JPS56153262A - Detecting method for short circuited point of wiring pattern - Google Patents

Detecting method for short circuited point of wiring pattern

Info

Publication number
JPS56153262A
JPS56153262A JP5633080A JP5633080A JPS56153262A JP S56153262 A JPS56153262 A JP S56153262A JP 5633080 A JP5633080 A JP 5633080A JP 5633080 A JP5633080 A JP 5633080A JP S56153262 A JPS56153262 A JP S56153262A
Authority
JP
Japan
Prior art keywords
short circuited
magnetic field
point
circuited point
current loop
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5633080A
Other languages
Japanese (ja)
Inventor
Koji Namiki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5633080A priority Critical patent/JPS56153262A/en
Publication of JPS56153262A publication Critical patent/JPS56153262A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To ensure an extermely hgh-accurate detection for the short circuited point of a wiring pattern without contacting the wiring, by shifting a detecting element incorporating a Hall device along a current loop formed including the short circuited point. CONSTITUTION:If the short circuited point 16 exists between the broken lines 122 and 132, current loop shown by a thick line is formed when the power source 17 is connected between the terminals 12a and 13a of the terminal group 15. Under such conditions, the detector 19 having the detecting element 18 consisting of the Hall device which detects the local magnetic field is shifted nearly to the center part between the two wires. Thus the local magnetic field generated from the current loop is detected, and the finite magnetic field value is detected until the device 18 reaches the short circuited point 16. And the magnetic field value becomes zero as soon as the device 18 goes beyond the part 16 to outside of the current loop. As a result, the point where the detected magnetic field changes from a finite value to zero under a shift of detector 19 is detected as the short circuited point.
JP5633080A 1980-04-30 1980-04-30 Detecting method for short circuited point of wiring pattern Pending JPS56153262A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5633080A JPS56153262A (en) 1980-04-30 1980-04-30 Detecting method for short circuited point of wiring pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5633080A JPS56153262A (en) 1980-04-30 1980-04-30 Detecting method for short circuited point of wiring pattern

Publications (1)

Publication Number Publication Date
JPS56153262A true JPS56153262A (en) 1981-11-27

Family

ID=13024172

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5633080A Pending JPS56153262A (en) 1980-04-30 1980-04-30 Detecting method for short circuited point of wiring pattern

Country Status (1)

Country Link
JP (1) JPS56153262A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281068U (en) * 1985-11-08 1987-05-23
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281068U (en) * 1985-11-08 1987-05-23
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates

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