JP2013501958A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2013501958A5 JP2013501958A5 JP2012524640A JP2012524640A JP2013501958A5 JP 2013501958 A5 JP2013501958 A5 JP 2013501958A5 JP 2012524640 A JP2012524640 A JP 2012524640A JP 2012524640 A JP2012524640 A JP 2012524640A JP 2013501958 A5 JP2013501958 A5 JP 2013501958A5
- Authority
- JP
- Japan
- Prior art keywords
- group
- resist
- carbon atoms
- ether
- resist stripping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000203 mixture Substances 0.000 claims description 21
- -1 amide compound Chemical class 0.000 claims description 14
- 239000002798 polar solvent Substances 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 7
- XPFVYQJUAUNWIW-UHFFFAOYSA-N furfuryl alcohol Chemical compound OCC1=CC=CO1 XPFVYQJUAUNWIW-UHFFFAOYSA-N 0.000 claims description 6
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical group COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 claims description 5
- 239000003586 protic polar solvent Substances 0.000 claims description 5
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 claims description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 4
- 239000002202 Polyethylene glycol Substances 0.000 claims description 4
- 150000001298 alcohols Chemical class 0.000 claims description 4
- 229920001223 polyethylene glycol Polymers 0.000 claims description 4
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 claims description 3
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 claims description 2
- HRWADRITRNUCIY-UHFFFAOYSA-N 2-(2-propan-2-yloxyethoxy)ethanol Chemical compound CC(C)OCCOCCO HRWADRITRNUCIY-UHFFFAOYSA-N 0.000 claims description 2
- COBPKKZHLDDMTB-UHFFFAOYSA-N 2-[2-(2-butoxyethoxy)ethoxy]ethanol Chemical compound CCCCOCCOCCOCCO COBPKKZHLDDMTB-UHFFFAOYSA-N 0.000 claims description 2
- WFSMVVDJSNMRAR-UHFFFAOYSA-N 2-[2-(2-ethoxyethoxy)ethoxy]ethanol Chemical compound CCOCCOCCOCCO WFSMVVDJSNMRAR-UHFFFAOYSA-N 0.000 claims description 2
- WAEVWDZKMBQDEJ-UHFFFAOYSA-N 2-[2-(2-methoxypropoxy)propoxy]propan-1-ol Chemical compound COC(C)COC(C)COC(C)CO WAEVWDZKMBQDEJ-UHFFFAOYSA-N 0.000 claims description 2
- FETMDPWILVCFLL-UHFFFAOYSA-N 2-[2-(2-propan-2-yloxyethoxy)ethoxy]ethanol Chemical compound CC(C)OCCOCCOCCO FETMDPWILVCFLL-UHFFFAOYSA-N 0.000 claims description 2
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 claims description 2
- HCGFUIQPSOCUHI-UHFFFAOYSA-N 2-propan-2-yloxyethanol Chemical compound CC(C)OCCO HCGFUIQPSOCUHI-UHFFFAOYSA-N 0.000 claims description 2
- 239000001089 [(2R)-oxolan-2-yl]methanol Substances 0.000 claims description 2
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 claims description 2
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 claims description 2
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 claims description 2
- BSYVTEYKTMYBMK-UHFFFAOYSA-N tetrahydrofurfuryl alcohol Chemical compound OCC1CCCO1 BSYVTEYKTMYBMK-UHFFFAOYSA-N 0.000 claims description 2
- 125000004432 carbon atom Chemical group C* 0.000 claims 13
- 239000000126 substance Substances 0.000 claims 9
- 125000000217 alkyl group Chemical group 0.000 claims 6
- 150000001875 compounds Chemical class 0.000 claims 5
- DLFVBJFMPXGRIB-UHFFFAOYSA-N Acetamide Chemical compound CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 claims 4
- 150000007514 bases Chemical class 0.000 claims 4
- 229910052751 metal Inorganic materials 0.000 claims 4
- 239000002184 metal Substances 0.000 claims 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 claims 3
- 125000003545 alkoxy group Chemical group 0.000 claims 3
- 229910052799 carbon Inorganic materials 0.000 claims 3
- 238000005530 etching Methods 0.000 claims 3
- 229920005862 polyol Polymers 0.000 claims 3
- RXYPXQSKLGGKOL-UHFFFAOYSA-N 1,4-dimethylpiperazine Chemical compound CN1CCN(C)CC1 RXYPXQSKLGGKOL-UHFFFAOYSA-N 0.000 claims 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims 2
- ZHNUHDYFZUAESO-UHFFFAOYSA-N Formamide Chemical compound NC=O ZHNUHDYFZUAESO-UHFFFAOYSA-N 0.000 claims 2
- YNAVUWVOSKDBBP-UHFFFAOYSA-N Morpholine Chemical compound C1COCCN1 YNAVUWVOSKDBBP-UHFFFAOYSA-N 0.000 claims 2
- ATHHXGZTWNVVOU-UHFFFAOYSA-N N-methylformamide Chemical compound CNC=O ATHHXGZTWNVVOU-UHFFFAOYSA-N 0.000 claims 2
- GLUUGHFHXGJENI-UHFFFAOYSA-N Piperazine Chemical compound C1CNCCN1 GLUUGHFHXGJENI-UHFFFAOYSA-N 0.000 claims 2
- 125000003342 alkenyl group Chemical group 0.000 claims 2
- 125000003277 amino group Chemical group 0.000 claims 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims 2
- 229910052739 hydrogen Inorganic materials 0.000 claims 2
- 239000001257 hydrogen Substances 0.000 claims 2
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims 2
- 125000002768 hydroxyalkyl group Chemical group 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 claims 2
- 125000006832 (C1-C10) alkylene group Chemical group 0.000 claims 1
- QRUNVPYMAYUPET-UHFFFAOYSA-N 1,4-bis(butoxymethyl)piperazine Chemical compound CCCCOCN1CCN(COCCCC)CC1 QRUNVPYMAYUPET-UHFFFAOYSA-N 0.000 claims 1
- OJXLIOVJOMRAJX-UHFFFAOYSA-N 1,4-bis(methoxymethyl)piperazine Chemical compound COCN1CCN(COC)CC1 OJXLIOVJOMRAJX-UHFFFAOYSA-N 0.000 claims 1
- DDPRYTUJYNYJKV-UHFFFAOYSA-N 1,4-diethylpiperazine Chemical compound CCN1CCN(CC)CC1 DDPRYTUJYNYJKV-UHFFFAOYSA-N 0.000 claims 1
- PVOAHINGSUIXLS-UHFFFAOYSA-N 1-Methylpiperazine Chemical compound CN1CCNCC1 PVOAHINGSUIXLS-UHFFFAOYSA-N 0.000 claims 1
- HXKKHQJGJAFBHI-UHFFFAOYSA-N 1-aminopropan-2-ol Chemical compound CC(O)CN HXKKHQJGJAFBHI-UHFFFAOYSA-N 0.000 claims 1
- IQXXEPZFOOTTBA-UHFFFAOYSA-N 1-benzylpiperazine Chemical compound C=1C=CC=CC=1CN1CCNCC1 IQXXEPZFOOTTBA-UHFFFAOYSA-N 0.000 claims 1
- GIAFURWZWWWBQT-UHFFFAOYSA-N 2-(2-aminoethoxy)ethanol Chemical compound NCCOCCO GIAFURWZWWWBQT-UHFFFAOYSA-N 0.000 claims 1
- QHTUMQYGZQYEOZ-UHFFFAOYSA-N 2-(4-methylpiperazin-1-yl)ethanol Chemical compound CN1CCN(CCO)CC1 QHTUMQYGZQYEOZ-UHFFFAOYSA-N 0.000 claims 1
- KKFDCBRMNNSAAW-UHFFFAOYSA-N 2-(morpholin-4-yl)ethanol Chemical compound OCCN1CCOCC1 KKFDCBRMNNSAAW-UHFFFAOYSA-N 0.000 claims 1
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 claims 1
- BFSVOASYOCHEOV-UHFFFAOYSA-N 2-diethylaminoethanol Chemical compound CCN(CC)CCO BFSVOASYOCHEOV-UHFFFAOYSA-N 0.000 claims 1
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 claims 1
- JOMNTHCQHJPVAZ-UHFFFAOYSA-N 2-methylpiperazine Chemical compound CC1CNCCN1 JOMNTHCQHJPVAZ-UHFFFAOYSA-N 0.000 claims 1
- WFCSWCVEJLETKA-UHFFFAOYSA-N 2-piperazin-1-ylethanol Chemical compound OCCN1CCNCC1 WFCSWCVEJLETKA-UHFFFAOYSA-N 0.000 claims 1
- YCGHZPCZCOSQKQ-UHFFFAOYSA-N 3-(2-ethylhexoxy)-n,n-dimethylpropanamide Chemical compound CCCCC(CC)COCCC(=O)N(C)C YCGHZPCZCOSQKQ-UHFFFAOYSA-N 0.000 claims 1
- LVYXPOCADCXMLP-UHFFFAOYSA-N 3-butoxy-n,n-dimethylpropanamide Chemical compound CCCCOCCC(=O)N(C)C LVYXPOCADCXMLP-UHFFFAOYSA-N 0.000 claims 1
- LBVMWHCOFMFPEG-UHFFFAOYSA-N 3-methoxy-n,n-dimethylpropanamide Chemical compound COCCC(=O)N(C)C LBVMWHCOFMFPEG-UHFFFAOYSA-N 0.000 claims 1
- UIKUBYKUYUSRSM-UHFFFAOYSA-N 3-morpholinopropylamine Chemical compound NCCCN1CCOCC1 UIKUBYKUYUSRSM-UHFFFAOYSA-N 0.000 claims 1
- APFXIUYBBXRHCO-UHFFFAOYSA-N 4-(butoxymethyl)morpholine Chemical compound CCCCOCN1CCOCC1 APFXIUYBBXRHCO-UHFFFAOYSA-N 0.000 claims 1
- BYSXWBNALKMFPC-UHFFFAOYSA-N 4-(methoxymethyl)morpholine Chemical compound COCN1CCOCC1 BYSXWBNALKMFPC-UHFFFAOYSA-N 0.000 claims 1
- RJWLLQWLBMJCFD-UHFFFAOYSA-N 4-methylpiperazin-1-amine Chemical compound CN1CCN(N)CC1 RJWLLQWLBMJCFD-UHFFFAOYSA-N 0.000 claims 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 claims 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 claims 1
- UEEJHVSXFDXPFK-UHFFFAOYSA-N N-dimethylaminoethanol Chemical compound CN(C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-N 0.000 claims 1
- OHLUUHNLEMFGTQ-UHFFFAOYSA-N N-methylacetamide Chemical compound CNC(C)=O OHLUUHNLEMFGTQ-UHFFFAOYSA-N 0.000 claims 1
- 229910019142 PO4 Inorganic materials 0.000 claims 1
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 claims 1
- YIMQCDZDWXUDCA-UHFFFAOYSA-N [4-(hydroxymethyl)cyclohexyl]methanol Chemical compound OCC1CCC(CO)CC1 YIMQCDZDWXUDCA-UHFFFAOYSA-N 0.000 claims 1
- 125000004450 alkenylene group Chemical group 0.000 claims 1
- 125000002947 alkylene group Chemical group 0.000 claims 1
- 229910052782 aluminium Inorganic materials 0.000 claims 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims 1
- LHIJANUOQQMGNT-UHFFFAOYSA-N aminoethylethanolamine Chemical compound NCCNCCO LHIJANUOQQMGNT-UHFFFAOYSA-N 0.000 claims 1
- IMUDHTPIFIBORV-UHFFFAOYSA-N aminoethylpiperazine Chemical compound NCCN1CCNCC1 IMUDHTPIFIBORV-UHFFFAOYSA-N 0.000 claims 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 150000001721 carbon Chemical group 0.000 claims 1
- 239000003610 charcoal Substances 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 239000010949 copper Substances 0.000 claims 1
- VKONPUDBRVKQLM-UHFFFAOYSA-N cyclohexane-1,4-diol Chemical compound OC1CCC(O)CC1 VKONPUDBRVKQLM-UHFFFAOYSA-N 0.000 claims 1
- 238000000151 deposition Methods 0.000 claims 1
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 claims 1
- SZXQTJUDPRGNJN-UHFFFAOYSA-N dipropylene glycol Chemical compound OCCCOCCCO SZXQTJUDPRGNJN-UHFFFAOYSA-N 0.000 claims 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- CRVGTESFCCXCTH-UHFFFAOYSA-N methyl diethanolamine Chemical compound OCCN(C)CCO CRVGTESFCCXCTH-UHFFFAOYSA-N 0.000 claims 1
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 claims 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims 1
- YZTJYBJCZXZGCT-UHFFFAOYSA-N phenylpiperazine Chemical compound C1CNCCN1C1=CC=CC=C1 YZTJYBJCZXZGCT-UHFFFAOYSA-N 0.000 claims 1
- 239000010452 phosphate Substances 0.000 claims 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 claims 1
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 4
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 2
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 1
- NFJSYLMJBNUDNG-UHFFFAOYSA-N 1,3-dipropylimidazolidin-2-one Chemical class CCCN1CCN(CCC)C1=O NFJSYLMJBNUDNG-UHFFFAOYSA-N 0.000 description 1
- ZFPGARUNNKGOBB-UHFFFAOYSA-N 1-Ethyl-2-pyrrolidinone Chemical compound CCN1CCCC1=O ZFPGARUNNKGOBB-UHFFFAOYSA-N 0.000 description 1
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 1
- KMTRUDSVKNLOMY-UHFFFAOYSA-N Ethylene carbonate Chemical compound O=C1OCCO1 KMTRUDSVKNLOMY-UHFFFAOYSA-N 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- IEJIGPNLZYLLBP-UHFFFAOYSA-N dimethyl carbonate Chemical compound COC(=O)OC IEJIGPNLZYLLBP-UHFFFAOYSA-N 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- YAMHXTCMCPHKLN-UHFFFAOYSA-N imidazolidin-2-one Chemical compound O=C1NCCN1 YAMHXTCMCPHKLN-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000003013 phosphoric acid derivatives Chemical class 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 150000004040 pyrrolidinones Chemical class 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000011550 stock solution Substances 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- STCOOQWBFONSKY-UHFFFAOYSA-N tributyl phosphate Chemical compound CCCCOP(=O)(OCCCC)OCCCC STCOOQWBFONSKY-UHFFFAOYSA-N 0.000 description 1
- DQWPFSLDHJDLRL-UHFFFAOYSA-N triethyl phosphate Chemical compound CCOP(=O)(OCC)OCC DQWPFSLDHJDLRL-UHFFFAOYSA-N 0.000 description 1
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2009-0073762 | 2009-08-11 | ||
| KR20090073762 | 2009-08-11 | ||
| PCT/KR2010/005238 WO2011019189A2 (ko) | 2009-08-11 | 2010-08-10 | 레지스트 박리액 조성물 및 이를 이용한 레지스트의 박리방법 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013501958A JP2013501958A (ja) | 2013-01-17 |
| JP2013501958A5 true JP2013501958A5 (enExample) | 2014-11-20 |
| JP5647685B2 JP5647685B2 (ja) | 2015-01-07 |
Family
ID=43586635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012524640A Active JP5647685B2 (ja) | 2009-08-11 | 2010-08-10 | レジスト剥離液組成物及びこれを用いたレジストの剥離方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9081291B2 (enExample) |
| JP (1) | JP5647685B2 (enExample) |
| KR (1) | KR20110016418A (enExample) |
| CN (1) | CN102472985B (enExample) |
| TW (1) | TWI519910B (enExample) |
| WO (1) | WO2011019189A2 (enExample) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101487853B1 (ko) * | 2009-02-03 | 2015-01-29 | 이데미쓰 고산 가부시키가이샤 | 레지스트 박리제 조성물 및 그것을 이용한 레지스트 박리 방법 |
| KR100950779B1 (ko) * | 2009-08-25 | 2010-04-02 | 엘티씨 (주) | Tft―lcd 통합공정용 포토레지스트 박리제 조성물 |
| KR101879576B1 (ko) * | 2011-06-29 | 2018-07-18 | 동우 화인켐 주식회사 | 오프셋 인쇄용 요판 세정액 조성물 및 이를 이용한 세정방법 |
| CN103064263B (zh) * | 2011-08-22 | 2015-06-10 | 东友精细化工有限公司 | 抗蚀剂剥离液组合物及利用该组合物的抗蚀剂剥离方法 |
| KR101880303B1 (ko) * | 2011-11-04 | 2018-07-20 | 동우 화인켐 주식회사 | 포토레지스트 박리액 조성물 |
| KR101880302B1 (ko) * | 2011-10-25 | 2018-07-20 | 동우 화인켐 주식회사 | 레지스트 박리액 조성물 및 이를 이용한 레지스트 박리방법 |
| KR20140024625A (ko) * | 2012-08-20 | 2014-03-03 | 주식회사 동진쎄미켐 | 포토레지스트 제거용 박리액 조성물 |
| US20140100151A1 (en) * | 2012-10-08 | 2014-04-10 | Air Products And Chemicals Inc. | Stripping and Cleaning Compositions for Removal of Thick Film Resist |
| CN102956505B (zh) * | 2012-11-19 | 2015-06-17 | 深圳市华星光电技术有限公司 | 开关管的制作方法、阵列基板的制作方法 |
| KR101946379B1 (ko) * | 2012-11-20 | 2019-02-11 | 주식회사 동진쎄미켐 | 포토레지스트 박리액 조성물 및 포토레지스트의 박리방법 |
| US9158202B2 (en) * | 2012-11-21 | 2015-10-13 | Dynaloy, Llc | Process and composition for removing substances from substrates |
| CN103308654B (zh) * | 2013-06-13 | 2016-08-10 | 深圳市华星光电技术有限公司 | 用于测试光阻剥离液中水分含量的方法 |
| KR102119438B1 (ko) * | 2013-10-30 | 2020-06-08 | 삼성디스플레이 주식회사 | 박리액 및 이를 이용한 표시 장치의 제조방법 |
| US9346737B2 (en) * | 2013-12-30 | 2016-05-24 | Eastman Chemical Company | Processes for making cyclohexane compounds |
| KR102092922B1 (ko) * | 2014-03-21 | 2020-04-14 | 동우 화인켐 주식회사 | 레지스트 박리액 조성물 및 이를 이용한 레지스트의 박리방법 |
| KR101586453B1 (ko) * | 2014-08-20 | 2016-01-21 | 주식회사 엘지화학 | 포토레지스트 제거용 스트리퍼 조성물 및 이를 이용한 포토레지스트의 박리방법 |
| JP6553074B2 (ja) * | 2014-10-14 | 2019-07-31 | アーゼッド・エレクトロニック・マテリアルズ(ルクセンブルグ)ソシエテ・ア・レスポンサビリテ・リミテ | レジストパターン処理用組成物およびそれを用いたパターン形成方法 |
| KR102347618B1 (ko) * | 2015-04-02 | 2022-01-05 | 동우 화인켐 주식회사 | 레지스트 박리액 조성물 |
| KR102529951B1 (ko) * | 2015-12-14 | 2023-05-08 | 삼성디스플레이 주식회사 | 포토 레지스트 박리제 조성물 및 이를 이용한 박막 트랜지스터 어레이의 제조 방법 |
| KR102422264B1 (ko) * | 2016-03-11 | 2022-07-18 | 주식회사 이엔에프테크놀로지 | 신너 조성물 |
| KR102433114B1 (ko) * | 2016-05-02 | 2022-08-17 | 주식회사 이엔에프테크놀로지 | 신너 조성물 |
| WO2018058341A1 (en) * | 2016-09-28 | 2018-04-05 | Dow Global Technologies Llc | Sulfoxide/glycol ether based solvents for use in the electronics industry |
| KR102465604B1 (ko) * | 2016-11-01 | 2022-11-11 | 주식회사 이엔에프테크놀로지 | 신너 조성물 |
| CN106773562A (zh) * | 2016-12-23 | 2017-05-31 | 昆山艾森半导体材料有限公司 | 一种去除az光刻胶的去胶液 |
| CN108255027B (zh) * | 2016-12-28 | 2024-04-12 | 安集微电子(上海)有限公司 | 一种光刻胶清洗液 |
| JP6899220B2 (ja) * | 2017-01-11 | 2021-07-07 | 株式会社ダイセル | レジスト除去用組成物 |
| CN110178204B (zh) * | 2017-01-17 | 2022-11-04 | 株式会社大赛璐 | 半导体基板清洗剂 |
| CN108424818A (zh) * | 2017-02-14 | 2018-08-21 | 东友精细化工有限公司 | 掩模清洗液组合物 |
| CN108693717A (zh) * | 2017-03-29 | 2018-10-23 | 东友精细化工有限公司 | 抗蚀剂剥离液组合物 |
| CN108929808B (zh) * | 2017-05-26 | 2020-11-27 | 荒川化学工业株式会社 | 无铅软钎料焊剂用清洗剂组合物、无铅软钎料焊剂的清洗方法 |
| CN107271450A (zh) * | 2017-06-20 | 2017-10-20 | 深圳市华星光电技术有限公司 | 一种聚酰胺/氮化硅膜致密性的检测方法 |
| US11762297B2 (en) * | 2019-04-09 | 2023-09-19 | Tokyo Electron Limited | Point-of-use blending of rinse solutions to mitigate pattern collapse |
| CN110396315B (zh) * | 2019-07-22 | 2020-11-10 | 深圳市华星光电技术有限公司 | 改性修复液、制备方法及修复色阻的方法 |
| WO2021100651A1 (ja) * | 2019-11-20 | 2021-05-27 | 日産化学株式会社 | 洗浄剤組成物及び洗浄方法 |
| WO2022065842A1 (ko) * | 2020-09-22 | 2022-03-31 | 주식회사 엘지화학 | 포토레지스트 제거용 스트리퍼 조성물 및 이를 이용한 포토레지스트의 박리방법 |
| CN112947015A (zh) * | 2021-02-08 | 2021-06-11 | 绵阳艾萨斯电子材料有限公司 | Pr胶剥离液及其在液晶面板制程再生中的应用 |
| CN116285995A (zh) * | 2021-12-20 | 2023-06-23 | 李长荣化学工业股份有限公司 | 用于移除硅的蚀刻组成物及使用其移除硅的方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100528266B1 (ko) | 1996-03-22 | 2006-03-09 | 바스프 악티엔게젤샤프트 | 건식에칭후측벽잔류물제거용용액및제거방법 |
| DE19801049A1 (de) | 1998-01-14 | 1999-07-15 | Clariant Gmbh | Verwendung von Formamidinium-Salzen als Bleichaktivatoren |
| JP4649817B2 (ja) | 2000-07-26 | 2011-03-16 | 三菱瓦斯化学株式会社 | パラジウム除去液およびパジジウムの除去方法 |
| JP2002278092A (ja) * | 2000-12-27 | 2002-09-27 | Sumitomo Chem Co Ltd | 剥離剤組成物 |
| ATE434033T1 (de) | 2002-04-25 | 2009-07-15 | Fujifilm Electronic Materials | Nicht korrodierende reinigungsmittel zur entfernung von ätzmittelrückständen |
| JP2004029346A (ja) * | 2002-06-25 | 2004-01-29 | Mitsubishi Gas Chem Co Inc | レジスト剥離液組成物 |
| JP4443864B2 (ja) * | 2002-07-12 | 2010-03-31 | 株式会社ルネサステクノロジ | レジストまたはエッチング残さ物除去用洗浄液および半導体装置の製造方法 |
| KR20060024478A (ko) * | 2004-09-13 | 2006-03-17 | 주식회사 동진쎄미켐 | 포토레지스트 박리액 조성물 |
| US20060116313A1 (en) * | 2004-11-30 | 2006-06-01 | Denise Geitz | Compositions comprising tannic acid as corrosion inhibitor |
| KR20060064441A (ko) * | 2004-12-08 | 2006-06-13 | 말린크로트 베이커, 인코포레이티드 | 비수성 비부식성 마이크로전자 세정 조성물 |
| US7700533B2 (en) * | 2005-06-23 | 2010-04-20 | Air Products And Chemicals, Inc. | Composition for removal of residue comprising cationic salts and methods using same |
| KR101304723B1 (ko) * | 2006-08-22 | 2013-09-05 | 동우 화인켐 주식회사 | 아미드계 화합물을 포함하는 포토레지스트 박리액 및 이를이용한 박리 방법 |
| JP4617337B2 (ja) * | 2007-06-12 | 2011-01-26 | 富士フイルム株式会社 | パターン形成方法 |
| US8361237B2 (en) * | 2008-12-17 | 2013-01-29 | Air Products And Chemicals, Inc. | Wet clean compositions for CoWP and porous dielectrics |
-
2010
- 2010-08-10 CN CN201080034160.8A patent/CN102472985B/zh active Active
- 2010-08-10 US US13/387,087 patent/US9081291B2/en active Active
- 2010-08-10 WO PCT/KR2010/005238 patent/WO2011019189A2/ko not_active Ceased
- 2010-08-10 KR KR1020100076819A patent/KR20110016418A/ko not_active Ceased
- 2010-08-10 JP JP2012524640A patent/JP5647685B2/ja active Active
- 2010-08-11 TW TW099126775A patent/TWI519910B/zh active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2013501958A5 (enExample) | ||
| TWI432920B (zh) | 抗蝕劑剝離劑組成物 | |
| TWI617902B (zh) | 光阻剝離液組成物以及使用該組成物的光阻剝離方法 | |
| JP2001520118A5 (enExample) | ||
| JP2914646B2 (ja) | 非腐食性フォトレジスト剥離用組成物 | |
| JP2004536910A5 (enExample) | ||
| TWI261734B (en) | Photoresist removing solution and method for removing photoresist using same | |
| JP6087655B2 (ja) | 現像液、及び感光性樹脂組成物の現像処理方法 | |
| GB2092164A (en) | Loght or radiation-sensitive polymer composition | |
| JP2010237491A5 (enExample) | ||
| TW200819916A (en) | Negative photosensitive polyimide polymer and uses thereof | |
| JP2014048667A (ja) | 厚膜のネガ型フォトレジスト用剥離液組成物{strippercompositionforthicknegativephotoresist} | |
| JP6497668B2 (ja) | フォトレジスト除去用ストリッパー組成物およびこれを用いたフォトレジストの剥離方法 | |
| KR20150080518A (ko) | 포지티브형 감광성 수지 조성물, 폴리이미드 수지 패턴의 형성 방법, 및 패턴화된 폴리이미드 수지막 | |
| CN103376649A (zh) | 感放射线性组合物、显示元件用层间绝缘膜以及其形成方法 | |
| JP2016200643A (ja) | 感光性樹脂組成物、パターン硬化膜の製造方法及び電子部品 | |
| ATE497608T1 (de) | Antireflexionsbeschichtungszusammensetzung und verfahren zum belichten eines photoresists unter ihre anwendung | |
| TWI406112B (zh) | 光阻清除組成物及清除光阻之方法 | |
| WO2013018987A1 (ko) | 염료를 포함하는 고분자 화합물 및 이를 포함하는 경화성 수지 조성물 | |
| CN101794087B (zh) | 用于光致抗蚀剂的剥离剂组合物及使用所述剥离剂组合物剥离光致抗蚀剂的方法 | |
| CN103064263B (zh) | 抗蚀剂剥离液组合物及利用该组合物的抗蚀剂剥离方法 | |
| KR102228536B1 (ko) | 포토레지스트 제거용 스트리퍼 조성물 및 이를 이용한 포토레지스트의 박리방법 | |
| KR101733729B1 (ko) | 포토레지스트 박리액 조성물 및 이를 이용한 포토레지스트 박리 방법 | |
| CN103728834A (zh) | 光酸发生剂及含有该光酸发生剂的抗蚀剂组合物 | |
| JP4474776B2 (ja) | レジスト剥離剤 |