TW237526B - - Google Patents
Info
- Publication number
- TW237526B TW237526B TW080101343A TW80101343A TW237526B TW 237526 B TW237526 B TW 237526B TW 080101343 A TW080101343 A TW 080101343A TW 80101343 A TW80101343 A TW 80101343A TW 237526 B TW237526 B TW 237526B
- Authority
- TW
- Taiwan
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S345/00—Computer graphics processing and selective visual display systems
- Y10S345/904—Display with fail/safe testing feature
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Liquid Crystal (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Liquid Crystal Display Device Control (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/557,257 US5073754A (en) | 1990-07-24 | 1990-07-24 | Method and apparatus for testing LCD panel array using a magnetic field sensor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW237526B true TW237526B (enExample) | 1995-01-01 |
Family
ID=24224670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW080101343A TW237526B (enExample) | 1990-07-24 | 1991-02-21 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US5073754A (enExample) |
| JP (1) | JPH0626987A (enExample) |
| TW (1) | TW237526B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104050907A (zh) * | 2013-03-15 | 2014-09-17 | 烽腾科技有限公司 | 用于识别电子电路中的缺陷的装置及方法 |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5081687A (en) * | 1990-11-30 | 1992-01-14 | Photon Dynamics, Inc. | Method and apparatus for testing LCD panel array prior to shorting bar removal |
| KR960002145B1 (ko) * | 1991-07-30 | 1996-02-13 | 가부시기가이샤 히다찌세이사구쇼 | 박막트랜지스터 액정기판의 검사방법 및 그 장치 |
| US5243272A (en) * | 1992-05-13 | 1993-09-07 | Genrad, Inc. | Method of testing control matrices employing distributed source return |
| US5463322A (en) * | 1993-12-03 | 1995-10-31 | General Electric Company | Method of locating common electrode shorts in an imager assembly |
| JP2672260B2 (ja) * | 1994-06-07 | 1997-11-05 | トーケン工業株式会社 | Ｔｆｔ−ｌｃｄの検査方法 |
| US5821759A (en) * | 1997-02-27 | 1998-10-13 | International Business Machines Corporation | Method and apparatus for detecting shorts in a multi-layer electronic package |
| US6242923B1 (en) * | 1997-02-27 | 2001-06-05 | International Business Machines Corporation | Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards |
| US6154043A (en) * | 1997-05-07 | 2000-11-28 | Advanced Micro Devices, Inc. | Method and apparatus for identifying the position of a selected semiconductor die relative to other dice formed from the same semiconductor wafer |
| US6064220A (en) * | 1997-07-29 | 2000-05-16 | Lsi Logic Corporation | Semiconductor integrated circuit failure analysis using magnetic imaging |
| US6118279A (en) | 1997-07-30 | 2000-09-12 | Candescent Technologies Corporation | Magnetic detection of short circuit defects in plate structure |
| DE69836486T2 (de) * | 1997-07-30 | 2007-10-11 | Candescent Technologies Corp., San Jose | Magnetischer stromdetektor und kurzschlusserkennung in einer plattenstruktur |
| US6107806A (en) * | 1997-07-30 | 2000-08-22 | Candescent Technologies Corporation | Device for magnetically sensing current in plate structure |
| KR20010111969A (ko) * | 2000-06-14 | 2001-12-20 | 은탁 | 자기헤드를 이용한 플라즈마 디스플레이 패널의 전극패턴검사 장치 및 그 방법 |
| JP2002131365A (ja) * | 2000-08-16 | 2002-05-09 | Oht Inc | 検査方法及び検査装置 |
| US7081908B2 (en) * | 2001-02-22 | 2006-07-25 | Mitsubishi Heavy Industries, Ltd. | Apparatus and method for testing electrode structure for thin display device using FET function |
| KR100528696B1 (ko) * | 2003-05-06 | 2005-11-16 | 엘지.필립스 엘시디 주식회사 | 평판표시장치의 검사방법 및 장치 |
| KR100528695B1 (ko) * | 2003-05-06 | 2005-11-16 | 엘지.필립스 엘시디 주식회사 | 평판표시장치의 검사방법 및 장치 |
| KR100942841B1 (ko) | 2003-06-02 | 2010-02-18 | 엘지디스플레이 주식회사 | 액정표시소자의 검사 방법 및 장치와 리페어방법 및 장치 |
| US20050195150A1 (en) * | 2004-03-03 | 2005-09-08 | Sharp Kabushiki Kaisha | Display panel and display device |
| KR20060021649A (ko) * | 2004-09-03 | 2006-03-08 | 엘지전자 주식회사 | 고밀도 미세 패턴의 단락 도선 위치 검출을 위한 자기 센서 |
| JP2006105795A (ja) * | 2004-10-06 | 2006-04-20 | Hioki Ee Corp | 絶縁検査方法および絶縁検査装置 |
| US7477333B2 (en) * | 2005-08-30 | 2009-01-13 | Chunghwa Picture Tubes, Ltd. | Liquid crystal display panel with electrostatic discharge protection |
| US9035673B2 (en) | 2010-01-25 | 2015-05-19 | Palo Alto Research Center Incorporated | Method of in-process intralayer yield detection, interlayer shunt detection and correction |
| US9523729B2 (en) * | 2013-09-13 | 2016-12-20 | Infineon Technologies Ag | Apparatus and method for testing electric conductors |
| CN105699815B (zh) * | 2016-03-08 | 2019-01-18 | 广州市丰海科技股份有限公司 | 一种led模组自动老化的检测方法及其检测系统 |
| CN106054474B (zh) * | 2016-05-27 | 2019-05-03 | 深圳市华星光电技术有限公司 | 液晶显示面板及液晶显示面板线路监测方法 |
| US9947255B2 (en) * | 2016-08-19 | 2018-04-17 | Apple Inc. | Electronic device display with monitoring circuitry |
| CN106297614B (zh) * | 2016-08-30 | 2019-11-12 | 苏州华兴源创科技股份有限公司 | 一种液晶产品的测试方法 |
| CN107316597B (zh) * | 2017-08-11 | 2020-11-13 | 深圳同兴达科技股份有限公司 | 一种液晶显示模组开路短路检测系统 |
| CN115167021B (zh) * | 2022-08-05 | 2023-07-25 | 苏州华星光电技术有限公司 | 显示面板的检测方法及检测装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2311903A1 (de) * | 1973-03-09 | 1974-09-12 | Siemens Ag | Verfahren und einrichtung zur ortung von kurzschluessen in mehrlagenverdrahtungen |
| JPS56153262A (en) * | 1980-04-30 | 1981-11-27 | Toshiba Corp | Detecting method for short circuited point of wiring pattern |
| JPS56154678A (en) * | 1980-04-30 | 1981-11-30 | Fujitsu Ltd | Inspection method for conductor pattern |
| DE3111393A1 (de) * | 1981-03-23 | 1982-09-30 | WEE Elektronik Entwicklungs-Gesellschaft mbH, 6980 Wertheim | Verfahren und einrichtung zum orten von kurzschluessen in leiterplatten, verdrahtungen, leitungen, kabeln oder dergleichen |
| JPS5899768A (ja) * | 1981-12-09 | 1983-06-14 | Matsushita Electric Ind Co Ltd | 基板パタ−ン短絡箇所検出装置 |
| US4507605A (en) * | 1982-05-17 | 1985-03-26 | Testamatic, Incorporated | Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items |
| JPS59111197A (ja) * | 1982-12-17 | 1984-06-27 | シチズン時計株式会社 | マトリクス型表示装置の駆動回路 |
| US4542333A (en) * | 1983-05-05 | 1985-09-17 | Ppg Industries, Inc. | Method and apparatus utilizing magnetic field sensing for detecting discontinuities in a conductor member associated with a glass sheet |
-
1990
- 1990-07-24 US US07/557,257 patent/US5073754A/en not_active Expired - Fee Related
-
1991
- 1991-02-21 TW TW080101343A patent/TW237526B/zh active
- 1991-07-24 JP JP3206233A patent/JPH0626987A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104050907A (zh) * | 2013-03-15 | 2014-09-17 | 烽腾科技有限公司 | 用于识别电子电路中的缺陷的装置及方法 |
| TWI664433B (zh) * | 2013-03-15 | 2019-07-01 | 美商烽騰科技有限公司 | 用於識別電子電路中之缺陷之裝置及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US5073754A (en) | 1991-12-17 |
| JPH0626987A (ja) | 1994-02-04 |