JP5785194B2 - 静止電流（ｉｄｄｑ）指示および試験装置および方法 - Google Patents

静止電流（ｉｄｄｑ）指示および試験装置および方法 Download PDF

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Publication number
JP5785194B2
JP5785194B2 JP2012551199A JP2012551199A JP5785194B2 JP 5785194 B2 JP5785194 B2 JP 5785194B2 JP 2012551199 A JP2012551199 A JP 2012551199A JP 2012551199 A JP2012551199 A JP 2012551199A JP 5785194 B2 JP5785194 B2 JP 5785194B2
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JP
Japan
Prior art keywords
electronic device
quiescent current
ground node
circuit
switching element
Prior art date
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Expired - Fee Related
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JP2012551199A
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English (en)
Japanese (ja)
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JP2013518285A5 (enExample
JP2013518285A (ja
Inventor
エイ． ジャリッジ、ニコラス
エイ． ジャリッジ、ニコラス
シハデー カンダー、イブラヒム
シハデー カンダー、イブラヒム
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NXP USA Inc
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NXP USA Inc
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Expired - Fee Related legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49155—Manufacturing circuit on or in base

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2012551199A 2010-01-29 2011-01-19 静止電流（ｉｄｄｑ）指示および試験装置および方法 Expired - Fee Related JP5785194B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/696,257 2010-01-29
US12/696,257 US8476917B2 (en) 2010-01-29 2010-01-29 Quiescent current (IDDQ) indication and testing apparatus and methods
PCT/US2011/021711 WO2011094103A2 (en) 2010-01-29 2011-01-19 Quiescent current (iddq) indication and testing apparatus and methods

Publications (3)

Publication Number Publication Date
JP2013518285A JP2013518285A (ja) 2013-05-20
JP2013518285A5 JP2013518285A5 (enExample) 2014-03-13
JP5785194B2 true JP5785194B2 (ja) 2015-09-24

Family

ID=44320056

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012551199A Expired - Fee Related JP5785194B2 (ja) 2010-01-29 2011-01-19 静止電流（ｉｄｄｑ）指示および試験装置および方法

Country Status (5)

Country Link
US (1) US8476917B2 (enExample)
EP (1) EP2531866A2 (enExample)
JP (1) JP5785194B2 (enExample)
CN (1) CN102770774B (enExample)
WO (1) WO2011094103A2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9103877B2 (en) * 2012-04-03 2015-08-11 Sandisk Technologies Inc. Apparatus and method for IDDQ tests
US9866133B2 (en) 2014-01-10 2018-01-09 Astec International Limited Control circuits and methods for regulating output voltages using multiple and/or adjustable reference voltages
CN104919689B (zh) 2014-01-10 2017-11-10 雅达电子国际有限公司 基于可调参考电压调节输出电压的控制电路和方法
CN104897954A (zh) * 2015-05-22 2015-09-09 成都前锋电子仪器有限责任公司 多路智能燃气表静态电流自动检测装置
CN105067928B (zh) * 2015-08-11 2018-01-30 惠州华阳通用电子有限公司 一种汽车电子产品暗电流自动化测试方法及装置
US10139448B2 (en) 2016-08-31 2018-11-27 Nxp Usa, Inc. Scan circuitry with IDDQ verification
TWI628448B (zh) * 2017-03-07 2018-07-01 慧榮科技股份有限公司 電路測試方法
US11223289B2 (en) 2020-01-17 2022-01-11 Astec International Limited Regulated switched mode power supplies having adjustable output voltages
US11398287B2 (en) * 2020-03-24 2022-07-26 Sandisk Technologies Llc Input/output circuit internal loopback

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0658981A (ja) * 1992-08-05 1994-03-04 Sanyo Electric Co Ltd Ｃｍｏｓ集積回路の電流検出回路
JP2715956B2 (ja) 1995-01-20 1998-02-18 日本電気株式会社 Ｉｄｄｑを用いたＣＭＯＳ論理回路の故障箇所の絞り込み方法
DE19626103A1 (de) 1995-06-30 1997-01-02 Nec Corp Fehlerbeurteilungssystem mit Erfassung von anomalem Strom und V-I-Charakteristika
US5773990A (en) 1995-09-29 1998-06-30 Megatest Corporation Integrated circuit test power supply
JP3641517B2 (ja) * 1995-10-05 2005-04-20 株式会社ルネサステクノロジ 半導体装置
DE69733789T2 (de) * 1996-06-05 2006-06-01 Interuniversitair Micro-Electronica Centrum Vzw Hochauflösendes Stromversorgungsprüfsystem
TW384474B (en) 1997-03-21 2000-03-11 Koninkl Philips Electronics Nv IDDQ testable programmable logic arrays
JP2950313B2 (ja) * 1998-01-19 1999-09-20 日本電気株式会社 半導体集積回路の入力バッファ回路
US6313657B1 (en) * 1998-12-24 2001-11-06 Advantest Corporation IC testing apparatus and testing method using same
US6496028B1 (en) * 1999-05-11 2002-12-17 Interuniversitair Micro-Elektronica Centrum Method and apparatus for testing electronic devices
US6859058B2 (en) 1999-05-11 2005-02-22 Interuniversitair Microelektronica Centrum (Imec Uzw) Method and apparatus for testing electronic devices
JP3430137B2 (ja) * 2000-09-27 2003-07-28 エヌイーシーマイクロシステム株式会社 Ｉｄｄｑテスト回路
WO2002042783A2 (en) 2000-11-22 2002-05-30 Ecole De Technologie Superieure Vddq INTEGRATED CIRCUIT TESTING SYSTEM AND METHOD
JP3720271B2 (ja) * 2001-03-22 2005-11-24 株式会社ルネサステクノロジ 半導体集積回路装置
US6833724B2 (en) 2001-09-10 2004-12-21 University Of North Carolina At Charlotte Methods and apparatus for testing electronic circuits
DE10145021C1 (de) * 2001-09-13 2003-04-30 Infineon Technologies Ag Integrierte Schaltung mit einer Strommesseinheit und ein Verfahren zum Messen eines Stromes
JP2003156534A (ja) * 2001-11-21 2003-05-30 Hitachi Ltd 半導体集積回路
WO2004025314A1 (en) 2002-09-16 2004-03-25 Koninklijke Philips Electronics N.V. A method and apparatus for iddq measuring
JP4346373B2 (ja) * 2002-10-31 2009-10-21 株式会社ルネサステクノロジ 半導体装置
WO2004104605A1 (ja) 2003-05-21 2004-12-02 Advantest Corporation 電流測定装置及び試験装置
US6930500B2 (en) 2003-08-01 2005-08-16 Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College IDDQ testing of CMOS mixed-signal integrated circuits
JP4557526B2 (ja) * 2003-11-10 2010-10-06 パナソニック株式会社 半導体集積回路及び半導体集積回路の故障検出方法
JP2005164467A (ja) * 2003-12-04 2005-06-23 Matsushita Electric Ind Co Ltd Ｉｄｄｑ測定回路
US7282905B2 (en) 2004-12-10 2007-10-16 Texas Instruments Incorporated System and method for IDDQ measurement in system on a chip (SOC) design
JP4627446B2 (ja) 2005-02-25 2011-02-09 株式会社アドバンテスト 電流測定装置、試験装置、電流測定方法、および試験方法
US7274203B2 (en) * 2005-10-25 2007-09-25 Freescale Semiconductor, Inc. Design-for-test circuit for low pin count devices
WO2007049331A1 (ja) * 2005-10-25 2007-05-03 Renesas Technology Corp. 接続装置、ｉｄｄｑテスト方法及び半導体集積回路
CN100554974C (zh) * 2006-04-18 2009-10-28 聚积科技股份有限公司 对半导体组件及其驱动控制电路进行侦测的方法与装置
WO2008029348A2 (en) * 2006-09-06 2008-03-13 Nxp B.V. Testable integrated circuit and ic test method
US8044676B2 (en) * 2008-06-11 2011-10-25 Infineon Technologies Ag IDDQ testing
US7688100B2 (en) 2008-06-30 2010-03-30 Freescale Semiconductor, Inc. Integrated circuit and a method for measuring a quiescent current of a module
CN101533043A (zh) * 2009-04-20 2009-09-16 上海汽车集团股份有限公司 车辆静态电流测试系统
US8278960B2 (en) * 2009-06-19 2012-10-02 Freescale Semiconductor, Inc. Method and circuit for measuring quiescent current
DE102009037649B4 (de) * 2009-08-14 2017-11-23 Texas Instruments Deutschland Gmbh Elektronische Vorrichtung und Verfahren zur Induktivitätsstrommessung

Also Published As

Publication number Publication date
CN102770774B (zh) 2015-04-08
CN102770774A (zh) 2012-11-07
WO2011094103A2 (en) 2011-08-04
US8476917B2 (en) 2013-07-02
WO2011094103A3 (en) 2011-11-03
EP2531866A2 (en) 2012-12-12
US20110187396A1 (en) 2011-08-04
JP2013518285A (ja) 2013-05-20

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