JP6197619B2 - 電子装置及び電子装置の製造方法 - Google Patents
電子装置及び電子装置の製造方法 Download PDFInfo
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- JP6197619B2 JP6197619B2 JP2013254372A JP2013254372A JP6197619B2 JP 6197619 B2 JP6197619 B2 JP 6197619B2 JP 2013254372 A JP2013254372 A JP 2013254372A JP 2013254372 A JP2013254372 A JP 2013254372A JP 6197619 B2 JP6197619 B2 JP 6197619B2
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- bonding material
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- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
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- B23K3/00—Tools, devices or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
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- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400°C
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- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
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- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
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- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/725—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a laterally-adjacent insulating package substrate, interposer or RDL
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- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
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- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013254372A JP6197619B2 (ja) | 2013-12-09 | 2013-12-09 | 電子装置及び電子装置の製造方法 |
| US14/532,032 US9490232B2 (en) | 2013-12-09 | 2014-11-04 | Electronic apparatus and method for fabricating the same |
| CN201410708719.0A CN104701281B (zh) | 2013-12-09 | 2014-11-26 | 电子设备及其制造方法 |
| CN201710096431.6A CN106887418A (zh) | 2013-12-09 | 2014-11-26 | 电子设备及其制造方法 |
| CN201611027509.0A CN107039379A (zh) | 2013-12-09 | 2014-11-26 | 电子设备及其制造方法 |
| CN201710096783.1A CN107424983A (zh) | 2013-12-09 | 2014-11-26 | 电子设备及其制造方法 |
| US15/142,690 US9530745B2 (en) | 2013-12-09 | 2016-04-29 | Electronic apparatus and method for fabricating the same |
| US15/271,744 US9761552B2 (en) | 2013-12-09 | 2016-09-21 | Electronic apparatus and method for fabricating the same |
| US15/351,992 US9812418B2 (en) | 2013-12-09 | 2016-11-15 | Electronic apparatus and method for fabricating the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013254372A JP6197619B2 (ja) | 2013-12-09 | 2013-12-09 | 電子装置及び電子装置の製造方法 |
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| JP2015115363A JP2015115363A (ja) | 2015-06-22 |
| JP2015115363A5 JP2015115363A5 (enExample) | 2016-12-15 |
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| CN (4) | CN106887418A (enExample) |
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| JP6061276B2 (ja) | 2014-08-29 | 2017-01-18 | インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation | 金属層間のはんだ接合の形成方法 |
| CN105575924B (zh) * | 2014-10-15 | 2018-07-03 | 台达电子工业股份有限公司 | 功率模块 |
| JP6806520B2 (ja) * | 2016-10-17 | 2021-01-06 | ラピスセミコンダクタ株式会社 | 半導体装置および配線基板の設計方法 |
| JP7251446B2 (ja) * | 2019-10-28 | 2023-04-04 | 株式会社オートネットワーク技術研究所 | 伝熱部材付基板及び伝熱部材付基板の製造方法 |
| JP7526642B2 (ja) * | 2020-11-20 | 2024-08-01 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
| US11830786B2 (en) * | 2020-12-28 | 2023-11-28 | Innoscience (Suzhou) Technology Co., Ltd. | Semiconductor package and method for manufacturing the same |
| WO2023123106A1 (zh) * | 2021-12-29 | 2023-07-06 | 华为技术有限公司 | 芯片封装结构及其制备方法、电子设备 |
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| JPS5883150U (ja) * | 1981-11-30 | 1983-06-06 | 株式会社日立製作所 | 半導体集積回路装置 |
| TW258829B (enExample) * | 1994-01-28 | 1995-10-01 | Ibm | |
| JPH10270498A (ja) * | 1997-03-27 | 1998-10-09 | Toshiba Corp | 電子装置の製造方法 |
| JPH11307565A (ja) | 1998-04-24 | 1999-11-05 | Mitsubishi Electric Corp | 半導体装置の電極およびその製造方法ならびに半導体装置 |
| JP2001351946A (ja) * | 2000-06-05 | 2001-12-21 | Mitsubishi Electric Corp | 半導体装置 |
| JP2001358458A (ja) | 2000-06-12 | 2001-12-26 | Hitachi Ltd | Pbフリーはんだ接続を有する電子機器 |
| JP2002076606A (ja) | 2000-06-12 | 2002-03-15 | Hitachi Ltd | 電子機器および半導体装置 |
| JP2002151551A (ja) * | 2000-11-10 | 2002-05-24 | Hitachi Ltd | フリップチップ実装構造、その実装構造を有する半導体装置及び実装方法 |
| JP4656275B2 (ja) * | 2001-01-15 | 2011-03-23 | 日本電気株式会社 | 半導体装置の製造方法 |
| JP4152596B2 (ja) | 2001-02-09 | 2008-09-17 | 新日鉄マテリアルズ株式会社 | ハンダ合金、ハンダボール及びハンダバンプを有する電子部材 |
| US6805974B2 (en) | 2002-02-15 | 2004-10-19 | International Business Machines Corporation | Lead-free tin-silver-copper alloy solder composition |
| US7015590B2 (en) * | 2003-01-10 | 2006-03-21 | Samsung Electronics Co., Ltd. | Reinforced solder bump structure and method for forming a reinforced solder bump |
| JP4791685B2 (ja) | 2003-05-22 | 2011-10-12 | シャープ株式会社 | 導電性ボール、電極構造、電子部品の電極の形成方法、電子部品ならびに電子機器 |
| JP2007242783A (ja) | 2006-03-07 | 2007-09-20 | Fujikura Ltd | 半導体装置及び電子装置 |
| CN101454887B (zh) * | 2006-05-29 | 2011-03-23 | 日本电气株式会社 | 电子部件、半导体封装件和电子器件 |
| JP4946262B2 (ja) * | 2006-08-18 | 2012-06-06 | 富士通セミコンダクター株式会社 | 半導体素子の実装方法及び半導体装置の製造方法 |
| KR100876646B1 (ko) * | 2007-04-27 | 2009-01-09 | 한국과학기술원 | 취성파괴 방지를 위한 무전해 NiXP로 표면처리된전자부품의 접합 방법 |
| JP2009054790A (ja) * | 2007-08-27 | 2009-03-12 | Oki Electric Ind Co Ltd | 半導体装置 |
| TWI359714B (en) * | 2008-11-25 | 2012-03-11 | Univ Yuan Ze | Method for inhibiting the formation of palladium-n |
| US8308052B2 (en) * | 2010-11-24 | 2012-11-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Thermal gradient reflow for forming columnar grain structures for solder bumps |
| US9704793B2 (en) * | 2011-01-04 | 2017-07-11 | Napra Co., Ltd. | Substrate for electronic device and electronic device |
| JP5899768B2 (ja) * | 2011-09-30 | 2016-04-06 | 富士通株式会社 | 半導体パッケージ、配線基板ユニット、及び電子機器 |
| JP2013080844A (ja) * | 2011-10-04 | 2013-05-02 | Fujitsu Ltd | 基板モジュールの製造方法、基板モジュール及び基板モジュール組立体 |
| JP6165411B2 (ja) * | 2011-12-26 | 2017-07-19 | 富士通株式会社 | 電子部品及び電子機器 |
| JP6061369B2 (ja) * | 2012-01-30 | 2017-01-18 | 凸版印刷株式会社 | 配線基板およびその製造方法、ならびにはんだ付き配線基板の製造方法 |
| CN102936669B (zh) * | 2012-11-28 | 2014-09-10 | 一远电子科技有限公司 | 一种低熔点无铅焊料合金 |
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2014
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Also Published As
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|---|---|
| CN104701281A (zh) | 2015-06-10 |
| US20170062373A1 (en) | 2017-03-02 |
| US20150162312A1 (en) | 2015-06-11 |
| US20160247776A1 (en) | 2016-08-25 |
| CN106887418A (zh) | 2017-06-23 |
| CN107424983A (zh) | 2017-12-01 |
| US9812418B2 (en) | 2017-11-07 |
| JP2015115363A (ja) | 2015-06-22 |
| CN107039379A (zh) | 2017-08-11 |
| CN104701281B (zh) | 2017-07-14 |
| US20170012013A1 (en) | 2017-01-12 |
| US9761552B2 (en) | 2017-09-12 |
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