KR101249467B1 - Film-type probe block for checking lcd - Google Patents

Abstract

PURPOSE: An LCD testing film type probe block for easy alignment is provided to provide elasticity at the time of contact by pressurizing a film type probe contactor using a tension block, easily perform alignment by the adjustment of the tension block to X, Y and Z directions on a block body, prevent the displacement of the film type probe contactor by elasticity and pressure despite consistent pressurization by forming an inclined surface on the lower surface of the tension block and increasing the pressurization during the time of pressurizing the film type probe contactor, and simultaneously making the input part of a film and an electrode pad exactly connected, thereby increasing the test efficiency. CONSTITUTION: An LCD testing film type probe block includes a block body(10), a tension block(20), guide block(30), a stick bar(40), a probe contactor(50), an FPC(60) and a cover plate(70). The block body having a flat plate shape vertically forms an extension part in the front, an inserting groove on the lower surface of the extension part and an alignment control hole on the upper surface and the side of the extension part. The tension block includes a lower plate having a flat plate shape made of a synthetic resin material and includes a combining protrusion vertically protruded on an upper surface side of the lower plate as an integral part in order to be inserted into the insertion groove of the block body. The tension block is combined to the block body using bolts. The guide block of which a side has a triangular shape is combined to the bottom of the block body. The stick bar is attached and fixed to the bottom plate of the tension block. The probe contactor having a film type including a drive IC(Integrated Circuit) is attached and fixed to the lower surface of the stick bar. The input terminal and the output terminal of the probe contactor are interconnected at the FPC. The cover plate combined to the lower surface of the guide block using bolts fixes the probe contactor and the FPC to the guide block by pressure.

Description

Film type probe block for LCD inspection {FILM-TYPE PROBE BLOCK FOR CHECKING LCD}

The present invention relates to a film type probe block for LCD inspection, and specifically, protrudes a protrusion on the upper end of the tension block, and forms a groove on the bottom of the block body to insert the protrusion into the groove to be easily assembled in a state of assembly. Tension block is used to press the film type probe contactor to provide elasticity upon contact, and the LCD block can be easily aligned by adjusting the tension block in the X, Y, and Z directions on the block body. It relates to a film type probe block for use.

2. Description of the Related Art Generally, an image display device is a device that receives various electrical signals in a panel form, reproduces various images according to a received signal, and displays the images on a panel. The image display device includes a liquid crystal display panel, a plasma display panel (PDP), an active matrix organic light emitting diode display panel ; Usually called an OLED panel).

In recent years, an information exchange apparatus has been developed in which not only image display but also a signal operated by touching or an electrical signal is transmitted to the panel, and the manipulated image is displayed according to the transmitted signal. That is, the information exchange apparatus transmits not only the image but also the operated signal, so that the operation and the image display are simultaneously performed on the panel so that information exchange is possible.

As described above, since various information is exchanged on the panel, the circuit structure on the panel is complicated, and due to the development of portable devices such as mobile phones, miniaturization and electrode pads through which signals are exchanged are directly converted to narrow the gap, The probability of failure is increased. If such defects can not be checked and defects are generated after the subsequent process, there is a problem that the processing cost due to defects is increased.

Therefore, a probe device is used which tests for defects by contacting electrode pads on which signals of the panel are exchanged. Such a conventional probe apparatus is contacted with an electrode pad by a needle or a blade type probe capable of checking the exchange of signals at each position where signals are exchanged, Test. However, a conventional probe device has a problem in that a sharp tip-type probe means is directly contacted to exchange various signals, thereby causing damage to the electrode pad to which the probe means comes in contact, resulting in secondary failure.

Each of the electrode pads is provided with probe means for each of the positions where the signals of the electrode pads are exchanged and is provided so as to be in contact with the electrode pads. By providing the probing means for each signal exchange position of the electrode pads integrated in the narrow space due to miniaturization, It is necessary to perform a test while driving a large number of probe means in a narrow space. Therefore, the apparatus is complicated and it is difficult to determine a large number of signals.

In recent years, a film type test probe device having a circuit pattern to be internally tested in the form of a film and testing the signal generated in the circuit pattern through a printed circuit board and a driving circuit element has been developed and used.

Such a film-type test probe apparatus of the prior art is equipped to test for defects while exchanging a signal to be tested while being movably pressed to connect the input portion of the test film to the electrode pad portion of the panel.

However, in the film type test probe apparatus of the related art, in order to maintain the connection state between the input portion of the film and the electrode pad of the panel, the means to be pressed is a single type However, if the elastic force is reduced by a plurality of times of use, there is a problem that it is difficult to maintain the connected state without returning to the original state.

The film-type test probe device of the prior art is supported by the lower part of the body and is inclined with respect to the film. As the input part of the film is pressed during each test, the position of the test film is displaced by the continuous pressing operation, The input portion of the film and the electrode pad are not correctly connected to each other.

Further, the probe is easily deformed by the pressure when the probe and the LCD are in contact with each other, and the repeated reliability of the probe is lowered due to deformation.

Further, since the probe is formed as a needle or a blade type, there is a problem that the degree of freedom of arrangement is lowered.

In order to solve this problem, Korean Patent Registration No. 10-1070332 (Probe Unit) has been posted.

1 to 3, the probe unit 100 includes a probe block 110, a pressure block 120, a probe sheet 130, a first connection sheet 140, a second connection sheet 150, The probe holder 160 and the window block 170 are included.

The probe block 110 is provided as a block having a generally cuboid shape. The top surface of the probe block 110 is stepped so that the leading end portion is provided higher than the rear end. A fastening groove (not shown) is formed at the top end of the probe block 110. A bolt for fastening the fixing plate 860 and the probe block 110 is inserted into the fastening groove. A fastening groove 115 is formed on the bottom of the probe block 110. The fastening groove 115 is inserted with a bolt 164 for fastening the probe holder 160 and the probe block 110. The bottom of the probe block 110 is inclined upward so that its height gradually increases from the front end to the rear end. The groove 111 is formed at the lower end of the probe block 110. The groove 111 is formed along the width direction of the probe block 110. The first fastening hole 112 is formed at one side of the probe block 110 forming the groove 111.

The pressing block 120 is located in the groove 111. The pressing block 120 contacts the contact lines of the probe sheet 130 and the connection terminals of the flat panel display panel (not shown). The press block 120 is provided with an elastic material. The pressing block 120 presses the flat panel display panel D at a predetermined pressure. The second fastening hole 121 is formed in the pressing block 120. The second fastening hole 121 is provided as a through hole extending from the front surface of the pressing block 120 to the rear surface. The bolt 122 is inserted into the second fastening hole 121 and the first fastening hole 112. The bolt 122 couples the pressure block 120 and the probe block 110.

The pressure plate 123 protrudes forward from the lower end of the pressure block 120. The pressure plate 123 has a thin plate shape.

The pressure plate 123 has a length smaller than the width in the first direction X of the probe sheet 130 described later. The bottom of the pressure plate 123 is inclined upward from the front end to the rear end. The bottom of the pressure plate 123 has a first region 123a and a second region 123b. The first region 123a is inclined upward at the first angle θ1. The second region 123b extends from the first region 123a and is inclined upward at the second angle θ2. The second angle θ2 is an angle greater than the first angle θ1. The bottom of the pressure block 120 extending from the bottom of the pressure plate 123 is inclined upward at the same angle as the second region 123b. The bottom of the pressing block 120 has the same inclination angle as the bottom of the probe block 110 and is located on the same plane.

An elastic groove 124 is formed along the first direction X in the upper portion of the pressure plate 123. The elastic groove 124 extends into the pressing block 120 from the front surface of the pressing block 120. The elastic groove 124 is formed by the upper surface 124a, the lower surface 124b, and the inner surface 124c. The upper surface 124a and the lower surface 124b are surfaces extending from the front surface of the pressing block 120 to the inside of the pressing block 120 and are formed in parallel with each other. The upper surface 124a and the lower surface 124b may extend upwardly inclined. The inner side surface 124c is located inside the pressing block 120 and connects the upper surface 124a and the lower surface 124b. The inner surface 124c may be formed perpendicular to the upper surface 124a and the lower surface 124b. Alternatively, an area where the inner surface 124c is connected to the upper surface 124a and the lower surface 124b may be rounded. The lower surface 124b is provided as an upper surface of the pressure plate 123.

An inspection groove 126 is formed on the front surface of the pressing block 120. The inspection grooves 126 are formed in both edge regions of the pressing block 120, respectively. The inspection groove 126 extends from the upper surface of the pressing block 120 along the third direction Z to the lower surface. As viewed from the top, the inspection groove 126 is located outside the pressing plate 123 along the first direction X, and the alignment regions of the probe sheet 130 are respectively formed in the region where the inspection groove 126 is formed. Located.

However, this probe unit is difficult to assemble because it is coupled from the front of the probe block, there is a problem that the alignment of the pressure block is impossible to adjust the alignment.

Domestic patent registration 10-1070332

The present invention is to solve the problems as described above, by using a tension block in the state of easily assembled by protruding the protrusions on the upper end of the tension block, forming a groove on the bottom of the block body by inserting the protrusions into the groove. Film type probe for LCD inspection that pressurizes the film type probe contactor to provide elasticity upon contact and to easily align the tension block by adjusting the tension block in the X, Y, and Z directions. The purpose is to provide a block.

In addition, the present invention is to form an inclined surface on the bottom surface of the Tenseon block to increase the pressing force when pressing the film-type probe contactor to block the displacement of the film-type probe contactor even in the continuous pressing operation by the elasticity and pressure and At the same time, another object is to provide a film type probe block for LCD inspection which allows the input part of the film and the electrode pad to be connected correctly.

According to an aspect of the present invention,

A block body which is formed in a flat plate shape and has an extension portion perpendicular to the front end, an insertion groove is formed in a bottom surface of the extension portion, and an alignment control hole is formed in the upper surface and the side of the extension portion; A tension block which is bolted to the block body by being provided with a synthetic resin material, the lower plate having a flat plate shape and a coupling protrusion protruding vertically integrally from one side of the upper surface of the lower plate so as to be inserted into the insertion groove of the block body; A guide block having a side shape formed in a triangular shape and bolted to a lower end of the block body; A stick bar adhesively fixed to the lower plate of the tension block; A probe type contactor having a drive IC and adhesively fixed to the bottom of the stick bar; An FPC having an input terminal of the probe contactor and an output terminal thereof coupled to each other; And a cover plate bolted to the bottom of the guide block to press-fix the probe contactor and the FPC to the guide block.

Here, the alignment adjusting hole of the block body is formed so as to communicate with the insertion groove on the upper surface thereof to adjust the tension block in the X direction; A second alignment adjusting hole formed to communicate with the insertion groove at the front of the extension part to adjust the tension block in the Y direction; And a third alignment adjusting hole formed on both sides of the extension part to communicate with the insertion groove to adjust the tension block in the Z direction.

Here, the lower plate of the tension block has a gap g spaced apart from the bottom surface of the extension part of the block body to have elasticity.

Here, the lower plate of the tension block is provided with an inclined surface on the bottom surface to increase the pressing force.

Here, the lower plate of the tension block is formed with a mounting groove so that the stick bar is inserted into the bottom surface.

Here, the tension block is coupled to the outside by the bolt is fastened on the inner side of the extension of the block body to maximize the tightening force.

According to the LCD inspection film type probe block of the present invention is configured as described above, the protrusion is projected on the upper end of the tension block, the groove is formed on the bottom surface of the block body, the protrusion is inserted into the groove to be easily assembled in the state The tension block is used to press the film-type probe contactor to provide elasticity upon contact, and the tension block can be easily aligned in the X, Y, and Z directions in the block body.

In addition, according to the present invention by forming an inclined surface on the bottom surface of the line block block to increase the pressing force when pressing the film-type probe contactor to block the displacement of the film-type probe contactor even in the continuous pressing operation by the elasticity and pressure At the same time, the input portion of the film and the electrode pad can be accurately connected to increase the inspection efficiency.

1 to 3 is a view showing the configuration of a conventional probe unit.
Figure 4 is a perspective view showing the configuration of a film type probe block for LCD inspection according to the present invention.
5 is an exploded perspective view of Fig.
6 is a side view of Fig.
7 is a cross-sectional view taken along line AA of FIG. 4.
8 is a perspective view showing the configuration of a probe unit to which the film type probe block for LCD inspection according to the present invention is coupled.
9 is an explanatory diagram showing a state in which the tension block of the LCD type probe block for LCD inspection according to the present invention is adjusted in the X, Y, and Z directions.
10 is a side view showing a state of contact with the test pad of the LCD type film inspection probe block and the LCD according to the present invention.

Hereinafter, the configuration of an LCD inspection film type probe block according to the present invention will be described in detail with reference to the accompanying drawings.

In the following description of the present invention, detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear. The following terms are defined in consideration of the functions of the present invention, and may be changed according to the intentions or customs of the user, the operator, and the like. Therefore, the definition should be based on the contents throughout this specification.

Figure 4 is a perspective view showing the configuration of a film type probe block for LCD inspection according to the invention, Figure 5 is an exploded perspective view of Figure 4, Figure 6 is a side view of Figure 4, Figure 7 is a cross-sectional view of Figure 4, 8 is a perspective view showing the configuration of a probe unit to which the film type probe block for LCD inspection according to the present invention is coupled.

4 to 8, the film type probe block 1 for LCD inspection according to the present invention includes a block body 10, a tension block 20, a guide block 30, a stick bar 40, and a probe contact. The rotor 50, the FPC 60, and the cover plate 70 are included.

First, the block body 10 is formed of a metal material in the form of a flat plate, an extension portion 11 is formed perpendicularly to the front end, an insertion groove 13 is formed on the bottom of the extension portion 11, the upper surface and the extension portion (11) The alignment control hole 15 is formed on the side. Here, the alignment adjusting hole 15 of the block body 10 is formed to communicate with the insertion groove 13 on the upper surface thereof to adjust the first alignment block for adjusting the tension block 20 to be described below in the X direction. The second alignment adjusting hole 15b and the extension part 11 are formed to communicate with the insertion groove 13 at the front of the hole 15a and the extension part 11 to adjust the tension block 20 in the Y direction. It is formed to communicate with the insertion groove 13 on both sides is made of a third alignment adjustment hole (15c) for adjusting the tension block 20 in the Z direction. At this time, each of the set screw 17 is inserted into the alignment adjusting hole 15 to move the tension block 20.

In addition, the tension block 20 is a synthetic resin material, and a projection protrusion integrally vertically protruding integrally from one side of the upper surface of the lower plate 21 so as to be inserted into the lower plate 21 of the flat plate shape and the insertion groove 13 of the block body 10 ( 23 is provided and bolted to the block body (10). Here, the tension block 20 is preferably formed of polyether ether ketone (PEEK) or polyetherimide (PEI) of the synthetic resin material. Here, the tension block 20 is adjusted in the X, Y, and Z directions by the alignment adjusting holes 15 of the block body 10, and the extension 11 of the block body 10 to maximize the tightening force. ) The bolt is fastened on the inner side and coupled to the outer side. Here, the lower plate 21 of the tension block 20 is preferably spaced apart from the bottom surface of the extension portion 11 of the block body 10 so as to have elasticity to have a gap g, and to increase the pressing force. An inclined surface 25 is provided at a bottom thereof, and a seating groove 27 is formed at the bottom thereof so that the stick bar 40 to be described below is inserted.

In addition, the guide block 30 is formed of a metal material in a triangular shape of the side shape, is bolted to the lower end of the block body (10).

In addition, the stick bar 40 (Stick bar) is formed in the shape of a rectangular plate made of metal or synthetic resin material, and is fixed to the lower plate of the tension block 20 by double-sided tape.

On the other hand, the probe contactor 50 is a film type having a conventional structure and having an output terminal at one end, an input terminal at the other end, and a drive IC electrically coupled to the input terminal and the output terminal at the center, And adhered and fixed to the bottom surface of the bar 40 with an adhesive.

The FPC 60 has a conventional structure in which an input terminal of the probe contactor 50 and an output terminal thereof are joined to each other.

In addition, the cover plate 70 is formed in a plate shape of a metal material, and bolted to the bottom of the guide block 30 to press-fix the probe contactor 50 and the FPC 60 to the guide block 30.

On the other hand, the plurality of LCD inspection film type probe block 1 according to the present invention is coupled to the probe unit (3) as shown in FIG.

Hereinafter, an operation of the LCD inspection film type probe block according to the present invention will be described in detail with reference to the accompanying drawings.

9 is an explanatory view showing a state in which the tension block of the LCD type probe block for LCD inspection according to the present invention is adjusted in the X, Y, Z directions, and FIG. 10 is a film type probe block and LCD for LCD inspection according to the present invention. Side view showing the state of contact with the test pad.

The LCD inspection film type probe block 1 according to the present invention is mounted on the probe unit 3 in an assembled state.

In this state, when the test pad 7 of the LCD 5 and the X-contact alignment of the probe contactor 50 do not match, as shown in FIG. 9, the set screw of the first alignment adjusting hole 15a ( 17) to adjust the position of the tension block 20 in the X direction.

If the alignment of the test pad 7 of the LCD 5 and the Y-contact of the probe contactor 50 does not match, the tension block 20 is adjusted by adjusting the set screw 17 of the second alignment adjusting hole 15b. Adjust the position of Y direction.

In addition, when the alignment of the test pad 7 of the LCD 5 and the Z-contact of the probe contactor 50 does not match, the tension block 20 is adjusted by adjusting the set screw 17 of the third alignment adjusting hole 15c. Adjust the position of Z direction.

Meanwhile, when the probe contactor 50 contacts the test pad 7 of the LCD 5, sufficient elasticity is provided by the lower plate 21 itself of the tension block 20 and the gap g.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. It is to be understood, however, that the invention is not to be limited to the specific forms thereof, which are to be considered as being limited to the specific embodiments, but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims. .

10: block body 20: tension block
30: guide block 40: stick bar
50: probe contactor 60: FPC
70: cover plate

Claims (6)

A block body which is formed in a flat plate shape and has an extension portion perpendicular to the front end, an insertion groove is formed in a bottom surface of the extension portion, and an alignment control hole is formed in the upper surface and the side of the extension portion;
A tension block which is bolted to the block body by being provided with a synthetic resin material, the lower plate having a flat plate shape and a coupling protrusion protruding vertically integrally from one side of the upper surface of the lower plate so as to be inserted into the insertion groove of the block body;
A guide block having a side shape formed in a triangular shape and bolted to a lower end of the block body;
A stick bar adhesively fixed to the lower plate of the tension block;
A probe type contactor having a drive IC and adhesively fixed to the bottom of the stick bar;
An FPC having an input terminal of the probe contactor and an output terminal thereof coupled to each other; And
And a cover plate bolted to the bottom of the guide block to press-fix and fix the probe contactor and the FPC to the guide block. The method of claim 1,
Alignment adjustment hole of the block body,
A first alignment adjusting hole formed to communicate with the insertion groove on an upper surface thereof to adjust the tension block in the X direction;
A second alignment adjusting hole formed to communicate with the insertion groove at the front of the extension part to adjust the tension block in the Y direction; And
And a third alignment adjusting hole formed on both sides of the extension part so as to communicate with the insertion groove to adjust the tension block in the Z direction. The method of claim 1,
The lower plate of the tension block,
The film type probe block for LCD inspection, characterized in that it has a gap (g) spaced apart from the bottom of the extension portion of the block body to have elasticity. The method of claim 1,
The lower plate of the tension block,
Film type probe block for LCD inspection, characterized in that the inclined surface is provided on the bottom to increase the pressing force. The method of claim 1,
The lower plate of the tension block,
The film type probe block for LCD inspection, characterized in that the mounting groove is formed so that the stick bar is inserted into the bottom surface. The method of claim 1,
The tension block,
Film-type probe block for LCD inspection, characterized in that the bolt is fastened on the inner side of the extension of the block body to maximize the fastening force is coupled to the outside.

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