CN107592114B - 电路装置、物理量检测装置、电子设备和移动体 - Google Patents
电路装置、物理量检测装置、电子设备和移动体 Download PDFInfo
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- CN107592114B CN107592114B CN201710485286.0A CN201710485286A CN107592114B CN 107592114 B CN107592114 B CN 107592114B CN 201710485286 A CN201710485286 A CN 201710485286A CN 107592114 B CN107592114 B CN 107592114B
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
- H03M1/069—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy by range overlap between successive stages or steps
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
- H03M1/0697—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy in time, e.g. using additional comparison cycles
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
- H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
- H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
- H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
- H03M1/066—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by continuously permuting the elements used, i.e. dynamic element matching
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
- H03M1/682—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits both converters being of the unary decoded type
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Power Engineering (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016133925A JP6769141B2 (ja) | 2016-07-06 | 2016-07-06 | 回路装置、物理量検出装置、電子機器及び移動体 |
| JP2016-133925 | 2016-07-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107592114A CN107592114A (zh) | 2018-01-16 |
| CN107592114B true CN107592114B (zh) | 2023-11-07 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710485286.0A Active CN107592114B (zh) | 2016-07-06 | 2017-06-23 | 电路装置、物理量检测装置、电子设备和移动体 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9954545B2 (enExample) |
| JP (1) | JP6769141B2 (enExample) |
| CN (1) | CN107592114B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018088648A (ja) * | 2016-11-29 | 2018-06-07 | ルネサスエレクトロニクス株式会社 | 固体撮像装置 |
| US10680636B2 (en) | 2018-03-26 | 2020-06-09 | Samsung Electronics Co., Ltd. | Analog-to-digital converter (ADC) with reset skipping operation and analog-to-digital conversion method |
| JP7595575B2 (ja) * | 2019-08-29 | 2024-12-06 | ヌヴォトンテクノロジージャパン株式会社 | 半導体回路 |
| JP7565691B2 (ja) * | 2020-02-07 | 2024-10-11 | 旭化成エレクトロニクス株式会社 | 逐次比較ａｄ変換器 |
| CN113484655B (zh) * | 2021-09-07 | 2022-01-25 | 西安热工研究院有限公司 | 一种冗余测量越线检测方法、系统及存储介质 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003283336A (ja) * | 2002-03-22 | 2003-10-03 | Mitsubishi Electric Corp | Ａ／ｄ変換回路 |
| CN101674086A (zh) * | 2008-09-08 | 2010-03-17 | 索尼株式会社 | 逐次逼近型a/d转换器及其控制方法、固体摄像器件和摄像装置 |
| JP2012119767A (ja) * | 2010-11-29 | 2012-06-21 | Toshiba Corp | 逐次比較型ａ／ｄ変換器、および、ｄｃ−ｄｃ変換器 |
| JP2013211611A (ja) * | 2012-03-30 | 2013-10-10 | Seiko Epson Corp | Ａ／ｄ変換回路及び電子機器 |
| CN104954021A (zh) * | 2014-03-25 | 2015-09-30 | 精工爱普生株式会社 | 逐次比较型模拟数字转换器以及物理量检测传感器 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2774955B2 (ja) * | 1994-11-01 | 1998-07-09 | 富士通株式会社 | 周囲光検出装置，光源点灯制御装置および読取装置 |
| US20050231292A1 (en) * | 2004-03-31 | 2005-10-20 | Hiroshi Akahori | Jitter generator |
| JP2006108893A (ja) | 2004-10-01 | 2006-04-20 | Matsushita Electric Ind Co Ltd | 逐次比較型ａｄ変換方法および逐次比較型ａｄ変換装置 |
| JP4529650B2 (ja) | 2004-11-12 | 2010-08-25 | 株式会社デンソー | 逐次比較型ａｄ変換器 |
| JP4764086B2 (ja) * | 2005-07-27 | 2011-08-31 | パナソニック株式会社 | 半導体集積回路装置 |
| TWI267628B (en) * | 2005-08-25 | 2006-12-01 | Analog Integrations Corp | Single-chip gyro device implemented by back-end semiconductor fabrication process |
| JP4814705B2 (ja) * | 2005-10-13 | 2011-11-16 | パナソニック株式会社 | 半導体集積回路装置及び電子装置 |
| JP5440758B2 (ja) | 2009-05-07 | 2014-03-12 | セイコーエプソン株式会社 | Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法 |
| JP5589780B2 (ja) | 2010-11-08 | 2014-09-17 | セイコーエプソン株式会社 | Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法 |
| JP2012151561A (ja) * | 2011-01-17 | 2012-08-09 | Seiko Epson Corp | Ａ／ｄ変換回路、集積回路装置及び電子機器 |
| JP5699674B2 (ja) * | 2011-02-22 | 2015-04-15 | セイコーエプソン株式会社 | Ｄ／ａ変換回路、ａ／ｄ変換回路及び電子機器 |
| JP5549824B2 (ja) | 2013-07-01 | 2014-07-16 | セイコーエプソン株式会社 | Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法 |
| JP6372102B2 (ja) * | 2014-03-10 | 2018-08-15 | 株式会社ソシオネクスト | アナログデジタル変換回路 |
| JP5904240B2 (ja) | 2014-07-30 | 2016-04-13 | セイコーエプソン株式会社 | Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法 |
-
2016
- 2016-07-06 JP JP2016133925A patent/JP6769141B2/ja active Active
-
2017
- 2017-06-23 CN CN201710485286.0A patent/CN107592114B/zh active Active
- 2017-06-29 US US15/637,073 patent/US9954545B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003283336A (ja) * | 2002-03-22 | 2003-10-03 | Mitsubishi Electric Corp | Ａ／ｄ変換回路 |
| CN101674086A (zh) * | 2008-09-08 | 2010-03-17 | 索尼株式会社 | 逐次逼近型a/d转换器及其控制方法、固体摄像器件和摄像装置 |
| JP2012119767A (ja) * | 2010-11-29 | 2012-06-21 | Toshiba Corp | 逐次比較型ａ／ｄ変換器、および、ｄｃ−ｄｃ変換器 |
| JP2013211611A (ja) * | 2012-03-30 | 2013-10-10 | Seiko Epson Corp | Ａ／ｄ変換回路及び電子機器 |
| CN104954021A (zh) * | 2014-03-25 | 2015-09-30 | 精工爱普生株式会社 | 逐次比较型模拟数字转换器以及物理量检测传感器 |
Also Published As
| Publication number | Publication date |
|---|---|
| US9954545B2 (en) | 2018-04-24 |
| US20180013441A1 (en) | 2018-01-11 |
| CN107592114A (zh) | 2018-01-16 |
| JP2018007128A (ja) | 2018-01-11 |
| JP6769141B2 (ja) | 2020-10-14 |
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