JP2020510340A5 - - Google Patents
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- Publication number
- JP2020510340A5 JP2020510340A5 JP2019548740A JP2019548740A JP2020510340A5 JP 2020510340 A5 JP2020510340 A5 JP 2020510340A5 JP 2019548740 A JP2019548740 A JP 2019548740A JP 2019548740 A JP2019548740 A JP 2019548740A JP 2020510340 A5 JP2020510340 A5 JP 2020510340A5
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- voltage
- input
- quantizer
- node
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005669 field effect Effects 0.000 claims 4
- 230000001419 dependent effect Effects 0.000 claims 2
- 238000000034 method Methods 0.000 claims 2
- 230000008929 regeneration Effects 0.000 claims 2
- 238000011069 regeneration method Methods 0.000 claims 2
- 238000005070 sampling Methods 0.000 claims 2
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 230000005685 electric field effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/453,707 | 2017-03-08 | ||
| US15/453,707 US9755655B1 (en) | 2017-03-08 | 2017-03-08 | Dynamic quantizers having multiple reset levels |
| PCT/US2018/018255 WO2018164818A1 (en) | 2017-03-08 | 2018-02-14 | Dynamic quantizers having multiple reset levels |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020510340A JP2020510340A (ja) | 2020-04-02 |
| JP2020510340A5 true JP2020510340A5 (enExample) | 2021-03-25 |
| JP7274420B2 JP7274420B2 (ja) | 2023-05-16 |
Family
ID=59702469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019548740A Active JP7274420B2 (ja) | 2017-03-08 | 2018-02-14 | 複数のリセットレベルを有する動的量子化器 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9755655B1 (enExample) |
| EP (1) | EP3593452B1 (enExample) |
| JP (1) | JP7274420B2 (enExample) |
| KR (1) | KR102564880B1 (enExample) |
| CN (1) | CN110521119B (enExample) |
| WO (1) | WO2018164818A1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107733432B (zh) * | 2017-11-10 | 2019-09-03 | 中国电子科技集团公司第五十八研究所 | 高精度电荷域流水线adc共模电荷误差校准系统 |
| CN107863964B (zh) * | 2017-11-10 | 2019-09-24 | 中国电子科技集团公司第五十八研究所 | 可精确控制共模电荷量的全差分电荷传输电路 |
| CN107863962B (zh) * | 2017-11-10 | 2019-09-03 | 中国电子科技集团公司第五十八研究所 | 高精度电荷域流水线adc的电容适配误差校准系统 |
| US10454463B1 (en) | 2018-08-21 | 2019-10-22 | Xilinx, Inc. | Adaptable quantizers having dedicated supply voltage for tail device drivers |
| JPWO2021200415A1 (enExample) * | 2020-03-30 | 2021-10-07 | ||
| CN115885472A (zh) * | 2020-07-24 | 2023-03-31 | 株式会社半导体能源研究所 | 半导体装置 |
| US11670345B2 (en) | 2021-02-05 | 2023-06-06 | Samsung Electronics Co., Ltd. | Sense amplifier including pre-amplifier circuit and memory device including same |
| KR20220139063A (ko) | 2021-04-07 | 2022-10-14 | 에스케이하이닉스 주식회사 | 클럭 신호 처리 회로, 반도체 장치 및 반도체 시스템 |
| US12348205B2 (en) | 2021-04-23 | 2025-07-01 | Samsung Electronics Co., Ltd. | Amplifier circuit |
| US11973621B2 (en) | 2021-12-17 | 2024-04-30 | Samsung Display Co., Ltd. | Power efficient slicer for decision feedback equalizer |
| US11664821B1 (en) * | 2022-02-08 | 2023-05-30 | SK Hynix Inc. | Error floor performance of a bit flipping decoder through identifying unreliable check nodes |
| KR102898523B1 (ko) | 2024-11-19 | 2025-12-09 | 서강대학교산학협력단 | 아날로그-디지털 변환기 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4821286A (en) * | 1986-05-27 | 1989-04-11 | American Telephone And Telegraph Company | Quaternary signal regenerator |
| US6021172A (en) * | 1994-01-28 | 2000-02-01 | California Institute Of Technology | Active pixel sensor having intra-pixel charge transfer with analog-to-digital converter |
| JP2000114970A (ja) * | 1998-10-07 | 2000-04-21 | Yozan Inc | 比較回路およびアナログデジタル変換回路 |
| JP2002076901A (ja) * | 2000-08-30 | 2002-03-15 | Matsushita Electric Ind Co Ltd | Δ変調とδς変調を混合した方式の変調器,オーバーサンプリング型d/a変換器およびa/d変換器 |
| US6456215B1 (en) * | 2000-11-29 | 2002-09-24 | Raytheon Company | Method and system for quantizing an input signal |
| US6392449B1 (en) * | 2001-01-05 | 2002-05-21 | National Semiconductor Corporation | High-speed low-power low-offset hybrid comparator |
| US7288998B2 (en) * | 2003-05-02 | 2007-10-30 | Silicon Laboratories Inc. | Voltage controlled clock synthesizer |
| WO2007072588A1 (ja) * | 2005-12-20 | 2007-06-28 | Matsushita Electric Industrial Co., Ltd. | 比較器及びa/d変換器 |
| US7420497B2 (en) * | 2006-06-28 | 2008-09-02 | Broadcom Corporation | Low offset flash analog-to-digital converter |
| JP5412639B2 (ja) * | 2008-10-31 | 2014-02-12 | 国立大学法人東京工業大学 | 比較器及びアナログデジタル変換器 |
| TWI382669B (zh) * | 2009-07-16 | 2013-01-11 | Ralink Technology Corp | 用於管線式類比數位轉換器之比較器及相關訊號取樣方法 |
| US8040159B1 (en) * | 2010-03-23 | 2011-10-18 | Lattice Semiconductor Corporation | Comparator with jitter mitigation |
| JP2011211371A (ja) * | 2010-03-29 | 2011-10-20 | Panasonic Corp | 逐次比較型ad変換器用クロック生成回路 |
| TWI443969B (zh) * | 2010-11-17 | 2014-07-01 | Ind Tech Res Inst | 以動態比較器為基礎的比較系統 |
| JP2012227588A (ja) * | 2011-04-15 | 2012-11-15 | Fujitsu Semiconductor Ltd | 比較回路及びアナログデジタル変換回路 |
| US8692582B1 (en) * | 2012-01-06 | 2014-04-08 | Altera Corporation | Latched comparator circuitry |
| JP5417470B2 (ja) * | 2012-03-05 | 2014-02-12 | 株式会社半導体理工学研究センター | ダイナミックコンパレータのためのオフセット電圧補正回路とそれを用いたダイナミックコンパレータ回路 |
| JP2013187695A (ja) * | 2012-03-07 | 2013-09-19 | Sony Corp | コンパレータおよびad変換器 |
| CN102638268B (zh) * | 2012-04-19 | 2015-02-18 | 北京工业大学 | 基于逐次比较量化器的三阶前馈Sigma-Delta调制器 |
| US8730404B2 (en) * | 2012-05-31 | 2014-05-20 | Silicon Laboratories Inc. | Providing a reset mechanism for a latch circuit |
| US9287862B2 (en) * | 2013-12-26 | 2016-03-15 | Texas Instruments Incorporated | Bootstrapped sampling switch circuits and systems |
| CN104158545B (zh) * | 2014-08-14 | 2017-04-05 | 电子科技大学 | 一种基于压控振荡器量化的逐次逼近寄存器型模数转换器 |
-
2017
- 2017-03-08 US US15/453,707 patent/US9755655B1/en not_active Expired - Fee Related
-
2018
- 2018-02-14 JP JP2019548740A patent/JP7274420B2/ja active Active
- 2018-02-14 EP EP18708020.5A patent/EP3593452B1/en active Active
- 2018-02-14 CN CN201880025256.4A patent/CN110521119B/zh active Active
- 2018-02-14 WO PCT/US2018/018255 patent/WO2018164818A1/en not_active Ceased
- 2018-02-14 KR KR1020197029140A patent/KR102564880B1/ko active Active
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