JP2578897B2 - 物品の表面欠陥の検出方法及びその装置 - Google Patents

物品の表面欠陥の検出方法及びその装置

Info

Publication number
JP2578897B2
JP2578897B2 JP63091233A JP9123388A JP2578897B2 JP 2578897 B2 JP2578897 B2 JP 2578897B2 JP 63091233 A JP63091233 A JP 63091233A JP 9123388 A JP9123388 A JP 9123388A JP 2578897 B2 JP2578897 B2 JP 2578897B2
Authority
JP
Japan
Prior art keywords
light
article
light emitting
detecting
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63091233A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6438638A (en
Inventor
ユルゲン・クレンク
ホルスト・クラソブスキ
ゲルハルト・ユーネマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daimler Benz AG
Original Assignee
Daimler Benz AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daimler Benz AG filed Critical Daimler Benz AG
Publication of JPS6438638A publication Critical patent/JPS6438638A/ja
Application granted granted Critical
Publication of JP2578897B2 publication Critical patent/JP2578897B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/102—Video camera

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP63091233A 1987-04-13 1988-04-13 物品の表面欠陥の検出方法及びその装置 Expired - Lifetime JP2578897B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19873712513 DE3712513A1 (de) 1987-04-13 1987-04-13 Verfahren und vorrichtung zur erkennung von oberflaechenfehlern
DE3712513.3 1987-04-13

Publications (2)

Publication Number Publication Date
JPS6438638A JPS6438638A (en) 1989-02-08
JP2578897B2 true JP2578897B2 (ja) 1997-02-05

Family

ID=6325542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63091233A Expired - Lifetime JP2578897B2 (ja) 1987-04-13 1988-04-13 物品の表面欠陥の検出方法及びその装置

Country Status (6)

Country Link
US (1) US4918321A (enExample)
EP (1) EP0286994B1 (enExample)
JP (1) JP2578897B2 (enExample)
CA (1) CA1285331C (enExample)
DE (1) DE3712513A1 (enExample)
ES (1) ES2059421T3 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
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JP2012514186A (ja) * 2008-12-29 2012-06-21 カール ツァイス オーアイエム ゲーエムベーハー 少なくとも一部が反射性を呈する物体表面の光学的検査装置
KR20160074251A (ko) * 2014-12-18 2016-06-28 대보정보통신 주식회사 통행권발행기 카세트용 통행권 가압장치
KR101845104B1 (ko) * 2010-10-04 2018-04-03 더 보잉 컴파니 자동 시각 검사 시스템

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US6462813B1 (en) 1996-04-12 2002-10-08 Perceptron, Inc. Surface defect inspection system and method
JP4001387B2 (ja) 1996-08-22 2007-10-31 フォルクハイム ウント ヴィーリンク ゲーエムベーハー 寸法の大きいマッチング面の表面性状を目視検査するための装置
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DE102004007828B4 (de) * 2004-02-18 2006-05-11 Isra Vision Systems Ag Verfahren und System zur Inspektion von Oberflächen
DE102004007829B4 (de) * 2004-02-18 2007-04-05 Isra Vision Systems Ag Verfahren zur Bestimmung von zu inspizierenden Bereichen
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DE102007013883A1 (de) * 2007-03-20 2008-10-30 Beulenzentrum Jentgens Gmbh & Co. Kg Verfahren und Vorrichtung zur Erfassung und Auswertung von Hagelschäden
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US9541505B2 (en) 2009-02-17 2017-01-10 The Boeing Company Automated postflight troubleshooting sensor array
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US8812154B2 (en) * 2009-03-16 2014-08-19 The Boeing Company Autonomous inspection and maintenance
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US9046892B2 (en) * 2009-06-05 2015-06-02 The Boeing Company Supervision and control of heterogeneous autonomous operations
US8773289B2 (en) 2010-03-24 2014-07-08 The Boeing Company Runway condition monitoring
US8599044B2 (en) 2010-08-11 2013-12-03 The Boeing Company System and method to assess and report a health of a tire
US8712634B2 (en) 2010-08-11 2014-04-29 The Boeing Company System and method to assess and report the health of landing gear related components
US20130204798A1 (en) * 2010-08-13 2013-08-08 Arwe Service Gmbh Method for vehicle conditioning and provision
JP2012098181A (ja) * 2010-11-02 2012-05-24 Sumitomo Electric Ind Ltd 検出装置及び検出方法
DE102011082178A1 (de) * 2011-09-06 2013-03-07 Hauni Maschinenbau Ag Optische Inspektion von stabförmigen Artikeln der Tabak verarbeitenden Industrie
US9117185B2 (en) 2012-09-19 2015-08-25 The Boeing Company Forestry management system
US9412203B1 (en) 2013-01-22 2016-08-09 Carvana, LLC Systems and methods for generating virtual item displays
EP2770322B1 (en) * 2013-02-26 2019-01-16 C.R.F. Società Consortile per Azioni Method and system for detecting defects in painting of components, in particular of motor-vehicle bodies
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US10036712B2 (en) 2013-10-24 2018-07-31 Philips Lighting Holding B.V. Defect inspection system and method using an array of light sources
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ES2630736B1 (es) * 2015-12-07 2018-07-04 Universidad De Zaragoza Sistema y método de detección de defectos en superficies especulares o semi-especulares mediante proyección fotogramétrica
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US10939023B2 (en) 2016-12-07 2021-03-02 Carvana Llc Vehicle photographic chamber
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Publication number Priority date Publication date Assignee Title
JP2012514186A (ja) * 2008-12-29 2012-06-21 カール ツァイス オーアイエム ゲーエムベーハー 少なくとも一部が反射性を呈する物体表面の光学的検査装置
KR101845104B1 (ko) * 2010-10-04 2018-04-03 더 보잉 컴파니 자동 시각 검사 시스템
KR20160074251A (ko) * 2014-12-18 2016-06-28 대보정보통신 주식회사 통행권발행기 카세트용 통행권 가압장치

Also Published As

Publication number Publication date
EP0286994B1 (de) 1994-07-20
EP0286994A2 (de) 1988-10-19
DE3712513C2 (enExample) 1993-01-21
JPS6438638A (en) 1989-02-08
CA1285331C (en) 1991-06-25
ES2059421T3 (es) 1994-11-16
DE3712513A1 (de) 1988-11-03
EP0286994A3 (en) 1990-03-14
US4918321A (en) 1990-04-17

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