JPH0626987A - Ｌｃｄパネルにおける交差短絡欠陥の位置を決定する方法および装置 - Google Patents

Ｌｃｄパネルにおける交差短絡欠陥の位置を決定する方法および装置

Info

Publication number
JPH0626987A
JPH0626987A JP3206233A JP20623391A JPH0626987A JP H0626987 A JPH0626987 A JP H0626987A JP 3206233 A JP3206233 A JP 3206233A JP 20623391 A JP20623391 A JP 20623391A JP H0626987 A JPH0626987 A JP H0626987A
Authority
JP
Japan
Prior art keywords
short
panel
defect
magnetic field
lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3206233A
Other languages
English (en)
Japanese (ja)
Inventor
Francois J Henley
フランソワ・ジェイ・ヘンリイ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Photon Dynamics Inc
Original Assignee
Photon Dynamics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photon Dynamics Inc filed Critical Photon Dynamics Inc
Publication of JPH0626987A publication Critical patent/JPH0626987A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S345/00—Computer graphics processing and selective visual display systems
    • Y10S345/904—Display with fail/safe testing feature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP3206233A 1990-07-24 1991-07-24 Ｌｃｄパネルにおける交差短絡欠陥の位置を決定する方法および装置 Pending JPH0626987A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US557,257 1990-07-24
US07/557,257 US5073754A (en) 1990-07-24 1990-07-24 Method and apparatus for testing LCD panel array using a magnetic field sensor

Publications (1)

Publication Number Publication Date
JPH0626987A true JPH0626987A (ja) 1994-02-04

Family

ID=24224670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3206233A Pending JPH0626987A (ja) 1990-07-24 1991-07-24 Ｌｃｄパネルにおける交差短絡欠陥の位置を決定する方法および装置

Country Status (3)

Country Link
US (1) US5073754A (enExample)
JP (1) JPH0626987A (enExample)
TW (1) TW237526B (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010111969A (ko) * 2000-06-14 2001-12-20 은탁 자기헤드를 이용한 플라즈마 디스플레이 패널의 전극패턴검사 장치 및 그 방법
JP2002131365A (ja) * 2000-08-16 2002-05-09 Oht Inc 検査方法及び検査装置
JP2006105795A (ja) * 2004-10-06 2006-04-20 Hioki Ee Corp 絶縁検査方法および絶縁検査装置
US7301360B2 (en) 2003-05-06 2007-11-27 Lg.Philips Lcd Co., Ltd. Method and apparatus for inspecting flat panel display
CN105699815A (zh) * 2016-03-08 2016-06-22 广州市丰海科技股份有限公司 一种led模组自动老化的检测方法及其检测系统

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US5081687A (en) * 1990-11-30 1992-01-14 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array prior to shorting bar removal
KR960002145B1 (ko) * 1991-07-30 1996-02-13 가부시기가이샤 히다찌세이사구쇼 박막트랜지스터 액정기판의 검사방법 및 그 장치
US5243272A (en) * 1992-05-13 1993-09-07 Genrad, Inc. Method of testing control matrices employing distributed source return
US5463322A (en) * 1993-12-03 1995-10-31 General Electric Company Method of locating common electrode shorts in an imager assembly
JP2672260B2 (ja) * 1994-06-07 1997-11-05 トーケン工業株式会社 Ｔｆｔ−ｌｃｄの検査方法
US5821759A (en) * 1997-02-27 1998-10-13 International Business Machines Corporation Method and apparatus for detecting shorts in a multi-layer electronic package
US6242923B1 (en) * 1997-02-27 2001-06-05 International Business Machines Corporation Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards
US6154043A (en) * 1997-05-07 2000-11-28 Advanced Micro Devices, Inc. Method and apparatus for identifying the position of a selected semiconductor die relative to other dice formed from the same semiconductor wafer
US6064220A (en) * 1997-07-29 2000-05-16 Lsi Logic Corporation Semiconductor integrated circuit failure analysis using magnetic imaging
US6118279A (en) 1997-07-30 2000-09-12 Candescent Technologies Corporation Magnetic detection of short circuit defects in plate structure
DE69836486T2 (de) * 1997-07-30 2007-10-11 Candescent Technologies Corp., San Jose Magnetischer stromdetektor und kurzschlusserkennung in einer plattenstruktur
US6107806A (en) * 1997-07-30 2000-08-22 Candescent Technologies Corporation Device for magnetically sensing current in plate structure
US7081908B2 (en) * 2001-02-22 2006-07-25 Mitsubishi Heavy Industries, Ltd. Apparatus and method for testing electrode structure for thin display device using FET function
KR100528695B1 (ko) * 2003-05-06 2005-11-16 엘지.필립스 엘시디 주식회사 평판표시장치의 검사방법 및 장치
KR100942841B1 (ko) 2003-06-02 2010-02-18 엘지디스플레이 주식회사 액정표시소자의 검사 방법 및 장치와 리페어방법 및 장치
US20050195150A1 (en) * 2004-03-03 2005-09-08 Sharp Kabushiki Kaisha Display panel and display device
KR20060021649A (ko) * 2004-09-03 2006-03-08 엘지전자 주식회사 고밀도 미세 패턴의 단락 도선 위치 검출을 위한 자기 센서
US7477333B2 (en) * 2005-08-30 2009-01-13 Chunghwa Picture Tubes, Ltd. Liquid crystal display panel with electrostatic discharge protection
US9035673B2 (en) 2010-01-25 2015-05-19 Palo Alto Research Center Incorporated Method of in-process intralayer yield detection, interlayer shunt detection and correction
KR20140113469A (ko) * 2013-03-15 2014-09-24 포톤 다이나믹스, 인코포레이티드 검사 중에 디스플레이의 실시간 모니터링을 위한 시스템 및 방법
US9523729B2 (en) * 2013-09-13 2016-12-20 Infineon Technologies Ag Apparatus and method for testing electric conductors
CN106054474B (zh) * 2016-05-27 2019-05-03 深圳市华星光电技术有限公司 液晶显示面板及液晶显示面板线路监测方法
US9947255B2 (en) * 2016-08-19 2018-04-17 Apple Inc. Electronic device display with monitoring circuitry
CN106297614B (zh) * 2016-08-30 2019-11-12 苏州华兴源创科技股份有限公司 一种液晶产品的测试方法
CN107316597B (zh) * 2017-08-11 2020-11-13 深圳同兴达科技股份有限公司 一种液晶显示模组开路短路检测系统
CN115167021B (zh) * 2022-08-05 2023-07-25 苏州华星光电技术有限公司 显示面板的检测方法及检测装置

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Publication number Priority date Publication date Assignee Title
DE2311903A1 (de) * 1973-03-09 1974-09-12 Siemens Ag Verfahren und einrichtung zur ortung von kurzschluessen in mehrlagenverdrahtungen
JPS56153262A (en) * 1980-04-30 1981-11-27 Toshiba Corp Detecting method for short circuited point of wiring pattern
JPS56154678A (en) * 1980-04-30 1981-11-30 Fujitsu Ltd Inspection method for conductor pattern
DE3111393A1 (de) * 1981-03-23 1982-09-30 WEE Elektronik Entwicklungs-Gesellschaft mbH, 6980 Wertheim Verfahren und einrichtung zum orten von kurzschluessen in leiterplatten, verdrahtungen, leitungen, kabeln oder dergleichen
JPS5899768A (ja) * 1981-12-09 1983-06-14 Matsushita Electric Ind Co Ltd 基板パタ−ン短絡箇所検出装置
US4507605A (en) * 1982-05-17 1985-03-26 Testamatic, Incorporated Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items
JPS59111197A (ja) * 1982-12-17 1984-06-27 シチズン時計株式会社 マトリクス型表示装置の駆動回路
US4542333A (en) * 1983-05-05 1985-09-17 Ppg Industries, Inc. Method and apparatus utilizing magnetic field sensing for detecting discontinuities in a conductor member associated with a glass sheet

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010111969A (ko) * 2000-06-14 2001-12-20 은탁 자기헤드를 이용한 플라즈마 디스플레이 패널의 전극패턴검사 장치 및 그 방법
JP2002131365A (ja) * 2000-08-16 2002-05-09 Oht Inc 検査方法及び検査装置
US7301360B2 (en) 2003-05-06 2007-11-27 Lg.Philips Lcd Co., Ltd. Method and apparatus for inspecting flat panel display
JP2008145445A (ja) * 2003-05-06 2008-06-26 Lg Display Co Ltd フラットパネルディスプレイの検査方法及び検査装置
JP2006105795A (ja) * 2004-10-06 2006-04-20 Hioki Ee Corp 絶縁検査方法および絶縁検査装置
CN105699815A (zh) * 2016-03-08 2016-06-22 广州市丰海科技股份有限公司 一种led模组自动老化的检测方法及其检测系统
CN105699815B (zh) * 2016-03-08 2019-01-18 广州市丰海科技股份有限公司 一种led模组自动老化的检测方法及其检测系统

Also Published As

Publication number Publication date
US5073754A (en) 1991-12-17
TW237526B (enExample) 1995-01-01

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