JP4718999B2 - 薄膜トランジスタ基板の製造方法、および、液晶表示装置の薄膜トランジスタ製造方法 - Google Patents
薄膜トランジスタ基板の製造方法、および、液晶表示装置の薄膜トランジスタ製造方法 Download PDFInfo
- Publication number
- JP4718999B2 JP4718999B2 JP2005379395A JP2005379395A JP4718999B2 JP 4718999 B2 JP4718999 B2 JP 4718999B2 JP 2005379395 A JP2005379395 A JP 2005379395A JP 2005379395 A JP2005379395 A JP 2005379395A JP 4718999 B2 JP4718999 B2 JP 4718999B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- film transistor
- forming
- insulating film
- gate insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000758 substrate Substances 0.000 title claims description 88
- 239000010409 thin film Substances 0.000 title claims description 64
- 239000004973 liquid crystal related substance Substances 0.000 title claims description 30
- 238000004519 manufacturing process Methods 0.000 title claims description 25
- 239000010410 layer Substances 0.000 claims description 84
- 239000002070 nanowire Substances 0.000 claims description 71
- 239000010408 film Substances 0.000 claims description 66
- 238000000034 method Methods 0.000 claims description 22
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 17
- 239000002904 solvent Substances 0.000 claims description 14
- 238000000059 patterning Methods 0.000 claims description 12
- 229920000642 polymer Polymers 0.000 claims description 6
- 238000009413 insulation Methods 0.000 claims description 3
- 238000003825 pressing Methods 0.000 claims 1
- 239000011241 protective layer Substances 0.000 claims 1
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 18
- 239000011810 insulating material Substances 0.000 description 14
- 230000015572 biosynthetic process Effects 0.000 description 11
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 239000000463 material Substances 0.000 description 7
- 229920002120 photoresistant polymer Polymers 0.000 description 6
- 238000003892 spreading Methods 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 229910021393 carbon nanotube Inorganic materials 0.000 description 4
- 239000002041 carbon nanotube Substances 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 3
- 239000012212 insulator Substances 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 230000001476 alcoholic effect Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 239000004205 dimethyl polysiloxane Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- -1 polydimethylsiloxane Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- TYHJXGDMRRJCRY-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) tin(4+) Chemical compound [O-2].[Zn+2].[Sn+4].[In+3] TYHJXGDMRRJCRY-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/4908—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1292—Multistep manufacturing methods using liquid deposition, e.g. printing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
- H01L29/0665—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body the shape of the body defining a nanostructure
- H01L29/0669—Nanowires or nanotubes
- H01L29/0673—Nanowires or nanotubes oriented parallel to a substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78696—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/936—Specified use of nanostructure for electronic or optoelectronic application in a transistor or 3-terminal device
- Y10S977/938—Field effect transistors, FETS, with nanowire- or nanotube-channel region
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Nonlinear Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Formation Of Insulating Films (AREA)
Description
図1及び図2を参照すると、液晶表示パネルは液晶16を間に置いて互いに対向する薄膜トランジスタ(Thin Film Transistor:以下“TFT”という)基板70及びカラーフィルタ基板80を備える。
カラーフィルタ基板80は、上部基板11上にゲートライン2またはデータライン4と対応する位置に形成され、セル領域を区画するブラックマトリクス18と、ブラックマトリクス18により区画されたセル領域にカラー具現のためのカラーフィルタ12及び画素電極22と垂直電界をなす共通電極14とを備える。
図3は、従来の他のTFT基板を示す断面図である。
図3を参照すると、従来の他のTFT基板は、ナノワイヤ39(図4参照)を用いて形成したTFTの活性層38を備える。
従来の図3に示すTFT基板は前述の図1に示したTFT基板80に比べ、TFTの活性層38をナノワイヤ39を用いて形成した点を除いては、前述のTFT基板80と同一であるため、ナノワイヤ39を用いて形成したTFTの活性層38を除く他の構成要素に対する説明は省略する。
また、本発明の液晶表示装置の薄膜トランジスタ製造方法は、基板上にゲート電極を形成する段階と、薄膜トランジスタの活性領域が形成される領域に対応する領域に溝を有するゲート絶縁膜を前記ゲート電極上に形成する段階と、前記ゲート絶縁膜の溝にインクジェットを用いてナノワイヤを形成することにより、前記薄膜トランジスタの活性層を形成する段階と、前記活性層上に薄膜トランジスタのソース電極とドレイン電極を形成する段階とを含み、前記ゲート絶縁膜の溝は、前記溝に対応した突出部を有するモールドを用いて前記ゲート絶縁膜をパターニングして形成されることを特徴とする。
図6を参照すると、本発明の実施の形態に係るTFT基板は、下部基板101上にゲート絶縁膜106を間に置いて、交差して形成されたゲートライン(図示せず)及びデータライン(図示せず)と、それらの交差部毎に形成されるTFT130と、ゲートライン及びデータラインの交差構造で備えられたセル領域に形成される画素電極122を備える。
これを詳細にすると、TFTの活性層138が形成された下部基板101上にPECVD、スパッタリングなどの蒸着方法を通じ、ソース/ドレイン金属層が形成される。次いで、ソース/ドレイン金属層上にフォトレジスト膜を形成し、第2のマスクを用いて下部基板101上にフォトレジストパターンを形成する。
これを詳細に説明すると、下部基板101上に無機または有機絶縁物質及びフォトレジスト膜が全面塗布され、第3のマスクを用いたフォトレジストパターンを形成する。
図8Aを参照すると、ゲートライン(図示せず)及びゲート電極132が形成された下部基板101上に無機または有機ハイブリッド絶縁物質106aが全面塗布される。
本発明の、本実施の形態に係るTFT基板は、図6の薄膜トランジスタ基板と比べ、ナノワイヤ139(活性層138を形成する)をゲート絶縁膜106の溝107に固定させるための高分子絶縁膜110をさらに含むのを除いては、前述の実施の形態と同一であるため、他の構成要素に対する説明は省略する。
Claims (13)
- 基板上にゲート電極を形成する段階と、
薄膜トランジスタの活性領域が形成される領域に対応する領域に溝(groove)を有するゲート絶縁膜を前記ゲート電極上に形成する段階と、
前記ゲート絶縁膜の溝にインクジェットを用いてナノワイヤを形成することにより、前記薄膜トランジスタの活性層を形成する段階と、
前記活性層上にソース電極とドレイン電極を形成する段階と
を含み、
前記ゲート絶縁膜の溝は、前記溝に対応した突出部を有するモールドを用いて前記ゲート絶縁膜をパターニングして形成される
ことを特徴とする薄膜トランジスタ基板の製造方法。 - 前記ドレイン電極の一部分を露出するコンタクトホール(contact hole)を有する保護膜を形成する段階と、前記コンタクトホールを介して前記ドレイン電極に接続される画素電極を形成する段階とをさらに含むことを特徴とする請求項1に記載の薄膜トランジスタ基板の製造方法。
- 前記ゲート絶縁膜を形成する段階は、前記薄膜トランジスタの活性層が形成される領域と突出部を有するソフトモールド又はハードモールドを整列させる段階と、前記ソフトモールド又はハードモールドを前記基板上の前記ゲート絶縁膜に接触させる段階と、前記ソフトモールド又はハードモールドを加圧して、前記ゲート絶縁膜に溝を形成する段階とを含むことを特徴とする請求項1に記載の薄膜トランジスタ基板の製造方法。
- 前記薄膜トランジスタの活性層を形成する段階は、インクジェットを用いて、前記ゲート絶縁膜の溝に前記ナノワイヤを塗布する段階を含むことを特徴とする請求項1に記載の薄膜トランジスタ基板の製造方法。
- 前記ナノワイヤは、前記インクジェットにより塗布されるようにアルコール系溶媒に溶解されることを特徴とする請求項4に記載の薄膜トランジスタ基板の製造方法。
- 前記薄膜トランジスタの活性層を形成する段階は、前記ソース電極及びドレイン電極と接続される前記ナノワイヤの端部を熱処理する段階をさらに含むことを特徴とする請求項1に記載の薄膜トランジスタ基板の製造方法。
- 前記ナノワイヤの位置を前記ゲート絶縁膜の溝に固定するように高分子絶縁膜を前記薄膜トランジスタの活性層上に形成する段階をさらに含むことを特徴とする請求項1に記載の薄膜トランジスタ基板の製造方法。
- 基板上にゲート電極を形成する段階と、
薄膜トランジスタの活性領域が形成される領域に対応する領域に溝を有するゲート絶縁膜を前記ゲート電極上に形成する段階と、
前記ゲート絶縁膜の溝にインクジェットを用いてナノワイヤを形成することにより、前記薄膜トランジスタの活性層を形成する段階と、
前記活性層上に薄膜トランジスタのソース電極とドレイン電極を形成する段階と
を含み、
前記ゲート絶縁膜の溝は、前記溝に対応した突出部を有するモールドを用いて前記ゲート絶縁膜をパターニングして形成される
ことを特徴とする液晶表示装置の薄膜トランジスタ製造方法。 - 前記ゲート絶縁膜を形成する段階は、前記モールドを整列させる段階と、前記モールドを前記基板上の前記ゲート絶縁膜に接触させる段階と、前記モールドを加圧して、前記ゲート絶縁膜に溝を形成する段階とを含むことを特徴とする請求項8に記載の液晶表示装置の薄膜トランジスタ製造方法。
- 前記薄膜トランジスタの活性層を形成する段階は、インクジェットを用いて、前記ゲート絶縁膜の溝に前記ナノワイヤを塗布する段階を含むことを特徴とする請求項8に記載の液晶表示装置の薄膜トランジスタ製造方法。
- 前記ナノワイヤは、前記インクジェットにより塗布されるようにアルコール系溶媒に溶解されることを特徴とする請求項10に記載の液晶表示装置の薄膜トランジスタ製造方法。
- 前記薄膜トランジスタの活性層を形成する段階は、前記ソース電極及びドレイン電極と接続される前記ナノワイヤの端部を熱処理する段階を含むことを特徴とする請求項8に記載の液晶表示装置の薄膜トランジスタ製造方法。
- 前記ナノワイヤの位置を前記ゲート絶縁膜の溝に固定するように高分子絶縁膜を前記薄膜トランジスタの活性層上に形成する段階をさらに含むことを特徴とする請求項8に記載の液晶表示装置の薄膜トランジスタ製造方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2005-0053714 | 2005-06-21 | ||
KR1020050053714A KR101137865B1 (ko) | 2005-06-21 | 2005-06-21 | 박막 트랜지스터 기판의 제조방법 및 이를 이용한 박막트랜지스터 기판 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007005757A JP2007005757A (ja) | 2007-01-11 |
JP4718999B2 true JP4718999B2 (ja) | 2011-07-06 |
Family
ID=37572528
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005379395A Expired - Fee Related JP4718999B2 (ja) | 2005-06-21 | 2005-12-28 | 薄膜トランジスタ基板の製造方法、および、液晶表示装置の薄膜トランジスタ製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7465612B2 (ja) |
JP (1) | JP4718999B2 (ja) |
KR (1) | KR101137865B1 (ja) |
CN (1) | CN100466206C (ja) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101157983B1 (ko) * | 2005-12-26 | 2012-06-25 | 엘지디스플레이 주식회사 | 박막 패턴의 제조방법 및 이를 이용한 평판표시소자의제조방법 |
JP4970997B2 (ja) | 2006-03-30 | 2012-07-11 | パナソニック株式会社 | ナノワイヤトランジスタの製造方法 |
US7838865B2 (en) * | 2006-12-22 | 2010-11-23 | Palo Alto Research Center Incorporated | Method for aligning elongated nanostructures |
KR101366983B1 (ko) * | 2006-12-27 | 2014-02-25 | 엘지디스플레이 주식회사 | 액정표시장치 제조방법 |
KR100852628B1 (ko) * | 2007-02-05 | 2008-08-18 | 연세대학교 산학협력단 | 1d 나노와이어 채널을 이용한 박막트랜지스터의 제조방법 |
KR101362138B1 (ko) * | 2007-03-07 | 2014-02-13 | 엘지디스플레이 주식회사 | 평판표시패널 및 그 제조방법 |
KR101407288B1 (ko) * | 2007-04-27 | 2014-06-16 | 엘지디스플레이 주식회사 | 박막 트랜지스터 및 그의 제조 방법 |
KR20100047851A (ko) * | 2007-08-07 | 2010-05-10 | 파나소닉 주식회사 | 반도체 장치와 그 제조 방법 및 화상 표시 장치 |
CN101999162A (zh) * | 2007-12-14 | 2011-03-30 | 纳米系统公司 | 形成衬底元件的方法 |
US8018675B2 (en) * | 2008-03-06 | 2011-09-13 | Tdk Corporation | Thin film magnetic head |
KR101532058B1 (ko) * | 2008-09-26 | 2015-06-29 | 삼성디스플레이 주식회사 | 박막 트랜지스터 제조용 절연막 패턴, 이의 제조 방법 및 이를 이용한 박막 트랜지스터 기판 제조 방법 |
JP4913190B2 (ja) * | 2009-09-24 | 2012-04-11 | 株式会社東芝 | 不揮発性記憶装置 |
KR101309263B1 (ko) * | 2010-02-19 | 2013-09-17 | 한국전자통신연구원 | 유기 박막 트랜지스터 및 그 형성방법 |
JP5275524B2 (ja) * | 2010-11-17 | 2013-08-28 | シャープ株式会社 | 薄膜トランジスタ基板及びそれを備えた表示装置並びに薄膜トランジスタ基板の製造方法 |
JP5700291B2 (ja) * | 2011-03-24 | 2015-04-15 | 凸版印刷株式会社 | 薄膜トランジスタとその製造方法、および当該薄膜トランジスタを用いた画像表示装置 |
JP5853390B2 (ja) * | 2011-03-28 | 2016-02-09 | 凸版印刷株式会社 | 薄膜トランジスタ及びその製造方法並びに画像表示装置 |
CN103107065B (zh) * | 2011-11-15 | 2017-04-05 | 黄辉 | 一种基于纳米线有序排列的纳米线器件的制备方法 |
CN102403231B (zh) * | 2011-11-22 | 2014-09-03 | 复旦大学 | 使用纳米压印和接触式光刻制备硅纳米线晶体管的方法 |
TWI467307B (zh) * | 2012-02-10 | 2015-01-01 | E Ink Holdings Inc | 電泳顯示面板及其製作方法與電泳顯示裝置 |
CN103972296B (zh) * | 2013-01-31 | 2017-10-24 | 清华大学 | 薄膜晶体管 |
CN103165471A (zh) * | 2013-02-19 | 2013-06-19 | 京东方科技集团股份有限公司 | 薄膜晶体管及其制作方法和显示装置 |
CN103236442B (zh) * | 2013-04-23 | 2016-12-28 | 京东方科技集团股份有限公司 | 薄膜晶体管及其制造方法、阵列基板、电子装置 |
TWI508305B (zh) | 2013-05-06 | 2015-11-11 | E Ink Holdings Inc | 主動元件 |
KR20150110961A (ko) | 2014-03-21 | 2015-10-05 | 삼성디스플레이 주식회사 | 액정 표시 장치 |
CN104183648B (zh) * | 2014-07-25 | 2017-06-27 | 京东方科技集团股份有限公司 | 一种薄膜晶体管及其制作方法、阵列基板和显示装置 |
CN108091700A (zh) * | 2017-12-28 | 2018-05-29 | 深圳市华星光电半导体显示技术有限公司 | 薄膜晶体管及其制造方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02224275A (ja) * | 1989-02-27 | 1990-09-06 | Hitachi Ltd | 薄膜トランジスタ |
JPH06112486A (ja) * | 1992-09-28 | 1994-04-22 | Alps Electric Co Ltd | 薄膜トランジスタと液晶表示装置用基板および薄膜トランジスタの製造方法 |
JP2005045188A (ja) * | 2003-07-25 | 2005-02-17 | Fuji Xerox Co Ltd | 電子素子、集積回路およびその製造方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100660813B1 (ko) * | 1999-12-31 | 2006-12-26 | 엘지.필립스 엘시디 주식회사 | 엑스레이 디텍터용 어레이기판 제조방법 |
KR100803177B1 (ko) * | 2001-05-14 | 2008-02-14 | 삼성전자주식회사 | 액정표시장치용 박막 트랜지스터 및 그 제조방법 |
KR100443835B1 (ko) * | 2002-04-17 | 2004-08-11 | 엘지.필립스 엘시디 주식회사 | 정전기 방지를 위한 박막트랜지스터 어레이 기판 및 그 제조방법 |
US7569153B2 (en) * | 2002-05-23 | 2009-08-04 | Lg Display Co., Ltd. | Fabrication method of liquid crystal display device |
KR100869740B1 (ko) * | 2002-08-17 | 2008-11-21 | 엘지디스플레이 주식회사 | 액정표시소자 및 그 제조방법 |
DE602004006256T2 (de) * | 2003-05-20 | 2008-01-24 | Polymer Vision Ltd. | Struktur einer halbleiter-anordnung und eine methode zur herstellung einer halbleiteranordnung |
US7365395B2 (en) * | 2004-09-16 | 2008-04-29 | Nanosys, Inc. | Artificial dielectrics using nanostructures |
US7405129B2 (en) * | 2004-11-18 | 2008-07-29 | International Business Machines Corporation | Device comprising doped nano-component and method of forming the device |
KR101109623B1 (ko) * | 2005-04-07 | 2012-01-31 | 엘지디스플레이 주식회사 | 박막트랜지스터와 그 제조방법. |
-
2005
- 2005-06-21 KR KR1020050053714A patent/KR101137865B1/ko active IP Right Grant
- 2005-12-21 US US11/312,605 patent/US7465612B2/en active Active
- 2005-12-23 CN CNB2005101350018A patent/CN100466206C/zh not_active Expired - Fee Related
- 2005-12-28 JP JP2005379395A patent/JP4718999B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02224275A (ja) * | 1989-02-27 | 1990-09-06 | Hitachi Ltd | 薄膜トランジスタ |
JPH06112486A (ja) * | 1992-09-28 | 1994-04-22 | Alps Electric Co Ltd | 薄膜トランジスタと液晶表示装置用基板および薄膜トランジスタの製造方法 |
JP2005045188A (ja) * | 2003-07-25 | 2005-02-17 | Fuji Xerox Co Ltd | 電子素子、集積回路およびその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
CN100466206C (zh) | 2009-03-04 |
US20060284181A1 (en) | 2006-12-21 |
US7465612B2 (en) | 2008-12-16 |
CN1885509A (zh) | 2006-12-27 |
KR101137865B1 (ko) | 2012-04-20 |
KR20060133845A (ko) | 2006-12-27 |
JP2007005757A (ja) | 2007-01-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4718999B2 (ja) | 薄膜トランジスタ基板の製造方法、および、液晶表示装置の薄膜トランジスタ製造方法 | |
JP4021440B2 (ja) | 薄膜トランジスタアレイ基板の製造方法 | |
KR100456151B1 (ko) | 박막 트랜지스터 어레이 기판 및 그 제조 방법 | |
US7718994B2 (en) | Array substrates for use in liquid crystal displays and fabrication methods thereof | |
US20080142797A1 (en) | Thin film transistor, thin film transistor substate, and method of manufacturing the same | |
US20080003726A1 (en) | Method for fabricating a thin film transistor for use with a flat panel display device | |
US20080007687A1 (en) | Liquid crystal display device and a manufacturing method thereof | |
WO2018090482A1 (zh) | 阵列基板及其制备方法、显示装置 | |
JP2004334214A (ja) | 薄膜トランジスタ・アレイ基板及びその製造方法 | |
KR20080014523A (ko) | 액정표시장치용 어레이 기판 및 그 제조 방법 | |
KR101074947B1 (ko) | 박막트랜지스터 어레이 기판 및 그 제조방법 | |
US8077268B2 (en) | Thin film transistor substrate and method of manufacturing the same | |
US20100020258A1 (en) | Thin film transistor substrate, method of manufacturing thereof and liquid crystal display device | |
US7179697B2 (en) | Method of fabricating an electronic device | |
JP2006295121A (ja) | 薄膜トランジスタを用いた液晶表示装置及びその製造方法 | |
JP5324758B2 (ja) | 薄膜トランジスタ、表示装置、およびその製造方法 | |
US6440783B2 (en) | Method for fabricating a thin film transistor display | |
US8420302B2 (en) | Method of fine patterning a thin film and method of manufacturing a display substrate using the method | |
JP5221082B2 (ja) | Tft基板 | |
KR101205767B1 (ko) | 액상의 유기 반도체물질을 이용한 액정표시장치용 어레이기판의 제조방법 | |
JP2011222688A (ja) | 薄膜のパターニング方法及び表示パネルの製造方法 | |
KR100507283B1 (ko) | 박막트랜지스터 액정표시장치의 제조방법 | |
KR101087242B1 (ko) | 액정 표시 장치용 박막 트랜지스터 소자 및 그의 제조 방법 | |
JP4052804B2 (ja) | 電極基板および電極基板の作製方法 | |
KR101236240B1 (ko) | 액정표시장치용 어레이 기판의 제조방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090318 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20091020 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100120 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110104 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110308 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20110329 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20110401 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 4718999 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140408 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |