CN102770774B - 静态电流(iddq)指示及测试装置和方法 - Google Patents

静态电流(iddq)指示及测试装置和方法 Download PDF

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Publication number
CN102770774B
CN102770774B CN201180007327.6A CN201180007327A CN102770774B CN 102770774 B CN102770774 B CN 102770774B CN 201180007327 A CN201180007327 A CN 201180007327A CN 102770774 B CN102770774 B CN 102770774B
Authority
CN
China
Prior art keywords
iddq
electronic device
ground node
electrically coupled
ground
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201180007327.6A
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English (en)
Chinese (zh)
Other versions
CN102770774A (zh
Inventor
N·A·杰瑞格
I·S·坎达尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP USA Inc
Original Assignee
Freescale Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Publication of CN102770774A publication Critical patent/CN102770774A/zh
Application granted granted Critical
Publication of CN102770774B publication Critical patent/CN102770774B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49155—Manufacturing circuit on or in base

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN201180007327.6A 2010-01-29 2011-01-19 静态电流(iddq)指示及测试装置和方法 Expired - Fee Related CN102770774B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/696,257 2010-01-29
US12/696,257 US8476917B2 (en) 2010-01-29 2010-01-29 Quiescent current (IDDQ) indication and testing apparatus and methods
PCT/US2011/021711 WO2011094103A2 (en) 2010-01-29 2011-01-19 Quiescent current (iddq) indication and testing apparatus and methods

Publications (2)

Publication Number Publication Date
CN102770774A CN102770774A (zh) 2012-11-07
CN102770774B true CN102770774B (zh) 2015-04-08

Family

ID=44320056

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201180007327.6A Expired - Fee Related CN102770774B (zh) 2010-01-29 2011-01-19 静态电流(iddq)指示及测试装置和方法

Country Status (5)

Country Link
US (1) US8476917B2 (enExample)
EP (1) EP2531866A2 (enExample)
JP (1) JP5785194B2 (enExample)
CN (1) CN102770774B (enExample)
WO (1) WO2011094103A2 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9103877B2 (en) * 2012-04-03 2015-08-11 Sandisk Technologies Inc. Apparatus and method for IDDQ tests
US9866133B2 (en) 2014-01-10 2018-01-09 Astec International Limited Control circuits and methods for regulating output voltages using multiple and/or adjustable reference voltages
US9698694B2 (en) 2014-01-10 2017-07-04 Astec International Limited Control circuits and methods for regulating output voltages based on adjustable references voltages
CN104897954A (zh) * 2015-05-22 2015-09-09 成都前锋电子仪器有限责任公司 多路智能燃气表静态电流自动检测装置
CN105067928B (zh) * 2015-08-11 2018-01-30 惠州华阳通用电子有限公司 一种汽车电子产品暗电流自动化测试方法及装置
US10139448B2 (en) 2016-08-31 2018-11-27 Nxp Usa, Inc. Scan circuitry with IDDQ verification
TWI628448B (zh) * 2017-03-07 2018-07-01 慧榮科技股份有限公司 電路測試方法
US11223289B2 (en) 2020-01-17 2022-01-11 Astec International Limited Regulated switched mode power supplies having adjustable output voltages
US11398287B2 (en) * 2020-03-24 2022-07-26 Sandisk Technologies Llc Input/output circuit internal loopback

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US5850404A (en) * 1995-01-20 1998-12-15 Nec Corporation Fault block detecting system using abnormal current
US5889789A (en) * 1995-06-30 1999-03-30 Nec Coporation Fault mode estimating system using abnormal current and V-I characteristics
US6127838A (en) * 1997-03-21 2000-10-03 U.S. Philips Corporation IDDQ testable programmable logic arrays
CN101059537A (zh) * 2006-04-18 2007-10-24 聚积科技股份有限公司 静默电流侦测方法及其装置
CN101533043A (zh) * 2009-04-20 2009-09-16 上海汽车集团股份有限公司 车辆静态电流测试系统

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US5773990A (en) 1995-09-29 1998-06-30 Megatest Corporation Integrated circuit test power supply
JP3641517B2 (ja) * 1995-10-05 2005-04-20 株式会社ルネサステクノロジ 半導体装置
DE69733789T2 (de) * 1996-06-05 2006-06-01 Interuniversitair Micro-Electronica Centrum Vzw Hochauflösendes Stromversorgungsprüfsystem
JP2950313B2 (ja) * 1998-01-19 1999-09-20 日本電気株式会社 半導体集積回路の入力バッファ回路
US6313657B1 (en) * 1998-12-24 2001-11-06 Advantest Corporation IC testing apparatus and testing method using same
US6496028B1 (en) * 1999-05-11 2002-12-17 Interuniversitair Micro-Elektronica Centrum Method and apparatus for testing electronic devices
US6859058B2 (en) 1999-05-11 2005-02-22 Interuniversitair Microelektronica Centrum (Imec Uzw) Method and apparatus for testing electronic devices
JP3430137B2 (ja) * 2000-09-27 2003-07-28 エヌイーシーマイクロシステム株式会社 Ｉｄｄｑテスト回路
CA2407766C (en) 2000-11-22 2010-06-29 Ecole De Technologie Superieure Vddq integrated circuit testing system and method
JP3720271B2 (ja) * 2001-03-22 2005-11-24 株式会社ルネサステクノロジ 半導体集積回路装置
WO2003023358A2 (en) 2001-09-10 2003-03-20 University Of North Carolina At Charlotte Methods and apparatus for testing electronic circuits
DE10145021C1 (de) * 2001-09-13 2003-04-30 Infineon Technologies Ag Integrierte Schaltung mit einer Strommesseinheit und ein Verfahren zum Messen eines Stromes
JP2003156534A (ja) * 2001-11-21 2003-05-30 Hitachi Ltd 半導体集積回路
AU2003255888A1 (en) 2002-09-16 2004-04-30 Koninklijke Philips Electronics N.V. A method and apparatus for iddq measuring
JP4346373B2 (ja) * 2002-10-31 2009-10-21 株式会社ルネサステクノロジ 半導体装置
WO2004104605A1 (ja) 2003-05-21 2004-12-02 Advantest Corporation 電流測定装置及び試験装置
US6930500B2 (en) 2003-08-01 2005-08-16 Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College IDDQ testing of CMOS mixed-signal integrated circuits
JP4557526B2 (ja) * 2003-11-10 2010-10-06 パナソニック株式会社 半導体集積回路及び半導体集積回路の故障検出方法
JP2005164467A (ja) * 2003-12-04 2005-06-23 Matsushita Electric Ind Co Ltd Ｉｄｄｑ測定回路
US7282905B2 (en) 2004-12-10 2007-10-16 Texas Instruments Incorporated System and method for IDDQ measurement in system on a chip (SOC) design
JP4627446B2 (ja) 2005-02-25 2011-02-09 株式会社アドバンテスト 電流測定装置、試験装置、電流測定方法、および試験方法
WO2007049331A1 (ja) * 2005-10-25 2007-05-03 Renesas Technology Corp. 接続装置、ｉｄｄｑテスト方法及び半導体集積回路
US7274203B2 (en) * 2005-10-25 2007-09-25 Freescale Semiconductor, Inc. Design-for-test circuit for low pin count devices
ATE465419T1 (de) * 2006-09-06 2010-05-15 Nxp Bv Prüfbare integrierte schaltung und ic- prüfverfahren
US8044676B2 (en) * 2008-06-11 2011-10-25 Infineon Technologies Ag IDDQ testing
US7688100B2 (en) 2008-06-30 2010-03-30 Freescale Semiconductor, Inc. Integrated circuit and a method for measuring a quiescent current of a module
US8278960B2 (en) * 2009-06-19 2012-10-02 Freescale Semiconductor, Inc. Method and circuit for measuring quiescent current
DE102009037649B4 (de) * 2009-08-14 2017-11-23 Texas Instruments Deutschland Gmbh Elektronische Vorrichtung und Verfahren zur Induktivitätsstrommessung

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5850404A (en) * 1995-01-20 1998-12-15 Nec Corporation Fault block detecting system using abnormal current
US5889789A (en) * 1995-06-30 1999-03-30 Nec Coporation Fault mode estimating system using abnormal current and V-I characteristics
US6127838A (en) * 1997-03-21 2000-10-03 U.S. Philips Corporation IDDQ testable programmable logic arrays
CN101059537A (zh) * 2006-04-18 2007-10-24 聚积科技股份有限公司 静默电流侦测方法及其装置
CN101533043A (zh) * 2009-04-20 2009-09-16 上海汽车集团股份有限公司 车辆静态电流测试系统

Also Published As

Publication number Publication date
US20110187396A1 (en) 2011-08-04
JP2013518285A (ja) 2013-05-20
EP2531866A2 (en) 2012-12-12
WO2011094103A2 (en) 2011-08-04
US8476917B2 (en) 2013-07-02
WO2011094103A3 (en) 2011-11-03
JP5785194B2 (ja) 2015-09-24
CN102770774A (zh) 2012-11-07

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CP01 Change in the name or title of a patent holder

Address after: Texas in the United States

Patentee after: NXP USA, Inc.

Address before: Texas in the United States

Patentee before: FREESCALE SEMICONDUCTOR, Inc.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20150408