JPH0115960B2 - - Google Patents

Info

Publication number
JPH0115960B2
JPH0115960B2 JP14381285A JP14381285A JPH0115960B2 JP H0115960 B2 JPH0115960 B2 JP H0115960B2 JP 14381285 A JP14381285 A JP 14381285A JP 14381285 A JP14381285 A JP 14381285A JP H0115960 B2 JPH0115960 B2 JP H0115960B2
Authority
JP
Japan
Prior art keywords
transistor
data
transistors
layer
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14381285A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6117297A (ja
Inventor
Garii Hoorachetsuku Robaato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JPS6117297A publication Critical patent/JPS6117297A/ja
Publication of JPH0115960B2 publication Critical patent/JPH0115960B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
    • G11C17/10—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
    • G11C17/12—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices
    • G11C17/123—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/14—Dummy cell management; Sense reference voltage generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
JP60143812A 1984-06-29 1985-06-28 基準回路 Granted JPS6117297A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/625,910 US4648074A (en) 1984-06-29 1984-06-29 Reference circuit with semiconductor memory array
US625910 1984-06-29

Publications (2)

Publication Number Publication Date
JPS6117297A JPS6117297A (ja) 1986-01-25
JPH0115960B2 true JPH0115960B2 (enExample) 1989-03-22

Family

ID=24508136

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60143812A Granted JPS6117297A (ja) 1984-06-29 1985-06-28 基準回路

Country Status (3)

Country Link
US (1) US4648074A (enExample)
JP (1) JPS6117297A (enExample)
KR (1) KR900000053B1 (enExample)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62129997A (ja) * 1985-11-13 1987-06-12 Mitsubishi Electric Corp ダイナミツクｒａｍ
US5132930A (en) * 1986-07-31 1992-07-21 Mitsubishi Denki Kabushiki Kaisha CMOS dynamic memory device having multiple flip-flop circuits selectively coupled to form sense amplifiers specific to neighboring data bit lines
US5719805A (en) * 1987-04-24 1998-02-17 Kabushiki Kaisha Toshiba Electrically programmable non-volatile semiconductor memory including series connected memory cells and decoder circuitry for applying a ground voltage to non-selected circuit units
US5313420A (en) * 1987-04-24 1994-05-17 Kabushiki Kaisha Toshiba Programmable semiconductor memory
US5245566A (en) * 1987-04-24 1993-09-14 Fujio Masuoka Programmable semiconductor
US6034899A (en) * 1987-06-29 2000-03-07 Kabushiki Kaisha Toshiba Memory cell of nonvolatile semiconductor memory device
US6545913B2 (en) 1987-06-29 2003-04-08 Kabushiki Kaisha Toshiba Memory cell of nonvolatile semiconductor memory device
US5877981A (en) * 1987-06-29 1999-03-02 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device having a matrix of memory cells
US5270969A (en) * 1987-06-29 1993-12-14 Kabushiki Kaisha Toshiba Electrically programmable nonvolatile semiconductor memory device with nand cell structure
US5448517A (en) * 1987-06-29 1995-09-05 Kabushiki Kaisha Toshiba Electrically programmable nonvolatile semiconductor memory device with NAND cell structure
US5008856A (en) * 1987-06-29 1991-04-16 Kabushiki Kaisha Toshiba Electrically programmable nonvolatile semiconductor memory device with NAND cell structure
US4939690A (en) * 1987-12-28 1990-07-03 Kabushiki Kaisha Toshiba Electrically erasable programmable read-only memory with NAND cell structure that suppresses memory cell threshold voltage variation
EP0508552B1 (en) * 1988-10-24 1997-12-10 Kabushiki Kaisha Toshiba Programmable semiconductor memory
DE3855444T2 (de) * 1988-10-24 1996-12-19 Toshiba Kawasaki Kk Programmierbarer Halbleiterspeicher
JPH0266898U (enExample) * 1988-11-10 1990-05-21
KR910004166B1 (ko) * 1988-12-27 1991-06-22 삼성전자주식회사 낸드쎌들을 가지는 전기적으로 소거 및 프로그램 가능한 반도체 메모리장치
US5293345A (en) * 1989-06-12 1994-03-08 Kabushiki Kaisha Toshiba Semiconductor memory device having a data detection circuit with two reference potentials
JPH0346197A (ja) * 1989-07-13 1991-02-27 Fujitsu Ltd 半導体記憶装置
US5126970A (en) * 1990-04-06 1992-06-30 Vlsi Technology, Inc. Static random access memory with PMOS pass gates
JP3350045B2 (ja) * 1990-10-11 2002-11-25 株式会社日立製作所 半導体記憶装置
JPH04195900A (ja) * 1990-11-27 1992-07-15 Nec Ic Microcomput Syst Ltd カレントミラー型センスアンプ
JPH04316478A (ja) * 1991-04-12 1992-11-06 Nec Corp 生物試料観察装置、システムおよび方法
JP2917722B2 (ja) * 1993-01-07 1999-07-12 日本電気株式会社 電気的書込消去可能な不揮発性半導体記憶装置
KR960012252B1 (ko) * 1993-03-05 1996-09-18 삼성전자 주식회사 반도체 메모리장치
FR2751778B1 (fr) * 1996-07-23 1998-11-06 Sgs Thomson Microelectronics Memoire accessible en lecture seulement
JP2978813B2 (ja) * 1997-02-27 1999-11-15 日本電気アイシーマイコンシステム株式会社 半導体記憶回路
JP3169858B2 (ja) * 1997-06-20 2001-05-28 日本電気アイシーマイコンシステム株式会社 多値型半導体記憶装置
US6137720A (en) * 1997-11-26 2000-10-24 Cypress Semiconductor Corporation Semiconductor reference voltage generator having a non-volatile memory structure
JP3620992B2 (ja) * 1999-04-23 2005-02-16 株式会社 沖マイクロデザイン 半導体記憶装置
DE10113239C1 (de) * 2001-03-19 2002-08-22 Infineon Technologies Ag Bewerterschaltung zum Auslesen einer in einer Speicherzelle gespeicherten Information
TW559814B (en) * 2001-05-31 2003-11-01 Semiconductor Energy Lab Nonvolatile memory and method of driving the same
DE60226489D1 (de) 2001-12-27 2008-06-19 Lg Electronics Inc Waschmaschine
US6639852B2 (en) * 2002-01-07 2003-10-28 Faraday Technology Corp. Sensing apparatus for a ROM memory device
ITTO20030121A1 (it) * 2003-02-18 2004-08-19 St Microelectronics Srl Amplificatore di lettura di celle di memoria non volatili a
JP2007053229A (ja) * 2005-08-18 2007-03-01 Nec Electronics Corp 半導体記憶装置およびその製造方法
JPWO2010082243A1 (ja) * 2009-01-13 2012-06-28 パナソニック株式会社 不揮発性半導体メモリ及びメモリシステム
EP3948868B1 (en) * 2019-10-18 2024-06-05 Yangtze Memory Technologies Co., Ltd. Method of programming and verifying memory device and related memory device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4449203A (en) * 1981-02-25 1984-05-15 Motorola, Inc. Memory with reference voltage generator

Also Published As

Publication number Publication date
KR860000660A (ko) 1986-01-30
KR900000053B1 (en) 1990-01-18
JPS6117297A (ja) 1986-01-25
US4648074A (en) 1987-03-03

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Legal Events

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LAPS Cancellation because of no payment of annual fees