JP2015185609A5 - - Google Patents

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Publication number
JP2015185609A5
JP2015185609A5 JP2014059077A JP2014059077A JP2015185609A5 JP 2015185609 A5 JP2015185609 A5 JP 2015185609A5 JP 2014059077 A JP2014059077 A JP 2014059077A JP 2014059077 A JP2014059077 A JP 2014059077A JP 2015185609 A5 JP2015185609 A5 JP 2015185609A5
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JP
Japan
Prior art keywords
film
region
semiconductor substrate
height
manufacturing
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JP2014059077A
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English (en)
Japanese (ja)
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JP2015185609A (ja
JP6362373B2 (ja
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Priority to JP2014059077A priority Critical patent/JP6362373B2/ja
Priority claimed from JP2014059077A external-priority patent/JP6362373B2/ja
Priority to US14/645,592 priority patent/US9711563B2/en
Publication of JP2015185609A publication Critical patent/JP2015185609A/ja
Publication of JP2015185609A5 publication Critical patent/JP2015185609A5/ja
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Publication of JP6362373B2 publication Critical patent/JP6362373B2/ja
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JP2014059077A 2014-03-20 2014-03-20 光電変換装置の製造方法 Active JP6362373B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014059077A JP6362373B2 (ja) 2014-03-20 2014-03-20 光電変換装置の製造方法
US14/645,592 US9711563B2 (en) 2014-03-20 2015-03-12 Method of manufacturing semiconductor device having an insulating film in trenches of a semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014059077A JP6362373B2 (ja) 2014-03-20 2014-03-20 光電変換装置の製造方法

Publications (3)

Publication Number Publication Date
JP2015185609A JP2015185609A (ja) 2015-10-22
JP2015185609A5 true JP2015185609A5 (enExample) 2017-03-30
JP6362373B2 JP6362373B2 (ja) 2018-07-25

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JP2014059077A Active JP6362373B2 (ja) 2014-03-20 2014-03-20 光電変換装置の製造方法

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US (1) US9711563B2 (enExample)
JP (1) JP6362373B2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6569549B2 (ja) * 2015-05-01 2019-09-04 セイコーエプソン株式会社 電気光学装置、電子機器、及び電気光学装置の製造方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0155874B1 (ko) * 1995-08-31 1998-12-01 김광호 반도체장치의 평탄화방법 및 이를 이용한 소자분리방법
JPH11312730A (ja) * 1998-04-28 1999-11-09 Sony Corp 半導体装置の製造方法
JP2003142674A (ja) 2001-11-07 2003-05-16 Toshiba Corp Mos型固体撮像装置
US20040135198A1 (en) * 2002-07-23 2004-07-15 Kabushiki Kaisha Toshiba Semiconductor device and method of fabricating the same, nonvolatile semiconductor memory and method of fabricating the same, and electronic apparatus including nonvolatile semiconductor memory
JP4947931B2 (ja) * 2004-08-12 2012-06-06 ルネサスエレクトロニクス株式会社 半導体装置
CN100573870C (zh) * 2004-08-12 2009-12-23 株式会社瑞萨科技 双浅沟绝缘半导体装置及其制造方法
JP2006351747A (ja) * 2005-06-15 2006-12-28 Matsushita Electric Ind Co Ltd 半導体装置及びその製造方法
JP2007109966A (ja) 2005-10-14 2007-04-26 Matsushita Electric Ind Co Ltd 半導体装置およびその製造方法
JP2007207828A (ja) * 2006-01-31 2007-08-16 Matsushita Electric Ind Co Ltd 固体撮像装置の製造方法
JP2009117681A (ja) * 2007-11-08 2009-05-28 Panasonic Corp 半導体装置の製造方法および固体撮像装置の製造方法
JP2010199358A (ja) * 2009-02-26 2010-09-09 Fujitsu Semiconductor Ltd 半導体装置の製造方法
JP5704848B2 (ja) * 2010-06-30 2015-04-22 キヤノン株式会社 固体撮像装置およびカメラ
US8722509B2 (en) * 2011-08-05 2014-05-13 United Microelectronics Corp. Method of forming trench isolation
JP5991739B2 (ja) * 2012-06-15 2016-09-14 キヤノン株式会社 固体撮像装置およびその製造方法、ならびにカメラ
US8703577B1 (en) * 2012-12-17 2014-04-22 United Microelectronics Corp. Method for fabrication deep trench isolation structure
US9123612B2 (en) * 2013-10-31 2015-09-01 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor structure and manufacturing method thereof

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