JP5500942B2 - ウエーハの加工方法 - Google Patents
ウエーハの加工方法 Download PDFInfo
- Publication number
- JP5500942B2 JP5500942B2 JP2009247530A JP2009247530A JP5500942B2 JP 5500942 B2 JP5500942 B2 JP 5500942B2 JP 2009247530 A JP2009247530 A JP 2009247530A JP 2009247530 A JP2009247530 A JP 2009247530A JP 5500942 B2 JP5500942 B2 JP 5500942B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- ring
- device region
- region
- protective tape
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000003672 processing method Methods 0.000 title claims description 7
- 230000003014 reinforcing effect Effects 0.000 claims description 23
- 230000001681 protective effect Effects 0.000 claims description 22
- 230000002093 peripheral effect Effects 0.000 claims description 20
- 238000000926 separation method Methods 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 15
- 235000012431 wafers Nutrition 0.000 description 56
- 239000004065 semiconductor Substances 0.000 description 8
- 230000002787 reinforcement Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Dicing (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
10 研削ユニット
11 ウエーハ
15 デバイス
17 デバイス領域
19 外周余剰領域
22 研削ホイール
23 保護テープ
31 切削ブレード
33 円形分離溝
56 円形凹部
58 リング状補強部
Claims (1)
- 複数のデバイスが分割予定ラインによって区画されて形成されたデバイス領域と、該デバイス領域を囲繞する外周余剰領域とを表面に有するウエーハを加工するウエーハの加工方法であって、
ウエーハの表面に保護テープを貼着する保護テープ貼着工程と、
回転可能なチャックテーブルにウエーハの保護テープ側を保持し、ウエーハの裏面に切削ブレードを位置づけるとともに該チャックテーブルを回転させて該デバイス領域と該外周余剰領域との境界部を切削して分離溝を形成し、該デバイス領域からリング状の該外周余剰領域を切り離す分離溝形成工程と、
該分離溝形成工程実施後、該保護テープによって該デバイス領域と該リング状の外周余剰領域とが一体になったウエーハの該デバイス領域に対応する裏面のみを研削して、円形凹部を形成するとともに該リング状の外周余剰領域をリング状補強部として残存させる裏面研削工程と、
該保護テープを介して該リング状補強部に支持されたウエーハの該デバイス領域を搬送する搬送工程と、
該保護テープから該リング状補強部を取り外すリング状補強部取り外し工程と、
該リング状補強部取り外し工程実施後、ウエーハの該デバイス領域をダイシングテープを介して環状フレームで支持する支持工程と、
切削ブレードで該デバイス領域をダイシングして該デバイス領域を個々のデバイスに分割する分割工程と、
を備えたことを特徴とするウエーハの加工方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009247530A JP5500942B2 (ja) | 2009-10-28 | 2009-10-28 | ウエーハの加工方法 |
TW099130643A TWI497578B (zh) | 2009-10-28 | 2010-09-10 | Wafer processing method |
KR1020100093780A KR101591109B1 (ko) | 2009-10-28 | 2010-09-28 | 웨이퍼 가공 방법 |
US12/902,311 US7994025B2 (en) | 2009-10-28 | 2010-10-12 | Wafer processing method without occurrence of damage to device area |
CN201010523112.7A CN102082121B (zh) | 2009-10-28 | 2010-10-26 | 晶片的加工方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009247530A JP5500942B2 (ja) | 2009-10-28 | 2009-10-28 | ウエーハの加工方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011096767A JP2011096767A (ja) | 2011-05-12 |
JP5500942B2 true JP5500942B2 (ja) | 2014-05-21 |
Family
ID=43898789
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009247530A Active JP5500942B2 (ja) | 2009-10-28 | 2009-10-28 | ウエーハの加工方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7994025B2 (ja) |
JP (1) | JP5500942B2 (ja) |
KR (1) | KR101591109B1 (ja) |
CN (1) | CN102082121B (ja) |
TW (1) | TWI497578B (ja) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2962676B1 (fr) * | 2010-07-13 | 2012-08-03 | Essilor Int | Procede de detourage d'une lentille ophtalmique de lunettes comportant un film de revetement. |
JP5890977B2 (ja) * | 2011-07-20 | 2016-03-22 | 株式会社ディスコ | 加工方法 |
JP5865159B2 (ja) * | 2012-04-06 | 2016-02-17 | 株式会社ディスコ | スピンドルユニット及び切削装置 |
CN103050480B (zh) * | 2012-08-14 | 2015-08-19 | 上海华虹宏力半导体制造有限公司 | 硅片的背面图形化的工艺方法 |
CN103811407B (zh) * | 2012-11-06 | 2016-04-13 | 上海华虹宏力半导体制造有限公司 | 硅片的背面图形化的工艺方法 |
KR102259959B1 (ko) | 2013-12-05 | 2021-06-04 | 삼성전자주식회사 | 캐리어 및 이를 이용하는 반도체 장치의 제조 방법 |
JP6341709B2 (ja) * | 2014-03-18 | 2018-06-13 | 株式会社ディスコ | ウェーハの加工方法 |
JP2016127232A (ja) * | 2015-01-08 | 2016-07-11 | 株式会社ディスコ | ウェーハの加工方法 |
JP6479532B2 (ja) | 2015-03-30 | 2019-03-06 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
JP2017126725A (ja) * | 2016-01-15 | 2017-07-20 | 株式会社ディスコ | ウエーハの加工方法 |
JP6887722B2 (ja) * | 2016-10-25 | 2021-06-16 | 株式会社ディスコ | ウェーハの加工方法及び切削装置 |
JP7084718B2 (ja) * | 2017-12-28 | 2022-06-15 | 株式会社ディスコ | 被加工物の加工方法 |
JP2020066064A (ja) * | 2018-10-22 | 2020-04-30 | 株式会社ディスコ | 被加工物の加工方法及び加工装置 |
CN111933754A (zh) * | 2020-08-14 | 2020-11-13 | 孙鹏 | 一种n型多晶硅太阳能电池及其制造方法 |
CN115132568A (zh) * | 2021-03-25 | 2022-09-30 | 三美电机株式会社 | 半导体装置的制造方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005123263A (ja) * | 2003-10-14 | 2005-05-12 | Shinko Electric Ind Co Ltd | 半導体ウェハの加工方法 |
JP5390740B2 (ja) | 2005-04-27 | 2014-01-15 | 株式会社ディスコ | ウェーハの加工方法 |
JP2007019379A (ja) * | 2005-07-11 | 2007-01-25 | Disco Abrasive Syst Ltd | ウェーハの加工方法 |
JP5073962B2 (ja) * | 2006-05-12 | 2012-11-14 | 株式会社ディスコ | ウエーハの加工方法 |
JP2009043992A (ja) * | 2007-08-09 | 2009-02-26 | Disco Abrasive Syst Ltd | ウエーハの加工方法 |
-
2009
- 2009-10-28 JP JP2009247530A patent/JP5500942B2/ja active Active
-
2010
- 2010-09-10 TW TW099130643A patent/TWI497578B/zh active
- 2010-09-28 KR KR1020100093780A patent/KR101591109B1/ko active IP Right Grant
- 2010-10-12 US US12/902,311 patent/US7994025B2/en active Active
- 2010-10-26 CN CN201010523112.7A patent/CN102082121B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
TWI497578B (zh) | 2015-08-21 |
TW201123286A (en) | 2011-07-01 |
CN102082121A (zh) | 2011-06-01 |
US20110097852A1 (en) | 2011-04-28 |
US7994025B2 (en) | 2011-08-09 |
CN102082121B (zh) | 2014-08-13 |
JP2011096767A (ja) | 2011-05-12 |
KR101591109B1 (ko) | 2016-02-02 |
KR20110046265A (ko) | 2011-05-04 |
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