JPH10313101A5 - - Google Patents

Info

Publication number
JPH10313101A5
JPH10313101A5 JP1997119639A JP11963997A JPH10313101A5 JP H10313101 A5 JPH10313101 A5 JP H10313101A5 JP 1997119639 A JP1997119639 A JP 1997119639A JP 11963997 A JP11963997 A JP 11963997A JP H10313101 A5 JPH10313101 A5 JP H10313101A5
Authority
JP
Japan
Prior art keywords
diffusion layers
adjacent
diffusion
transistor
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1997119639A
Other languages
English (en)
Japanese (ja)
Other versions
JP4005663B2 (ja
JPH10313101A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP11963997A priority Critical patent/JP4005663B2/ja
Priority claimed from JP11963997A external-priority patent/JP4005663B2/ja
Priority to US09/072,724 priority patent/US6094390A/en
Publication of JPH10313101A publication Critical patent/JPH10313101A/ja
Priority to US09/587,263 priority patent/US6288927B1/en
Publication of JPH10313101A5 publication Critical patent/JPH10313101A5/ja
Application granted granted Critical
Publication of JP4005663B2 publication Critical patent/JP4005663B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP11963997A 1997-05-09 1997-05-09 半導体記憶装置 Expired - Fee Related JP4005663B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP11963997A JP4005663B2 (ja) 1997-05-09 1997-05-09 半導体記憶装置
US09/072,724 US6094390A (en) 1997-05-09 1998-05-06 Semiconductor memory device with column gate and equalizer circuitry
US09/587,263 US6288927B1 (en) 1997-05-09 2000-06-05 Semiconductor memory device with column gate and equalizer circuitry

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11963997A JP4005663B2 (ja) 1997-05-09 1997-05-09 半導体記憶装置

Publications (3)

Publication Number Publication Date
JPH10313101A JPH10313101A (ja) 1998-11-24
JPH10313101A5 true JPH10313101A5 (enExample) 2005-03-10
JP4005663B2 JP4005663B2 (ja) 2007-11-07

Family

ID=14766436

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11963997A Expired - Fee Related JP4005663B2 (ja) 1997-05-09 1997-05-09 半導体記憶装置

Country Status (2)

Country Link
US (2) US6094390A (enExample)
JP (1) JP4005663B2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10108744B8 (de) * 2001-02-23 2008-06-26 Qimonda Ag Integrierter DRAM-Speicherbaustein
KR100525460B1 (ko) * 2003-05-23 2005-10-31 (주)실리콘세븐 2개의 메모리 블락 사이에 3개의 센스앰프를 가지며,인출과 기입 동작 구간이 분리되는 리프레쉬 동작을수행하는 에스램 호환 메모리 및 그 구동방법
JP4912621B2 (ja) * 2005-06-07 2012-04-11 富士通株式会社 半導体装置及び半導体装置の配線方法
JP5587141B2 (ja) 2010-11-05 2014-09-10 ピーエスフォー ルクスコ エスエイアールエル 半導体装置
JP5528987B2 (ja) 2010-11-11 2014-06-25 ピーエスフォー ルクスコ エスエイアールエル 半導体装置
JP5736224B2 (ja) * 2011-04-12 2015-06-17 ルネサスエレクトロニクス株式会社 半導体記憶装置
JP5711033B2 (ja) 2011-04-12 2015-04-30 ルネサスエレクトロニクス株式会社 半導体集積回路装置
KR102070623B1 (ko) 2013-07-09 2020-01-29 삼성전자 주식회사 비트 라인 등화 회로
JP6129004B2 (ja) 2013-07-18 2017-05-17 ルネサスエレクトロニクス株式会社 半導体メモリ
KR20150089539A (ko) * 2014-01-28 2015-08-05 에스케이하이닉스 주식회사 프리차지 회로 및 이를 이용하는 반도체 메모리 장치
JP6373441B2 (ja) * 2017-04-11 2018-08-15 ルネサスエレクトロニクス株式会社 半導体メモリ
JP6378391B2 (ja) * 2017-04-12 2018-08-22 ルネサスエレクトロニクス株式会社 半導体記憶装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4853897A (en) * 1986-12-10 1989-08-01 Kabushiki Kaisha Toshiba Complementary semiconductor memory device
US5579256A (en) * 1988-11-01 1996-11-26 Hitachi, Ltd. Semiconductor memory device and defect remedying method thereof
JPH06268173A (ja) * 1993-03-15 1994-09-22 Toshiba Corp 半導体記憶装置
JP3004177B2 (ja) * 1993-09-16 2000-01-31 株式会社東芝 半導体集積回路装置
US5973369A (en) * 1997-03-11 1999-10-26 Nec Corporation SRAM having P-channel TFT as load element with less series-connected high resistance

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