KR100854757B1 - The Probe Device and Probe Block for Display Panel Test using the Device - Google Patents

Abstract

The present invention relates to a probe block for inspecting a display panel, and in particular, by implementing an array pitch as the probe itself through a pitch implementation, not only a compact but precise array pitch can be realized in an easy operation, but also a plurality of electrodes to be densified. It is possible to carry out an accurate inspection process according to the pad, and even if the repair or repair is impossible due to damage or deformation of some of the probes, only the damaged or deformed parts can be replaced, thereby making maintenance and maintenance easier. The present invention relates to a probe that can reduce cost and a probe block for inspecting a display panel using the same.

Probe according to an embodiment of the present invention for this purpose is a probe pin for directly contacting a plurality of electrode pads provided in the display panel to transfer an electrical signal; And a pitch implement part formed at an outer side of the probe pin to receive the probe pin therein, to implement a pitch corresponding to the pitch in which the plurality of electrode pads are arranged, and to insulate adjacent probe pins. .

Probe, Pitch, Electrode Pad, Display, Probe Pin

Description

Probe Device and Probe Block for Display Panel Test using the Device}

1 is a perspective view of a conventional probe block for display panel inspection

Figure 2 is a perspective view of a slot structure for fixing the probe in a conventional probe block

3 is a perspective view showing a first probe according to an embodiment of the present invention;

4 is a perspective view showing a second probe according to an embodiment of the present invention;

5 is a perspective view showing a combination of probe blocks according to another embodiment of the present invention;

6 is an exploded perspective view of a probe block according to another embodiment of the present invention;

Figure 7 is an exploded perspective view of the probe assembly in the probe block according to another embodiment of the present invention

8 is an exploded cross-sectional view of a probe assembly in a probe block according to another embodiment of the present invention.

9 is a cross-sectional view of the probe assembly in the probe block according to another embodiment of the present invention

* Description of the symbols for the main parts of the drawings *

2: probe 2a according to an embodiment of the present invention: first probe 2b: second probe

3: probe block for inspecting the display panel according to another embodiment of the present invention

4: connecting substrate 10: conventional probe block for display panel inspection

11 block base 12 connecting substrate 13 probe assembly 14 probe pin

15: slot structure 15a, 15b: external socket 16a, 16b: slot 22: pitch implementation

31: probe assembly 32: flow preventing part 32a: first flow preventing part

32b: second flow prevention part 33: block base 34: connection block 35: reinforcement block

211 pad contact portion 212 substrate contact portion 221 body 221a protrusion

222: pad interference prevention unit 223: substrate interference prevention unit 224: pad connection unit

225: substrate connection portion 311: housing 311a: side wall 311b: front 311c: rear

311d: upper surface 312: cover part 312a: first cover part 312b: second cover part

312c: width 321: flow preventing groove 331: coupling protrusion 341: seating hole 342: fastening protrusion

351: through hole 3111: probe receiving groove 3112: insertion groove 3113: coupling groove

3114: cover coupling groove 3121: guide groove 3122: insertion hole

The present invention relates to an inspection apparatus for inspecting a display panel, and more particularly, a probe for inspecting a defect of a display panel by directly contacting a plurality of probes to a plurality of electrode pads provided in the display panel, and a display panel inspection using the same. Relates to a probe block.

In general, display panels such as liquid crystal display devices are rapidly developed in size and high resolution due to mass production technology and research and development, and have been developed not only for notebook computers but also for applications such as large monitors, LCDs, PDPs, and mobile phones. It is gradually replacing CRT (Cathode Ray Tube) products, and its share in the display industry is gradually increasing.

Such a display panel is disposed on two substrates so that the surfaces on which two electrodes are formed are faced to each other, a liquid crystal material is injected between the two substrates, and an electric field generated by applying a voltage to the two electrodes. An apparatus for expressing an image by changing the transmittance of light by moving the liquid crystal molecules, and includes a drive circuit (Drive IC).

The driving circuit displays an image by applying an electrical signal to a pixel area of a display panel defined by crossing a plurality of gate lines and data lines, and, like a semiconductor chip, displays the image on a display panel before mounting the display panel to a product. An electrical signal is applied to inspect whether a pixel is defective or not, and includes a plurality of electrode pads.

1 is a perspective view of a probe block for a conventional display panel inspection.

Referring to FIG. 1, the conventional display panel inspection probe block 10 directly contacts a plurality of electrode pads provided in the display panel, and electrically connects the plurality of electrode pads and the inspection system to inspect for defects. The block base 11 includes a block base 11, a connecting substrate 12, and a probe assembly 13.

The block base 11 is mounted on one side of the inspection system, and the other side is coupled to the upper surface of the probe assembly 13 to support the probe assembly 13.

The connection substrate 12 is connected to the inspection system, and electrically connects the plurality of electrode pads and the inspection system through the probe assembly 13 at the bottom of the block base 11.

The probe assembly 13 accommodates a plurality of probe pins 14 therein, a plurality of probe pins 14 protrudes downward from one side, and a plurality of probe pins 14 on the other side of the connection board. (12) to make it possible to electrically connect the plurality of electrode pads and the inspection system.

The plurality of probe pins 14 directly contact a plurality of electrode pads provided in the display panel, and directly contact the connection board 12 to transmit electrical signals, and each probe pin 14 has a plurality of electrode pads. Each pitch is spaced apart by the same distance as the pitch, and this pitch implementation is an important factor in ensuring accurate inspection results.

2 is a perspective view of a slot structure for fixing a probe in a conventional probe block, a plurality of probe pins are fixed to the probe assembly while being implemented in a pitch corresponding to a plurality of electrode pads using various configurations and methods, as an example Figure shows the slot structure used.

1 and 2, the slot structure 15 includes a pair of external sockets 15a and 15b in which a plurality of slots 16a and 16b are formed, and a plurality of slots 15a and 15b are formed between the external sockets 15a and 15b. The probe pin 14 is inserted and fixed.

The slots 16a and 16b are grooves formed by recessing at a predetermined depth on one surface of the external sockets 15a and 15b, and the probe pins 14 are inserted and fixed in each groove, and are spaced apart by the same distance. The distance from which the slots 16a and 16b are spaced is formed to match the pitch of the plurality of electrode pads, thereby implementing the pitch of the plurality of probe pins 14.

In the conventional display panel inspection probe block 10, in order to derive an accurate inspection result, a pitch in which a plurality of electrode pads are arranged and a pitch in which the probe pins 14 are arranged are required to match. , 16b) is generally formed through machining, which makes it difficult to realize a precise pitch.

In addition, with the development of the display technology, a plurality of electrode pads are implemented with fine pitch, which is gradually densified. Accordingly, the probe pin 14 and the slots 16a and 16b implementing the pitch are correspondingly formed. The array pitch must also be densified together, but due to the high strain rate of the material due to machining, there is a limit to the micromachining, thereby increasing the difficulty of achieving a dense pitch.

In addition, when damage or deformation occurs in the slots 16a and 16b due to the continuous use and the mistake of the person performing the inspection, as the arrangement pitches of the slots 16a and 16b are denser, the difficulty of maintenance work increases in proportion. If one slot 16a or 16b is damaged and cannot be repaired, the entire slot structure 15 needs to be replaced, thereby increasing the maintenance cost.

The present invention has been made to solve the above problems, an object of the present invention is a probe that can implement a precise pitch corresponding to the arrangement pitch of the plurality of electrode pads provided in the display panel and a probe block for display panel inspection using the same The purpose is to provide.

Another object of the present invention is to implement a precise pitch in an easy configuration, even if the damage or deformation occurs in some parts can be replaced only the damaged or deformed portion can be replaced to reduce the ease of maintenance work and maintenance costs An object of the present invention is to provide a probe that can be used and a probe block for inspecting a display panel using the same.

Another object of the present invention is to meet the phenomenon that the arrangement pitch of a plurality of electrode pads is densified due to the rapid development of the display technology field, it is possible to implement a dense pitch corresponding to the arrangement pitch, and accordingly whether the display panel is defective An object of the present invention is to provide a probe capable of acquiring an accurate inspection result and a probe block for inspecting a display panel using the same.

A probe for achieving the object of the present invention described above and a probe block for inspecting a display panel using the same includes the following configuration.

Probe according to an embodiment of the present invention is a probe pin for directly contacting a plurality of electrode pads provided in the display panel to transfer an electrical signal; And a pitch implement part formed at an outer side of the probe pin to receive the probe pin therein, to implement a pitch corresponding to the pitch in which the plurality of electrode pads are arranged, and to insulate adjacent probe pins. .

In addition, the probe block for display panel inspection according to another embodiment of the present invention, the probe assembly having a probe receiving groove in which a plurality of probes are arranged in a stack, the pitch assembly is implemented by the pitch implement; A block base to which the probe assembly is coupled and mounted to an inspection system; And a connection block to which a connection substrate is coupled and coupled to the block base.

Therefore, by implementing the arrangement pitch as the probe itself through the pitch implementation, it is possible to form a precise pitch with an easy configuration, to perform an accurate inspection process for the arrangement pitch of the plurality of electrode pads to be densified, some probes In the event of damage or deformation, only the damaged or modified probe can be replaced, thereby reducing the ease of maintenance and maintenance costs.

Herein, the present invention provides a probe block for testing a display panel according to another embodiment of the present invention for accommodating a probe according to an embodiment of the present invention capable of implementing a precise pitch with an easy configuration, and receiving the probe and connecting the test system. It includes.

Hereinafter, with reference to the accompanying drawings, a preferred embodiment of the configuration of a probe according to an embodiment of the present invention among the above-described embodiments will be described in detail.

3 is a perspective view showing a first probe according to an embodiment of the present invention.

Referring to FIG. 3, the probe 2 according to an embodiment of the present invention contacts one side of the electrode pad and the other side of the probe board to be connected to the inspection system to perform an inspection process on the display panel. The configuration includes a probe pin and a pitch implementing portion 22.

The probe pin is configured to electrically connect a plurality of electrode pads and a connection board. The pitch implementation part 22 is formed at an outer side thereof, and is accommodated in the pitch implementation part 22. 211 and the substrate contact portion 212.

The pad contact portion 211 is configured to be in direct contact with a plurality of electrode pads, and a surface contacting the plurality of electrode pads is exposed to the outside of the pitch implementing portion 22, and downwards to contact the plurality of electrode pads. Bent in the B direction).

The substrate contact portion 212 is configured to be in direct contact with a connecting substrate, and the surface contacting the connecting substrate is exposed to the outside of the pitch implementing portion 22, and is bent upwards (arrow C direction) to contact the connecting substrate. Is formed.

On the other hand, the specific shape of the probe pin may be formed in a thin plate shape substantially coincident with the pitch implementation portion 22 formed on the outside.

The pitch implementing unit 22 is formed on the outside of the probe pin to accommodate the probe pin therein, and implements the pitch of the probe 2 to its thickness while insulating the probe pins arranged adjacent to each other. The structure includes a main body 221, a pad interference prevention part 222, a substrate interference prevention part 223, a pad connection part 224, and a substrate connection part 225.

In addition, the pitch implementing unit 22 is preferably formed by coating a Ferline (Paryline) on the probe pin, the pitch may be implemented as the probe 2 itself by the pitch implementing unit 22, the conventional machine By solving the difficulty of pitch implementation due to the limitation of machining, it is possible not only to realize precise pitch with easy machining, but also to replace only some damaged probes 2 when some probes 2 are damaged. Can be implemented.

The main body 221 is formed in a rectangular plate as a whole, and comprises a protrusion 221a protruding from both upper ends, for receiving the probe 2 is coupled to the probe block according to another embodiment of the present invention Configuration.

The pad interference prevention portion 222 is formed on the outside while exposing one surface of the pad contact portion 211, while extending in the direction (arrow B direction) in contact with the electrode pad, both sides are reduced in diameter to form a stage. It is formed to extend.

When the pad interference prevention part 222 is formed in a stepless shape, the lapping process is performed to uniformly form the outer surface after the pitch implementing part 3 is formed by using a perlin coating. This is because foreign matters may remain during the lapping process, and thus, interference between the adjacent arrayed probes 2 may occur, thereby causing a problem in that the plurality of electrode pads may not be accurately contacted.

Therefore, in order to prevent this, the pad interference prevention part 222 is formed in a step, thereby preventing interference between the pad contact parts 211 in contact with the plurality of electrode pads, thereby providing a more accurate inspection process. Make it work.

In addition, in the lapping process, a lapping film is attached onto an auto lapping machine or a lapping jig, and the lapping process is preferably performed by a user.

The substrate interference preventing part 223 is formed on the outside while exposing one surface of the substrate contacting part 212. The substrate interference preventing part 223 extends in a direction (arrow C direction) in contact with the connection substrate, and both sides are reduced in diameter to form a step. It is formed to extend.

As described above, the substrate interference prevention unit 223 prevents interference between the substrate contacting units 212 in contact with the connection substrate like the pad interference prevention unit 222 so as to perform a more accurate inspection process. It is formed in a stage.

The pad connection part 224 is configured to connect the main body 221 and the pad interference prevention part 222, and the pad contact part 211 may contact the plurality of electrode pads at one lower end of the main body 221. It is formed extending in length.

The substrate connecting portion 225 connects the main body 221 and the substrate interference prevention part 223 to a length that allows the substrate contacting part 212 to contact the connecting substrate at the other end of the lower side of the main body 221. It is formed to extend.

Hereinafter, with reference to the accompanying drawings a preferred embodiment of the configuration of the probe block for testing the display panel according to another embodiment of the present invention, which receives the probe from the above-described embodiments of the present invention and connects with the inspection system in detail. Explain.

5 is a combined perspective view of a probe block according to another embodiment of the present invention.

Referring to FIG. 5, the probe block 3 for inspecting a display panel according to another embodiment of the present invention may include a probe assembly 31, a flow preventing part 32, a block base 33, a connection block 34, and reinforcement. Block 35.

6 is an exploded perspective view of a probe block according to another embodiment of the present invention, Figure 7 is an exploded perspective view of the probe assembly in the probe block according to another embodiment of the present invention.

5 to 7, the probe assembly 31 is accommodated by stacking a plurality of probes 2, and allowing the probes 2 to contact the plurality of electrode pads and the connection board 4, respectively. , Housing 311, cover 312 and pad (not shown).

Therefore, since the pitch of the probe block 3 is realized by the pitch implementing unit 22 without additional machining, a precise pitch corresponding to the electrode pad densified by stacking the probes 2 can be realized. .

In addition, the connection substrate 4 has a drive IC mounted on one side thereof, and connects the drive IC to the inspection system and the probe 2, respectively, so that the inspection process for the display panel can be performed. Configuration.

The housing 311 constitutes a main body of the probe assembly 31. The housing 311 accommodates a plurality of probes 2 therein and is coupled to the block base 33, and includes a probe accommodation groove 3111 and an insertion groove. 3112, the coupling groove 3113, and the cover part coupling groove 3114.

The probe accommodating groove 3111 is an open space defined by both side walls 311a of the housing 311, and is accommodated and fixed while a plurality of probes 2 are stacked and arranged, and the main body of the probe 2 ( It is formed in a shape substantially coincident with 221, and the distance between the side walls 311a is preferably formed to have a length corresponding to the inspection area to be examined by the probe block (3).

On the other hand, the probe receiving groove 3111 can be accommodated and fixed while the above-described probes 2 are stacked and arranged, but the probe receiving grooves 3111 can be accurately contacted with the pitches of the electrode pads without causing interference between adjacent probes 2 arranged adjacently. As shown in FIG. 5, it is preferable that the probes 2, which may be in zigzag contact with a plurality of electrode pads, may be sequentially stacked.

4 is a perspective view showing a second probe according to an embodiment of the present invention.

Thus, referring to FIGS. 3 to 5, the probe accommodating groove 3111 may be fixed while being sequentially stacked with a first probe as shown in FIG. 3 and a second probe as shown in FIG. 4. The first probe 2a and the second probe 2b are formed with different lengths of the pad connection part 224 and the substrate connection part 225, respectively.

In more detail, the first probe (2a) and the second probe (2b) is approximately equal to the total length (L1, L2), the pad connector 224 is the first probe (2a) and the second probe Each of the substrate connectors 225 is formed to have different lengths A2 and B2 at the first probe 2a and the second probe 2b at (2b). .

In addition, referring to FIG. 3, the first probe 2a has a length A1 of the pad connection part 224 longer than the length A2 of the substrate connection part 225, and the second probe 2b. Referring to FIG. 4, the length B2 of the board connection part 225 is formed longer than the length B1 of the pad connection part 224.

Here, as described above, since the total length L1 of the first probe 2a and the total length L2 of the second probe 2b are substantially coincident with each other, the pad connection part 224 of the first probe 2a is provided. The length (A1) of the second probe (2b) is approximately the same as the length (B2) of the substrate connection portion 225, the length (A2) of the substrate connection portion 225 in the first probe (2a) It is preferably formed to substantially match the length B1 of the pad connection portion 224 of the probe 2b.

Meanwhile, referring to FIG. 3, the pad connecting portion 224 of the first probe 2a further includes a pad protrusion 2241, and the pad protrusion 2241 is upward from the pad connecting portion 224 (arrow C). Direction) is a rectangular plate-like protrusion formed by protruding a predetermined length, and configured to guide the position of the first probe 2a when the first probe 2a is accommodated in the probe block according to another embodiment of the present invention. to be.

In addition, referring to FIG. 4, the substrate connector 225 of the second probe 2b further includes a substrate protrusion 2251, and the substrate protrusion 2251 is downward from the substrate connector 225 (arrow B). Direction) is a rectangular plate-shaped protrusion which is formed to protrude a predetermined length, and guides the position of the second probe 2b when the second probe 2b is accommodated in the probe block according to another embodiment of the present invention. Configuration.

Accordingly, the probe receiving groove 311 may be accommodated and fixed while the probe 2 of the first probe 2a or the second probe 2b is stacked and arranged, but the first probe 2a ) And the second probe 2b are sequentially stacked and accommodated and fixed so that the second probe 2b can be accurately contacted with the pitch of the electrode pads without causing interference between adjacent probes 2 arranged adjacent to each other.

Referring to FIG. 7, the insertion groove 3112 is a cylindrical groove formed by recessing a predetermined depth in the front surface 311b and the rear surface 311c of the housing 311, and the housing 311 and the cover portion 312. It is a configuration for assisting the firm coupling and guide the coupling position of the housing 311 and the cover 312 can be formed of a plurality of grooves spaced at a certain distance so as to implement a robust yet easy coupling between each other and , Preferably, two grooves.

6 and 7, the coupling groove 3113 is a cylindrical groove formed by recessing a predetermined depth in the upper surface 311d of the housing 311, and firmly secures the housing 311 and the block base 33. It is a configuration for assisting the coupling and to guide the coupling position, and may be formed of a plurality of grooves spaced at a predetermined distance so as to implement a strong and easy coupling between the housing 311 and the block base 33, preferably May be formed of two grooves.

The cover part coupling groove 3114 is a groove formed in a 'b' shape on both side walls 311a of the housing 311, and the cover part 312 at the front surface 311b and the rear surface 311c of the housing 311. ) Is inserted and detachably coupled, it is a configuration for guiding the position of the cover portion 312, it is preferable that the cover portion 312 is formed in a shape substantially coincident with both sides.

In addition, the housing 311 may include a fastening groove 311e for coupling the probe assembly 31 and the block base 33 through separate fasteners, and the front surface 311b of the housing 311. ) And the rear surface 311c may include a plurality of fastening grooves 311f to be coupled to the cover portion 312 through separate fasteners.

The cover part 312 is detachably coupled to the housing 311 and is provided in the main body 221 of the probe 2 in a state in which the probe 2 is inserted into the probe accommodation groove 3111. The lower side of the protrusion 221a supports and is fixed, and includes a guide groove 3121 and an insertion hole 3122.

In addition, the cover part 312 is composed of a first cover part 312a and a second cover part 312b respectively coupled to the front surface 311b and the rear surface 311c of the housing 311, thereby providing the probe assembly ( It is possible to implement the ease of the assembly process of 31).

The guide groove 3121 is a groove formed by recessing a predetermined depth in the lower surface of the cover portion 312, and is formed to have a length substantially equal to the width 312c of the cover portion 312, and the first probe 2a. The pad protrusion 2241 of FIG. 2 is inserted, thereby guiding the coupling position where the plurality of probes 2 can be stably contacted with the electrode pad and the connection board, thereby facilitating the assembly process of the probe assembly 31. Can be implemented.

The insertion hole 3122 is a cylindrical protrusion formed to protrude to a predetermined length and is inserted into the insertion groove 3112 of the housing 311 to assist the housing 311 and the cover 312 to be firmly coupled. At the same time, guide the coupling position of the cover portion 312.

Although not shown, the pad is provided in the probe accommodation groove 3111, and when the plurality of probes 2 are stacked, the pads elastically support the plurality of stacked probes 2. Accordingly, even when the probe block 3 is continuously used, the tension of the probe 2 is prevented from being lowered, so that an accurate inspection process can be performed for a long time.

8 is an exploded cross-sectional view of the probe assembly in the probe block according to another embodiment of the present invention, Figure 9 is a cross-sectional view of the probe assembly in the probe block according to another embodiment of the present invention.

7 to 9, the flow preventing part 32 is configured to fix a plurality of probes 2 stacked on the probe accommodation grooves 3111, and adheres to the probes 2 through an adhesive means. And, the probe (2) is in contact with the electrode pad to prevent the minute flow is generated in the process of performing the inspection to perform a more accurate inspection process, and includes a flow preventing hole 321.

The flow preventing hole 321 is a plurality of through holes formed spaced apart at equal intervals in the flow preventing portion 32, the pad protrusion 2221 or the substrate protrusion 2251 of the probe 2 is inserted from one side To penetrate to the other side, thereby firmly fixing the probe (2).

On the other hand, the flow preventing part 32 is the first probe 2a and the second probe (2b) when the stacking arrangement is sequentially, the first projection that the pad projection (2241) of the first probe (2a) is inserted and fixed It is preferable that it is comprised by the flow prevention part 32a and the 2nd flow prevention part 32b to which the board | substrate protrusion 2251 of the 2nd probe 2b is inserted and fixed.

Therefore, as shown in FIGS. 8 and 9, the first probe 2a penetrates through the flow preventing hole 321 of the first flow preventing part 32a to guide the groove of the first cover part 312a. It is inserted into and fixed to the 3121, the second probe (2b) is one side is supported by the second cover portion 312b, the other side is inserted into the flow preventing hole 321 of the second flow preventing portion (32b). It is fixed.

5 and 6, the block base 33 is a configuration in which the components of the probe block 3 are combined to be connected to the inspection system as a whole. The probe assembly 31, the connection block 34, Reinforcement block 35 is coupled, mounted to the inspection system, and includes a coupling protrusion 331.

The coupling protrusion 331 is a cylindrical protrusion formed to protrude in a direction in which the probe assembly 31 is coupled to the coupling protrusion 331. The coupling protrusion 331 is inserted into and fixed to the coupling groove 3113 of the housing 311. Guide the coupling position to implement an easy assembly process, and assists the coupling force of the block base 33 and the probe assembly 31.

On the other hand, the coupling protrusion 331 guides the coupling position of the probe assembly 31, if the block base 33 and can implement the support for the coupling force of the probe assembly 31, in addition to the cylindrical shape as described above various other It may be formed in the form, in this case it is preferably formed in a shape complementary to the coupling groove (3113).

The connection block 34 is coupled to the block base 33, and a plurality of substrate contact portions 212 (shown in FIG. 6) exposed to the outside of the probe assembly 31 are coupled to the connection substrate 4. It is to be electrically connected to the connecting substrate 4, and includes a seating hole 341 and the fastening protrusion 342.

The seating hole 341 is a configuration in which the reinforcing block 35 is seated and supports the seated reinforcing block 35 and is recessed to a predetermined depth at one side of the connection block 34.

The fastening protrusion 342 is a cylindrical protrusion having a thread formed on its outer circumference as a whole. The fastening protrusion 342 is formed to protrude from the seating hole 341 of the connection block 34. 33 is coupled to the coupling block 34 and the reinforcement block 35 to the block base 33.

Referring to FIG. 6, the reinforcement block 35 is disposed between the block base 33 and the connection block 34 to be coupled to each other, and reinforces the strength of the block base 33. In order to prevent the wear and damage by reinforcing the strength of the block base 33 mounted on the inspection system at the time of replacement), and includes a through hole 351.

Since the reinforcement block 35 has electrode pads formed at different pitches for each display panel, and frequently used to replace the probe block 3 having the corresponding pitch, the reinforcement block 35 is mounted and separated from the inspection system. Reinforces the strength of the repeated block base 33, and is provided to prevent its wear and damage.

The through hole 351 penetrates the fastening protrusion 342 so that the connection block 34, the reinforcing block 35 and the block base 33 are fastened to each other by the fastening protrusion 342, and firmly fastens. A plurality can be formed spaced apart at regular intervals to achieve this, and two can be formed.

Hereinafter, with reference to the accompanying drawings a preferred embodiment of the coupling relationship of the probe block according to another embodiment of the present invention will be described in detail.

6 to 9, the first probe 2a and the second probe 2b are sequentially stacked and arranged in the probe accommodation groove 3111 of the housing 311. In this case, a partial enlargement of FIG. 6 is performed. As shown in the figure, the pad interference prevention portion 222 and the pad contact portion 212 of the first probe 2a and the second probe 2b are arranged in a zigzag, so that they are accurately contacted with a plurality of electrode pads. Allow the inspection process to be performed.

In addition, the number of the first probe 2a and the second probe 2b being sequentially stacked is approximately equal to the number of the plurality of electrode pads provided in the test area, and the test area is the probe receiving groove. It is preferable to substantially coincide with the width (direction in which the probes are stacked) of 3111.

8 and 9, when the first probe 2a and the second probe 2b are stacked and arranged in the probe accommodation groove 3111, the first cover part 312a and the first cover part 312a may be disposed in the housing 311. The second cover part 312b is coupled, in which case the cover part 312 supports the protrusions 221a of the first probe 2a and the second probe 2b to fix the probe 2. The pad protrusion 2241 of the first probe 2a penetrates through the flow preventing groove 321 of the first flow preventing portion 32a to be inserted into the guide groove 3121, and the first flow preventing portion ( 32a) is adhesively fixed to the probe 2 through an adhesive means to prevent microfluidity that may occur in the inspection process.

In addition, the substrate protrusion 2251 of the second probe 2b is penetrated and fixed to the flow preventing groove 321 of the second flow preventing portion 32a, and the second flow preventing portion 32a is adhered through an adhesive means. It is adhesively fixed to the probe 2 to prevent microfluidity that may occur in the inspection process.

Through the above process, as shown in Figure 6, the probe assembly 31 is coupled, the block base 33, the reinforcement block 35, the connecting block 34 in order to combine, in the process The substrate contact portion 212 protruding to the outside of the probe assembly 31 is coupled to be in contact with the connection substrate 4 coupled to the connection block 34.

On the other hand, the probe block 3 for the display panel inspection as described above is firmly coupled by using a separate fastener, and can be integrated and replaced in the unit of the probe block 3, and thus the substrate contact portion 212 Work to implement accurate contact between the connection board and the connection (4) is made in the manufacturing process, it is possible to minimize the occurrence of contact failure between the two components in the later use process.

The present invention described above is not limited to the above-described embodiments and the accompanying drawings, and it is common in the art that various substitutions, modifications, and changes can be made without departing from the technical spirit of the present invention. It will be apparent to those who have knowledge.

The present invention can achieve the following effects by the above configuration, the embodiment and the coupling relationship.

The present invention implements an array pitch as the probe itself through a pitch implementation unit, and can achieve a precise and precise array pitch with an easy operation, and can perform an accurate inspection process corresponding to a plurality of electrode pads to be densified. Can be achieved.

According to the present invention, even when damage or deformation occurs in some of the plurality of probes, repair is not possible, and thus only the damaged or deformed parts can be replaced, thereby achieving an effect of reducing maintenance costs and ease of maintenance. have.

By reinforcing the strength of the probe block, even if frequent replacement of the probe block is made to use the probe block corresponding to the electrode pads implemented with various arrangement pitches, it is possible to prevent the wear or damage from occurring easily. Has an effect.

Claims (14)

delete delete delete Probe pins that directly contact a plurality of electrode pads provided in the display panel to transmit an electrical signal, and probes formed on the outside of the probe pins to implement a pitch corresponding to the pitch where the plurality of electrode pads are arranged and adjacently arranged. A probe including a pitch implement to insulate the pins from each other; A probe assembly having a probe receiving groove in which the probe is arranged in plural and a pitch is realized by the pitch implementing unit; A block base to which the probe assembly is coupled and mounted to an inspection system; And Probe block for display panel inspection comprising a connection block coupled to the connection substrate and the block base. The apparatus of claim 4, wherein the pitch implementing unit includes: a main body inserted into and fixed to the probe accommodation groove; A pad connection part connected to one side of the main body; And a substrate connection part connected to the other side of the main body and formed to have a different length from the pad connection part. The probe assembly may include a first probe formed with the pad connector longer than the substrate connector; And a second probe having a length greater than that of the pad connection portion, being sequentially stacked and fixed to the substrate connection portion. The display panel of claim 5, wherein the first probe has a substrate protrusion protruding from the substrate connecting portion, and the second probe includes a pad protrusion protruding from the pad connecting portion. Probe Block. The method of claim 6, The probe assembly includes a housing in which the probe receiving groove is formed, and a cover part detachably coupled to the housing; The cover unit probe block for display panel inspection, characterized in that it comprises a guide groove into which the substrate projection is inserted. The method of claim 4, wherein the probe assembly And a pad for elastically supporting a plurality of probes arranged in a stack. The method of claim 7, wherein the display panel probe block for inspecting Probe block for display panel inspection, characterized in that it has a plurality of flow prevention holes are formed spaced apart at the same distance, the flow prevention portion for preventing a plurality of probes stacked in the probe receiving groove to flow. The method of claim 9, wherein the display panel probe block for inspecting The substrate block of the first probe penetrates the flow preventing hole and is inserted into the guide groove, and the pad protrusion of the second probe is inserted into the flow preventing hole. The method of claim 4, wherein the probe block for inspecting the display panel And a reinforcing block disposed between the block base and the connection block. 8. The method of claim 7, wherein the cover portion has an insertion hole for guiding a position coupled to the housing, the housing includes an insertion groove into which the insertion hole is fixed; The block base has a coupling protrusion for guiding the coupling position of the probe assembly, the housing probe panel block for display panel characterized in that it comprises a coupling groove into which the coupling projection is inserted. The method of claim 4, wherein The probe pin has a pad contact portion, one side of which is in contact with a plurality of electrode pads, and the other side of the probe pin, which is in contact with the connection substrate; The pitch implement part exposes a surface where the pad contact part contacts with a plurality of electrode pads, and a pad interference prevention part that is formed on an outer side thereof, and a substrate interference part that exposes a surface where the substrate contact part contacts a connecting substrate and is formed outside the pad contact part. Probe block for inspecting the display panel, characterized in that it comprises a prevention unit. The method of claim 13, The pad interference prevention part is formed in a step in the direction in which the pad contact portion is in contact with the plurality of electrode pads, And the substrate interference prevention part is formed in a step in a direction in which the substrate contact part is in contact with the connection substrate.

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