL120927A (enExample)
TW (1) TW297096B (enExample)
WO (2) WO1996041205A1 (enExample)

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US7589648B1 (en) * 2005-02-10 2009-09-15 Lattice Semiconductor Corporation Data decompression
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US7274203B2 (en) * 2005-10-25 2007-09-25 Freescale Semiconductor, Inc. Design-for-test circuit for low pin count devices
WO2007069097A1 (en) * 2005-11-02 2007-06-21 Nxp B.V. Ic testing methods and apparatus
CN100442242C (zh) * 2006-02-28 2008-12-10 环达电脑(上海)有限公司 用于测试主板插槽的设备、系统及方法
US7511641B1 (en) 2006-09-19 2009-03-31 Lattice Semiconductor Corporation Efficient bitstream compression
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US20080114772A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Method for connecting to a network location associated with content
US20080112562A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Methods for linking content with license
US8079071B2 (en) 2006-11-14 2011-12-13 SanDisk Technologies, Inc. Methods for accessing content based on a session ticket
US20080114693A1 (en) * 2006-11-14 2008-05-15 Fabrice Jogand-Coulomb Method for allowing content protected by a first DRM system to be accessed by a second DRM system
US8763110B2 (en) * 2006-11-14 2014-06-24 Sandisk Technologies Inc. Apparatuses for binding content to a separate memory device
US8327454B2 (en) * 2006-11-14 2012-12-04 Sandisk Technologies Inc. Method for allowing multiple users to access preview content
CN101102566B (zh) * 2007-06-25 2010-12-08 中兴通讯股份有限公司 一种手机jtag调试接口信号设计方法及其调试方法
US7657805B2 (en) * 2007-07-02 2010-02-02 Sun Microsystems, Inc. Integrated circuit with blocking pin to coordinate entry into test mode
US8051338B2 (en) * 2007-07-19 2011-11-01 Cray Inc. Inter-asic data transport using link control block manager
US7902865B1 (en) 2007-11-15 2011-03-08 Lattice Semiconductor Corporation Compression and decompression of configuration data using repeated data frames
US8621125B2 (en) * 2009-10-13 2013-12-31 Intellitech Corporation System and method of sending and receiving data and commands using the TCK and TMS of IEEE 1149.1
CN102236066B (zh) * 2010-04-22 2015-07-01 上海华虹集成电路有限责任公司 实现芯片功能故障快速调试定位的方法及调试电路
US8694844B2 (en) 2010-07-29 2014-04-08 Texas Instruments Incorporated AT speed TAP with dual port router and command circuit
CN103097902B (zh) * 2010-07-29 2015-12-09 德克萨斯仪器股份有限公司 改进全速测试访问端口操作
CN102778645B (zh) * 2011-05-09 2014-09-17 京微雅格（北京）科技有限公司 一种jtag主控制器及其实现方法
CN104899123B (zh) * 2015-04-24 2017-06-06 英业达科技有限公司 一种主板上dimm插槽的地址设置信号的连接测试装置与方法
KR20160139496A (ko) * 2015-05-27 2016-12-07 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
US9791505B1 (en) * 2016-04-29 2017-10-17 Texas Instruments Incorporated Full pad coverage boundary scan
CN108957283B (zh) * 2017-05-19 2021-08-03 龙芯中科技术股份有限公司 辐照实验板、监控终端、asic芯片辐照实验系统
CN107843828A (zh) * 2017-10-26 2018-03-27 电子科技大学 一种基于fpga的数字电路边界扫描控制系统
CN109917277B (zh) * 2019-05-16 2019-08-23 上海燧原智能科技有限公司 虚拟测试方法、装置、设备及存储介质
US10746798B1 (en) 2019-05-31 2020-08-18 Nvidia Corp. Field adaptable in-system test mechanisms
US11204849B2 (en) 2020-03-13 2021-12-21 Nvidia Corporation Leveraging low power states for fault testing of processing cores at runtime
CN113938125B (zh) * 2021-10-19 2023-02-24 浙江大学 多通道可配置可测试与修调的数字信号隔离器

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Also Published As

Publication number Publication date
EP0834081B1 (en) 2004-02-25
WO1996041205A1 (en) 1996-12-19
CN1187244A (zh) 1998-07-08
DE69631658T2 (de) 2004-12-16
KR19990022049A (ko) 1999-03-25
JP3698166B2 (ja) 2005-09-21
DE69631658D1 (de) 2004-04-01
WO1996041206A1 (en) 1996-12-19
IL120927A0 (en) 1997-09-30
US5805609A (en) 1998-09-08
EP0834081A1 (en) 1998-04-08
IL120927A (en) 2000-06-01
JPH11506833A (ja) 1999-06-15
EP0834081A4 (en) 1999-03-24
TW297096B (enExample) 1997-02-01
CN1089441C (zh) 2002-08-21
KR100248258B1 (ko) 2000-03-15

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