JP4743827B2 - 液晶パネルの外観検査装置 - Google Patents

液晶パネルの外観検査装置 Download PDF

Info

Publication number
JP4743827B2
JP4743827B2 JP2004243660A JP2004243660A JP4743827B2 JP 4743827 B2 JP4743827 B2 JP 4743827B2 JP 2004243660 A JP2004243660 A JP 2004243660A JP 2004243660 A JP2004243660 A JP 2004243660A JP 4743827 B2 JP4743827 B2 JP 4743827B2
Authority
JP
Japan
Prior art keywords
liquid crystal
crystal panel
inspection
panel
suction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004243660A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006064387A (ja
Inventor
司 工藤
賢一 鷲尾
雅規 佐野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2004243660A priority Critical patent/JP4743827B2/ja
Priority to TW094126691A priority patent/TWI263041B/zh
Priority to KR1020050076054A priority patent/KR100654218B1/ko
Priority to CNB2005100932967A priority patent/CN100451599C/zh
Publication of JP2006064387A publication Critical patent/JP2006064387A/ja
Application granted granted Critical
Publication of JP4743827B2 publication Critical patent/JP4743827B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1313—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells specially adapted for a particular application

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2004243660A 2004-08-24 2004-08-24 液晶パネルの外観検査装置 Expired - Fee Related JP4743827B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004243660A JP4743827B2 (ja) 2004-08-24 2004-08-24 液晶パネルの外観検査装置
TW094126691A TWI263041B (en) 2004-08-24 2005-08-08 Appearance inspection device of liquid crystal panel
KR1020050076054A KR100654218B1 (ko) 2004-08-24 2005-08-19 액정패널의 외관 검사장치
CNB2005100932967A CN100451599C (zh) 2004-08-24 2005-08-24 液晶面板的外观检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004243660A JP4743827B2 (ja) 2004-08-24 2004-08-24 液晶パネルの外観検査装置

Publications (2)

Publication Number Publication Date
JP2006064387A JP2006064387A (ja) 2006-03-09
JP4743827B2 true JP4743827B2 (ja) 2011-08-10

Family

ID=36093214

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004243660A Expired - Fee Related JP4743827B2 (ja) 2004-08-24 2004-08-24 液晶パネルの外観検査装置

Country Status (4)

Country Link
JP (1) JP4743827B2 (ko)
KR (1) KR100654218B1 (ko)
CN (1) CN100451599C (ko)
TW (1) TWI263041B (ko)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100399114C (zh) * 2006-07-24 2008-07-02 友达光电股份有限公司 结合显示面板与背光模块的方法
CN103182695B (zh) * 2011-12-29 2015-07-01 财团法人金属工业研究发展中心 可重组工具机的组构装置
CN102589600A (zh) * 2012-03-09 2012-07-18 北京元陆鸿远电子技术有限公司 一种电容器外观检查支架
KR101363733B1 (ko) * 2013-05-08 2014-02-21 주식회사 티엠씨 액화천연가스 저장탱크용 멤브레인 시트의 검사 장치
KR101440230B1 (ko) * 2013-05-08 2014-10-07 주식회사 티엠씨 액화천연가스 저장탱크용 멤브레인 시트의 검사 장치
TWI540089B (zh) * 2013-05-17 2016-07-01 由田新技股份有限公司 一種工作機及其上的真空吸附式承載裝置
CN103376576B (zh) * 2013-07-03 2016-03-02 杨玉峰 一种4k2k v-by-one接口液晶显示屏的自动测试方法及系统
KR101362329B1 (ko) * 2013-09-12 2014-02-12 한동희 디스플레이용 패널의 검사장치
JP5865890B2 (ja) * 2013-12-26 2016-02-17 株式会社ジャパンディスプレイ 液晶表示装置の組立て装置
CN103763910B (zh) * 2013-12-31 2016-06-15 埃泰克汽车电子(芜湖)有限公司 一种用于保险丝安装位置的检测装置及其检测方法
CN104121853A (zh) * 2014-07-15 2014-10-29 深圳市大族激光科技股份有限公司 壳体检测装置及其载物台
KR101663648B1 (ko) * 2015-03-11 2016-10-07 주식회사 영우디에스피 플렉시블 디스플레이 패널 검사용 반전기
CN107101577A (zh) * 2017-04-05 2017-08-29 东莞长盈精密技术有限公司 产品测量治具
JP6908123B2 (ja) * 2017-09-28 2021-07-21 日本電産株式会社 外観検査装置及び外観検査方法
CN107934427B (zh) * 2017-12-21 2024-05-14 浙江预立兴川机器人技术股份有限公司 一种液晶面板精准抓取及放置转移系统
CN108279513A (zh) * 2017-12-28 2018-07-13 中电科风华信息装备股份有限公司 液晶屏外观自动检测设备
CN108447429B (zh) * 2018-02-06 2020-06-23 宁波图锐自动化设备有限公司 一种液晶屏检测方法及系统
CN108247317A (zh) * 2018-03-30 2018-07-06 青岛元启智能机器人科技有限公司 一种液晶屏自动定位装置
JP7161870B2 (ja) * 2018-06-27 2022-10-27 ファスフォードテクノロジ株式会社 ダイボンダおよび半導体装置の製造方法
CN109282966A (zh) * 2018-08-31 2019-01-29 合肥泰沃达智能装备有限公司 一种导光板旋转检测平台
CN109100901B (zh) * 2018-10-15 2024-04-16 苏州精濑光电有限公司 一种宏观检查机的上灯箱
CN109342459A (zh) * 2018-11-14 2019-02-15 大连崇达电路有限公司 高精密印制线路板外观质量检测装置用承载单元
CN109916597B (zh) * 2019-04-18 2020-12-04 深圳市华星光电半导体显示技术有限公司 光学检测装置及光学检测方法
CN113811741B (zh) * 2019-05-10 2024-08-13 三星电子株式会社 尺寸测量夹具和包括该尺寸测量夹具的尺寸测量装置
CN110596921A (zh) * 2019-09-04 2019-12-20 深圳市联得自动化装备股份有限公司 液晶显示屏检测装置
JP7502108B2 (ja) * 2020-07-31 2024-06-18 ファスフォードテクノロジ株式会社 ダイボンディング装置および半導体装置の製造方法
CN111999034B (zh) * 2020-10-27 2021-01-26 武汉精测电子集团股份有限公司 点屏装置和测试设备
KR20220147217A (ko) * 2021-04-27 2022-11-03 삼성전자주식회사 치수 측정용 지그 및 그를 포함하는 치수 측정 장치
KR102620467B1 (ko) * 2021-08-23 2024-01-04 (주)인스케이프 용기형 물체의 다각도 촬영 장치
KR102612030B1 (ko) * 2021-12-15 2023-12-08 다래비젼주식회사 백라이트 진공흡착 모듈용 부품 자동검사장치과 이의 자동검사방법
CN114815337B (zh) * 2022-04-27 2023-08-15 安徽煜祺光学科技有限公司 一种显示模组半自动贴合机
KR102493691B1 (ko) * 2022-06-27 2023-02-06 밸류플러스테크놀러지 주식회사 모바일 디바이스 외관 촬영 장치
KR102563511B1 (ko) * 2022-07-15 2023-08-07 시냅스이미징(주) 카메라를 이용한 다면검사장치 및 검사방법

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04218743A (ja) * 1990-12-19 1992-08-10 Seiko Epson Corp フラットディスプレイの検査装置
JPH09153534A (ja) * 1995-11-30 1997-06-10 Ando Electric Co Ltd ウェーハ移載装置
JP3220633B2 (ja) * 1995-12-28 2001-10-22 シャープ株式会社 液晶表示装置のクロストーク検査方法及びクロストーク検査装置
JPH10227721A (ja) * 1997-02-18 1998-08-25 Micronics Japan Co Ltd 液晶パネルの検査方法および装置
JPH10253543A (ja) * 1997-03-06 1998-09-25 Kao Corp 基板外観検査装置及び方法
JP3378795B2 (ja) * 1998-03-27 2003-02-17 シャープ株式会社 表示装置の検査装置および検査方法
JP2000018927A (ja) * 1998-07-02 2000-01-21 Oita Nippon Denki Kk 外観検査装置
JP3463579B2 (ja) * 1998-10-20 2003-11-05 松下電器産業株式会社 バンプ付電子部品の実装装置
JP2002014058A (ja) * 2000-06-30 2002-01-18 Matsushita Electric Ind Co Ltd 検査方法及び装置
JP2002305229A (ja) * 2001-04-06 2002-10-18 Micronics Japan Co Ltd 表示用基板の受け渡し装置
JP2003139709A (ja) * 2001-11-05 2003-05-14 Olympus Optical Co Ltd ホルダ装置
JP2004219298A (ja) * 2003-01-16 2004-08-05 Matsushita Electric Ind Co Ltd ディスプレイパネルの点灯検査装置

Also Published As

Publication number Publication date
KR100654218B1 (ko) 2006-12-06
CN1740764A (zh) 2006-03-01
KR20060023105A (ko) 2006-03-13
TW200607999A (en) 2006-03-01
CN100451599C (zh) 2009-01-14
JP2006064387A (ja) 2006-03-09
TWI263041B (en) 2006-10-01

Similar Documents

Publication Publication Date Title
JP4743827B2 (ja) 液晶パネルの外観検査装置
TWI333544B (en) Substrate inspection apparatus
KR101166828B1 (ko) 평판표시장치용 검사장비 및 검사 방법
JP4619880B2 (ja) 円筒状物体の外観検査装置
KR101514409B1 (ko) 비전검사장치
TW200427980A (en) Inspection device for transparent substrate end surface and inspection method therefor
WO2020191919A1 (zh) 一种外观检测设备及待检测产品的外观检测方法
JP4385419B2 (ja) 外観検査方法及び外観検査装置
JP2007248292A (ja) 外観検査装置
JP4592070B2 (ja) 液晶パネルの外観検査装置及び外観検査方法
JP7246938B2 (ja) 検査装置
KR20060112339A (ko) 자동 광학 검사 시스템 및 방법
JP4392557B2 (ja) 検査装置
KR100933467B1 (ko) 에이오아이（ａｏｉ） 장치
JP2002076031A (ja) 半導体製造装置
JP4309181B2 (ja) パネルの外観検査装置
TWM514002U (zh) 光學檢測設備
KR100825968B1 (ko) 평판 디스플레이의 가장자리 검사 장치
JP2007024775A (ja) 容器の外形検査装置
JP2001345481A (ja) 光電変換素子の検査方法及び装置
JP7271329B2 (ja) 照明装置及びこれを備えた外観検査装置
JP4495473B2 (ja) 検査システム
CN114264658B (zh) Led芯片检测装置及设备
KR20230133664A (ko) 검사장치 및 기판처리장치
TW202411629A (zh) 環狀製品的外觀檢查裝置

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070604

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20090820

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090908

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091109

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100506

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100703

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20101129

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101207

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110506

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20110509

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140520

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4743827

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees