JP6336231B1 - 真空処理装置 - Google Patents
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- JP6336231B1 JP6336231B1 JP2018504956A JP2018504956A JP6336231B1 JP 6336231 B1 JP6336231 B1 JP 6336231B1 JP 2018504956 A JP2018504956 A JP 2018504956A JP 2018504956 A JP2018504956 A JP 2018504956A JP 6336231 B1 JP6336231 B1 JP 6336231B1
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- 239000000758 substrate Substances 0.000 claims abstract description 116
- 230000003028 elevating effect Effects 0.000 claims abstract description 41
- 208000036829 Device dislocation Diseases 0.000 claims description 4
- 238000009434 installation Methods 0.000 abstract description 4
- 238000007789 sealing Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 5
- 238000005477 sputtering target Methods 0.000 description 5
- 239000010409 thin film Substances 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
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- C—CHEMISTRY; METALLURGY
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
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- C23C14/34—Sputtering
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
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- H01L21/67706—Mechanical details, e.g. roller, belt
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- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67736—Loading to or unloading from a conveyor
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- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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- H01—ELECTRIC ELEMENTS
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
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Abstract
Description
本発明は、前記昇降板が上下移動する範囲の上部には、前記真空槽に設けられた開口と、前記開口を覆って搬出入室を形成させる蓋部材とが設けられ、前記基板保持装置に配置された前記処理対象物が前記開口に挿入されると、前記開口は前記蓋部材で閉塞される真空処理装置である。
本発明は、前記搬出入室を真空排気する真空排気装置が設けられた真空処理装置である。
本発明は、前記上方側移動装置と前記下方側移動装置との間で、前記基板保持装置を受け渡す上下間受渡装置が設けられた真空処理装置である。
本発明は、前記基板保持装置にはピンが設けられており、前記受渡装置は、前記ピンと係合可能なフックを有する真空処理装置である。
本発明は、前記フックは、上方又は下方のうち、いずれかに移動することで、前記ピンとの係合が解除される真空処理装置である。
本発明は、前記受渡装置は、前記昇降板と前記上方側移動装置との間で前記基板保持装置を受け渡す上方側受渡装置と、前記昇降板と前記下方側移動装置との間で前記基板保持装置を受け渡す下方側受渡装置と、を有する真空処理装置である。
図5の符号10は、処理対象物に真空処理を行う真空処理装置であり、真空槽12を有しており、真空槽12には、昇降装置16が設けられている。
蓋部31は、真空槽12の外部に配置され、制御装置25に接続された押圧装置33に取りつけられており、押圧装置33は、制御装置25の制御によって、蓋部31を鉛直下方に移動させ、又は、鉛直上方に移動させる。符号52は、蓋部31が移動する際のガイドである。
真空槽12は主真空排気装置34に接続されており、真空槽12の内部を真空排気する際には、蓋部31は押圧装置33によって、蓋部31に設けられた外部密閉リング32が、開口26を取り囲むように真空槽12の天井部分と接触するように移動され、また、押圧装置33によって、蓋部31が真空槽12の天井に押圧され、外部密閉リング32は、真空槽12の開口26の周囲の部分と蓋部31とに密着される。
ここでは、昇降移動は、鉛直方向または鉛直に近い方向の上方移動と鉛直方向または鉛直に近い方向の下方移動との両方向の移動が昇降移動とされている。
横方向は昇降移動の方向と垂直な方向であり、ここでは、横方向の移動は、水平方向または水平に近い方向への移動となっている。
下方側移動装置36は、処理対象物11の裏面と下方側処理装置50とが対面できるように配置されている。下方側移動装置36によって処理領域12a内を移動する基板保持装置27に配置された処理対象物11の裏面は、下方側処理装置50によって真空処理される。
この副真空排気装置49は、真空槽12を真空排気する主真空排気装置34と同一の装置であってもよいが、例えば、主真空排気装置34は真空槽12内を清浄な真空に保っており、副真空排気装置49は搬出入室30内の大気雰囲気を繰り返し排気して真空雰囲気を形成しているので、主真空排気装置34と副真空排気装置49を同一の装置とすると、真空槽12内を清浄な真空に保てなくなる可能性がある。従って、真空槽12を真空排気する主真空排気装置34と搬出入室30を真空排気する副真空排気装置49とは、別々の真空排気装置であった方がよい。
また、一台の基板保持装置27に複数枚の処理対象物11が配置されていてもよい。
なお、上記例では、蓋部31は板状とされていたが、基板保持装置27の形状に合わせた箱状の蓋部にされていてもよい。
上記説明では、処理領域12aと昇降領域12bとは、互いに連通し、同一の圧力の真空雰囲気にされているとしたが、排気経路の相違等の不平衡のため、不可避的な圧力差が処理領域12aと昇降領域12bとの間に発生するが、その圧力差は無視できる程度に小さいので、不可避的な圧力差が存在しても同一の圧力であるものとする。
11……処理対象物
12……真空槽
12a……処理領域
12b……昇降領域
14……昇降軸
15……昇降板
16……昇降装置
17……昇降孔
21……昇降力発生装置
22……台座板
23……ベローズ
24……窓開部
25……制御装置
26……開口
27……基板保持装置
28……ピン
29……内部密閉リング
30……搬出入室
31……蓋部
32……外部密閉リング
33……押圧装置
35……上方側移動装置
36……下方側移動装置
37……受渡装置
37a……上方側受渡装置
37b……下方側受渡装置
39……上下間受渡装置
40……上方側処理装置
41……ガス導入装置
42……上方側スライダー
43……下方側スライダー
44、67……上方側フック
45、67……下方側フック
46……スパッタリングターゲット
47……バッキングプレート
48……ローラ
50……下方側処理装置
Claims (7)
- 処理対象物が処理面を露出させて配置される基板保持装置が搬出入される真空槽と、
昇降板上に配置された前記基板保持装置を前記真空槽内で昇降移動させる昇降装置と、
前記真空槽内の上方側で前記基板保持装置を横方向に移動させる上方側移動装置と、
前記真空槽内の下方側で前記基板保持装置を横方向に移動させる下方側移動装置と、
前記昇降板と、前記上方側移動装置及び前記下方側移動装置との間で前記基板保持装置を受け渡す受渡装置と、
を有し、
前記上方側移動装置によって移動される前記基板保持装置に配置された前記処理対象物は上方側処理装置によって真空処理がされ、前記下方側移動装置によって移動される前記基板保持装置に配置された前記処理対象物は下方側処理装置によって真空処理をされる真空処理装置。 - 前記昇降板が上下移動する範囲の上部には、前記真空槽に設けられた開口と、
前記開口を覆って搬出入室を形成させる蓋部材とが設けられ、
前記基板保持装置に配置された前記処理対象物が前記開口に挿入されると、前記開口は前記蓋部材で閉塞される請求項1記載の真空処理装置。 - 前記搬出入室を真空排気する真空排気装置が設けられた請求項2記載の真空処理装置。
- 前記上方側移動装置と前記下方側移動装置との間で、前記基板保持装置を受け渡す上下間受渡装置が設けられた請求項1記載の真空処理装置。
- 前記基板保持装置にはピンが設けられており、
前記受渡装置は、前記ピンと係合可能なフックを有する請求項1記載の真空処理装置。 - 前記フックは、上方又は下方のうち、いずれかに移動することで、前記ピンとの係合が解除される請求項5記載の真空処理装置。
- 前記受渡装置は、前記昇降板と前記上方側移動装置との間で前記基板保持装置を受け渡す上方側受渡装置と、
前記昇降板と前記下方側移動装置との間で前記基板保持装置を受け渡す下方側受渡装置と、を有する請求項1記載の真空処理装置。
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Application Number | Priority Date | Filing Date | Title |
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JP2016215115 | 2016-11-02 | ||
JP2016215115 | 2016-11-02 | ||
PCT/JP2017/039629 WO2018084214A1 (ja) | 2016-11-02 | 2017-11-01 | 真空処理装置 |
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JP6336231B1 true JP6336231B1 (ja) | 2018-06-06 |
JPWO2018084214A1 JPWO2018084214A1 (ja) | 2018-11-01 |
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US (1) | US10612130B2 (ja) |
JP (1) | JP6336231B1 (ja) |
KR (1) | KR101972730B1 (ja) |
CN (1) | CN108884561B (ja) |
TW (1) | TWI662644B (ja) |
WO (1) | WO2018084214A1 (ja) |
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JP2020001893A (ja) * | 2018-06-28 | 2020-01-09 | 株式会社アルバック | 真空処理装置 |
JP6697118B2 (ja) * | 2018-08-27 | 2020-05-20 | 株式会社アルバック | 成膜装置及び成膜方法並びに太陽電池の製造方法 |
DE112019005363T5 (de) * | 2019-01-08 | 2021-07-15 | Ulvac, Inc. | Vakuumbearbeitungsvorrichtung |
JP6799193B1 (ja) * | 2020-07-29 | 2020-12-09 | 株式会社アルバック | 搬送駆動機構 |
WO2022079311A1 (de) * | 2020-10-16 | 2022-04-21 | Fhr Anlagenbau Gmbh | Verfahren und vorrichtung zum beschichten von einzelnen substraten in einer doppelzügigen/doppelstöckigen inline-vakuum-beschichtungsanlage |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5554569A (en) * | 1978-10-12 | 1980-04-21 | Leybold Heraeus Verwaltung | Vacuum coating apparatus having continuous or semicontinuous crude material transporting apparatus |
JP2005171369A (ja) * | 2003-12-15 | 2005-06-30 | Canon Inc | 基板保持機構 |
WO2007123032A1 (ja) * | 2006-04-19 | 2007-11-01 | Ulvac, Inc. | 縦型基板搬送装置および成膜装置 |
JP2008520525A (ja) * | 2004-11-15 | 2008-06-19 | 日本板硝子株式会社 | 配列構造を有するコーティングの蒸着方法および設備 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0896358A (ja) | 1994-09-22 | 1996-04-12 | Mitsubishi Chem Corp | 磁気記録媒体の製造方法 |
JP4614529B2 (ja) | 2000-12-07 | 2011-01-19 | キヤノンアネルバ株式会社 | インライン式基板処理装置 |
JP4222589B2 (ja) | 2001-03-26 | 2009-02-12 | キヤノンアネルバ株式会社 | 基板搬送装置及びそれを用いた基板処理装置 |
JP4452029B2 (ja) | 2003-03-24 | 2010-04-21 | 株式会社アルバック | 酸化マグネシウム被膜の形成方法及び大気リターン型のインライン式真空蒸着装置 |
TWI257959B (en) * | 2005-01-20 | 2006-07-11 | Uvat Technology Co Ltd | Continuous vacuum film deposition machine with built-in electrostatic dust removal mechanism |
JP5014603B2 (ja) | 2005-07-29 | 2012-08-29 | 株式会社アルバック | 真空処理装置 |
CN101522939A (zh) | 2006-10-27 | 2009-09-02 | 株式会社爱发科 | 等离子显示器面板的制造方法以及制造装置 |
KR100927621B1 (ko) * | 2007-03-22 | 2009-11-20 | 삼성에스디아이 주식회사 | 보호막층을 증착시키는 장치와, 이를 이용한 증착 방법 |
KR101100366B1 (ko) * | 2009-04-24 | 2011-12-30 | 주식회사 코리아 인스트루먼트 | 후막 증착용 마그네트론 스퍼터링 장치 |
WO2012098871A1 (ja) * | 2011-01-20 | 2012-07-26 | 東京エレクトロン株式会社 | 真空処理装置 |
KR20130049080A (ko) * | 2011-11-03 | 2013-05-13 | 삼성디스플레이 주식회사 | 회전식 박막 증착 장치 및 그것을 이용한 박막 증착 방법 |
JP2013131542A (ja) | 2011-12-20 | 2013-07-04 | Ulvac Japan Ltd | インライン式成膜装置 |
JP6419635B2 (ja) * | 2014-04-23 | 2018-11-07 | 株式会社アルバック | 保持装置、真空処理装置 |
JP6009513B2 (ja) * | 2014-09-02 | 2016-10-19 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
KR102079460B1 (ko) * | 2015-12-17 | 2020-02-19 | 가부시키가이샤 알박 | 진공 처리 장치 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5554569A (en) * | 1978-10-12 | 1980-04-21 | Leybold Heraeus Verwaltung | Vacuum coating apparatus having continuous or semicontinuous crude material transporting apparatus |
JP2005171369A (ja) * | 2003-12-15 | 2005-06-30 | Canon Inc | 基板保持機構 |
JP2008520525A (ja) * | 2004-11-15 | 2008-06-19 | 日本板硝子株式会社 | 配列構造を有するコーティングの蒸着方法および設備 |
WO2007123032A1 (ja) * | 2006-04-19 | 2007-11-01 | Ulvac, Inc. | 縦型基板搬送装置および成膜装置 |
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