JP5230761B2 - 発光素子 - Google Patents
発光素子 Download PDFInfo
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- JP5230761B2 JP5230761B2 JP2011033622A JP2011033622A JP5230761B2 JP 5230761 B2 JP5230761 B2 JP 5230761B2 JP 2011033622 A JP2011033622 A JP 2011033622A JP 2011033622 A JP2011033622 A JP 2011033622A JP 5230761 B2 JP5230761 B2 JP 5230761B2
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- 239000010410 layer Substances 0.000 claims description 205
- 239000011241 protective layer Substances 0.000 claims description 83
- 239000000758 substrate Substances 0.000 claims description 70
- 239000004065 semiconductor Substances 0.000 claims description 68
- 239000000463 material Substances 0.000 claims description 18
- 238000009792 diffusion process Methods 0.000 claims description 8
- 239000002019 doping agent Substances 0.000 claims description 8
- 229910052759 nickel Inorganic materials 0.000 claims description 8
- 229910052737 gold Inorganic materials 0.000 claims description 7
- 230000001681 protective effect Effects 0.000 claims description 6
- 229910052719 titanium Inorganic materials 0.000 claims description 6
- 229910002704 AlGaN Inorganic materials 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 229910052763 palladium Inorganic materials 0.000 claims description 5
- -1 AlInGaAs Inorganic materials 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 229910052718 tin Inorganic materials 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 230000015556 catabolic process Effects 0.000 claims description 3
- 229910052738 indium Inorganic materials 0.000 claims description 3
- 229910052741 iridium Inorganic materials 0.000 claims description 3
- 229910052697 platinum Inorganic materials 0.000 claims description 3
- 229910052715 tantalum Inorganic materials 0.000 claims description 3
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 claims description 2
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 claims description 2
- 229910052750 molybdenum Inorganic materials 0.000 claims description 2
- 229910052758 niobium Inorganic materials 0.000 claims description 2
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- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
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- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 2
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 2
- 239000011112 polyethylene naphthalate Substances 0.000 description 2
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- 239000000919 ceramic Substances 0.000 description 1
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- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
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- 238000004544 sputter deposition Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
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- 238000001039 wet etching Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/38—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
- H01L33/385—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape the electrode extending at least partially onto a side surface of the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L24/23—Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
- H01L24/24—Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01012—Magnesium [Mg]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1203—Rectifying Diode
- H01L2924/12032—Schottky diode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Led Devices (AREA)
- Led Device Packages (AREA)
Description
上記第1導電型半導体層130がn型半導体層であり、上記第2導電型半導体層150がp型半導体層であり、上記第1電極170はn−オーミック金属であり、上記電極層160の第1層161がp−オーミック金属で形成される場合、上記保護層120はn型またはp型半導体層で形成できる。
上記第1導電型半導体層130がn型半導体層であり、上記第2導電型半導体層150がp型半導体層であり、上記第1電極170はn−オーミック金属であり、上記電極層160の第1層161がn−オーミック金属で形成される場合、上記保護層120はp型半導体層で形成できる。
上記第1導電型半導体層130がp型半導体層であり、上記第2導電型半導体層150がn型半導体層であり、上記第1電極170はp−オーミック金属であり、上記電極層160の第1層161がn−オーミック金属で形成される場合、上記保護層120はn型またはp型半導体層で形成できる。
上記第1導電型半導体層130がp型半導体層であり、上記第2導電型半導体層150がn型半導体層であり、上記第1電極170はp−オーミック金属であり、上記電極層160の第1層161がp−オーミック金属で形成される場合、上記保護層120はn型半導体層で形成できる。
以下、第2実施形態に従う発光素子100B及びその製造方法について詳細に説明する。第2実施形態に対する説明において、第1実施形態と重複する説明は省略または簡略に説明する。
以下、第3実施形態に従う発光素子100C及びその製造方法について詳細に説明する。第3実施形態に対する説明において、第1実施形態と重複する説明は省略または簡略に説明する。
以下、第4実施形態に従う発光素子100D及びその製造方法について詳細に説明する。第4実施形態に対する説明において、第1実施形態と重複する説明は省略または簡略に説明する。
以下、第5実施形態に従う発光素子100E及びその製造方法について詳細に説明する。第5実施形態に対する説明においては第3実施形態を参照する。
Claims (12)
- 基板と、
前記基板の上の、n型またはp型ドーパントを含む保護層と、
前記保護層の上の電極層と、
前記電極層の上に形成されて光を生成し、第1半導体層、前記第1半導体層の下に活性層及び前記活性層の下に第2導電型半導体層を含む発光構造物と、
一端は前記発光構造物の上面に配置され、他端は前記保護層に配置される第1電極と、を含み、
前記電極層は、前記保護層の上面に接触する第1層と、前記第1層の上に形成されて前記発光構造物から放出される光を反射する第2層と、を含み、
前記保護層は、Si、GaN、InN、AlN、InGaN、AlGaN、InAlGaN、AlInN、AlGaAs、InGaAs、AlInGaAs、GaP、AlGaP、InGaP、AlInGaP、またはInPのうち、1つ以上を含み、
前記保護層は、前記電極層の第1層とショットキー接触をなすことを特徴とする発光素子。 - 前記第1層及び第2層の間には拡散防止層及び結合強化層のうち、少なくとも1つをさらに含むことを特徴とする請求項1に記載の発光素子。
- 前記発光構造物の側面と前記第1電極との間に保護部材を含むことを特徴とする請求項1又は2に記載の発光素子。
- 前記電極層の第2層上に第2電極を含むことを特徴とする請求項1乃至3のいずれかに記載の発光素子。
- 前記ショットキー接触により形成された降伏電圧は、前記発光構造物の動作電圧より大きいことを特徴とする請求項1乃至4のいずれかに記載の発光素子。
- 前記第2層は、前記発光構造物とオーミック接触をなす材質を含むことを特徴とする請求項1乃至5のいずれかに記載の発光素子。
- 前記第2層は、Ag、Rh、Ni、Au、Pd、Ir、Ti、Pt、W、またはAlのうち、少なくとも1つを含むことを特徴とする請求項1乃至6のいずれかに記載の発光素子。
- 前記第1層は、Au、Sn、In、Pd、Cu、Mo、W、Si、Ta、Nb、またはNiのうち、少なくとも1つを含むことを特徴とする請求項1乃至7のいずれかに記載の発光素子。
- 前記基板の下に電極パッドを含み、前記電極パッドは前記保護層及び前記基板を貫通する導電性貫通ホールにより前記電極層と電気的に連結されることを特徴とする請求項1乃至8のいずれかに記載の発光素子。
- 前記基板の下面の一側に第1電極パッド及び他側に第2電極パッドを含み、
前記第1電極パッドは、前記保護層及び前記基板を貫通する第1導電性貫通ホールにより第1電極と電気的に連結され、
前記第2電極パッドは、前記保護層及び前記基板を貫通する第2導電性貫通ホールにより前記電極層と電気的に連結されることを特徴とする請求項1乃至8のいずれかに記載の発光素子。 - 前記基板は電気伝導性を有し、前記基板の下に電極パッドを含むことを特徴とする請求項1乃至8のいずれかに記載の発光素子。
- 前記基板は電気伝導性を有し、
前記第1電極パッド及び第2電極パッドと前記基板との間、及び前記第1導電性貫通ホール及び第2導電性貫通ホールと前記基板との間に絶縁構造を含むことを特徴とする請求項10に記載の発光素子。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20100016043A KR100999784B1 (ko) | 2010-02-23 | 2010-02-23 | 발광 소자, 발광 소자 제조방법 및 발광 소자 패키지 |
KR10-2010-0016043 | 2010-02-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011176314A JP2011176314A (ja) | 2011-09-08 |
JP5230761B2 true JP5230761B2 (ja) | 2013-07-10 |
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Application Number | Title | Priority Date | Filing Date |
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JP2011033622A Active JP5230761B2 (ja) | 2010-02-23 | 2011-02-18 | 発光素子 |
Country Status (6)
Country | Link |
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US (1) | US8395182B2 (ja) |
EP (1) | EP2362450B1 (ja) |
JP (1) | JP5230761B2 (ja) |
KR (1) | KR100999784B1 (ja) |
CN (1) | CN102169937B (ja) |
TW (1) | TWI492418B (ja) |
Families Citing this family (29)
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US8476649B2 (en) | 2010-12-16 | 2013-07-02 | Micron Technology, Inc. | Solid state lighting devices with accessible electrodes and methods of manufacturing |
KR101930308B1 (ko) * | 2011-07-28 | 2018-12-18 | 엘지이노텍 주식회사 | 발광 소자 |
KR101865923B1 (ko) * | 2011-10-12 | 2018-06-08 | 엘지이노텍 주식회사 | 발광소자, 발광소자 패키지 및 라이트 유닛 |
KR101852898B1 (ko) | 2011-10-17 | 2018-04-27 | 엘지이노텍 주식회사 | 발광소자 |
US8552461B2 (en) * | 2011-11-21 | 2013-10-08 | Foxsemicon Integrated Technology, Inc. | Light emitting diode without leads |
JP5776535B2 (ja) * | 2011-12-16 | 2015-09-09 | 豊田合成株式会社 | Iii族窒化物半導体発光素子 |
TWI662719B (zh) * | 2012-03-30 | 2019-06-11 | 晶元光電股份有限公司 | 發光元件 |
KR101886156B1 (ko) * | 2012-08-21 | 2018-09-11 | 엘지이노텍 주식회사 | 발광소자 |
JP6032823B2 (ja) * | 2012-09-27 | 2016-11-30 | 富士機械製造株式会社 | 半導体装置及びその製造方法 |
KR101969308B1 (ko) * | 2012-10-26 | 2019-04-17 | 삼성전자주식회사 | 반도체 발광소자 및 그 제조 방법 |
KR101976459B1 (ko) * | 2012-11-02 | 2019-05-09 | 엘지이노텍 주식회사 | 발광소자, 발광소자 패키지 및 라이트 유닛 |
CN103811593B (zh) | 2012-11-12 | 2018-06-19 | 晶元光电股份有限公司 | 半导体光电元件的制作方法 |
KR101481012B1 (ko) * | 2013-02-21 | 2015-01-14 | 루미마이크로 주식회사 | 발광 소자 및 발광 소자 패키지 |
JP6071650B2 (ja) * | 2013-03-01 | 2017-02-01 | スタンレー電気株式会社 | 半導体発光装置 |
TWI626395B (zh) | 2013-06-11 | 2018-06-11 | 晶元光電股份有限公司 | 發光裝置 |
CN103400916A (zh) * | 2013-08-21 | 2013-11-20 | 深圳市凯信光电有限公司 | 一种led晶片结构 |
WO2016011609A1 (zh) * | 2014-07-23 | 2016-01-28 | 深圳市国源铭光电科技有限公司 | 一种led光源及led灯 |
CN106463575A (zh) * | 2014-07-23 | 2017-02-22 | 深圳市国源铭光电科技有限公司 | Led光源的制作方法及批量制作方法 |
CN104167485A (zh) * | 2014-08-21 | 2014-11-26 | 中国科学院半导体研究所 | 一种自支撑led阵列光源结构 |
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