JP5209215B2 - プローブユニット及び検査装置 - Google Patents
プローブユニット及び検査装置 Download PDFInfo
- Publication number
- JP5209215B2 JP5209215B2 JP2007008088A JP2007008088A JP5209215B2 JP 5209215 B2 JP5209215 B2 JP 5209215B2 JP 2007008088 A JP2007008088 A JP 2007008088A JP 2007008088 A JP2007008088 A JP 2007008088A JP 5209215 B2 JP5209215 B2 JP 5209215B2
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- JP
- Japan
- Prior art keywords
- probe
- plate
- fpc
- inspection
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Liquid Crystal (AREA)
Description
前記実施形態に係るプローブユニット21は、接続ケーブル部25のFPCケーブル46の端子48をガイドフィルム50で覆うタイプのプローブユニット全てに適用することができる。
Claims (3)
- 検査対象板の検査に用いるプローブユニットであって、
前記検査対象板の回路の電極に電気的に接触して検査信号を印加するプローブ組立体と、当該プローブ組立体と外部装置とを電気的に接続する接続ケーブル部とを備え、
前記プローブ組立体の基端部の多数の針部が接触するFPCケーブルの多数の端子を覆ってガイドフィルムが設けられ、
当該ガイドフィルムが、前記FPCケーブルの多数の端子と同じ数だけ、各端子に整合する位置にそれぞれ設けられ、前記プローブ組立体の基端部の多数の針部が前記FPCケーブルの多数の端子に直接接触するのを許容するガイド穴と、当該各ガイド穴に並行して、FPCプレートの先端側縁部の角部に合わせた位置に設けられた折り曲げ部とを備え、
前記折り曲げ部が、FPCプレートの先端側縁部の角部を覆うように接着固定されたことを特徴とするプローブユニット。 - 請求項1に記載のプローブユニットにおいて、
前記ガイドフィルムが、長方形状のフィルム材で構成されたことを特徴とするプローブユニット。 - 検査対象板の検査に用いる検査装置であって、
外部から挿入された検査対象板を外部から搬入し、検査終了後に外部へ搬送するパネルセット部と、当該パネルセット部から渡された検査対象板を支持して試験する測定部とを備え、
前記測定部のプローブユニットとして、請求項1又は2に記載のプローブユニットを用いたことを特徴とする検査装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007008088A JP5209215B2 (ja) | 2007-01-17 | 2007-01-17 | プローブユニット及び検査装置 |
TW096142706A TWI354104B (en) | 2007-01-17 | 2007-11-12 | Probe unit and inspection apparatus |
KR1020070116517A KR100922097B1 (ko) | 2007-01-17 | 2007-11-15 | 프로브 유닛 및 검사 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007008088A JP5209215B2 (ja) | 2007-01-17 | 2007-01-17 | プローブユニット及び検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008175628A JP2008175628A (ja) | 2008-07-31 |
JP5209215B2 true JP5209215B2 (ja) | 2013-06-12 |
Family
ID=39702761
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007008088A Active JP5209215B2 (ja) | 2007-01-17 | 2007-01-17 | プローブユニット及び検査装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5209215B2 (ja) |
KR (1) | KR100922097B1 (ja) |
TW (1) | TWI354104B (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5406790B2 (ja) * | 2009-08-04 | 2014-02-05 | 株式会社日本マイクロニクス | プローブユニット及びこれを用いる試験装置 |
KR101152181B1 (ko) * | 2010-05-06 | 2012-06-15 | 주식회사디아이 | 디스플레이 패널 검사용 프로브 블록 및 프로브 유닛 |
JP2020115155A (ja) * | 2020-05-07 | 2020-07-30 | 日置電機株式会社 | 測定装置 |
KR102295340B1 (ko) * | 2020-11-26 | 2021-08-31 | 주식회사 프로이천 | 자석 완충식 프로브핀 어레이유닛 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07105416B2 (ja) * | 1987-10-21 | 1995-11-13 | 松下電器産業株式会社 | 測定装置 |
JPH0557832U (ja) * | 1991-12-27 | 1993-07-30 | 太陽誘電株式会社 | 微小容量コンデンサ |
JP3602630B2 (ja) * | 1995-12-14 | 2004-12-15 | 株式会社日本マイクロニクス | プローブユニット |
JP4235280B2 (ja) * | 1998-06-12 | 2009-03-11 | 株式会社日本マイクロニクス | プローブ組立体 |
JP3958875B2 (ja) * | 1998-07-24 | 2007-08-15 | 株式会社日本マイクロニクス | プローバ及びプローブ針接触方法 |
KR100314586B1 (ko) * | 1999-05-17 | 2001-11-15 | 이석행 | 액정디스플레이 검사용 프로브장치 |
KR20020093383A (ko) * | 2001-06-08 | 2002-12-16 | 주식회사 유림하이테크산업 | 엘시디 검사용 프로브 카드 |
JP4369201B2 (ja) * | 2003-10-22 | 2009-11-18 | 株式会社日本マイクロニクス | プローブ組立体 |
JP4634059B2 (ja) | 2004-03-26 | 2011-02-16 | 株式会社日本マイクロニクス | プローブ組立体 |
JP4790997B2 (ja) * | 2004-03-26 | 2011-10-12 | 株式会社日本マイクロニクス | プローブ装置 |
-
2007
- 2007-01-17 JP JP2007008088A patent/JP5209215B2/ja active Active
- 2007-11-12 TW TW096142706A patent/TWI354104B/zh not_active IP Right Cessation
- 2007-11-15 KR KR1020070116517A patent/KR100922097B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR100922097B1 (ko) | 2009-10-16 |
TW200837355A (en) | 2008-09-16 |
TWI354104B (en) | 2011-12-11 |
KR20080067949A (ko) | 2008-07-22 |
JP2008175628A (ja) | 2008-07-31 |
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