JP2018007128A5 - - Google Patents

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JP2018007128A5
JP2018007128A5 JP2016133925A JP2016133925A JP2018007128A5 JP 2018007128 A5 JP2018007128 A5 JP 2018007128A5 JP 2016133925 A JP2016133925 A JP 2016133925A JP 2016133925 A JP2016133925 A JP 2016133925A JP 2018007128 A5 JP2018007128 A5 JP 2018007128A5
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JP2018007128A (ja
JP6769141B2 (ja
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Priority to CN201710485286.0A priority patent/CN107592114B/zh
Priority to US15/637,073 priority patent/US9954545B2/en
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JP2016133925A 2016-07-06 2016-07-06 回路装置、物理量検出装置、電子機器及び移動体 Active JP6769141B2 (ja)

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Application Number Priority Date Filing Date Title
JP2016133925A JP6769141B2 (ja) 2016-07-06 2016-07-06 回路装置、物理量検出装置、電子機器及び移動体
CN201710485286.0A CN107592114B (zh) 2016-07-06 2017-06-23 电路装置、物理量检测装置、电子设备和移动体
US15/637,073 US9954545B2 (en) 2016-07-06 2017-06-29 Circuit device, physical quantity detection device, electronic apparatus, and vehicle

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JP2016133925A JP6769141B2 (ja) 2016-07-06 2016-07-06 回路装置、物理量検出装置、電子機器及び移動体

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JP2018007128A JP2018007128A (ja) 2018-01-11
JP2018007128A5 true JP2018007128A5 (enExample) 2019-06-27
JP6769141B2 JP6769141B2 (ja) 2020-10-14

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JP (1) JP6769141B2 (enExample)
CN (1) CN107592114B (enExample)

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JP2018088648A (ja) * 2016-11-29 2018-06-07 ルネサスエレクトロニクス株式会社 固体撮像装置
US10680636B2 (en) 2018-03-26 2020-06-09 Samsung Electronics Co., Ltd. Analog-to-digital converter (ADC) with reset skipping operation and analog-to-digital conversion method
JP7595575B2 (ja) * 2019-08-29 2024-12-06 ヌヴォトンテクノロジージャパン株式会社 半導体回路
JP7565691B2 (ja) * 2020-02-07 2024-10-11 旭化成エレクトロニクス株式会社 逐次比較ａｄ変換器
CN113484655B (zh) * 2021-09-07 2022-01-25 西安热工研究院有限公司 一种冗余测量越线检测方法、系统及存储介质

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JP2774955B2 (ja) * 1994-11-01 1998-07-09 富士通株式会社 周囲光検出装置，光源点灯制御装置および読取装置
JP4011377B2 (ja) * 2002-03-22 2007-11-21 株式会社ルネサステクノロジ Ａ／ｄ変換回路
US20050231292A1 (en) * 2004-03-31 2005-10-20 Hiroshi Akahori Jitter generator
JP2006108893A (ja) 2004-10-01 2006-04-20 Matsushita Electric Ind Co Ltd 逐次比較型ａｄ変換方法および逐次比較型ａｄ変換装置
JP4529650B2 (ja) 2004-11-12 2010-08-25 株式会社デンソー 逐次比較型ａｄ変換器
JP4764086B2 (ja) * 2005-07-27 2011-08-31 パナソニック株式会社 半導体集積回路装置
TWI267628B (en) * 2005-08-25 2006-12-01 Analog Integrations Corp Single-chip gyro device implemented by back-end semiconductor fabrication process
JP4814705B2 (ja) * 2005-10-13 2011-11-16 パナソニック株式会社 半導体集積回路装置及び電子装置
JP2010063055A (ja) * 2008-09-08 2010-03-18 Sony Corp 逐次比較型ａ／ｄ変換器、逐次比較型ａ／ｄ変換器の制御方法、固体撮像装置および撮像装置
JP5440758B2 (ja) 2009-05-07 2014-03-12 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法
JP5589780B2 (ja) 2010-11-08 2014-09-17 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法
JP2012119767A (ja) * 2010-11-29 2012-06-21 Toshiba Corp 逐次比較型ａ／ｄ変換器、および、ｄｃ−ｄｃ変換器
JP2012151561A (ja) * 2011-01-17 2012-08-09 Seiko Epson Corp Ａ／ｄ変換回路、集積回路装置及び電子機器
JP5699674B2 (ja) * 2011-02-22 2015-04-15 セイコーエプソン株式会社 Ｄ／ａ変換回路、ａ／ｄ変換回路及び電子機器
JP6136097B2 (ja) * 2012-03-30 2017-05-31 セイコーエプソン株式会社 Ａ／ｄ変換回路及び電子機器
JP5549824B2 (ja) 2013-07-01 2014-07-16 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法
JP6372102B2 (ja) * 2014-03-10 2018-08-15 株式会社ソシオネクスト アナログデジタル変換回路
JP6287433B2 (ja) 2014-03-25 2018-03-07 セイコーエプソン株式会社 逐次比較型アナログ−デジタル変換器、物理量検出センサー、電子機器及び移動体並びに逐次比較型アナログ−デジタル変換方法
JP5904240B2 (ja) 2014-07-30 2016-04-13 セイコーエプソン株式会社 Ａ／ｄ変換回路、電子機器及びａ／ｄ変換方法

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