JPH0414494B2 - - Google Patents
Info
- Publication number
- JPH0414494B2 JPH0414494B2 JP58248427A JP24842783A JPH0414494B2 JP H0414494 B2 JPH0414494 B2 JP H0414494B2 JP 58248427 A JP58248427 A JP 58248427A JP 24842783 A JP24842783 A JP 24842783A JP H0414494 B2 JPH0414494 B2 JP H0414494B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- processed
- brushes
- rotating
- holding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/28—Work carriers for double side lapping of plane surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
- H01L21/3046—Mechanical treatment, e.g. grinding, polishing, cutting using blasting, e.g. sand-blasting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58248427A JPS60143634A (ja) | 1983-12-29 | 1983-12-29 | ウエ−ハ処理方法及び装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58248427A JPS60143634A (ja) | 1983-12-29 | 1983-12-29 | ウエ−ハ処理方法及び装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60143634A JPS60143634A (ja) | 1985-07-29 |
JPH0414494B2 true JPH0414494B2 (enrdf_load_stackoverflow) | 1992-03-13 |
Family
ID=17177959
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58248427A Granted JPS60143634A (ja) | 1983-12-29 | 1983-12-29 | ウエ−ハ処理方法及び装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60143634A (enrdf_load_stackoverflow) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6260225A (ja) * | 1985-09-10 | 1987-03-16 | Toshiba Ceramics Co Ltd | シリコンウエハの洗浄方法 |
JPS62121098U (enrdf_load_stackoverflow) * | 1986-01-27 | 1987-07-31 | ||
JPS6310548U (enrdf_load_stackoverflow) * | 1986-07-08 | 1988-01-23 | ||
JPH0795540B2 (ja) * | 1988-04-11 | 1995-10-11 | 株式会社日立製作所 | 超音波洗浄スプレイノズルを用いた基板両面の洗浄方法及び洗浄装置 |
JP2767165B2 (ja) * | 1991-07-31 | 1998-06-18 | 信越半導体株式会社 | ウエーハ洗浄槽 |
JP2890915B2 (ja) * | 1991-08-13 | 1999-05-17 | 信越半導体株式会社 | ウエーハのブラシ洗浄装置 |
US6003185A (en) * | 1994-07-15 | 1999-12-21 | Ontrak Systems, Inc. | Hesitation free roller |
JPH08188249A (ja) * | 1995-01-05 | 1996-07-23 | Murata Mach Ltd | パレットへの物品の段積装置 |
JP2564661Y2 (ja) * | 1995-01-11 | 1998-03-09 | 株式会社エンヤシステム | 貼付板洗浄装置 |
US5675856A (en) * | 1996-06-14 | 1997-10-14 | Solid State Equipment Corp. | Wafer scrubbing device |
US5862560A (en) * | 1996-08-29 | 1999-01-26 | Ontrak Systems, Inc. | Roller with treading and system including the same |
EP0837493B8 (en) * | 1996-10-21 | 2007-11-07 | Ebara Corporation | Cleaning apparatus |
US5901399A (en) * | 1996-12-30 | 1999-05-11 | Intel Corporation | Flexible-leaf substrate edge cleaning apparatus |
US5868857A (en) | 1996-12-30 | 1999-02-09 | Intel Corporation | Rotating belt wafer edge cleaning apparatus |
JPH10321572A (ja) * | 1997-05-15 | 1998-12-04 | Toshiba Corp | 半導体ウェーハの両面洗浄装置及び半導体ウェーハのポリッシング方法 |
JP2000176386A (ja) * | 1998-12-16 | 2000-06-27 | Ebara Corp | 基板洗浄装置 |
US6711775B2 (en) * | 1999-06-10 | 2004-03-30 | Lam Research Corporation | System for cleaning a semiconductor wafer |
KR20010037210A (ko) * | 1999-10-14 | 2001-05-07 | 구본준, 론 위라하디락사 | 기판 세정 장치 및 기판 세정 방법 |
JP6145334B2 (ja) * | 2013-06-28 | 2017-06-07 | 株式会社荏原製作所 | 基板処理装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5184371U (enrdf_load_stackoverflow) * | 1974-12-26 | 1976-07-06 |
-
1983
- 1983-12-29 JP JP58248427A patent/JPS60143634A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60143634A (ja) | 1985-07-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0414494B2 (enrdf_load_stackoverflow) | ||
KR100412542B1 (ko) | 작업물의세정방법및장치 | |
US5966765A (en) | Cleaning apparatus | |
KR101796651B1 (ko) | 유체 제트를 구비한 디스크-브러시 세정장치 모듈 | |
US6910240B1 (en) | Wafer bevel edge cleaning system and apparatus | |
KR20140099191A (ko) | 기판 이면의 연마 방법 및 기판 처리 장치 | |
US6560809B1 (en) | Substrate cleaning apparatus | |
US6261377B1 (en) | Method of removing particles and a liquid from a surface of substrate | |
CN113664009A (zh) | 一种晶圆清洗装置 | |
JP3560051B2 (ja) | 基板の研磨方法及び装置 | |
JP2001096245A (ja) | 洗浄方法および洗浄装置 | |
US10651057B2 (en) | Apparatus and method for cleaning a back surface of a substrate | |
US6079073A (en) | Washing installation including plural washers | |
JP6125884B2 (ja) | 基板処理装置及び処理基板の製造方法 | |
JP2003093978A (ja) | キャリヤプレートの洗浄方法及び装置 | |
JPH1131674A (ja) | ウェーハ洗浄装置 | |
JPH10335283A (ja) | 洗浄設備及び洗浄方法 | |
JPH10223583A (ja) | ブラシ式洗浄装置 | |
JP2001212531A (ja) | 洗浄装置 | |
US6813796B2 (en) | Apparatus and methods to clean copper contamination on wafer edge | |
JP2017147334A (ja) | 基板の裏面を洗浄する装置および方法 | |
TWI417951B (zh) | 基板液體處理裝置、基板液體處理方法及儲存有基板液體處理程式的記憶媒體 | |
JP6892176B1 (ja) | ワーク洗浄装置 | |
JP6122684B2 (ja) | 基板処理装置及び処理基板の製造方法 | |
JP6144531B2 (ja) | 基板処理装置及び処理基板の製造方法 |