TWI400442B - A detection method for a detection device and a panel - Google Patents

Description

Detection device and panel detection method

The present invention relates to a test device for use in a panel, and more particularly to a panel test device that can be overlapped and joined.

The display modules provided by the general industry (display module suppliers) to system manufacturers (such as mobile phone assemblers) usually use flexible circuit boards as connectors, so the system factory uses slots for softness. The board is plugged in.

However, because the display module supplier will perform a series of quality tests before the product leaves the factory to ensure the quality of the product (display module). In this series of quality tests, it is necessary to connect the display module to the test system, and multiple insertions and removals are required. However, due to the improper insertion and removal of the flexible circuit board and the test system of the display module, the flexible circuit board is deformed and the circuit is damaged, which causes the display of the display module to be abnormal.

In addition, another test system using a pinned structure as a connector, such a connector directly causes damage on the flexible circuit board, and also causes the display of the display module screen to be abnormal.

Therefore, in order to avoid the damage of the flexible circuit board of the display module due to too many times of plugging and unplugging, and thus the display of the display of the display module is abnormal, the inventor actively researches and innovates based on the product, and actively concentrates on research and development. After numerous design experiments, the invention has been produced to reduce the damage rate of the display module.

The following is a detailed description of the present invention and the detailed description of the various features and features of the present invention.

According to a first aspect of the invention, a detection device is proposed for detecting a panel. The panel includes a first circuit board, wherein the first circuit board includes a plurality of pins, wherein the testing device includes a second circuit board and a pressing member. The second circuit board includes a body, a plurality of test pads, a plurality of test circuits, and a plurality of conductive elements. The body has a first surface and a second surface. A plurality of test pads are disposed on the first surface, and the test pads respectively correspond to the pin settings. A plurality of test circuits are disposed on the second surface corresponding to the test pads. A plurality of conductive elements are disposed through the body for electrically connecting the test circuits to the test pads. The pressing component is disposed corresponding to the test pads of the second circuit board for closely bonding the first circuit board and the second circuit board after being stacked. When the first circuit board is superposed on the second circuit board, the test circuits are electrically connected to the pins via the conductive elements and the test pads.

According to a second aspect of the present invention, a method of detecting a panel is proposed. The method of detecting the panel includes the following steps. Providing a panel, the panel includes a first circuit board, and the first circuit board includes a plurality of pins; a detecting device having a second circuit board is provided, and the second circuit board includes a plurality of test pads, wherein the The test pad corresponds to the pin settings; the first circuit board and the second circuit board are overlapped to electrically connect the test pads to the pins; and a pressing component is disposed on the first circuit board and The second circuit board is overlapped so that the first circuit board and the second circuit board are tightly coupled.

1A and 1B, FIG. 1A is a top view of a test apparatus and a panel according to a preferred embodiment of the present invention, and FIG. 1B is a top view of the test apparatus and the panel stacked in FIG. 1A. The test device 200 is used to test a panel 100, and the panel 100 includes a first circuit board 110, and the first circuit board 110 has a plurality of pins 112 thereon. The testing device 200 of the present embodiment includes a second circuit board 210 and a pressing member 220 (shown in FIG. 1B). The second circuit board 210 includes a plurality of test pads 212, and the test pads 212 are respectively disposed corresponding to the pins 112 of the first circuit board 110, wherein when the first circuit board 110 and the second circuit board 210 are overlapped, The foot 112 is electrically coupled to the test pad 212. In this embodiment, the first circuit board 110 of the panel 100 is a flexible circuit board, and the pins 112 can also be a common gold finger structure. The test device 200 of the present embodiment is connected to the first circuit board 110 of the panel 100 by the second circuit board 210 to electrically connect the panel 100 to the test device 200 for testing, thereby causing the display screen 120 to display the test result. In this embodiment, after the first circuit board 110 and the second circuit board 210 are stacked, a pressing member 220 may be disposed on the second circuit board 210 (as shown in FIG. 1B) to make the first circuit board. 110 and the second circuit board 210 are closely joined after being stacked.

Referring to FIG. 1A again, in this embodiment, the shape of the test pad 212 is, for example, a circle, and the diameter w2 of the test pads 212 is slightly smaller than the width w1 of the pin 112, so that the test pad 212 can be completely connected. The foot 112 is in close contact. For example, when the width w1 of the pin 112 is 0.33 centimeters (mm), the width w2 of the test pad 212 is, for example, 0.3 centimeters (mm).

Next, please refer to FIGS. 1B and 1C, and FIG. 1C is a cross-sectional view taken along line 1C-1C of FIG. 1B. In this embodiment, the pressing member 220 is preferably disposed in a movable manner and correspondingly disposed on the test pad 212. In this way, the tightness between the pin 112 and the test pad 212 can be increased by the weight of the pressing member 220, so that the first circuit board 110 can be closely engaged with the second circuit board 210.

Referring to FIG. 1C , the second circuit board 210 includes a body 202 , a plurality of test pads 212 , a plurality of test circuits 216 , and a plurality of conductive elements 218 . The body 202 has a first surface 214 and a second surface 215. The aforementioned test pad 212 is disposed on the first surface 214. A plurality of circuits 216 are disposed on the second surface 215. The test circuits 216 are connected to a test system (not shown) of the test device 200 for transmitting test signals of the test system. Moreover, the test circuit 216 is electrically connected to the corresponding test pad 212 by the conductive element 218 being disposed in the body 202. In this way, the test signal transmitted by the test system can be transmitted to the panel 100 via the test circuit 216, the conductive element 218, the test pad 212, and the pin 112. In this embodiment, the conductive element 218 can be, for example, a metal wire, a conductive block, or other component that can be used for electrical conduction. In addition, the annular test pad 212 used in the present example may, of course, be of other shapes, such as a circle or a square.

Next, please refer to FIG. 2, which is a top view showing the second circuit board in FIG. 1A placed on the fixing member. In the present embodiment, the testing device 200 preferably further includes a fixing component 230 for fixing the second circuit board 210 for testing. This is because, in actual operation, the tester will test thousands of panels, so after the second circuit board 210 is fixed to the fixing component 230, the tester only needs to replace the first circuit board 110 (not shown) ), this can greatly reduce the work of testers.

In this embodiment, the fixing component 230 preferably includes a flat plate 232, a positioning plate 234, a first positioning post 236, and a second positioning post 238. The flat plate 232 has a recess 232a for accommodating the second circuit board 210 and the first circuit board 110 (refer to FIG. 3), wherein the recess 232a corresponds to the stacked first circuit board. The 110 and the second circuit board 210 are shaped such that the stacked first circuit board 110 and the second circuit board 210 can be closely placed in the recess 232a. In this way, the first circuit board 110 and the second circuit board 210 can be prevented from being shaken in the recess 232a.

In the present embodiment, the first positioning posts 236 are, for example, two, disposed in the recess 232a of the flat plate 232. In addition, the second circuit board 210 has two first positioning holes 210a corresponding to the first positioning posts 236 (may also refer to FIG. 1A). In this way, when the second circuit board 210 is sleeved on the first positioning post 236 via the first positioning hole 210a, the second circuit board 210 can be fixed in the recess 232a of the flat plate 232 to avoid the second circuit board. 210 moves in the XY direction. In addition, the positioning plate 234 is used to fix the second circuit board 210 that has been placed in the recess 232a, and can be locked to the flat plate 232 by screws 234a. In particular, when the positioning board 234 fixes the second circuit board 210, the positioning board 234 happens to expose the test pad 212 of the second circuit board 210.

Next, please refer to FIG. 3, which shows a view of placing the first circuit board on the second circuit board of FIG. 2. In this embodiment, the fixing component 230 further includes two second positioning posts 238 disposed in the recess 232a. The second positioning posts 238 are respectively disposed on opposite sides of one of the test pads 212 of the second circuit board 210 (as shown in FIG. 2), so that when the first circuit board 110 is placed in the recess 232a, The second positioning posts 238 are located on both sides of the first circuit board 110.

In addition, since the position of the positioning plate 234 happens to expose the second circuit board 210 to the test pad 212 (as shown in FIG. 3), when the top end of the first circuit board 110 abuts the positioning plate 234, the first circuit board 110 The pin 112 (which is not shown in FIG. 3 because it is on the other side) overlaps the test pad 212 of the second circuit board 210. In addition, the first circuit board 110 is disposed between the second positioning posts 238 by the assistance of the second positioning post 238. Therefore, the tester only needs to place the first circuit board 110 in the recess 232a, push the first circuit board 110 against the positioning board 234 and between the two second positioning posts 238, so that the first circuit can be made. The plate 110 is simultaneously positioned in the X direction and the Y direction. Then, the first circuit board 110 and the second circuit board 210 are tightly coupled by the pressing member 220 (not shown in FIG. 3), so that the pin 112 and the test pad 212 are electrically coupled.

In addition, since the pin 112 and the test pad 212 are electrically connected by contact, when the replacement panel 100 is tested, only the panel 100 needs to be removed, and no plugging or unplugging is required. Therefore, by testing the panel 100 by the testing device 200 of the embodiment, the destruction of the first circuit board 110 caused by the test multiple times can be avoided, and the damage rate of the panel 100 can be reduced.

In summary, the test device applied to the panel of the present invention can be directly tested by directly contacting the test pad of the test device with the pin of the panel, without the need for plugging and unplugging. In this way, the panel destruction rate due to multiple insertions and removals in the test can be effectively reduced, and the cost can be reduced.

The above embodiments of the present invention are provided for convenience of explanation only. When the meaning of the case cannot be limited, the various transformation designs according to the scope of the listed patent application should be included in the patent scope of the present application.

W1, w2. . . width

100. . . panel

110. . . First board

112. . . Pin

120. . . Display screen

200. . . Test device

202. . . Ontology

210. . . Second circuit board

210a. . . First positioning hole

212. . . Test pad

214. . . First surface

215. . . Second surface

216. . . Test circuit

218. . . Conductive component

220. . . Press fit

230. . . Fixed component

232. . . flat

232a. . . Groove

234. . . Positioning plate

234a. . . Screw

236. . . First positioning column

238. . . Second positioning column

1A is a top view of a test device and a panel according to a preferred embodiment of the present invention;

FIG. 1B is a top view showing the test apparatus and the panel in FIG. 1A;

Figure 1C is a cross-sectional view taken along line 1C-1C of Figure 1B;

2 is a top view showing the second circuit board in FIG. 1A placed on the fixing member;

Figure 3 is a view showing the top view of the first circuit board placed on the second circuit board of Figure 2.

100. . . panel

110. . . First board

112. . . Pin

202. . . Ontology

210. . . Second circuit board

212. . . Test pad

214. . . First surface

215. . . Second surface

216. . . Test circuit

218. . . Conductive component

220. . . Press fit

Claims (7)

A detecting device for detecting a panel, the panel comprising a first circuit board, wherein the first circuit board comprises a plurality of pins, wherein the testing device comprises: a second circuit board comprising: a body Having a first surface and a second surface; a plurality of test pads are disposed on the first surface, and the test pads are respectively disposed corresponding to the plurality of pins; and the plurality of test circuits are disposed corresponding to the test pads On the second surface, a plurality of conductive elements are disposed in the body for electrically connecting the test circuits to the test pads. When the first circuit board is overlapped with the second circuit board, the The test circuit is electrically connected to the pins via the conductive elements and the test pads; and at least one first positioning hole is disposed on the body; a fixing component is configured to fix the second circuit board; and a pressing member disposed corresponding to the test pads of the second circuit board for closely bonding the first circuit board and the second circuit board; wherein the fixing component comprises: a flat plate having a concave shape Slot, the a slot for arranging the second circuit board and the first circuit board, wherein the recess is corresponding to the shape of the stacked first circuit board and the second circuit board, so that the stacked The first circuit board and the second circuit board can be placed in the recess; and at least one first positioning post is disposed in the recess of the flat plate, corresponding to the first positioning hole, thereby making the second circuit The plate is fixed in the groove by being sleeved to the first positioning post via the first positioning hole. The test device of claim 1, wherein the fixing component further comprises: a positioning plate for fixing the second circuit board that has been placed in the recess, wherein the first circuit board is in conflict When the positioning plate is reached, the pins of the first circuit board overlap with the test pads of the second circuit board. The test device of claim 1, wherein the fixing component further comprises: two second positioning posts respectively disposed on opposite sides of the test pads of the second circuit board that have been placed in the recesses In the recess, when the first circuit board is placed in the recess, the second positioning posts are located on two sides of the first circuit board. The test device of claim 1, wherein the test pads are in the shape of a ring. The test device of claim 4, wherein the test pads have a diameter smaller than a width of the pin. A method for detecting a panel, comprising: providing a panel, the panel comprising a first circuit board, and the first circuit board includes a plurality of pins; providing a detecting device having a second circuit board, and the second circuit The board includes a plurality of test pads, wherein the test pads are disposed corresponding to the pins; a fixing component is provided, and the fixing component comprises a flat plate having a groove; and at least one via the second circuit board a first positioning hole sleeves the second circuit board on the first positioning post of the fixing component; a positioning plate is disposed on the second circuit board for fixing the second circuit board in the recess And exposing the test pads of the second circuit board; stacking the first circuit board and the second circuit board to make the test pads and the And electrically connecting the pin; and placing a pressing member on the overlapping of the first circuit board and the second circuit board to tightly engage the first circuit board and the second circuit board. The detecting method of claim 6, wherein the fixing component comprises a plurality of second positioning posts, wherein the step of placing the first circuit board comprises: adjusting the first circuit board such that the first circuit board is located Between the second positioning posts.