JP2013516749A5 - - Google Patents
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- Publication number
- JP2013516749A5 JP2013516749A5 JP2012546412A JP2012546412A JP2013516749A5 JP 2013516749 A5 JP2013516749 A5 JP 2013516749A5 JP 2012546412 A JP2012546412 A JP 2012546412A JP 2012546412 A JP2012546412 A JP 2012546412A JP 2013516749 A5 JP2013516749 A5 JP 2013516749A5
- Authority
- JP
- Japan
- Prior art keywords
- intermediate layer
- semiconductor chip
- optoelectronic semiconductor
- layer
- active zone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 24
- 230000005693 optoelectronics Effects 0.000 claims 15
- 239000002019 doping agent Substances 0.000 claims 3
- 238000009713 electroplating Methods 0.000 claims 3
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims 2
- 229910017604 nitric acid Inorganic materials 0.000 claims 2
- 229910002704 AlGaN Inorganic materials 0.000 claims 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims 1
- 239000003814 drug Substances 0.000 claims 1
- 229940079593 drug Drugs 0.000 claims 1
- 230000005670 electromagnetic radiation Effects 0.000 claims 1
- 230000035699 permeability Effects 0.000 claims 1
- 230000005855 radiation Effects 0.000 claims 1
- 229910052709 silver Inorganic materials 0.000 claims 1
- 239000004332 silver Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009060749.8 | 2009-12-30 | ||
| DE102009060749.8A DE102009060749B4 (de) | 2009-12-30 | 2009-12-30 | Optoelektronischer Halbleiterchip |
| PCT/EP2010/070274 WO2011080144A2 (de) | 2009-12-30 | 2010-12-20 | Optoelektronischer halbleiterchip und verwendung einer auf algan basierenden zwischenschicht |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013516749A JP2013516749A (ja) | 2013-05-13 |
| JP2013516749A5 true JP2013516749A5 (enExample) | 2013-10-10 |
Family
ID=43640034
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012546412A Pending JP2013516749A (ja) | 2009-12-30 | 2010-12-20 | オプトエレクトロニクス半導体チップおよびAlGaNをベースとする中間層の使用 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8592840B2 (enExample) |
| EP (1) | EP2519979B1 (enExample) |
| JP (1) | JP2013516749A (enExample) |
| KR (1) | KR101759273B1 (enExample) |
| CN (1) | CN102687289B (enExample) |
| DE (1) | DE102009060749B4 (enExample) |
| TW (1) | TWI442600B (enExample) |
| WO (1) | WO2011080144A2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102009058796A1 (de) | 2009-12-18 | 2011-06-22 | OSRAM Opto Semiconductors GmbH, 93055 | Optoelektronisches Bauelement und Verfahren zur Herstellung eines optoelektronischen Bauelements |
| US9419182B2 (en) | 2012-01-05 | 2016-08-16 | Micron Technology, Inc. | Solid-state radiation transducer devices having at least partially transparent buried-contact elements, and associated systems and methods |
| CN108615725A (zh) | 2012-07-11 | 2018-10-02 | 亮锐控股有限公司 | 降低或者消除ⅲ-氮化物结构中的纳米管缺陷 |
| DE102012111245A1 (de) * | 2012-11-21 | 2014-05-22 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Anschlussbereichs eines optoelektronischen Halbleiterchips |
| DE102013104192A1 (de) | 2013-04-25 | 2014-10-30 | Osram Opto Semiconductors Gmbh | Halbleiterbauelement mit einer Zwischenschicht |
| DE102018126936A1 (de) * | 2018-10-29 | 2020-04-30 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung von optoelektronischen Halbleiterbauteilen |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6121638A (en) * | 1995-09-12 | 2000-09-19 | Kabushiki Kaisha Toshiba | Multi-layer structured nitride-based semiconductor devices |
| US5903017A (en) * | 1996-02-26 | 1999-05-11 | Kabushiki Kaisha Toshiba | Compound semiconductor device formed of nitrogen-containing gallium compound such as GaN, AlGaN or InGaN |
| DE69835216T2 (de) * | 1997-07-25 | 2007-05-31 | Nichia Corp., Anan | Halbleitervorrichtung aus einer nitridverbindung |
| JP4166885B2 (ja) * | 1998-05-18 | 2008-10-15 | 富士通株式会社 | 光半導体装置およびその製造方法 |
| JP3786544B2 (ja) * | 1999-06-10 | 2006-06-14 | パイオニア株式会社 | 窒化物半導体素子の製造方法及びかかる方法により製造された素子 |
| DE10042947A1 (de) * | 2000-08-31 | 2002-03-21 | Osram Opto Semiconductors Gmbh | Strahlungsemittierendes Halbleiterbauelement auf GaN-Basis |
| US6504183B1 (en) | 2000-09-08 | 2003-01-07 | United Epitaxy Company | Epitaxial growth of nitride semiconductor device |
| DE10056475B4 (de) * | 2000-11-15 | 2010-10-07 | Osram Opto Semiconductors Gmbh | Strahlungsemittierendes Halbleiterbauelement auf GaN-Basis mit verbesserter p-Leitfähigkeit und Verfahren zu dessen Herstellung |
| US6828596B2 (en) * | 2002-06-13 | 2004-12-07 | Lumileds Lighting U.S., Llc | Contacting scheme for large and small area semiconductor light emitting flip chip devices |
| KR100580623B1 (ko) * | 2003-08-04 | 2006-05-16 | 삼성전자주식회사 | 초격자 구조의 반도체층을 갖는 반도체 소자 및 그 제조방법 |
| WO2005036658A1 (en) * | 2003-10-14 | 2005-04-21 | Showa Denko K.K. | Group-iii nitride semiconductor device |
| JP4423969B2 (ja) * | 2003-12-25 | 2010-03-03 | 日亜化学工業株式会社 | 窒化物半導体積層基板およびそれを用いた窒化物半導体デバイス、窒化物半導体レーザ素子 |
| KR101386192B1 (ko) | 2004-01-26 | 2014-04-17 | 오스람 옵토 세미컨덕터스 게엠베하 | 전류 분산 구조물을 갖는 박막 led |
| DE102005003460A1 (de) * | 2004-01-26 | 2005-10-13 | Osram Opto Semiconductors Gmbh | Dünnfilm-LED mit einer Stromaufweitungsstruktur |
| WO2005106972A1 (de) * | 2004-04-29 | 2005-11-10 | Osram Opto Semiconductors Gmbh | Verfahren zum herstellen eines strahlungsemittierenden halbleiterchips |
| JP2007201195A (ja) | 2006-01-26 | 2007-08-09 | Sumitomo Electric Ind Ltd | 窒化物半導体発光素子 |
| JPWO2007129773A1 (ja) | 2006-05-10 | 2009-09-17 | 昭和電工株式会社 | Iii族窒化物化合物半導体積層構造体 |
| EP1883141B1 (de) | 2006-07-27 | 2017-05-24 | OSRAM Opto Semiconductors GmbH | LD oder LED mit Übergitter-Mantelschicht |
| DE102006046237A1 (de) * | 2006-07-27 | 2008-01-31 | Osram Opto Semiconductors Gmbh | Halbleiter-Schichtstruktur mit Übergitter |
| DE102007046027A1 (de) | 2007-09-26 | 2009-04-02 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip mit einer Mehrfachquantentopfstruktur |
| US8368100B2 (en) * | 2007-11-14 | 2013-02-05 | Cree, Inc. | Semiconductor light emitting diodes having reflective structures and methods of fabricating same |
| DE102007057241A1 (de) | 2007-11-28 | 2009-06-04 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Schichtenstapels auf einem kristallinen Substrat und Anordnung umfassend einen auf einem Substrat angeordneten Schichtenstapel |
| DE102008011848A1 (de) * | 2008-02-29 | 2009-09-03 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterkörper und Verfahren zur Herstellung eines solchen |
| DE102008032318A1 (de) | 2008-03-31 | 2009-10-01 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip und Verfahren zur Herstellung eines solchen |
| KR101055090B1 (ko) * | 2009-03-02 | 2011-08-08 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
-
2009
- 2009-12-30 DE DE102009060749.8A patent/DE102009060749B4/de active Active
-
2010
- 2010-12-20 US US13/519,345 patent/US8592840B2/en active Active
- 2010-12-20 WO PCT/EP2010/070274 patent/WO2011080144A2/de not_active Ceased
- 2010-12-20 JP JP2012546412A patent/JP2013516749A/ja active Pending
- 2010-12-20 CN CN201080060178.5A patent/CN102687289B/zh active Active
- 2010-12-20 EP EP10798083.1A patent/EP2519979B1/de active Active
- 2010-12-20 KR KR1020127020129A patent/KR101759273B1/ko active Active
- 2010-12-28 TW TW099146210A patent/TWI442600B/zh active
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