KR100825968B1 - 평판 디스플레이의 가장자리 검사 장치 - Google Patents
평판 디스플레이의 가장자리 검사 장치 Download PDFInfo
- Publication number
- KR100825968B1 KR100825968B1 KR1020060051902A KR20060051902A KR100825968B1 KR 100825968 B1 KR100825968 B1 KR 100825968B1 KR 1020060051902 A KR1020060051902 A KR 1020060051902A KR 20060051902 A KR20060051902 A KR 20060051902A KR 100825968 B1 KR100825968 B1 KR 100825968B1
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- South Korea
- Prior art keywords
- flat panel
- panel display
- edge
- photographing
- moving
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Nonlinear Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (9)
- 삭제
- 삭제
- 삭제
- 평판 디스플레이의 가장자리 검사 장치에 있어서:평판 디스플레이가 놓여지는 스테이지;상기 스테이지에 놓여지는 평판 디스플레이의 4개의 가장자리 면을 동시에 각각 촬영하는 촬영부재들;상기 촬영부재들 각각으로부터 입력되는 영상정보를 이용하여 평판 디스플레이의 가장자리 결함 유무를 검사하는 처리부를 포함하되;상기 촬영부재는평판 디스플레이의 가장자리 저면으로 빛을 조사하는 조명부재;상기 조명부재의 빛이 조사되는 평판 디스플레이의 가장자리 저면을 촬영하는 카메라;상기 조명부재와 상기 카메라가 설치되며, 평판 디스플레이의 가장자리 아래에 위치되는 하단부, 상기 하단부로부터 연장되는 연결부, 그리고 상기 연결부로부터 연장되고 상기 하단부와 대향되도록 평판 디스플레이의 가장자리 상부에 위치되며 평판 디스플레이를 투과한 빛을 반사시키는 반사판이 설치되는 상단부를 갖는 이동브라켓; 및상기 이동 브래킷을 평판 디스플레이의 가장자리 면을 따라 이동시키는 제1이동부재를 포함하는 것을 특징으로 하는 평판 디스플레이의 가장자리 검사 장치.
- 삭제
- 제4항에 있어서,상기 촬영부재는상기 이동 브래킷을 대기 위치에서 촬영을 위한 위치로 이동시키기 위한 제2이동부재를 더 포함하는 것을 특징으로 하는 평판 디스플레이의 가장자리 검사 장치.
- 제4항에 있어서,상기 조명부재는 평판 디스플레이의 저면으로 경사지게 빛을 조사하는 것을 특징으로 하는 평판 디스플레이의 가장자리 검사 장치.
- 삭제
- 삭제
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060051902A KR100825968B1 (ko) | 2006-06-09 | 2006-06-09 | 평판 디스플레이의 가장자리 검사 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060051902A KR100825968B1 (ko) | 2006-06-09 | 2006-06-09 | 평판 디스플레이의 가장자리 검사 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20070117802A KR20070117802A (ko) | 2007-12-13 |
KR100825968B1 true KR100825968B1 (ko) | 2008-04-29 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020060051902A KR100825968B1 (ko) | 2006-06-09 | 2006-06-09 | 평판 디스플레이의 가장자리 검사 장치 |
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KR (1) | KR100825968B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101023472B1 (ko) * | 2009-09-07 | 2011-03-24 | 주식회사 케이엔제이 | 평판디스플레이 패널의 엣지면 검사장치 및 방법 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04157741A (ja) * | 1990-10-20 | 1992-05-29 | M I Technol:Kk | フラットパッケージ型icリードピンの画像入力装置 |
JPH07229722A (ja) * | 1994-02-21 | 1995-08-29 | Nkk Corp | 鋼板の形状測定装置 |
US6038029A (en) | 1998-03-05 | 2000-03-14 | Nova Measuring Instruments, Ltd. | Method and apparatus for alignment of a wafer |
JP2000230910A (ja) | 1999-02-12 | 2000-08-22 | Advanced Display Inc | 基板の付着異物検査装置および付着異物除去装置および付着異物除去方法 |
US6219442B1 (en) | 1996-10-08 | 2001-04-17 | International Business Machines Corporation | Apparatus and method for measuring distortion of a visible pattern on a substrate by viewing predetermined portions thereof |
-
2006
- 2006-06-09 KR KR1020060051902A patent/KR100825968B1/ko not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04157741A (ja) * | 1990-10-20 | 1992-05-29 | M I Technol:Kk | フラットパッケージ型icリードピンの画像入力装置 |
JPH07229722A (ja) * | 1994-02-21 | 1995-08-29 | Nkk Corp | 鋼板の形状測定装置 |
US6219442B1 (en) | 1996-10-08 | 2001-04-17 | International Business Machines Corporation | Apparatus and method for measuring distortion of a visible pattern on a substrate by viewing predetermined portions thereof |
US6038029A (en) | 1998-03-05 | 2000-03-14 | Nova Measuring Instruments, Ltd. | Method and apparatus for alignment of a wafer |
JP2000230910A (ja) | 1999-02-12 | 2000-08-22 | Advanced Display Inc | 基板の付着異物検査装置および付着異物除去装置および付着異物除去方法 |
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KR20070117802A (ko) | 2007-12-13 |
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