JP2013518285A5 - - Google Patents

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Publication number
JP2013518285A5
JP2013518285A5 JP2012551199A JP2012551199A JP2013518285A5 JP 2013518285 A5 JP2013518285 A5 JP 2013518285A5 JP 2012551199 A JP2012551199 A JP 2012551199A JP 2012551199 A JP2012551199 A JP 2012551199A JP 2013518285 A5 JP2013518285 A5 JP 2013518285A5
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JP
Japan
Prior art keywords
quiescent current
ground node
electronic device
switching element
electrically connected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2012551199A
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English (en)
Japanese (ja)
Other versions
JP5785194B2 (ja
JP2013518285A (ja
Filing date
Publication date
Priority claimed from US12/696,257 external-priority patent/US8476917B2/en
Application filed filed Critical
Publication of JP2013518285A publication Critical patent/JP2013518285A/ja
Publication of JP2013518285A5 publication Critical patent/JP2013518285A5/ja
Application granted granted Critical
Publication of JP5785194B2 publication Critical patent/JP5785194B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2012551199A 2010-01-29 2011-01-19 静止電流（ｉｄｄｑ）指示および試験装置および方法 Expired - Fee Related JP5785194B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/696,257 2010-01-29
US12/696,257 US8476917B2 (en) 2010-01-29 2010-01-29 Quiescent current (IDDQ) indication and testing apparatus and methods
PCT/US2011/021711 WO2011094103A2 (en) 2010-01-29 2011-01-19 Quiescent current (iddq) indication and testing apparatus and methods

Publications (3)

Publication Number Publication Date
JP2013518285A JP2013518285A (ja) 2013-05-20
JP2013518285A5 true JP2013518285A5 (enExample) 2014-03-13
JP5785194B2 JP5785194B2 (ja) 2015-09-24

Family

ID=44320056

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012551199A Expired - Fee Related JP5785194B2 (ja) 2010-01-29 2011-01-19 静止電流（ｉｄｄｑ）指示および試験装置および方法

Country Status (5)

Country Link
US (1) US8476917B2 (enExample)
EP (1) EP2531866A2 (enExample)
JP (1) JP5785194B2 (enExample)
CN (1) CN102770774B (enExample)
WO (1) WO2011094103A2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9103877B2 (en) * 2012-04-03 2015-08-11 Sandisk Technologies Inc. Apparatus and method for IDDQ tests
US9866133B2 (en) 2014-01-10 2018-01-09 Astec International Limited Control circuits and methods for regulating output voltages using multiple and/or adjustable reference voltages
CN104919689B (zh) 2014-01-10 2017-11-10 雅达电子国际有限公司 基于可调参考电压调节输出电压的控制电路和方法
CN104897954A (zh) * 2015-05-22 2015-09-09 成都前锋电子仪器有限责任公司 多路智能燃气表静态电流自动检测装置
CN105067928B (zh) * 2015-08-11 2018-01-30 惠州华阳通用电子有限公司 一种汽车电子产品暗电流自动化测试方法及装置
US10139448B2 (en) 2016-08-31 2018-11-27 Nxp Usa, Inc. Scan circuitry with IDDQ verification
TWI628448B (zh) * 2017-03-07 2018-07-01 慧榮科技股份有限公司 電路測試方法
US11223289B2 (en) 2020-01-17 2022-01-11 Astec International Limited Regulated switched mode power supplies having adjustable output voltages
US11398287B2 (en) * 2020-03-24 2022-07-26 Sandisk Technologies Llc Input/output circuit internal loopback

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CN101533043A (zh) * 2009-04-20 2009-09-16 上海汽车集团股份有限公司 车辆静态电流测试系统
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