CA1285331C - Method and apparatus for the detection of surface blemishes - Google Patents
Method and apparatus for the detection of surface blemishesInfo
- Publication number
- CA1285331C CA1285331C CA000564075A CA564075A CA1285331C CA 1285331 C CA1285331 C CA 1285331C CA 000564075 A CA000564075 A CA 000564075A CA 564075 A CA564075 A CA 564075A CA 1285331 C CA1285331 C CA 1285331C
- Authority
- CA
- Canada
- Prior art keywords
- light
- images
- strip
- lighting
- relative movement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000001514 detection method Methods 0.000 title abstract description 18
- 230000005693 optoelectronics Effects 0.000 claims description 4
- 230000007547 defect Effects 0.000 claims 3
- 238000012544 monitoring process Methods 0.000 claims 3
- 238000011156 evaluation Methods 0.000 claims 1
- 238000012360 testing method Methods 0.000 description 13
- 238000004458 analytical method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 229920002907 Guar gum Polymers 0.000 description 1
- OCYROESYHWUPBP-CIUDSAMLSA-N Pro-Ile Chemical compound CC[C@H](C)[C@@H](C([O-])=O)NC(=O)[C@@H]1CCC[NH2+]1 OCYROESYHWUPBP-CIUDSAMLSA-N 0.000 description 1
- 210000000746 body region Anatomy 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 235000010417 guar gum Nutrition 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 108010015796 prolylisoleucine Proteins 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DEP3712513.3 | 1987-04-13 | ||
| DE19873712513 DE3712513A1 (de) | 1987-04-13 | 1987-04-13 | Verfahren und vorrichtung zur erkennung von oberflaechenfehlern |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1285331C true CA1285331C (en) | 1991-06-25 |
Family
ID=6325542
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000564075A Expired - Fee Related CA1285331C (en) | 1987-04-13 | 1988-04-13 | Method and apparatus for the detection of surface blemishes |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4918321A (enExample) |
| EP (1) | EP0286994B1 (enExample) |
| JP (1) | JP2578897B2 (enExample) |
| CA (1) | CA1285331C (enExample) |
| DE (1) | DE3712513A1 (enExample) |
| ES (1) | ES2059421T3 (enExample) |
Families Citing this family (71)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR920704092A (ko) * | 1989-12-05 | 1992-12-19 | 원본미기재 | 물체의 광 측정을 위한 방법 및 장치 |
| US5041726A (en) * | 1990-06-11 | 1991-08-20 | Hughes Aircraft Company | Infrared holographic defect detector |
| DE4206868A1 (de) * | 1992-03-05 | 1993-09-09 | Hermann Dr Ing Tropf | Verfahren und vorrichtung zur aufnahme bewegter objekte mit einer kamera |
| US5414518A (en) * | 1992-08-10 | 1995-05-09 | Chrysler Corporation | Method and apparatus for the evaluation of reflective surfaces |
| US5471307A (en) * | 1992-09-21 | 1995-11-28 | Phase Shift Technology, Inc. | Sheet flatness measurement system and method |
| JP3172287B2 (ja) * | 1992-11-09 | 2001-06-04 | マツダ株式会社 | 塗膜欠陥検出装置 |
| JPH08184567A (ja) * | 1994-10-05 | 1996-07-16 | Musco Corp | 鏡面反射性又は半鏡面反射性表面を点検するための装置及び方法 |
| IL113428A0 (en) * | 1995-04-20 | 1995-07-31 | Yissum Res Dev Co | Glossmeter |
| DE19544481A1 (de) * | 1995-11-29 | 1997-06-05 | Laser Sorter Gmbh | Beleuchtungseinrichtung mit Halogen-Metalldampflampen |
| JP2976869B2 (ja) * | 1995-12-28 | 1999-11-10 | 日産自動車株式会社 | 表面欠陥検査装置 |
| US5686987A (en) | 1995-12-29 | 1997-11-11 | Orfield Associates, Inc. | Methods for assessing visual tasks to establish desirable lighting and viewing conditions for performance of tasks; apparatus; and, applications |
| US6462813B1 (en) * | 1996-04-12 | 2002-10-08 | Perceptron, Inc. | Surface defect inspection system and method |
| ATE216076T1 (de) * | 1996-08-22 | 2002-04-15 | Willing Gmbh Dr Ing | Vorrichtung zur visuellen inspektion der oberflächenbeschaffenheit von abmusterungsflächen grösserer abmessung |
| US6033503A (en) * | 1997-05-05 | 2000-03-07 | Steven K. Radowicz | Adhesive sensing assembly for end jointed beam |
| DE19730885A1 (de) * | 1997-07-18 | 1999-01-21 | Audi Ag | Verfahren zur automatischen Erkennung von Oberflächenfehlern an Rohkarosserien und Vorrichtung zur Durchführung des Verfahrens |
| DE19754549A1 (de) * | 1997-12-09 | 1999-06-10 | Bayerische Motoren Werke Ag | Verfahren zum Prüfen von matten, mit hellen Füllern versehenen Rohkarosserien auf Fehler |
| DE19754547B4 (de) * | 1997-12-09 | 2007-04-12 | Bayerische Motoren Werke Ag | Verfahren zur Bestimmung des Deckvermögens einer Lackierung |
| DE19816992A1 (de) | 1998-04-17 | 1999-11-04 | Daimler Chrysler Ag | Verfahren zur Markierung wenigstens eines Punktes auf einem Gegenstand |
| DE19842112B4 (de) * | 1998-09-07 | 2006-12-14 | Braun, Uwe Peter, Dipl.-Ing. | Einrichtung zur Einstellung und Steuerung der Beleuchtungsstärke von Kontrolleuchten |
| DE19855478B4 (de) * | 1998-12-01 | 2006-01-12 | Steinbichler Optotechnik Gmbh | Verfahren und Vorrichtung zur optischen Erfassung einer Kontrastlinie |
| GB9826802D0 (en) * | 1998-12-04 | 1999-01-27 | Vdrs Limited | Vehicle inspection system |
| JP2001004347A (ja) * | 1999-06-22 | 2001-01-12 | Mitsubishi Electric Corp | 欠陥検査装置 |
| DE19930688A1 (de) * | 1999-07-02 | 2001-01-04 | Byk Gardner Gmbh | Vorrichtung und Verfahren zur Bestimmung der Qualität von Oberflächen |
| US6266138B1 (en) | 1999-10-12 | 2001-07-24 | Perceptron, Inc. | System and method for detecting defects in a surface of a workpiece |
| FI19992761A7 (fi) * | 1999-12-22 | 2001-06-23 | Visy Oy | Menetelmä kuljetusvälineen kunnon valvomiseksi |
| DE10110994B4 (de) * | 2000-03-09 | 2012-11-29 | Isra Vision Systems Ag | Vorrichtung zur Bildabtastung eines Objektes |
| DE10242620B3 (de) * | 2002-09-13 | 2004-04-15 | Dr.Ing.H.C. F. Porsche Ag | Verfahren und Vorrichtung zum visuellen Erkennen von Farbglanzabweichungen |
| DE10261865A1 (de) * | 2002-12-20 | 2004-07-15 | Uwe Braun Sonnenlichtleitsysteme Lichtsysteme Gmbh | Verfahren, Vorrichtung und Computerprogramm zur optischen Oberflächenerfassung |
| EP1677098A4 (en) | 2003-10-21 | 2010-07-21 | Daihatsu Motor Co Ltd | DEVICE AND METHOD FOR INSPECTING DEFECTS IN A SURFACE |
| DE102004007829B4 (de) * | 2004-02-18 | 2007-04-05 | Isra Vision Systems Ag | Verfahren zur Bestimmung von zu inspizierenden Bereichen |
| DE102004007828B4 (de) * | 2004-02-18 | 2006-05-11 | Isra Vision Systems Ag | Verfahren und System zur Inspektion von Oberflächen |
| JP2006305426A (ja) * | 2005-04-26 | 2006-11-09 | Suzuki Motor Corp | 塗布状態検査方法、装置、及びコンピュータプログラム |
| DE102007013883A1 (de) * | 2007-03-20 | 2008-10-30 | Beulenzentrum Jentgens Gmbh & Co. Kg | Verfahren und Vorrichtung zur Erfassung und Auswertung von Hagelschäden |
| CA2684365A1 (en) * | 2007-04-16 | 2008-10-23 | Josep Maria Tornero Montserrat | System of detection of faults in surfaces by merging of images by means of light sweeping |
| DE102007034689B4 (de) * | 2007-07-12 | 2009-06-10 | Carl Zeiss Ag | Verfahren und Vorrichtung zum optischen Inspizieren einer Oberfläche an einem Gegenstand |
| SG157977A1 (en) * | 2008-06-23 | 2010-01-29 | Semiconductor Tech & Instr Inc | System and method for inspection of semiconductor packages |
| DE102008064562A1 (de) | 2008-12-29 | 2010-07-08 | Carl Zeiss Oim Gmbh | Vorrichtung zum optischen Inspizieren einer zumindest teilweise glänzenden Oberfläche an einem Gegenstand |
| US9418496B2 (en) * | 2009-02-17 | 2016-08-16 | The Boeing Company | Automated postflight troubleshooting |
| US9541505B2 (en) | 2009-02-17 | 2017-01-10 | The Boeing Company | Automated postflight troubleshooting sensor array |
| US8812154B2 (en) * | 2009-03-16 | 2014-08-19 | The Boeing Company | Autonomous inspection and maintenance |
| DE102009021733A1 (de) | 2009-05-12 | 2010-12-30 | Carl Zeiss Oim Gmbh | Vorrichtung und Verfahren zum optischen Inspizieren eines Gegenstandes |
| US9046892B2 (en) * | 2009-06-05 | 2015-06-02 | The Boeing Company | Supervision and control of heterogeneous autonomous operations |
| US8773289B2 (en) | 2010-03-24 | 2014-07-08 | The Boeing Company | Runway condition monitoring |
| US8599044B2 (en) | 2010-08-11 | 2013-12-03 | The Boeing Company | System and method to assess and report a health of a tire |
| US8712634B2 (en) | 2010-08-11 | 2014-04-29 | The Boeing Company | System and method to assess and report the health of landing gear related components |
| WO2012019800A2 (en) * | 2010-08-13 | 2012-02-16 | Arwe Service Gmbh | Method for vehicle conditioning and provision |
| US8982207B2 (en) * | 2010-10-04 | 2015-03-17 | The Boeing Company | Automated visual inspection system |
| JP2012098181A (ja) * | 2010-11-02 | 2012-05-24 | Sumitomo Electric Ind Ltd | 検出装置及び検出方法 |
| DE102011082178A1 (de) * | 2011-09-06 | 2013-03-07 | Hauni Maschinenbau Ag | Optische Inspektion von stabförmigen Artikeln der Tabak verarbeitenden Industrie |
| US9117185B2 (en) | 2012-09-19 | 2015-08-25 | The Boeing Company | Forestry management system |
| US9922356B1 (en) | 2013-01-22 | 2018-03-20 | Carvana, LLC | Methods and systems for online transactions |
| EP2770322B1 (en) * | 2013-02-26 | 2019-01-16 | C.R.F. Società Consortile per Azioni | Method and system for detecting defects in painting of components, in particular of motor-vehicle bodies |
| DE102013109915B4 (de) * | 2013-09-10 | 2015-04-02 | Thyssenkrupp Steel Europe Ag | Verfahren und Vorrichtung zur Überprüfung eines Inspektionssystems zur Erkennung von Oberflächendefekten |
| ES2907258T3 (es) | 2013-10-24 | 2022-04-22 | Signify Holding Bv | Sistema y método de detección de defectos |
| US10063758B2 (en) * | 2014-10-03 | 2018-08-28 | Davo Scheich | Vehicle photographic tunnel |
| KR101669998B1 (ko) * | 2014-12-18 | 2016-10-28 | 대보정보통신 주식회사 | 통행권발행기 카세트용 통행권 가압장치 |
| DE102015008409A1 (de) * | 2015-07-02 | 2017-01-05 | Eisenmann Se | Anlage zur optischen Überprüfung von Oberflächenbereichen von Gegenständen |
| ES2630736B1 (es) * | 2015-12-07 | 2018-07-04 | Universidad De Zaragoza | Sistema y método de detección de defectos en superficies especulares o semi-especulares mediante proyección fotogramétrica |
| DE102016111544A1 (de) * | 2016-06-23 | 2017-12-28 | Hochschule Düsseldorf | Laser-Scan-System |
| CN110249617B (zh) | 2016-12-07 | 2021-11-02 | 奥瓦德卡斯特姆规划有限责任公司 | 车辆拍摄室 |
| DE102017108770A1 (de) * | 2017-04-25 | 2018-10-25 | Eisenmann Se | Anlage zur optischen Überprüfung von Oberflächenbereichen von Gegenständen |
| CZ201861A3 (cs) * | 2018-02-05 | 2019-06-12 | Christoph Vávra | 3D analytický měřicí přístroj optických dat |
| DE102018118602B3 (de) | 2018-07-31 | 2019-11-28 | Sarma Aryasomayajula | Verfahren und Vorrichtung zur Erkennung und Analyse von Oberflächenfehlern dreidimensionaler Objekte mit einer reflektierenden Oberfläche, insbesondere von Kraftfahrzeugkarosserien |
| US11412135B2 (en) | 2018-12-05 | 2022-08-09 | Ovad Custom Stages, Llc | Bowl-shaped photographic stage |
| WO2020210790A1 (en) | 2019-04-11 | 2020-10-15 | Ovad Custom Stages, Llc | Ovoid vehicle photographic booth |
| WO2020247906A1 (en) | 2019-06-06 | 2020-12-10 | Ovad Custom Stages, Llc | Vehicle photographic system for identification of surface imperfections |
| HRP20240123T1 (hr) * | 2019-09-11 | 2024-04-12 | Proov Station | Sklop za detekciju nedostataka na karoseriji motornog vozila |
| CN113030100A (zh) * | 2021-03-02 | 2021-06-25 | 成都小淞科技有限公司 | 涂层瑕疵在线自动检测系统 |
| US12126774B2 (en) | 2021-03-19 | 2024-10-22 | Carvana, LLC | Mobile photobooth |
| DE102021107115B4 (de) | 2021-03-23 | 2025-01-30 | B+M Surface Systems Gmbh | Vorrichtung zur Untersuchung einer Oberfläche eines Bauteils |
| WO2024135842A1 (ja) * | 2022-12-23 | 2024-06-27 | ダイキン工業株式会社 | 撮影装置及び撮影方法 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3577039A (en) * | 1969-01-28 | 1971-05-04 | Bendix Corp | Optical apparatus for flaw detection |
| GB1379593A (en) * | 1971-05-21 | 1975-01-02 | Agfa Gevaert | Device for sensing a moving sheet material for imperfections |
| JPS5075483A (enExample) * | 1973-11-06 | 1975-06-20 | ||
| US4008606A (en) * | 1975-10-20 | 1977-02-22 | The United States Of America As Represented By The Secretary Of The Navy | Ship's bottom inspection apparatus |
| GB1592511A (en) * | 1977-05-18 | 1981-07-08 | Ferranti Ltd | Surface inspection apparatus |
| JPS5520123A (en) * | 1978-07-17 | 1980-02-13 | Nippon Pirooburotsuku Seizou K | Crack detector for bottle head |
| US4260899A (en) * | 1979-06-14 | 1981-04-07 | Intec Corporation | Wide web laser scanner flaw detection method and apparatus |
| US4345274A (en) * | 1980-10-08 | 1982-08-17 | Servo Corporation Of America | Object identification system utilizing closed circuit television |
| DE3111728A1 (de) * | 1981-03-25 | 1982-10-07 | Philips Patentverwaltung Gmbh, 2000 Hamburg | "pruefverfahren fuer werkstuecke" |
| JPS5867093A (ja) * | 1981-10-19 | 1983-04-21 | 株式会社東芝 | 印刷回路基板検査方法及びその装置 |
| JPS58190707A (ja) * | 1982-04-30 | 1983-11-07 | Toyoda Gosei Co Ltd | 表面検査方法 |
| US4563095A (en) * | 1982-12-20 | 1986-01-07 | Essex Group, Inc. | Method and apparatus for monitoring the surface of elongated objects |
| JPS59114445A (ja) * | 1982-12-21 | 1984-07-02 | Yamamura Glass Kk | 透明体の欠陥検出装置 |
| US4528455A (en) * | 1983-05-13 | 1985-07-09 | Magnaflux Corporation | Non-destructive testing system with dual scanning |
| US4629319A (en) * | 1984-02-14 | 1986-12-16 | Diffracto Ltd. | Panel surface flaw inspection |
| DE3411578A1 (de) * | 1984-03-29 | 1985-10-10 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verfahren zur ermittlung von lackfehlern und vorrichtung zur durchfuehrung des verfahrens |
| GB2159271B (en) * | 1984-04-27 | 1988-05-18 | Nissan Motor | Surface flaw detecting method and apparatus |
| DE3418317C1 (de) * | 1984-05-17 | 1985-01-31 | Daimler-Benz Ag, 7000 Stuttgart | Prüfraum zur Überprüfung der Oberfläche von Fahrzeugkarosserien |
| JPS628045A (ja) * | 1985-07-04 | 1987-01-16 | Nireko:Kk | 欠陥検出装置 |
| GB8517834D0 (en) * | 1985-07-15 | 1985-08-21 | Sira Ltd | Inspection apparatus |
| DE3534019A1 (de) * | 1985-09-24 | 1987-04-02 | Sick Optik Elektronik Erwin | Optische bahnueberwachungsvorrichtung |
-
1987
- 1987-04-13 DE DE19873712513 patent/DE3712513A1/de active Granted
-
1988
- 1988-04-08 ES ES88105660T patent/ES2059421T3/es not_active Expired - Lifetime
- 1988-04-08 EP EP88105660A patent/EP0286994B1/de not_active Expired - Lifetime
- 1988-04-13 JP JP63091233A patent/JP2578897B2/ja not_active Expired - Lifetime
- 1988-04-13 CA CA000564075A patent/CA1285331C/en not_active Expired - Fee Related
- 1988-04-13 US US07/180,936 patent/US4918321A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US4918321A (en) | 1990-04-17 |
| JPS6438638A (en) | 1989-02-08 |
| DE3712513C2 (enExample) | 1993-01-21 |
| EP0286994A2 (de) | 1988-10-19 |
| DE3712513A1 (de) | 1988-11-03 |
| EP0286994B1 (de) | 1994-07-20 |
| JP2578897B2 (ja) | 1997-02-05 |
| EP0286994A3 (en) | 1990-03-14 |
| ES2059421T3 (es) | 1994-11-16 |
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