JP2019138949A - Ledディスプレイの製造方法 - Google Patents
Ledディスプレイの製造方法 Download PDFInfo
- Publication number
- JP2019138949A JP2019138949A JP2018019500A JP2018019500A JP2019138949A JP 2019138949 A JP2019138949 A JP 2019138949A JP 2018019500 A JP2018019500 A JP 2018019500A JP 2018019500 A JP2018019500 A JP 2018019500A JP 2019138949 A JP2019138949 A JP 2019138949A
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- Prior art keywords
- led
- substrate
- wiring board
- defective
- leds
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/95001—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips involving a temporary auxiliary member not forming part of the bonding apparatus, e.g. removable or sacrificial coating, film or substrate
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
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Abstract
Description
図1は、本発明によるLEDディスプレイの製造方法を示す説明図である。図2は、本発明によるLEDディスプレイの製造方法の工程を示すフローチャートである。以下の説明において、マイクロLEDは、例えば、外形寸法が10μm×30μm以下であって、後述する点灯検査に合格し、発光が良好なLEDを対象とする。また、本発明によるLEDディスプレイの製造方法は、上記マイクロLEDを用いたLEDディスプレイを製造することを主な目的とするが、用途に応じて上記の外形寸法より大きいサイズのLEDにも適用することができる。
図6は、図2に示す配線基板の作製の詳細な工程を示すフローチャートである。図6に示す配線基板の作製(工程S2)は、回路層の作製(工程S21)、ストッパ層の作製(工程S22)、フォトスペーサ(PS)の作製(工程S23)、PS電極の作製(工程S24)、接着層の作製(工程S25)を含む。以下に説明するように、これらの5つの工程S21〜S25が実行されることにより、配線基板2が作製される。以下、配線基板2の構造を説明した後、配線基板2の作製における各工程の詳細について説明する。
図11は、図2に示す点灯検査、仮接着及びレーザリフトオフの詳細な工程を示すフローチャートである。点灯検査、仮接着及びLLO(工程S5)は、LEDの点灯検査(工程S51、S52)、LEDの仮接着(工程S53)、検査完了の判定(工程S54)及びレーザリフトオフ(工程S55)を含む。
1a…修正用LED基板
2、2a…配線基板
4、4a…LEDアレイ基板
10…ウエハ
11、11a…LED
12…化合物半導体
13a、13b、13c、13d…LED電極
15a、15b、15c…接着面
21…支持体
22、22a…回路層
23、23a、23b…フォトスペーサ(弾性支持部材)
24a、24b、24c、24d…PS電極(配線基板電極)
25a、25b、25c…ストッパ層
26a、26b、26c…接着層
100…LEDディスプレイ
Claims (7)
- 光透過性のウエハの一方の面上に予め定められた間隔で複数列にLEDが生成されたLED基板と、該LEDを駆動する回路を一方の面上に積層した回路層を含む配線基板とを貼り合わせて、前記ウエハの他方の面からレーザ光を照射し、前記LED基板から前記LEDを剥離させて、前記LEDを前記配線基板に実装することで、LED電極と配線基板電極とを接続して通電可能とするLEDディスプレイを製造する、LEDディスプレイの製造方法であって、
前記LED基板と前記配線基板とを貼り合わせるに際し、前記LED基板は、前記LEDの上面に設けられた前記LED電極の予め定められた近傍領域に接着面を有しており、前記配線基板は、前記回路層上の予め定められた位置に設けられた弾性支持部材、該弾性支持部材上に設けられた前記配線基板電極、前記接着面に応じた位置に設けられ前記弾性支持部材の加圧時の縮みを抑制するストッパ層、該ストッパ層上に設けられ光硬化性及び熱硬化性を兼ね備えた接着層、を有しており、前記LEDの前記接着面と前記配線基板の前記接着層の上面とを位置合わせする工程と、
前記配線基板に対して前記LED基板を加圧して貼り合わせる工程と、
前記LED基板を加圧した状態で前記ウエハの他方の面から紫外光を照射して、前記接着層を硬化させて前記LEDを前記配線基板に仮接着する工程と、
前記他方の面から前記レーザ光を照射して、前記LEDを前記LED基板から剥離する工程と、
前記LEDが実装された後に前記接着層を加熱して、前記接着層をさらに硬化させることにより、前記LEDを前記配線基板に本接着する工程と、
を含むことを特徴とするLEDディスプレイの製造方法。 - 前記貼り合わせる工程の次に、前記LED基板のLEDを検査する工程をさらに含み、
前記LEDを検査する工程は、前記LED電極及び前記配線基板電極を介して前記LEDに個別に通電し、該LEDの良否を判定する請求項1に記載のLEDディスプレイの製造方法。 - 前記LEDを検査する工程で前記LEDが良品と判定された場合には、前記仮接着する工程では、前記良品と判定されたLEDを前記配線基板に仮接着し、前記剥離する工程では、前記良品と判定されたLEDを前記LED基板から剥離して前記配線基板に実装する請求項2に記載のLEDディスプレイの製造方法。
- 前記LEDを検査する工程で不良品と判定されたLEDが存在した場合には、前記仮接着する工程では、少なくとも不良品と判定されたLEDを前記仮接着の対象から除外し、前記剥離する工程では、前記仮接着の対象から除外したLEDを前記レーザ光の照射対象から除外して前記LED基板に残留させる、請求項2に記載のLEDディスプレイの製造方法。
- 前記仮接着する工程は、前記不良品と判定されたLED含む1列のLED群を前記仮接着の対象から除外し、
前記剥離する工程は、前記1列のLED群を前記レーザ光の照射対象から除外して、前記1列のLED群を除く他の列のLED群を前記LED基板から剥離して前記配線基板に実装する、請求項4に記載のLEDディスプレイの製造方法。 - 前記不良品と判定されたLEDを含む1列のLED群が欠けた状態で良品のLEDが実装された配線基板と、代替用の1列のLED群を有するLED基板とを用いて、前記代替用の1列のLED群の各接着面と前記1列のLED群が欠けた配線基板の対応する各接着層の上面とを位置合わせした後に前記貼り合わせる工程を実行し、前記LEDを検査する工程で前記LED群のLEDが良品と判定された場合には、前記仮接着する工程では、前記良品と判定されたLEDを前記1列のLED群が欠けた配線基板に仮接着し、前記剥離する工程では、前記代替用の1列のLED群を有するLED基板から前記良品と判定されたLEDを剥離すると共に、前記1列のLED群が欠けた配線基板に前記良品と判定されたLEDを追加して実装する請求項5に記載のLEDディスプレイの製造方法。
- 前記LEDは、青色の波長帯域又は近紫外線の波長帯域の光を発するマイクロLEDであることを特徴とする請求項1〜6の何れか1項に記載のLEDディスプレイの製造方法。
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Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021052156A (ja) * | 2019-09-20 | 2021-04-01 | 東貝光電科技股▲ふん▼有限公司Unity Opto Technology Co.,Ltd. | マイクロledパネルの製造方法及びマイクロledパネル |
WO2021075794A1 (en) * | 2019-10-15 | 2021-04-22 | Samsung Electronics Co., Ltd. | Manufacturing method of display apparatus, interposer substrate, and computer program stored in readable medium |
WO2021157432A1 (ja) * | 2020-02-07 | 2021-08-12 | ソニーセミコンダクタソリューションズ株式会社 | 表示装置 |
WO2021193135A1 (ja) * | 2020-03-23 | 2021-09-30 | 東レエンジニアリング株式会社 | 実装方法、実装装置、および転写装置 |
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WO2022102691A1 (ja) | 2020-11-13 | 2022-05-19 | 積水化学工業株式会社 | 電子部品の製造方法、表示装置の製造方法、及び、支持テープ |
WO2022163005A1 (ja) * | 2021-01-29 | 2022-08-04 | 日東電工株式会社 | 電子部品転写用粘着シートおよび電子部品転写用粘着シートを用いた電子部品の加工方法 |
KR20220151599A (ko) | 2020-03-09 | 2022-11-15 | 세키스이가가쿠 고교가부시키가이샤 | 전자 부품의 제조 방법, 및, 표시 장치의 제조 방법 |
JP7219373B1 (ja) * | 2021-09-06 | 2023-02-07 | 積水化学工業株式会社 | 半導体装置製造用粘着テープ |
WO2023033176A1 (ja) | 2021-09-06 | 2023-03-09 | 積水化学工業株式会社 | 半導体装置製造用粘着テープ |
KR20230094635A (ko) * | 2021-12-21 | 2023-06-28 | 한국광기술원 | Led 측정장치 |
KR20230132876A (ko) | 2021-07-20 | 2023-09-18 | 신에츠 엔지니어링 가부시키가이샤 | 표시 기판의 첩합 장치 및 첩합 방법 |
JP7463153B2 (ja) | 2020-03-23 | 2024-04-08 | 東レエンジニアリング株式会社 | 実装方法および実装装置 |
JP7514777B2 (ja) | 2020-03-02 | 2024-07-11 | パロ アルト リサーチ センター,エルエルシー | マイクロledを基板に組み付けるための方法及びシステム |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI757037B (zh) * | 2021-01-06 | 2022-03-01 | 揚朋科技股份有限公司 | 顯示面板的修補方法 |
CN114141914B (zh) * | 2021-12-01 | 2023-05-23 | 东莞市中麒光电技术有限公司 | 衬底剥离方法 |
CN116053387A (zh) * | 2023-03-07 | 2023-05-02 | 惠科股份有限公司 | 显示面板制作方法与显示面板 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003332184A (ja) * | 2002-05-13 | 2003-11-21 | Sony Corp | 素子の転写方法 |
JP2007243076A (ja) * | 2006-03-11 | 2007-09-20 | Nichia Chem Ind Ltd | 発光装置及び発光装置の製造方法 |
JP2008053289A (ja) * | 2006-08-22 | 2008-03-06 | Renesas Technology Corp | 半導体装置の製造方法 |
JP2008109156A (ja) * | 2007-12-25 | 2008-05-08 | Sony Corp | 電子部品及びその製造方法、これを用いた画像表示装置 |
JP2015184542A (ja) * | 2014-03-25 | 2015-10-22 | ソニー株式会社 | 表示パネルおよび表示パネルの製造方法 |
JP2016001704A (ja) * | 2014-06-12 | 2016-01-07 | 三菱電機株式会社 | 映像表示装置、大型表示装置及び映像表示装置の製造方法 |
US20170148966A1 (en) * | 2014-06-13 | 2017-05-25 | Osram Opto Semiconductors Gmbh | Surface-Mountable Semiconductor Component and Method for Producing Same |
WO2017094461A1 (ja) * | 2015-12-01 | 2017-06-08 | シャープ株式会社 | 画像形成素子 |
JP2017157724A (ja) * | 2016-03-02 | 2017-09-07 | デクセリアルズ株式会社 | 表示装置及びその製造方法、並びに発光装置及びその製造方法 |
Family Cites Families (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE68926793T2 (de) * | 1988-03-15 | 1997-01-09 | Toshiba Kawasaki Kk | Dynamischer RAM |
EP1048972A3 (en) * | 1999-04-30 | 2004-03-10 | Matsushita Electric Industrial Co., Ltd. | Liquid crystal display element and manufacturing method thereof |
JP3906653B2 (ja) * | 2000-07-18 | 2007-04-18 | ソニー株式会社 | 画像表示装置及びその製造方法 |
JP4055817B2 (ja) | 2000-07-18 | 2008-03-05 | ソニー株式会社 | 画像表示装置 |
JP4539011B2 (ja) * | 2002-02-20 | 2010-09-08 | 富士電機システムズ株式会社 | 半導体装置 |
CN101151207B (zh) * | 2005-02-23 | 2012-01-04 | 皮克斯特罗尼克斯公司 | 显示装置和形成图像的方法 |
CN101562144B (zh) * | 2005-03-23 | 2012-11-21 | 精工爱普生株式会社 | 半导体装置的制法、半导体装置的安装方法及安装结构 |
JP2008218918A (ja) * | 2007-03-07 | 2008-09-18 | Sanken Electric Co Ltd | 半導体装置 |
JP2009151684A (ja) * | 2007-12-21 | 2009-07-09 | Sony Corp | 触覚シート部材、入力装置及び電子機器 |
JP4730443B2 (ja) * | 2009-02-04 | 2011-07-20 | ソニー株式会社 | 表示装置 |
WO2010090085A1 (ja) * | 2009-02-05 | 2010-08-12 | 旭硝子株式会社 | 偏光子付き積層体、支持体付き表示装置用パネル、表示装置用パネル、表示装置およびこれらの製造方法 |
KR20100138702A (ko) * | 2009-06-25 | 2010-12-31 | 삼성전자주식회사 | 가상 세계 처리 장치 및 방법 |
JP2011054641A (ja) * | 2009-08-31 | 2011-03-17 | Nitto Denko Corp | 被切断体からのダイシング表面保護テープの剥離除去方法 |
JP2011151268A (ja) * | 2010-01-22 | 2011-08-04 | Sharp Corp | 発光装置 |
US20130021544A1 (en) * | 2010-03-29 | 2013-01-24 | Keiichi Fukuyama | Display device, pressure detecting device and method for manufacturing display device |
WO2011142320A1 (ja) * | 2010-05-14 | 2011-11-17 | 三菱鉛筆株式会社 | 電気泳動表示装置、電気泳動表示装置の製造方法及び接着剤層付き基材の製造方法 |
US8381965B2 (en) * | 2010-07-22 | 2013-02-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Thermal compress bonding |
MX2013010253A (es) * | 2011-03-09 | 2013-10-30 | Bayer Ip Gmbh | Aparato, sistema y procedimiento de retroalimentacion de accionador de polimero electroactivo. |
KR101872027B1 (ko) * | 2011-07-12 | 2018-06-27 | 삼성전자주식회사 | 전자기 공진 입력이 가능한 소프트 키를 구비하는 터치 스크린 |
TWI555862B (zh) * | 2011-09-16 | 2016-11-01 | V科技股份有限公司 | 蒸鍍遮罩、蒸鍍遮罩的製造方法及薄膜圖案形成方法 |
CN103797593B (zh) * | 2011-10-11 | 2015-11-25 | 松下知识产权经营株式会社 | 发光装置及使用它的照明装置 |
KR20150036078A (ko) * | 2012-07-17 | 2015-04-07 | 닛토덴코 가부시키가이샤 | 봉지층 피복 반도체 소자 및 반도체 장치의 제조 방법 |
KR102078993B1 (ko) * | 2013-06-07 | 2020-02-19 | 엘지디스플레이 주식회사 | 유기발광 디스플레이 장치 |
JP2015050359A (ja) * | 2013-09-02 | 2015-03-16 | 日東電工株式会社 | 封止半導体素子および半導体装置の製造方法 |
CN203941937U (zh) * | 2013-12-24 | 2014-11-12 | 大连德豪光电科技有限公司 | 一种led倒装芯片 |
JP6347635B2 (ja) * | 2014-03-19 | 2018-06-27 | デクセリアルズ株式会社 | 異方性導電接着剤 |
JP6360157B2 (ja) * | 2014-04-04 | 2018-07-18 | 京セラ株式会社 | 熱硬化性樹脂組成物、半導体装置及び電気・電子部品 |
KR101615528B1 (ko) * | 2014-07-30 | 2016-04-26 | 류승봉 | 복합구조 형태를 갖는 투명 플렉시블 전극 |
EP4258844A3 (en) * | 2014-09-30 | 2023-11-15 | LG Display Co., Ltd. | Flexible organic light emitting display device |
CN104459987A (zh) * | 2014-11-14 | 2015-03-25 | 北京智谷睿拓技术服务有限公司 | 像素密度可调的显示器及显示像素密度调整方法 |
JP2016172344A (ja) * | 2015-03-17 | 2016-09-29 | セイコーエプソン株式会社 | 電子デバイス、および、電子デバイスの製造方法 |
JP6582727B2 (ja) * | 2015-08-21 | 2019-10-02 | セイコーエプソン株式会社 | 接合構造体、圧電デバイス、液体噴射ヘッド、及び接合構造体の製造方法 |
CN206627934U (zh) * | 2017-04-06 | 2017-11-10 | 厦门天马微电子有限公司 | 显示面板及显示装置 |
-
2018
- 2018-02-06 JP JP2018019500A patent/JP6916525B2/ja active Active
-
2019
- 2019-01-18 CN CN201980011428.7A patent/CN111684510A/zh active Pending
- 2019-01-18 KR KR1020207021574A patent/KR20200115505A/ko unknown
- 2019-01-18 WO PCT/JP2019/001419 patent/WO2019155848A1/ja active Application Filing
- 2019-01-31 TW TW108103707A patent/TW201939790A/zh unknown
-
2020
- 2020-07-17 US US16/931,772 patent/US20200402867A1/en not_active Abandoned
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003332184A (ja) * | 2002-05-13 | 2003-11-21 | Sony Corp | 素子の転写方法 |
JP2007243076A (ja) * | 2006-03-11 | 2007-09-20 | Nichia Chem Ind Ltd | 発光装置及び発光装置の製造方法 |
JP2008053289A (ja) * | 2006-08-22 | 2008-03-06 | Renesas Technology Corp | 半導体装置の製造方法 |
JP2008109156A (ja) * | 2007-12-25 | 2008-05-08 | Sony Corp | 電子部品及びその製造方法、これを用いた画像表示装置 |
JP2015184542A (ja) * | 2014-03-25 | 2015-10-22 | ソニー株式会社 | 表示パネルおよび表示パネルの製造方法 |
JP2016001704A (ja) * | 2014-06-12 | 2016-01-07 | 三菱電機株式会社 | 映像表示装置、大型表示装置及び映像表示装置の製造方法 |
US20170148966A1 (en) * | 2014-06-13 | 2017-05-25 | Osram Opto Semiconductors Gmbh | Surface-Mountable Semiconductor Component and Method for Producing Same |
WO2017094461A1 (ja) * | 2015-12-01 | 2017-06-08 | シャープ株式会社 | 画像形成素子 |
JP2017157724A (ja) * | 2016-03-02 | 2017-09-07 | デクセリアルズ株式会社 | 表示装置及びその製造方法、並びに発光装置及びその製造方法 |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021052156A (ja) * | 2019-09-20 | 2021-04-01 | 東貝光電科技股▲ふん▼有限公司Unity Opto Technology Co.,Ltd. | マイクロledパネルの製造方法及びマイクロledパネル |
WO2021075794A1 (en) * | 2019-10-15 | 2021-04-22 | Samsung Electronics Co., Ltd. | Manufacturing method of display apparatus, interposer substrate, and computer program stored in readable medium |
US11710431B2 (en) | 2019-10-15 | 2023-07-25 | Samsung Electronics Co., Ltd. | Manufacturing method of display apparatus, interposer substrate, and computer program stored in readable medium |
WO2021157432A1 (ja) * | 2020-02-07 | 2021-08-12 | ソニーセミコンダクタソリューションズ株式会社 | 表示装置 |
JP7514777B2 (ja) | 2020-03-02 | 2024-07-11 | パロ アルト リサーチ センター,エルエルシー | マイクロledを基板に組み付けるための方法及びシステム |
KR20220151599A (ko) | 2020-03-09 | 2022-11-15 | 세키스이가가쿠 고교가부시키가이샤 | 전자 부품의 제조 방법, 및, 표시 장치의 제조 방법 |
WO2021193135A1 (ja) * | 2020-03-23 | 2021-09-30 | 東レエンジニアリング株式会社 | 実装方法、実装装置、および転写装置 |
JP7463153B2 (ja) | 2020-03-23 | 2024-04-08 | 東レエンジニアリング株式会社 | 実装方法および実装装置 |
JP2021163945A (ja) * | 2020-04-03 | 2021-10-11 | 株式会社ジャパンディスプレイ | 発光素子の実装方法および表示装置 |
JP7434037B2 (ja) | 2020-04-03 | 2024-02-20 | 株式会社ジャパンディスプレイ | 発光素子の実装方法および表示装置 |
WO2022102691A1 (ja) | 2020-11-13 | 2022-05-19 | 積水化学工業株式会社 | 電子部品の製造方法、表示装置の製造方法、及び、支持テープ |
WO2022163005A1 (ja) * | 2021-01-29 | 2022-08-04 | 日東電工株式会社 | 電子部品転写用粘着シートおよび電子部品転写用粘着シートを用いた電子部品の加工方法 |
KR20230132876A (ko) | 2021-07-20 | 2023-09-18 | 신에츠 엔지니어링 가부시키가이샤 | 표시 기판의 첩합 장치 및 첩합 방법 |
WO2023033176A1 (ja) | 2021-09-06 | 2023-03-09 | 積水化学工業株式会社 | 半導体装置製造用粘着テープ |
KR20240057380A (ko) | 2021-09-06 | 2024-05-02 | 세키스이가가쿠 고교가부시키가이샤 | 반도체 장치 제조용 점착 테이프 |
JP7219373B1 (ja) * | 2021-09-06 | 2023-02-07 | 積水化学工業株式会社 | 半導体装置製造用粘着テープ |
KR20230094635A (ko) * | 2021-12-21 | 2023-06-28 | 한국광기술원 | Led 측정장치 |
KR102700929B1 (ko) | 2021-12-21 | 2024-08-30 | 한국광기술원 | Led 측정장치 |
Also Published As
Publication number | Publication date |
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KR20200115505A (ko) | 2020-10-07 |
US20200402867A1 (en) | 2020-12-24 |
CN111684510A (zh) | 2020-09-18 |
TW201939790A (zh) | 2019-10-01 |
WO2019155848A1 (ja) | 2019-08-15 |
JP6916525B2 (ja) | 2021-08-11 |
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