JP6769141B2 - 回路装置、物理量検出装置、電子機器及び移動体 - Google Patents

回路装置、物理量検出装置、電子機器及び移動体 Download PDF

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Publication number
JP6769141B2
JP6769141B2 JP2016133925A JP2016133925A JP6769141B2 JP 6769141 B2 JP6769141 B2 JP 6769141B2 JP 2016133925 A JP2016133925 A JP 2016133925A JP 2016133925 A JP2016133925 A JP 2016133925A JP 6769141 B2 JP6769141 B2 JP 6769141B2
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Japan
Prior art keywords
circuit
comparison
conversion
limit value
upper limit
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JP2016133925A
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English (en)
Japanese (ja)
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JP2018007128A5 (enExample
JP2018007128A (ja
Inventor
秀生 羽田
秀生 羽田
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Seiko Epson Corp
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Seiko Epson Corp
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Priority to JP2016133925A priority Critical patent/JP6769141B2/ja
Priority to CN201710485286.0A priority patent/CN107592114B/zh
Priority to US15/637,073 priority patent/US9954545B2/en
Publication of JP2018007128A publication Critical patent/JP2018007128A/ja
Publication of JP2018007128A5 publication Critical patent/JP2018007128A5/ja
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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/069—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy by range overlap between successive stages or steps
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/0697—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy in time, e.g. using additional comparison cycles
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
    • H03M1/066—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by continuously permuting the elements used, i.e. dynamic element matching
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
    • H03M1/682—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits both converters being of the unary decoded type

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Analogue/Digital Conversion (AREA)
JP2016133925A 2016-07-06 2016-07-06 回路装置、物理量検出装置、電子機器及び移動体 Active JP6769141B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016133925A JP6769141B2 (ja) 2016-07-06 2016-07-06 回路装置、物理量検出装置、電子機器及び移動体
CN201710485286.0A CN107592114B (zh) 2016-07-06 2017-06-23 电路装置、物理量检测装置、电子设备和移动体
US15/637,073 US9954545B2 (en) 2016-07-06 2017-06-29 Circuit device, physical quantity detection device, electronic apparatus, and vehicle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016133925A JP6769141B2 (ja) 2016-07-06 2016-07-06 回路装置、物理量検出装置、電子機器及び移動体

Publications (3)

Publication Number Publication Date
JP2018007128A JP2018007128A (ja) 2018-01-11
JP2018007128A5 JP2018007128A5 (enExample) 2019-06-27
JP6769141B2 true JP6769141B2 (ja) 2020-10-14

Family

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JP2016133925A Active JP6769141B2 (ja) 2016-07-06 2016-07-06 回路装置、物理量検出装置、電子機器及び移動体

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Country Link
US (1) US9954545B2 (enExample)
JP (1) JP6769141B2 (enExample)
CN (1) CN107592114B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018088648A (ja) * 2016-11-29 2018-06-07 ルネサスエレクトロニクス株式会社 固体撮像装置
US10680636B2 (en) 2018-03-26 2020-06-09 Samsung Electronics Co., Ltd. Analog-to-digital converter (ADC) with reset skipping operation and analog-to-digital conversion method
JP7595575B2 (ja) * 2019-08-29 2024-12-06 ヌヴォトンテクノロジージャパン株式会社 半導体回路
JP7565691B2 (ja) * 2020-02-07 2024-10-11 旭化成エレクトロニクス株式会社 逐次比較ａｄ変換器
CN113484655B (zh) * 2021-09-07 2022-01-25 西安热工研究院有限公司 一种冗余测量越线检测方法、系统及存储介质

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2774955B2 (ja) * 1994-11-01 1998-07-09 富士通株式会社 周囲光検出装置，光源点灯制御装置および読取装置
JP4011377B2 (ja) * 2002-03-22 2007-11-21 株式会社ルネサステクノロジ Ａ／ｄ変換回路
US20050231292A1 (en) * 2004-03-31 2005-10-20 Hiroshi Akahori Jitter generator
JP2006108893A (ja) 2004-10-01 2006-04-20 Matsushita Electric Ind Co Ltd 逐次比較型ａｄ変換方法および逐次比較型ａｄ変換装置
JP4529650B2 (ja) 2004-11-12 2010-08-25 株式会社デンソー 逐次比較型ａｄ変換器
JP4764086B2 (ja) * 2005-07-27 2011-08-31 パナソニック株式会社 半導体集積回路装置
TWI267628B (en) * 2005-08-25 2006-12-01 Analog Integrations Corp Single-chip gyro device implemented by back-end semiconductor fabrication process
JP4814705B2 (ja) * 2005-10-13 2011-11-16 パナソニック株式会社 半導体集積回路装置及び電子装置
JP2010063055A (ja) * 2008-09-08 2010-03-18 Sony Corp 逐次比較型ａ／ｄ変換器、逐次比較型ａ／ｄ変換器の制御方法、固体撮像装置および撮像装置
JP5440758B2 (ja) 2009-05-07 2014-03-12 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法
JP5589780B2 (ja) 2010-11-08 2014-09-17 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法
JP2012119767A (ja) * 2010-11-29 2012-06-21 Toshiba Corp 逐次比較型ａ／ｄ変換器、および、ｄｃ−ｄｃ変換器
JP2012151561A (ja) * 2011-01-17 2012-08-09 Seiko Epson Corp Ａ／ｄ変換回路、集積回路装置及び電子機器
JP5699674B2 (ja) * 2011-02-22 2015-04-15 セイコーエプソン株式会社 Ｄ／ａ変換回路、ａ／ｄ変換回路及び電子機器
JP6136097B2 (ja) * 2012-03-30 2017-05-31 セイコーエプソン株式会社 Ａ／ｄ変換回路及び電子機器
JP5549824B2 (ja) 2013-07-01 2014-07-16 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法
JP6372102B2 (ja) * 2014-03-10 2018-08-15 株式会社ソシオネクスト アナログデジタル変換回路
JP6287433B2 (ja) 2014-03-25 2018-03-07 セイコーエプソン株式会社 逐次比較型アナログ−デジタル変換器、物理量検出センサー、電子機器及び移動体並びに逐次比較型アナログ−デジタル変換方法
JP5904240B2 (ja) 2014-07-30 2016-04-13 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法

Also Published As

Publication number Publication date
US9954545B2 (en) 2018-04-24
US20180013441A1 (en) 2018-01-11
CN107592114A (zh) 2018-01-16
JP2018007128A (ja) 2018-01-11
CN107592114B (zh) 2023-11-07

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