KR100669827B1 - Probe assembly - Google Patents

Abstract

A probe assembly is provided to effectively install probes to a guide block by using self-elastic force of the probe and to improve reliability in inspecting a display panel by minimizing leak current by increasing signal transfer efficiency. A probe block for inspecting a flat panel display includes: a guide block(132) having slots formed on the upper and lower sides at a predetermined width and probes(150) positioned at the lateral side of the guide block and composed of a connecting beam unit(154); a first elastic beam unit(152) bent and extended from one end of the connecting beam unit, fitted and fixed to the slot formed at the lower side of the guide block, and provided with a first contact end(152b) contacted with a pattern of an object; and a second elastic beam unit(156) bent and extended from the other end of the connecting beam unit in parallel with the first elastic beam unit and fitted and fixed to the slot formed on the upper side of the guide block.

Description

Probe Assembly {PROBE ASSEMBLY}

1 is a perspective view of a probe assembly according to a first embodiment of the present invention.

2 is a side view of the probe assembly according to the first embodiment of the present invention.

3A and 3B are enlarged views of main parts of a probe assembly according to a first embodiment of the present invention.

4 is a perspective view of a probe block according to a first embodiment of the present invention.

5 is an exploded perspective view of a probe block according to a first embodiment of the present invention.

6 is a cross-sectional view of the probe block according to the first embodiment of the present invention.

7 is a perspective view illustrating a probe and a guide block in the probe block according to the first embodiment of the present invention.

8 is a front view showing a probe according to a first embodiment of the present invention.

9 is a perspective view of a probe assembly according to a second embodiment of the present invention.

10 is a side view of a probe assembly according to a second embodiment of the present invention.

11 is an exploded perspective view of a probe block according to a second embodiment of the present invention.

12 is a cross-sectional view of a probe block according to a second embodiment of the present invention.

13 is a plan view of a probe block according to a second embodiment of the present invention.

14 is a front view of a probe according to a second embodiment of the present invention.

Explanation of symbols on the main parts of the drawings

102: arm

104: head

110: fixed plate

120: substrate holder

130: probe block

132: guide block

150 probe

The present invention relates to a probe assembly for display panel inspection.

In general, flat panel displays such as liquid crystal displays (TFT-LCDs) are rapidly progressing in size and resolution due to mass production technology and achievements in R & D, resulting in not only notebook computers but also large monitors. It is also developed as an application product and gradually replaces existing cathode ray tube (CRT) products, and its weight in the display industry is gradually increasing.

Such a flat panel display performs a test process that checks whether a flat panel display device is normal by applying an electrical signal to a pad electrode of the flat panel display at the final stage of a manufacturing line and inspects a defective display device. The flat panel display is tested using a probe assembly having a probe block, and the probe block of the probe assembly is a needle type, a blade type, a film type, or the like. As it is developed and used in various forms.

Of these, since the needle-type probe block uses an epoxy resin to fix the needle-type probes, the probes have a problem of being distorted by deformation of the epoxy resin. In particular, the needle-type probe block has a limitation of reducing the outer diameter of the probes, and thus, there is a closed end where it is hardly possible to arrange as many probes as needed in the longitudinal direction on the limited mounting surface of the probe holder. It is not responding properly to the trend.

In order to solve this problem, a blade-type probe block has been proposed, but the blade-type probe block has a large portion exposed to the outside and thus has instability in signal transmission, and a separate fixing structure for fixing the probes (blade type). Since this was necessary, the assembly work is difficult and difficult disadvantages, which causes delays in assembly work time and productivity problems. In particular, the blade type probe block is fixed to the probe holder by the fixing structure, so that the probe can be replaced only by removing the fixing structure.

It is an object of the present invention to provide a novel type of probe block and probe assembly with a simple assembly process.

Another object of the present invention is to provide a probe block and a probe assembly for inspecting a display panel of a new type that can be easily replaced.

Still another object of the present invention is to provide a probe block and a probe assembly having a probe that can be fixed to a guide block using its elasticity.

Probe block for inspecting a flat panel display of the present invention for achieving the above object includes a guide block having a probe, and a slot into which the probe is inserted into the top and bottom surfaces, the probe is a slot formed on the bottom of the guide block A first elastic beam portion having a first contact end inserted into and fixed to the pattern of the object under test, a second elastic beam portion inserted into and fixed to a slot formed on the upper surface of the guide block, and the first elastic beam portion and the second elasticity It includes a connecting beam portion for connecting the beam portion.

According to an embodiment of the present invention, the probe further includes a hook hook formed on the first elastic beam part and the second elastic beam part, and the base block is formed on the bottom and top surfaces of the hook groove and is engaged with the hook hook. It may further include.

The probe block for inspecting the flat panel display of the present invention for achieving the above object is inserted into and fixed to the guide block and the slot formed on the lower surface of the guide block and the guide block formed with a predetermined width on the upper and lower surfaces, and contact with the pattern of the subject A first elastic beam portion having a first contact end, a connecting beam portion bent and extending from one end of the first elastic beam portion, bent from the connecting beam portion in a direction parallel to the first elastic beam portion, and It may include a probe having a second elastic beam portion is inserted into a slot formed on the upper surface of the guide block.

According to an embodiment of the present invention, the guide block further includes a locking groove formed in a direction crossing the slots on the upper surface and the lower surface, respectively, and the probe is the first elastic beam portion and the second elastic beam portion respectively; It may further include a hook hook formed on the first elastic beam portion and the second elastic beam portion to be fixed to the locking groove formed on the lower surface and the upper surface of the guide block.

According to an embodiment of the present invention, the probe is bent from the connecting beam part in a direction opposite to the second elastic beam part and contacted with a pattern of a circuit board to receive an electrical signal to be provided in a pattern of the object under test. It may further include a third elastic beam portion having a second contact end.

According to an embodiment of the present invention, the probe further includes a second contact end in contact with the pattern of the circuit board to receive the electrical signal to be provided in the pattern of the test subject, the second contact end is the second It may be formed in the elastic beam portion.

According to an embodiment of the present invention, the probes may be classified into a first group of probes inserted into an even row of the slots, and a second group of probes inserted into an odd row of the slots. Probes may be inserted from one direction of the guide block and fixed to the guide block, and the second group of probes may be inserted from the other direction of the guide block and fixed to the guide block.

According to an embodiment of the present invention, the probes are divided into a first group of even rows and a second group of odd rows, and the guide block may include a first mounting part in which the probes of the first group are inserted and fixed from one side direction; The second group of probes may be formed as a second mounting part which is inserted and fixed from the other direction.

According to an embodiment of the present invention, the guide block includes a first mounting portion in which even-numbered probes are inserted and fixed from one direction, and a second mounting portion in which odd-numbered probes are inserted and fixed from the other direction. Slots may be formed in the second mounting part at intervals twice the width.

Probe assembly for inspection of the flat panel display of the present invention for achieving the above object is a fixing plate coupled to the probe arm portion of the inspection equipment probe holder coupled to one side of the bottom of the fixing plate guide block mounted to the bottom surface of the probe holder Probes having a first elastic beam portion and a second elastic beam portion inserted into the upper surface and the bottom surface of the guide block elastically fixed to the substrate holder coupled to the other side of the bottom of the fixing plate and mounted on the bottom surface of the substrate holder and the probe The circuit board may include a circuit board that provides an electrical signal to be provided to the object under test.

According to an embodiment of the present invention, the guide block may have slots in which the first elastic beam part of the probe is inserted and fixed and the slots in which the second elastic beam part of the probe is fitted.

According to an embodiment of the present invention, the probe may further include a connecting beam part for elastically connecting the first elastic beam part and the second elastic beam part.

According to the exemplary embodiment of the present invention, the probe may further include a third elastic beam part which is bent from the connecting beam part in a direction opposite to the second elastic beam part.

According to an embodiment of the present invention, the probe has a first contact end in contact with the pattern of the inspected object and a second contact end in contact with the pattern of the circuit board to receive an electrical signal to be provided in the pattern of the inspected object. The first contact end of the probe may be located at the end of the first elastic beam part, and the second contact end of the probe may be located at the end of the third elastic beam part.

For example, the embodiments of the present invention may be modified in various forms, and the scope of the present invention should not be construed as being limited by the embodiments described below. It is provided to those skilled in the art to more fully describe the present invention. Thus, the shape of the elements in the drawings and the like are exaggerated to emphasize a more clear description.

Exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings, FIGS. 1 to 14. In addition, like reference numerals denote like elements that perform the same functions in the above drawings.

The basic intention of the present invention is to facilitate the fixing of the probes 150 and the guide block 132, in order to achieve this, the probe assembly 100 of the present invention uses a guide block 132 using its own elasticity It is characterized by having a probe 150 having a structure that can be fixed to.

In general, the apparatus for inspecting the display panel is a plurality of probe assembly 100 is fixedly placed on the base plate (not shown) to inspect the display panel (hereinafter LCD panel).

1 to 3B, the probe assembly 100 of the present invention includes an arm 102 fixed to a base plate (not shown) and a head fastened to each other by a fixing bolt at the tip of the arm 102. The head 104 is provided with a linear guide 106 between the head 104 and the arm 102 so that the flow up and down during the LCD panel inspection process. The fixing plate 110 is detachably coupled to the bottom of the head 104, and the fixing plate 110 is provided with a probe block 130 and a substrate holder 120.

As shown in FIGS. 4 to 7, the probe block 130, which is the most important component of the probe assembly 100, includes a guide block 132 and a plurality of clips detachably attached to the guide block 132. Of probes 150.

When the probe 150 is coupled to the guide block 132, the first and second elastic beam parts 152 and 156 may be slightly inserted into the slot 136, and after the probe 150 is inserted into the guide block 132, the probe 150 may be fixed to the guide block 132 by an elastic force. . The first elastic beam part 152 and the second elastic beam part 156 of the probe 150 are fixed to the top and bottom surfaces of the guide block 132 by interference fit.

6 and 8, the probe 150 is a blade type made of a thin conductive metal plate, and has a structural feature that may be elastically fitted and coupled to the guide block 132.

Looking at the structural features of the probe 150 in more detail, the probe 150 has a first elastic beam portion 152 is fitted into the slot 136 formed on the bottom surface of the guide block 132 is fixed. Since the first elastic beam part 152 of the probe 150 is concealed in the slot 136 of the guide block 132, there is no need for separate insulation and has a special effect that enables stable signal transmission. The first elastic beam portion 152 is bent toward the bottom of the guide block 132, the hook hook 152a, and bent downward at the end of the first elastic beam portion 152, from the slot 136 of the guide block 132 The first contact end 152b is exposed. The first contact end 152b is a part which is in contact with the pattern of the LCD panel 10 as the object to be inspected, and the hook hook 152a is a part which is caught by the locking groove 134 formed at the bottom of the guide block 132. As shown in FIGS. 3A and 3B, it can be seen that the first contact end 152b is capable of stable up-down (bending) in the slot 136 when contacted with the pattern of the LCD panel 10.

The probe 150 may include a connecting beam part 154 formed by bending from one end of the first elastic beam part 152 and a second elastic beam part 156 and a third elastic beam part 158 formed by being bent from an end of the connecting beam part 154. Has The second elastic beam part 156 is formed in a direction parallel to the first elastic beam part 152 and is inserted into and fixed to the slot 136 formed on the upper surface of the guide block 132. Like the first elastic beam unit 152, the second elastic beam unit 156 also has a hook hook 156a, and the second elastic beam unit 156 is shorter in length than the first elastic beam unit 152. The third elastic beam part 159 is bent to the connection beam part 134 in a direction opposite to the second elastic beam part 156, and the third elastic beam part 158 has a second contact end 158a bent upwardly. The second contact end 158a is a part in contact with the pattern of the circuit board 122 to receive an electrical signal to be provided in the pattern of the LCD panel 10. Here, the circuit board 122 is for receiving a test signal from the inspection apparatus and sending the test signal to the LCD panel 10. The circuit board 122 is the same driving IC 124 as the driving IC attached to the LCD panel 10. The circuit board 122 is installed on the bottom surface of the substrate holder 120, and one end of the circuit board 122 is inserted between the guide block 132 and the probe holder 140. On the other hand, the substrate holder 120 is formed with a groove 120a in which the driving IC 124 is located. The circuit board 122 preferably uses a flexible substrate.

Probe 150 is the first elastic beam portion 152 and the second elastic beam portion 156 is inserted into the slot 136 of the bottom and top of the guide block 132, the gap between the probes 150 is maintained, The locking hooks 152a and 156a of the first elastic beam part 152 and the second elastic beam part 156 are fitted into the locking grooves 134 of the guide block 132 so that the probe 150 is removed from the guide block 132. I will hold it.

The guide block 132 is a rectangular block having a predetermined length of ceramic material. The slots 136 are formed at regular intervals on the top and bottom surfaces thereof, so that the probes 150 are aligned at regular intervals. The locking grooves 134 are formed across the locking grooves 152a and 156a of the probe 150 to be fixed. The guide block 132 has two fixing members for coupling with the probe holder 140 on an upper surface thereof. Has a pin 139. The coupling of the guide block 132 and the probe holder 140 is made by side fixing plates 144 that are screwed into the screw holes 142 (shown in FIG. 5) formed on the side.

The probe holder 140 to which the probe block 130 is coupled is screwed to one side of the bottom surface of the fixing plate 110, and the substrate holder 120 is coupled to the fixing plate 110 beside the probe holder 130.

As described above, the probe assembly 100 of the present invention is a separate probe 150 because the probe 150 is fixed to the guide block 132 itself using the elastic force of the probe 150. In particular, the probe 150 can shorten the length between the first contact end 152b and the second contact end 158a and has a simple shape. In addition, since the probe block 130 may selectively remove and replace the probe 150 in the guide block 132, the probe 150 may be easily replaced.

(Other Embodiments of Probe Assembly)

9-14 illustrate another embodiment of a probe assembly.

9 to 10, the probe assembly 100 ′ has an arm 102, a head 104, and a linear guide 106 having the same configuration and function as the probe assembly 100 according to the first embodiment described above. ), Including the fixing plate 110, the probe block 130 ′, the substrate holder 120, and the like, are described in detail in the first embodiment, and thus will be omitted in the present embodiment. In the present embodiment, a probe 150 'having a simpler shape than the probe 150 of the first embodiment and a guide block 132' having the probes 150 'arranged alternately on the left and right are characterized by their characteristics. .

12 and 14, the probe 150 ′ is characterized in that the second contact end 156b is formed at the end of the second elastic beam part 156. As such, the second contact end 156b is used. When the probe 150 ′ formed at the end of the second elastic beam part 156 is applied, the positions of the circuit board 122 and the substrate holder 120 may be slightly changed. That is, the circuit board 122 is disposed between the guide block 132 ′ and the probe holder 140, and the substrate holder 120 is disposed on the circuit board 122, and the probe holder is placed on the substrate holder 120. 140 is arranged.

11 to 13, the probes 150 ′ are alternately arranged in the left and right directions of the guide block 132 ′. To this end, the guide block 132 ′ is formed by alternately arranging slots 136 on the top and bottom surfaces thereof. That is, the guide block 132 ′ may include a first mounting portion 132 a having an even number of slots into which the first group of probes 150 ′ are inserted, and an odd number of rows in which the second group of probes 150 ′ are inserted. It is divided into a second mounting portion 132b having slots, and a hook hook 152a of the probe 150 'is formed on the top and bottom surfaces of the guide block 132' forming the first mounting portion 132a and the second mounting portion 132b. A locking groove 134 is formed to which the 156a is coupled.

Further, the probes 150 'are alternately arranged and inserted into the slots 136 of the first mounting portion 132a and the slots 136 of the second mounting portion 132b so that the probes 150' are adjacent to each other. The pitch L1 of the first contact end 152b may be narrower than that of the first embodiment. Here, the first group of probes 150 ′ and the second group of probes 150 ′ are fixed to the first mounting portion 132a and the second mounting portion 132b of the guide block 132 ′ in opposite directions. However, the positions of the first contact ends 152b in contact with the pattern of the LCD panel (shown in FIG. 10) and the second contact ends 156b in contact with the patterns of the circuit board 122 are almost on the same line. It is preferred to be located.

More specifically, in the guide block 132 ′ of the present invention, slots 136 are formed on both sides with a constant width L, respectively, and both ends of the slots 136 alternate with each other inside the guide block 132 ′. Are arranged to form. In addition, the probes 150 'are coupled to the slots 136 formed on one side of the guide block 132' and the first group of probes 150 'coupled to the slots 136 formed on the other side of the guide block 132'. The first contact end 152b of the first and second probes 150 'coupled to the slots 136 on both sides of the guide block 132' are coupled to the second group of probes 150 '. Are staggered with each other.

Therefore, the gap L of the slot 136 to be formed outside the probe block 130 'is processed to the same width as in the first embodiment, and there is no great difficulty in manufacturing. Since the first contact ends 152b of the first and second groups of probes 150 ′ are staggered, the spacing L1 of the neighboring first contact ends 152b is halved with the spacing L of the slot 136. Since it can be reduced, it is possible to cope with the pattern of the LCD panel 10 having a compact spacing.

On the other hand, the present invention can be variously modified and take various forms in the probe assembly consisting of the above configuration. It is to be understood, however, that the present invention is not limited to the specific forms referred to in the above description, but rather includes all modifications, equivalents and substitutions within the spirit and scope of the invention as defined by the appended claims. It should be understood to do.

As described above, the probe assembly of the present invention utilizes the self-elastic force of the probe, so that the probe assembly is excellent in assembling the probes to the guide block.

In addition, the probe assembly of the present invention can increase the signal transmission efficiency through the probe to minimize the leakage current in the signal transmission process can improve the reliability of the display panel inspection.

In addition, the probe assembly of the present invention can easily replace the replacement of the probe in the guide block, it is easy to replace.

In addition, the probe assembly of the invention corresponds to the fine pitch since the first contact ends of the probes respectively coupled to the slots on both sides of the probe block are alternately positioned so that the distance between neighboring first contact ends can be reduced by half with respect to the spacing of the slots. This is possible.

Claims (12)

Probe block for flat panel display inspection: A guide block having slots formed on the upper and lower surfaces with a predetermined width; A first contact end positioned at a side surface of the guide block and having a first contact end bent from and extending from one end of the connection beam part and fitted into a slot formed on a lower surface of the guide block to be tightly contacted and in contact with a pattern of an object under test; And a probe having an elastic beam part and a second elastic beam part which is bent and extended from the other end of the connection beam part in a direction parallel to the elastic beam part and fitted into a slot formed on an upper surface of the guide block. The method of claim 1, The guide block further comprises a locking groove formed in a direction crossing the slots on the upper surface and the lower surface, respectively, The probe may further include a hook formed in the first elastic beam part and the second elastic beam part such that the first elastic beam part and the second elastic beam part are fitted into and secured to the locking grooves formed on the lower surface and the upper surface of the guide block, respectively. Probe block characterized in that. The method according to claim 1 or 2, The probe is A third elastic beam part bent from the connecting beam part in the opposite direction to the second elastic beam part and having a second contact end contacting the pattern of the circuit board to receive an electrical signal to be provided in the pattern of the test object; Probe block comprising a. The method according to claim 1 or 2, The probe further includes a second contact end in contact with the pattern of the circuit board to receive the electrical signal to be provided in the pattern of the test object, The second contact end is a probe block, characterized in that formed in the second elastic beam portion. The method according to claim 1 or 2, The guide block is provided with slots on both sides, respectively, and both ends of the slot are alternately arranged inside the guide block. A first group of probes coupled to slots formed on one side of the guide block, and a second group of probes coupled to slots formed on the other side of the guide block and coupled to slots on both sides of the guide block; And the first contact ends of the two probes are staggered from each other. In probe assembly for flat panel display inspection: A fixed plate coupled to the probe arm portion of the inspection equipment; A guide block provided below the fixing plate; Probes having a connecting beam part positioned at a side of the guide block, a first elastic beam part and a second elastic beam part bent and extended from both ends of the connecting beam part so as to be elastically fixed to the upper and lower surfaces of the guide block; And And a circuit board installed below the fixing plate to provide the probes with an electrical signal to be provided to the object under test. The method of claim 6, And a probe holder provided between the lower surface of the fixing plate and the upper surface of the guide block. The method of claim 6 And a substrate holder provided between the lower surface of the fixing plate and the upper surface of the circuit board to fix the circuit board. The method of claim 6 The guide block is a probe assembly, characterized in that the bottom surface and the upper surface is formed with slots fixed to the first elastic beam portion of the probe is fixed and the second elastic beam portion of the probe is fitted into the fixed. delete The method of claim 6, The probe is And a third elastic beam part bent from the connecting beam part in a direction opposite to the second elastic beam part. The method of claim 11, The probe has a first contact end in contact with the pattern of the inspected object and a second contact end in contact with the pattern of the circuit board to receive an electrical signal to be provided in the pattern of the inspected object. The first contact end of the probe is located at the end of the first elastic beam portion, And a second contact end of the probe is positioned at an end of the third elastic beam part.

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