JP2020096050A - 切削装置及び切削装置を用いたウエーハの加工方法 - Google Patents
切削装置及び切削装置を用いたウエーハの加工方法 Download PDFInfo
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- 238000003672 processing method Methods 0.000 title description 8
- 230000002093 peripheral effect Effects 0.000 claims abstract description 78
- 238000007689 inspection Methods 0.000 claims abstract description 45
- 238000012545 processing Methods 0.000 claims abstract description 11
- 238000000034 method Methods 0.000 claims abstract description 8
- 238000003384 imaging method Methods 0.000 claims abstract description 7
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- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
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- 230000003287 optical effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
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- 229910052710 silicon Inorganic materials 0.000 description 1
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Abstract
Description
図5は、円形切削ステップを示す側断面図である。円形切削ステップST1は、チャックテーブル10に保持されたウエーハ100の外周縁104に切削ブレードを切り込ませながらチャックテーブル10を回転させ、外周縁104に環状溝107を形成するステップである。本実施形態では、一方の切削ユニット17aのみで環状溝107を形成する場合について説明する。
図6は、洗浄ステップを示す側断面図である。洗浄ステップST2は、環状溝107が切削加工されたウエーハ100を洗浄するステップである。円形切削ステップST1を実施した後、搬送パッド9は、チャックテーブル10から加工後のウエーハ100を洗浄手段30のスピンナーテーブル31に搬送する。図6に示すように、スピンナーテーブル31にウエーハ100を載置したら、バルブ15aを開き、吸引源16aの吸引力によってウエーハ100をスピンナーテーブル31の保持面31aにおいて吸引保持する。その後、スピンナーテーブル31を所定の回転速度で、例えば矢印B方向に回転させながら、スピンナーテーブル31に保持されたウエーハ100に向けて洗浄水ノズル32から洗浄水33を供給し、ウエーハ100の洗浄を行う。洗浄終了後は、スピンナーテーブル31を洗浄時より高速で回転させ、高圧エアーを噴出するなどして、ウエーハ100を乾燥させる。なお、洗浄ステップST2では、洗浄水ノズル32をウエーハ100の上面(表面)101上を移動させて該上面101全面に洗浄水を供給してもよい。
図7は、撮影ステップを示す側断面図である。図8は、撮影ステップにおける撮影領域の一例を示す図である。撮影ステップST3は、ラインスキャンカメラ50を用いて、ウエーハ100を回転させながら該ウエーハ100の外周縁104全周分の環状溝107の画像を撮影するステップである。
検査ステップST4は、記憶部62に記憶された画像情報からウエーハ100の外周縁104全周分の画像を形成し、この画像から環状溝107の幅や環状溝107の領域の欠けの有無、大きさを検査するステップである。図9は、撮影された複数の画像情報から形成されたウエーハの外周縁全周分の画像の一例を示す図である。ウエーハ100の外周縁104全周分の画像90は、図9に示すように、撮影領域80に対応する画像情報を繋げて形成される。この画像90に基づいて、検査部63は、環状溝107の幅Lや環状溝107の領域の欠け108の有無、及び欠け108の大きさを検査する。環状溝107の幅Lは、環状溝107の溝内周エッジ107Aとウエーハ100の外周縁104との間の半径方向の長さをいう。また、環状溝107の領域の欠け108は、例えば、環状溝107の溝内周エッジ107Aに生じた欠損箇所であり、欠け108の大きさDは、欠け108の半径方向の長さをいう。
10 チャックテーブル(保持部)
17a、17b 切削ユニット
18 切削ブレード
30 洗浄手段
40 エッジクランプ(保持部)
50 ラインスキャンカメラ
50A 筐体
50B 撮像素子(受光素子)
60 制御ユニット
63 検査部
64 警告部
80 撮影領域
90 画像
100 ウエーハ
101 上面(表面)
104 外周縁
105 下面(裏面)
107 環状溝
108 欠け
200 検査領域
Claims (2)
- 切削ブレードが装着されるスピンドルを有しウエーハの外周縁を切削して環状溝を形成する切削ユニットと、
ウエーハを回転可能に保持する保持部と、
一列に並ぶ受光素子が該保持部に保持された該ウエーハの該環状溝に対面し該環状溝の幅方向に沿って配置されるラインスキャンカメラと、
該保持部を回転させながら該環状溝を撮像した該ラインスキャンカメラが出力する信号から該ウエーハの外周縁全周の該環状溝の画像を構成し、該画像から該環状溝の幅及び欠けを検出する検査部と、
該検査部の検査結果が予め登録した許容範囲を外れた場合に警告情報を発信する警告部と、を備える切削装置。 - 請求項1に記載の切削装置を用いて、表面から裏面に至る面取り部が外周縁に形成されたウエーハの外周縁を切削するウエーハの加工方法であって、
該ウエーハを保持面で保持し、該ウエーハの外周縁に該切削ブレードを切り込ませながら該保持部を回転させ、該外周縁に該環状溝を形成する円形切削ステップと、
該円形切削ステップの実施後、ウエーハを回転可能に保持する保持部に保持された該ウエーハの該環状溝に対面する位置に該ラインスキャンカメラを位置付け、該ウエーハを撮影しつつ該保持部を回転させ、該ウエーハ外周縁全周の画像を撮影する撮影ステップと、
該撮影ステップで撮影した該画像を該検査部で検査し、該検査部の検査結果が予め登録した許容範囲を外れた結果が出た場合に警告情報を発信する検査ステップと、を備える切削装置を用いたウエーハの加工方法。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018231861A JP7266398B2 (ja) | 2018-12-11 | 2018-12-11 | 切削装置及び切削装置を用いたウエーハの加工方法 |
SG10201911509QA SG10201911509QA (en) | 2018-12-11 | 2019-12-02 | Cutting apparatus and wafer processing method using cutting apparatus |
KR1020190158880A KR20200071670A (ko) | 2018-12-11 | 2019-12-03 | 절삭 장치 및 절삭 장치를 사용한 웨이퍼의 가공 방법 |
TW108144938A TWI809228B (zh) | 2018-12-11 | 2019-12-09 | 切割裝置及使用切割裝置的晶圓加工方法 |
CN201911256755.7A CN111312616A (zh) | 2018-12-11 | 2019-12-10 | 切削装置和使用了切削装置的晶片的加工方法 |
DE102019219221.1A DE102019219221A1 (de) | 2018-12-11 | 2019-12-10 | Schneidvorrichtung und Waferbearbeitungsverfahren, das eine Schneidvorrichtung benutzt |
US16/710,701 US20200185241A1 (en) | 2018-12-11 | 2019-12-11 | Cutting apparatus and wafer processing method using cutting apparatus |
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KR (1) | KR20200071670A (ja) |
CN (1) | CN111312616A (ja) |
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Cited By (2)
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EP3919578A1 (en) | 2020-06-02 | 2021-12-08 | Nitto Denko Corporation | Pressure-sensitive adhesive sheet for semiconductor processing |
CN114131770A (zh) * | 2020-09-03 | 2022-03-04 | 株式会社黛亚昂蔻 | 将原石切割成100面体制造高硬度钻石模拟物的方法及装置 |
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KR20210125726A (ko) * | 2020-04-09 | 2021-10-19 | 삼성전자주식회사 | 웨이퍼 트리밍 장치 |
TWM600933U (zh) * | 2020-05-07 | 2020-09-01 | 鈦昇科技股份有限公司 | 晶圓裝卸機 |
JP7548853B2 (ja) * | 2021-03-24 | 2024-09-10 | Towa株式会社 | 加工装置、及び加工品の製造方法 |
TWI756142B (zh) * | 2021-06-15 | 2022-02-21 | 博磊科技股份有限公司 | 基板切斷裝置及基板切斷裝置的作動方法 |
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2018
- 2018-12-11 JP JP2018231861A patent/JP7266398B2/ja active Active
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- 2019-12-03 KR KR1020190158880A patent/KR20200071670A/ko not_active Application Discontinuation
- 2019-12-09 TW TW108144938A patent/TWI809228B/zh active
- 2019-12-10 CN CN201911256755.7A patent/CN111312616A/zh active Pending
- 2019-12-10 DE DE102019219221.1A patent/DE102019219221A1/de active Pending
- 2019-12-11 US US16/710,701 patent/US20200185241A1/en not_active Abandoned
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TWI809228B (zh) | 2023-07-21 |
SG10201911509QA (en) | 2020-07-29 |
CN111312616A (zh) | 2020-06-19 |
KR20200071670A (ko) | 2020-06-19 |
US20200185241A1 (en) | 2020-06-11 |
DE102019219221A1 (de) | 2020-06-18 |
TW202036746A (zh) | 2020-10-01 |
JP7266398B2 (ja) | 2023-04-28 |
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