201011288 六、發明說明： 【發明所屬之技術領域】 本發明係有關於一種應用於面板的測試裝置，特別θ有 於一種可以疊合接合的面板測試裝置。 關 【先前技術】 -般業界(顯π 1频供應商)所提m⑽(例如 組裝商)之顯示器模組，通常都會以軟性電路板做為連接器， 因此該祕細為配合的採赌槽以供軟性魏板插接。 示器模域應商在產品出麵，會先於内部 —了連串的品質測試以確保產品(顯示器模組)的品質。在 :j的品質測試中，均f要將顯示器模組與測统: 而需多次進棚t之動作。烟·賴 路= 變和電路損壞，進而=力不當，使得軟性電路板形 貝裘進而造成顯示器模組的晝面顯示不正常。 此外，另-種採用扎針結構做為 連接哭合吉姐1 口疋使益的測4系統，此種 ，直接4軟性電路板上 晝面的顯示不正常。 a每戚顯不态模組 因此為了避免顯示賴組之軟 2損壞，進而造成顯示器模組 板因H次數過多 :發明人基於產品不斷研究鱗之二不=現象，妥是’ 考，經過無數次之設計實驗，;m潜=發思 x月莱之產生，以降低顯 201011288 示器模組之損壞率。 f發明内容】 以下，由具體實施例，且佐關式作詳細之_，俾使 ' 貴審查委貞麟於本剌之各項魏、特點，有更進一步之了 _ 解與認識。 根據本U之第-方向，提出—種檢測裝置，用以檢測一 ❹ 面板面板包括一第一電路板，其中第-電路板上包減雛 腳’其中測試裝置包括一第二電路板及壓合件。第二電路板包 括-本體、數個測試塾、數個測試電路及數個導電元件。本體 -有第I面及-第二表面。數個測試塾設置於第一表面 上且此式墊分麟應此些接腳設置。細測試電路對應 此些測試塾設置於第二表面上。數個導電元件貫穿設置於本體 中’用以使此些測試電路與此些測試墊電性連接。歷合件對應 此第二電路板之此些測試墊設置，用以使第一電路板及第二電 瞻 路板疊合後緊密接合。當第一電路板疊合於第二電路板時，此 H式電路係㈣此些導電元件、測試墊與此些接腳電性連 接。 根據本發明之第二方向’提出一種面板的檢測方法。面板 的檢測方法包括下列步驟。提供一面板，面板包括一第一電路 板，且第一電路板包括複數個接腳；提供具有一第二電路板之 一檢測裝置，且第二電路板，包括數個測試墊，其中此些測試 墊係對應此些翻設置；疊合第—電路板及第二電路板，以使 201011288 此些測試墊與此些接腳電性連接；以及置放一壓合件於第一電 路板及第二電路板之疊合處，以使第一電路板與第二電路板緊 密接合。 . 【實施方式】 . 請參閱第1A®及1B目’第1A®标本發明触實施例之 測試裝置及面板上視圖，第1B圖繪示將第丨八圖中測試裝置及 ❿ 面板疊合之上棚。測職置2_用_試-面板则^而面 板1〇〇包括一第一電路板no，且第一電路板11〇上具有數個接 腳(pin)112。本實施之測試裝置2〇〇包括一第二電路板21〇及一 麗合件220(繪示於第1B圖中）。第二電路板2 i 〇包括數個測試墊 212，且此些測試墊212係分別對應第一電路板11〇的接腳112 設置’其中當第一電路板110與第二電路板21〇疊合時，接腳112 會與測試墊212電性耦接。於本實施例中，面板1〇〇的第一電路 板110係為軟性電路板，且接腳112亦可為常見的金手指結構。 ❹ 本實施的測試裝置200係藉由第二電路板210與面板1〇〇的第一 電路板110連接，以使面板1〇〇與測試裝置2〇〇電性連接以進行 測試，進而使顯示螢幕120顯示測試結果。於本實施例中，於 弟一電路板110及第一電路板210疊合後，亦可以設置一壓合件 220於第二電路板210上(如第1B圖），以使第一電路板11〇及第 二電路板210疊合後緊密接合。 明再參知弟1A圖，於此實施例中，測試塾212的形狀例如 為圓形，且此些測試墊212的直徑W2略小於接腳112的寬度 201011288 wl，以使測試墊212能完全與接腳112密合。比如說，當接腳112 的寬度wl為0.33厘米(mm)時，測試墊212的寬度w2例如為0.3 厘米(mm) 〇 接著’請參照第1B及1C圖，第1C圖繪示依照第1B圖中剖 面線1C-1C的剖面圖。於本實施例中，屢合件220較佳的可以 • 活動式的方式設置’並且對應設置於測試墊212上。如此一來， 便能藉由壓合件220的重量增加接腳112與測試墊212的之間緊 ❹ 密度，而使第一電路板110可與第二電路板210疊合後緊密接 合。 請參照第1C圖，本實施例中第二電路板210包括一本體 202、數個測試墊212、數個測試電路216、數個導電元件218。 本體202具有-第-表面214、第二表面215。前述的測試塾212 係設置於第一表面214上。複數個電路216係設置於第二表面 215上’此些測试電路216係與測試裝置2〇〇的測試系統(未繪示） 218貫穿設置於本體2〇2中， 墊212電性連接。如此一來 • 連接，用以傳遞測試系統的測試訊號。再者，再藉由導電元件 ’使此些測試電路216與對應的測試201011288 VI. Description of the Invention: [Technical Field] The present invention relates to a test apparatus applied to a panel, and in particular, θ is a panel test apparatus which can be laminated and joined. Off [Prior Art] - The display module of the m(10) (for example, assembler) mentioned in the industry (usually π 1 frequency supplier) usually uses a flexible circuit board as a connector, so the secret is a matching gambling slot. For the soft Wei board docking. The manufacturer's model domain is in front of the product and will be preceded by a series of quality tests to ensure the quality of the product (display module). In the quality test of :j, the display module and the measurement system should be used: Smoke and Lai Road = change and circuit damage, and then = improper force, so that the soft circuit board shape and then the display module's face display is not normal. In addition, the other type uses the needle-pin structure as the test 4 system that connects the crying singer's 1 疋 疋 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , Therefore, in order to avoid the damage of the soft 2 of the display group, the display module board is caused by too many H times: the inventor constantly researches the scale of the second based on the product, and the result is a test. The second design experiment, m potential = the generation of the x-ray, to reduce the damage rate of the 201011288 display module. f Summary of the Invention In the following, from the specific examples, and the detailed description of the slogan, ' 贵 贵 贵 贵 贵 贵 贵 贵 贵 贵 于 于 于 于 于 于 于 于 于 于 剌 剌 剌 剌 剌 剌 剌 剌 剌 剌 剌 剌 剌 剌 剌According to the first direction of the present invention, a detecting device is provided for detecting a panel, wherein the panel comprises a first circuit board, wherein the first circuit board comprises a lowering leg, wherein the testing device comprises a second circuit board and a voltage Combined. The second circuit board includes a body, a plurality of test pads, a plurality of test circuits, and a plurality of conductive elements. Body - has the first side and the second side. A plurality of test rafts are disposed on the first surface and the lining of the lining should be set by the pins. The fine test circuit corresponds to the test 塾 set on the second surface. A plurality of conductive elements are disposed through the body ” to electrically connect the test circuits to the test pads. The matching component corresponds to the test pads of the second circuit board for closely bonding the first circuit board and the second circuit board. When the first circuit board is superposed on the second circuit board, the H-type circuit system (4) is electrically connected to the conductive elements and the test pads. According to a second aspect of the invention, a method of detecting a panel is proposed. The method of detecting the panel includes the following steps. Providing a panel, the panel includes a first circuit board, and the first circuit board includes a plurality of pins; a detecting device having a second circuit board is provided, and the second circuit board includes a plurality of test pads, wherein the The test pad is corresponding to the flipping arrangement; the first circuit board and the second circuit board are superimposed so that the test pads of 201011288 are electrically connected to the pins; and a pressing component is placed on the first circuit board and The second circuit board is overlapped so that the first circuit board and the second circuit board are tightly coupled. [Embodiment] Please refer to the top view of the test device and panel of the 1A® and 1B's 1A® specimen invention, and the 1B diagram shows the test device and the 面板 panel in FIG. On the shed. The test board 2_ uses the _ test-panel and the board 1 〇〇 includes a first board no, and the first board 11 has a plurality of pins 112. The test device 2 of the present embodiment includes a second circuit board 21A and a splicing member 220 (shown in FIG. 1B). The second circuit board 2 i 〇 includes a plurality of test pads 212 , and the test pads 212 are respectively disposed corresponding to the pins 112 of the first circuit board 11 ' 'where the first circuit board 110 and the second circuit board 21 are folded In time, the pin 112 is electrically coupled to the test pad 212. In this embodiment, the first circuit board 110 of the panel 1 is a flexible circuit board, and the pins 112 can also be a common gold finger structure. The testing device 200 of the present embodiment is connected to the first circuit board 110 of the panel 1 by the second circuit board 210, so that the panel 1 is electrically connected to the testing device 2 for testing, thereby enabling display. The screen 120 displays the test results. In this embodiment, after the circuit board 110 and the first circuit board 210 are stacked, a pressing member 220 may be disposed on the second circuit board 210 (as shown in FIG. 1B) to make the first circuit board. 11〇 and the second circuit board 210 are closely joined after being stacked. In the embodiment, the shape of the test cymbal 212 is, for example, a circle, and the diameter W2 of the test pads 212 is slightly smaller than the width 201011288 wl of the pin 112, so that the test pad 212 can be completely It is in close contact with the pin 112. For example, when the width w1 of the pin 112 is 0.33 cm (mm), the width w2 of the test pad 212 is, for example, 0.3 cm (mm). Then, please refer to FIGS. 1B and 1C, and FIG. 1C shows according to the first block. A cross-sectional view of the section line 1C-1C in the figure. In this embodiment, the relay member 220 is preferably disposed in a movable manner and correspondingly disposed on the test pad 212. In this way, the tightness between the pin 112 and the test pad 212 can be increased by the weight of the pressing member 220, so that the first circuit board 110 can be closely coupled with the second circuit board 210. Referring to FIG. 1C, in the embodiment, the second circuit board 210 includes a body 202, a plurality of test pads 212, a plurality of test circuits 216, and a plurality of conductive elements 218. The body 202 has a - surface 214 and a second surface 215. The aforementioned test cartridge 212 is disposed on the first surface 214. A plurality of circuits 216 are disposed on the second surface 215. The test circuits 216 are connected to the test device 2 (not shown) 218 and disposed in the body 2〇2, and the pads 212 are electrically connected. This way, the connection is used to pass the test signal of the test system. Furthermore, the test circuit 216 and the corresponding test are further performed by the conductive element
接著’請參照第2圖，Then, please refer to Figure 2,
201011288 放於固定元件的上視圖。於本實施例中，測試裝置2〇〇較佳地 更包括一固定元件230，用以固定第二電路板21〇，以利測試 的進行。這是由於’在實際的操作上，測試人員會測試成千上 萬片的面板，因此將第二電路板210固定於固定元件230後， . 測試人員僅需替換第一電路板110(未繪示），如此可大量減少 . 測試人員的工作。 於本貫施例中，固定元件230較佳地包括一平板232、一 ❿ 疋位板234、一第一定位柱236、一第二定位柱238。平板232 具有一凹槽232a，此凹槽232a係用以置放第二電路板210及 第一電路板110(請參照第3圖），其中凹槽232a係對應疊合後 的第一電路板110及第二電路板21〇之形狀設置，以使疊合後 的第一電路板110及第二電路板21〇能緊密置放於凹槽232a 中。如此一來’便能避免第一電路板110及第二電路板210在 凹槽232a中搖晃。 • 於本實施例中，第一定位柱236例如為2個，設置於平板 - 232的凹槽232a申。此外，第二電路板21〇係對應此些第一 • 疋位柱236具有兩個第一定位孔2i〇a(亦可同時參照第ία 圖）。如此一來，當第二電路板21〇經由第一定位孔21〇&套接 於弟疋位柱236上時，第二電路板21〇便能固定於平板232 的凹槽232a中’以避免第二電路板21〇於χγ方向移動。另 卜疋位板234係用以固定已置放於凹槽232a中之第二電路 板其可以藉由螺絲234a鎖固於平板232上。特別的是， Μ疋位板234固定第二電路板21〇後，此定位板234會恰巧裸 201011288 露出第二電路板210的測試墊212。 接著，請參照第3圖，繪示置放第一電路板於第2圖之第 二電路板之上視圖。於本實施例中，固定元件23〇更包括二第 二定位柱238 ’設置於凹槽232a中。第二定位柱238係分別 對應設置於第二電路板21G之-測試墊212之兩側(如第2圖 所不）’以使第一電路板110置放於凹槽232a中時，此些第二 定位柱238會位於第一電路板11()的兩側。 鲁 糾’由於定位板234的位置會恰巧使第二電路板210裸 露出測試墊212(如第3圖），因此當第一電路板11〇的頂端抵 觸到定位板234時’第-電路板11G的接腳112(因位於另一 面’並不會顯不於第3圖中)便會與第二電路板21〇的測試墊 212里合。此外，再藉由第二定位柱238的輔助，調整第一電 路板110位於第二定位柱238之間。因此，測試人員只要先將 第一電路板110置放於凹槽232a中，將第一電路板11〇推到 • 抵觸到定位板234且位於兩個第二定位柱238間，便可使第一 ' f路板m於乂方向及Y方向同時定位。接著，再藉由壓合 . 件220(未繪示於第3圖中)使第一電路板1丨〇及第二電路板2】〇 緊密接合，即可使接腳112及測試墊212電性耦接。 另外，由於接腳112及測試墊212係採用接觸的方式電性 連接，所以在替換面板1〇〇測試時，僅需移走面板1〇〇，不需 插拔。因此’藉由本實施例的測試裝置進行面板1〇〇的測 忒’可避免因测試多次而造成第一電路板11〇的毁壞，降低面 板100損壞率。 201011288 综合以上所述，本發明之應用於面板之測試裝置，可藉由 藉由測試裝置的測試墊直接與面板的接腳接觸耦接，直接進行 測試’不需插拔。如此一來，即可有效降低在測試中因多次插 拔的面板毁壞率，降低成本。 以上為本案所舉之實施例，僅為便於說明而設，當不能以 此限制本案之意義，即大凡依所列申請專利範圍所為之各種變 換設計，均應包含在本案之專利範圍中。 【圖式簡單說明】 $ 1A®纟本發明祕實施例之測試裝置及面板上視圖； ΐ 1B崎轉第1A ®中职裝置及碰4合之上視圖； f 1C圖、、會不依照第1B圖中剖面線1C-1C的剖面圖； $ 2 圖巾第二電路板置放测定元件的上視 圖；以及 第3圖、S不置放第一電路板於第2圖之第二電路板之上視圖。 201011288 【主要元件符號說明】 wl,w2:寬度 100 :面板 110 :第一電路板 112 :接腳 120 :顯示螢幕 200 :測試裝置 202 :本體 210 :第二電路板 210a :第一定位孔 212 :測試墊 214 ··第一表面 215 :第二表面 216 .測試電路 218 :導電元件 220 :壓合件 230 :固定元件 232 :平板 232a :凹槽 234 :定位板 234a :螺絲 236 :第一定位柱 238 :第二定位柱201011288 placed on the top view of the fixed component. In the present embodiment, the test device 2 〇〇 preferably further includes a fixing member 230 for fixing the second circuit board 21 以 for the test to proceed. This is because 'in actual operation, the tester will test tens of thousands of panels, so after the second circuit board 210 is fixed to the fixed component 230, the tester only needs to replace the first circuit board 110 (not drawn Show), this can be greatly reduced. The tester's work. In the present embodiment, the fixing component 230 preferably includes a flat plate 232, a 疋 clamping plate 234, a first positioning post 236, and a second positioning post 238. The flat plate 232 has a recess 232a for accommodating the second circuit board 210 and the first circuit board 110 (refer to FIG. 3), wherein the recess 232a corresponds to the stacked first circuit board. The 110 and the second circuit board 21 are shaped such that the stacked first circuit board 110 and the second circuit board 21 are tightly placed in the recess 232a. In this way, the first circuit board 110 and the second circuit board 210 can be prevented from being shaken in the recess 232a. In the present embodiment, the first positioning posts 236 are, for example, two, and are disposed in the grooves 232a of the flat plate 232. In addition, the second circuit board 21 has two first positioning holes 2i 〇a corresponding to the first 疋 positions 236 (may also refer to the ία figure). In this way, when the second circuit board 21 套 is sleeved on the 疋 position post 236 via the first positioning hole 21, the second circuit board 21 固定 can be fixed in the recess 232a of the flat plate 232. The second circuit board 21 is prevented from moving in the χγ direction. The pad 234 is used to fix the second circuit board that has been placed in the recess 232a and can be locked to the flat plate 232 by screws 234a. In particular, after the clamping plate 234 is fixed to the second circuit board 21, the positioning plate 234 will just expose the test pad 212 of the second circuit board 210 by naked 201011288. Next, please refer to FIG. 3, which shows a view of placing the first circuit board on the second circuit board of FIG. 2. In this embodiment, the fixing member 23 further includes two second positioning posts 238' disposed in the recess 232a. The second positioning posts 238 are respectively disposed on the two sides of the test pad 212 of the second circuit board 21G (as shown in FIG. 2) to allow the first circuit board 110 to be placed in the recess 232a. The second positioning posts 238 will be located on both sides of the first circuit board 11(). Since the position of the positioning plate 234 happens to expose the second circuit board 210 to the test pad 212 (as shown in FIG. 3), when the top end of the first circuit board 11 is in contact with the positioning plate 234, the first circuit board The 11G pin 112 (because it is located on the other side 'will not appear in Figure 3) will fit into the test pad 212 of the second circuit board 21A. In addition, the first circuit board 110 is disposed between the second positioning posts 238 by the assistance of the second positioning post 238. Therefore, the tester only needs to place the first circuit board 110 in the recess 232a, push the first circuit board 11 to the grounding plate 234, and between the two second positioning posts 238, so that the first An 'f-way board m is simultaneously positioned in the 乂 direction and the Y direction. Then, the first circuit board 1A and the second circuit board 2 are tightly joined by pressing the component 220 (not shown in FIG. 3), so that the pin 112 and the test pad 212 can be electrically connected. Sexual coupling. In addition, since the pin 112 and the test pad 212 are electrically connected by contact, when the panel 1 is replaced, only the panel 1 is removed, and no plugging or unplugging is required. Therefore, the measurement of the panel 1 by the test apparatus of the present embodiment can avoid the destruction of the first circuit board 11 due to the test many times, and reduce the damage rate of the panel 100. In view of the above, the test device applied to the panel of the present invention can be directly tested by the test pad of the test device being directly coupled to the pin of the panel, without the need for plugging and unplugging. In this way, the panel destruction rate due to multiple insertions in the test can be effectively reduced, and the cost can be reduced. The above embodiments of the present invention are provided for convenience of explanation only, and the meaning of the present case cannot be limited thereby, that is, various conversion designs according to the scope of the listed patent application are included in the patent scope of the present application. [Simple diagram of the diagram] $ 1A® 上 The test device and the panel top view of the embodiment of the invention; ΐ 1B The first 1A ® mid-level device and the top view of the touch 4; f 1C map, will not follow the first 1B is a cross-sectional view of the section line 1C-1C; $2 is a top view of the second circuit board on which the measuring element is placed; and FIG. 3, S is not placed on the second board of the second board in FIG. Top view. 201011288 [Main component symbol description] wl, w2: width 100: panel 110: first circuit board 112: pin 120: display screen 200: test device 202: body 210: second circuit board 210a: first positioning hole 212: Test pad 214 · · first surface 215 : second surface 216 . Test circuit 218 : conductive element 220 : press part 230 : fixed element 232 : flat plate 232a : groove 234 : positioning plate 234a : screw 236 : first positioning post 238: second positioning column