JP6316952B2 - メモリセルアレイに記憶された極値の識別装置及び方法 - Google Patents
メモリセルアレイに記憶された極値の識別装置及び方法 Download PDFInfo
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- 230000015654 memory Effects 0.000 title claims description 192
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- 239000013598 vector Substances 0.000 claims description 64
- 238000001514 detection method Methods 0.000 claims description 12
- 230000004044 response Effects 0.000 claims description 9
- 230000008859 change Effects 0.000 claims description 8
- 238000012546 transfer Methods 0.000 claims description 6
- 230000000295 complement effect Effects 0.000 claims description 5
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
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- 230000008569 process Effects 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 238000003491 array Methods 0.000 description 5
- 230000009471 action Effects 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000002457 bidirectional effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013642 negative control Substances 0.000 description 1
- 239000013641 positive control Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40622—Partial refresh of memory arrays
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/065—Differential amplifiers of latching type
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
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Description
max:
ClearAccumulator
InvertAccumulator
WriteRow(destination)
Forall bits in length {
ReadRow (src[bit])
if (AccumulatorBlockOr) {
WriteRow (destination)
exit-forall
}
}
Forall remaining bits in length {
AndRow (src[bit])
if (AccumulatorBlockOr) {
WriteRow (destination)
} else {
ReadRow (destination)
}
}
最小値を識別することに関連する擬似コードの例は以下を含む:
min:
ClearAccumulator
InvertAccumulator
WriteRow (destination)
Forall bits in length {
ReadRow (src[bit])
InvertAccumulator
If (AccumulatorBlockOr) {
WriteRow (destination)
exit-forall
}
}
Forall remaining bits in length {
ReadRow (src[bit])
InvertAccumulator
AndRow (destination)
If(AccumulatorBlockOr) {
WriteRow (destination)
}
}
それに結合された1つまたは複数のセルを有する最高インデックスのアクセスラインであることを示している。
Claims (17)
- 極値を識別する方法であって、メモリアレイにベクトルとして記憶されるN個のデータ値のセットの極値の位置を決定することを含み、極値の位置を決定する動作の数が、N個の値に関して一定のままであり、
前記N個のデータ値のセットの極値の位置を決定することは、複数のアクセスラインの中のより上位に関連付けされたインデックスを有するアクセスラインであって、ターゲットデータ値を記憶する少なくとも一つのメモリセルが接合されたアクセスラインを検出し、当該検出されたアクセスラインに結合された各メモリセルが記憶しているデータに基づくデータと、前記より上位に関連付けされたインデックスよりも一つ下位に関連付けられたインデックスを有するアクセスラインに結合された各メモリセルが記憶しているデータに基づくデータと、に対する論理積演算を行うことを含む、方法。 - 前記極値の位置を決定する前記動作の数は、前記ベクトルの長さに関して変化する、請求項1に記載の方法。
- 前記ベクトルは、ビットベクトルであり、各ビットベクトルはそれぞれ数値を表す、請求項1〜2のいずれか一項に記載の方法。
- 前記N個のデータ値のセットの極値の位置を決定することは、
前記論理積演算の結果に前記ターゲットデータ値が存在する場合は、前記論理積演算の結果と、前記下位に関連付けられたインデックスよりも更に一つ下位に関連付けされたインデックスを有するアクセスラインに結合された各メモリセルが記憶しているデータに基づくデータと、に対する論理積演算を行い、
前記論理積演算の結果に前記ターゲットデータ値が存在しない場合は、前記検出されたアクセスラインに結合された各メモリセルが記憶しているデータに基づくデータと、前記更に一つ下位に関連付けられたインデックスを有するアクセスラインに結合された各メモリセルが記憶しているデータに基づくデータと、に対する論理積演算を行うこと、をさらに含む、請求項1〜3のいずれか一項に記載の方法。 - 前記論理積演算の結果に前記ターゲットデータ値が存在するかどうかは、前記論理積演算の結果に対して論理和演算を実行することにより決定される、請求項4に記載の方法。
- メモリセルアレイと、前記アレイに結合された制御装置とを含む装置であって、
前記制御装置は、
検知回路に、
第1数のメモリセルの中の1つまたは複数のメモリセルがターゲットデータ値を記憶しているかどうかを決定するために、前記アレイに記憶されている幾つかのビットベクトルの中のより高いインデックスに対応する第1のアクセスラインに結合された前記第1数のメモリセルに記憶されているデータを検知させると共に、前記幾つかのビットベクトルの中のより低いインデックスに対応する第2のアクセスラインに結合された第2数のメモリセルに記憶されているデータを検知させ、
前記ターゲットデータ値が前記第1数のメモリセル中の1つまたは複数のメモリセルに記憶されているという決定に応答して、前記第1数のメモリセルに記憶されている前記データを前記第2数のメモリセルに記憶されている前記データと比較させ、
当該比較の結果が、前記第1数のメモリセルの中の前記ターゲットデータ値を記憶している1つまたは複数のメモリセルは前記第2数のメモリセルの中の前記ターゲットデータ値を記憶しているメモリセルと同じセンスラインに結合されている、ことを示していることに応答して、前記メモリセルアレイにおける前記比較の結果を記憶させるように構成される、装置。 - メモリセルのアレイにベクトルとして記憶されているデータのセットにおける極値を識別する方法であって、前記方法は、
前記メモリセルのアレイに結合された検知回路によって、特定のアクセスラインに結合された一群のメモリセルに記憶されたデータを検知すること、
前記検知回路によって、前記検知されたデータがターゲットデータ値を含んでいるかどうかを決定するために動作を実行すること、及び
前記検知されたデータが前記ターゲットデータ値を含んでいる場合、前記ターゲットデータ値を記憶している前記一群のメモリセルの中のメモリセルに結合されたセンスラインの位置を決定することを含み、
前記センスラインの位置を決定することは、前記検知されたデータに基づくデータと前記特定のアクセスラインの次の下位側アクセスラインに結合された一群のメモリセルに記憶されたデータに基づくデータとの論理積演算を前記検知回路によって実行することを含む、方法。 - 前記検知回路によって、前記検知されたデータがターゲットデータ値を含んでいるかどうかを決定するために動作を実行することは、前記検知回路によりブロック論理和演算を実行することを含む、請求項7に記載の方法。
- 前記ブロック論理和演算を前記検知回路により実行することは、
I/Oラインを前記ターゲットデータ値に対応するレベルまで充電すること、
複数の検知増幅器から前記I/Oラインに前記検知されたデータを転送すること、及び
前記I/Oラインの前記レベルが前記検知されたデータの転送に応じて変化するかどうかを決定することを含む、請求項8に記載の方法。 - 前記I/Oラインの前記レベルが前記検知されたデータの転送に応じて変化するかどうかを決定することは、前記レベルが閾値量で変化するかどうかを二次検知増幅器によって検出することを含み、前記I/Oラインの前記レベルが閾値量を越えて変化することは、前記検知されたデータが前記ターゲットデータ値を記憶していることを示す、請求項9に記載の方法。
- 前記検知されたデータが前記ターゲットデータ値を含まない場合、
前記検知回路により、前記特定のアクセスラインより低いベクトルのインデックスに対応する他のアクセスラインに結合された一群のメモリセルに記憶されているデータを検知すること、
前記検知回路により、前記他のアクセスラインに結合された前記一群のメモリセルから検知されたデータが前記ターゲットデータ値を含むかどうかを決定する動作を実行すること、及び
前記他のアクセスラインに結合された前記一群のメモリセルから検知されたデータが前記ターゲットデータ値を含む場合、前記他のアクセスラインに結合され且つ前記ターゲットデータ値を記憶するメモリセルに結合されたセンスラインの位置を決定することを更に含む、請求項7〜10のいずれか一項に記載の方法。 - センスラインに沿ってビットベクトルとして数値を記憶するメモリセルアレイ、及び前記アレイに結合された制御回路を含む装置であって、前記制御回路は、
前記メモリセルアレイに結合された検知回路により、特定のアクセスラインに結合された一群のメモリセルに記憶されているデータを検知すること、
前記検知回路により、前記検知されたデータがターゲットデータ値を記憶しているかどうかを決定する動作を実行すること、及び
前記検知されたデータが前記ターゲットデータ値を記憶していることに応答して、前記検知されたデータに基づくデータと前記特定のアクセスラインの次の下位側アクセスラインに結合された一群のメモリセルに記憶されたデータに基づくデータとの論理積演算を前記検知回路によって実行することを含むことにより、前記特定のアクセスラインに結合された一群のメモリセルの中の前記ターゲットデータ値を記憶しているメモリセルに結合されているセンスラインの位置を決定すること、
を制御するように構成されている、装置。 - 前記制御回路は、前記検知されたデータが前記ターゲットデータ値を含んでいるかどうかを決定するために、前記検知回路により、ブロック論理和演算を実行することを制御するように構成される、請求項12に記載の装置。
- センスラインに沿ってビットベクトルとして数値を記憶するメモリセルアレイと、
前記アレイに結合される制御回路であって、
第1のアクセスラインに結合された複数の第1メモリセルの各々が最上位ビットの情報として記憶しているデータ値を検知し、前記複数の第1メモリセルの中の少なくとも一つのメモリセルがターゲットデータ値を記憶しているかどうかを決定すること、
前記複数の第1メモリセルの中の少なくとも一つのメモリセルが前記ターゲットデータ値を記憶しているという決定に応答して、前記複数の第1メモリセルの各々が記憶しているデータ値と、第2アクセスラインに結合された複数の第2メモリセルの各々が前記最上位ビットの次の上位ビットの情報として記憶しているデータ値とを、第1の論理積演算を使用して比較すること、
前記第1の論理積演算から得られた値が前記ターゲットデータ値を含んでいる場合は、前記第1の論理積演算から得られた値と、第3アクセスラインに結合された複数の第3メモリセルの各々が前記次の上位ビットの更に次の上位ビットの情報として記憶しているデータ値とを、第2の論理積演算を使用して比較すること、及び
前記第1の論理積演算から得られた値が前記ターゲットデータ値を含んでいない場合は、前記複数の第1メモリセルの各々が記憶しているデータ値と、前記第3メモリセルの各々が記憶しているデータ値とを、第3の論理積演算を使用して比較すること、
を起こさせるように構成された制御回路と、
前記メモリセルアレイに結合された検知回路であって、複数の第1、第2および第3のメモリセルの各々が記憶しているデータ値の検知、並びに前記第1、第2および第3の第3の論理積演算を実行するように構成される検知回路と、を含む装置。 - 前記検知回路は、
前記メモリセルアレイの入力/出力(IO)ラインに電圧を充電するように構成された制御回路と、
前記メモリセルアレイの複数の相補センスライン対にそれぞれ結合された幾つかの一次検知増幅器と、
前記幾つかの一次検知増幅器にそれぞれ結合された幾つかのアキュムレータと、
前記IOラインに結合され、前記IOラインの電圧の変化を検知するよう構成される二次検知増幅器と、を含む、請求項14に記載の装置。 - 複数のセンスライン、複数のアクセスライン、及びこれらセンスラインおよびアクセスラインの交点にそれぞれ配置された複数のメモリセルを有し、前記センスラインに沿った数値に対応するN個のビットベクトルを記憶するメモリセルのアレイと、
前記アレイに結合された回路であって、前記N個のビットベクトルの中で最大値および最小値の少なくとも一方の数値を取るビットベクトルを決定する回路と、を含み、
前記回路は、
前記最大値および最小値の前記少なくとも一方をターゲットとするデータ値を記憶しているメモリセルが少なくとも一つは結合されたアクセスラインであって、前記複数のアクセスラインの中で一番上位に位置するアクセスラインを決定し、
当該決定されたアクセスラインに結合された複数のメモリセルが記憶しているデータに基づく第1データの各々と、前記決定されたアクセスラインよりも一つだけ下位に位置するアクセスラインに結合された複数のメモリセルが記憶しているデータに基づく第2データの各々と、に対する論理積演算を実行し、
当該論理積演算の結果が前記ターゲットとするデータ値を含んでいる場合は、前記論理積演算の結果に基づく第3データの各々と、前記一つだけ下位に位置するアクセスラインよりも更に一つだけ下位に位置するアクセスラインに結合された複数のメモリセルが記憶しているデータに基づく第4データの各々と、に対する論理積演算を実行し、
当該論理積演算の結果が前記ターゲットとするデータ値を含んでいない場合は、前記第1データの各々と、前記第4データの各々と、に対する論理積演算を実行する、ように少なくとも構成されている、装置。 - 前記回路は、前記複数のアクセスラインの中で、各ビットベクトルの最上位ビットの情報を記憶しているメモリセルが結合されたアクセスラインから検索を始めて、前記ターゲットとするデータ値を記憶しているメモリセルが少なくとも一つは結合されたアクセスラインを決定する、ようにさらに構成されている請求項16に記載の装置。
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