JP2013219181A - 半導体装置およびその製造方法 - Google Patents
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Abstract
【解決手段】上面にSOI領域1Aおよびバルクシリコン領域1Bを有する半導体基板1上において、SOI領域1Aに形成するMOSFETQaのソース・ドレイン領域にはエピタキシャル層14を形成し、バルクシリコン領域1BのMOSFETQbのソース・ドレイン領域にはエピタキシャル層を形成しない。また、エピタキシャル層14の端部を窒化シリコン膜13により覆うことで、エピタキシャル層14に上方からイオン注入を行い拡散層10を形成する際に、不純物イオンがシリコン層3の下面まで打ち込まれることを防ぐ。
【選択図】図1
Description
本実施の形態によるMOSFETを図面を参照して説明する。図1は、本実施の形態である半導体装置、例えばSOI基板上にnチャネル型MOSFETを有する半導体装置の断面図である。図1の断面図の左側にはSOI領域1Aを示し、図1の断面図の右側にはバルクシリコン領域1Bを示している。SOI領域1Aは半導体基板1上にBOX膜2を介してシリコン層(SOI層、半導体層)3が形成され、シリコン層3上にMOSFETQaが形成されている領域であり、バルクシリコン領域1Bは半導体基板1上にBOX膜(絶縁膜)2およびシリコン層3が形成されておらず、半導体基板1の主面にMOSFETQbが形成されている領域である。
本実施の形態では、前記実施の形態1と異なる製造方法により形成されるMOSFETを含む半導体装置について説明する。
本実施の形態3では、図22に示すように、バルクシリコン領域1Bにも薄膜ゲート酸化膜を備えたMOSFETQcおよびMOSFETQdを形成した例を示す。ここで、MOSFETQcのソース・ドレイン領域にはエピタキシャル層14が形成されておらず、MOSFETQdのソース・ドレイン領域にはエピタキシャル層14が形成されている。MOSFETQcは、バルクシリコン領域1Bの半導体基板1上に順に形成された、ゲート絶縁膜6cおよびゲート電極7cを有している。MOSFETQdは、バルクシリコン領域1Bの半導体基板1上に順に形成された、ゲート絶縁膜6dおよびゲート電極7dを有している。ゲート絶縁膜6c、6dは、ゲート絶縁膜6bよりも膜厚が小さい薄膜ゲート酸化膜である。ここで、薄膜ゲート酸化膜とは、MOSFETQaのゲート絶縁膜6aと同様に2〜3nmである。本実施の形態による効果を以下に述べる。
1A SOI領域
1B バルクシリコン領域
2 BOX膜
3 シリコン層
4 素子分離領域
5 酸化シリコン膜
6 ゲート絶縁膜
6a〜6d ゲート絶縁膜
7a〜7d ゲート電極
7e 窒化シリコン膜
8 エクステンション領域
9 エクステンション領域
10 拡散層
11 拡散層
12 窒化シリコン膜
12a 窒化シリコン膜
13 窒化シリコン膜
14 エピタキシャル層
15 シリサイド層
16 絶縁膜
17 層間絶縁膜
18 コンタクトプラグ
19 絶縁膜
20 層間絶縁膜
21 配線
Qa〜Qd MOSFET
R1〜R3 フォトレジスト膜
Claims (16)
- 主面に第1領域および第2領域を有する半導体基板と、
前記半導体基板上の前記第1領域に形成された第1絶縁膜と、
前記第1絶縁膜上に形成された半導体層と、
前記半導体基板上の前記第1領域に形成された第1電界効果トランジスタと、
前記半導体基板上の前記第2領域に形成された第2電界効果トランジスタと、
を有し、
前記第1電界効果トランジスタは、
前記半導体層上に第1ゲート絶縁膜を介して形成された第1ゲート電極と、
前記第1ゲート電極のゲート長方向において、前記第1ゲート電極を挟むように形成された第1導電型を有する一対の第1ソース・ドレイン領域と、
を有し、
前記第2電界効果トランジスタは、
前記半導体基板上に第2ゲート絶縁膜を介して形成された第2ゲート電極と、
前記第2ゲート電極のゲート長方向において、前記第2ゲート電極を挟むように前記半導体基板の上面に形成された、前記第1導電型を有する一対の第2ソース・ドレイン領域と、
を有し、
前記第1ソース・ドレイン領域は前記半導体層上に形成されたエピタキシャル層を含み、
前記第1ソース・ドレイン領域の上面は、前記半導体層と前記第1ゲート絶縁膜との界面よりも高い領域に位置し、
前記第2ソース・ドレイン領域の上面は、前記半導体基板と前記第2ゲート絶縁膜との界面と同じか、または低い領域に位置している、半導体装置。 - 前記第1ソース・ドレイン領域の上面は、前記第1ゲート絶縁膜の上面よりも高い領域に位置し、
前記第2ソース・ドレイン領域の上面は、前記第2ゲート絶縁膜の上面よりも低い領域に位置している、請求項1記載の半導体装置。 - 前記第1ゲート電極の側壁に接して形成されたサイドウォールが、前記エピタキシャル層の上面を覆っている、請求項1記載の半導体装置。
- 前記エピタキシャル層の端部は、前記エピタキシャル層の中央部より膜厚が薄く、
前記サイドウォールは、前記エピタキシャル層の前記端部の上面を覆っている、請求項3記載の半導体装置。 - 前記サイドウォールは、前記第1ゲート電極の側壁に接する第2絶縁膜および前記第2絶縁膜を覆う第3絶縁膜を含み、
前記第3絶縁膜が、前記エピタキシャル層の上面を覆っている、請求項3記載の半導体装置。 - 前記第2ゲート絶縁膜は、前記第1ゲート絶縁膜よりも膜厚が大きい、請求項1記載の半導体装置。
- 前記第2領域には、さらに第3電界効果トランジスタが形成されており、
前記第3電界効果トランジスタは、
前記半導体基板上に第3ゲート絶縁膜を介して形成された第3ゲート電極と、
前記第3ゲート電極のゲート長方向において、前記第3ゲート電極を挟むように前記半導体基板の上面に形成された、前記第1導電型を有する一対の第3ソース・ドレイン領域と、
を有し、
前記第3ゲート絶縁膜の膜厚は前記第2ゲート絶縁膜の膜厚よりも小さく、
前記第3ソース・ドレイン領域の上面は、前記半導体基板と前記第3ゲート絶縁膜との界面と同じか、または低い領域に位置している、請求項6記載の半導体装置。 - 前記第2領域には、さらに第4電界効果トランジスタが形成されており、
前記第4電界効果トランジスタは、
前記半導体基板上に第4ゲート絶縁膜を介して形成された第4ゲート電極と、
前記第4ゲート電極のゲート長方向において、前記第4ゲート電極を挟むように前記半導体基板の上面に形成された、前記第1導電型を有する一対の第4ソース・ドレイン領域と、
を有し、
前記第4ゲート絶縁膜の膜厚は前記第2ゲート絶縁膜の膜厚よりも小さく、
前記第4ソース・ドレイン領域は前記半導体基板上に形成されたエピタキシャル層を含み、
前記第4ソース・ドレイン領域の上面は、前記半導体基板と前記第4ゲート絶縁膜との界面よりも高い領域に位置している、請求項7記載の半導体装置。 - (a)半導体基板と、前記半導体基板上に形成された第1絶縁膜と、前記第1絶縁膜上に形成された半導体層とにより構成される基板を準備する工程と、
(b)前記基板の上面の第1領域に前記第1絶縁膜および前記半導体層を残し、前記基板の上面の第2領域の前記第1絶縁膜および前記半導体層を除去する工程と、
(c)前記第1領域の前記半導体層上に第1ゲート絶縁膜を介して第1ゲート電極を形成し、前記第2領域の前記半導体層上に第2ゲート絶縁膜を介して第2ゲート電極を形成する工程と、
(d)前記半導体層、前記半導体基板、前記第1ゲート電極および前記第2ゲート電極のそれぞれの表面を覆うように、第2絶縁膜および第3絶縁膜を順次形成する工程と、
(e)前記第3絶縁膜を一部除去し、前記第1ゲート電極の側壁に前記第2絶縁膜を介して自己整合的に前記第3絶縁膜を残す工程と、
(f)前記(e)工程の後、前記第1領域の前記第2絶縁膜を一部除去して前記半導体層の上面を露出させる工程と、
(g)前記(f)工程の後、前記第2領域の前記半導体基板の上面が前記第2絶縁膜により覆われている状態で、前記第1領域の前記半導体層上にエピタキシャル層を形成する工程と、
を有する、半導体装置の製造方法。 - 前記(e)工程では、前記第3絶縁膜を一部除去し、前記第1ゲート電極および前記第2ゲート電極のそれぞれの側壁に、前記第2絶縁膜を介して自己整合的に前記第3絶縁膜を残し、
(h1)前記(g)工程の後、前記第2領域の前記第2絶縁膜を一部除去して前記半導体基板の上面を露出させる工程と、
(i1)前記(h1)工程の後、前記第3絶縁膜を除去する工程と、
(j1)前記(i1)工程の後、前記第1ゲート電極の側壁に、第4絶縁膜を含み、前記第1ゲート電極に近い方の前記エピタキシャル層の端部の上面を覆う第1サイドウォールを形成し、
前記第2ゲート電極の側壁に、前記第4絶縁膜を含む第2サイドウォールを形成する工程と、
(k1)前記(j1)工程の後、前記エピタキシャル層に不純物を導入して第1ソース・ドレイン領域を形成し、前記第2領域の前記半導体基板の上面に不純物を導入して第2ソース・ドレイン領域を形成する工程と、
(l1)前記第1ゲート電極、前記第2ゲート電極、前記第1ソース・ドレイン領域および前記第2ソース・ドレイン領域のそれぞれの上面にシリサイド層を形成する工程と、
をさらに有する、請求項9記載の半導体装置の製造方法。 - 前記エピタキシャル層の端部は、前記エピタキシャル層の中央部より膜厚が薄く、
前記第1サイドウォールは、前記エピタキシャル層の前記端部の上面を覆っている、請求項10記載の半導体装置の製造方法。 - 前記(k1)工程では、前記第1サイドウォールをマスクとして、前記半導体層の上方から前記エピタキシャル層に不純物を打ち込むことで、前記第1ソース・ドレイン領域を形成する、請求項10記載の半導体装置の製造方法。
- 前記(e)工程では、前記第2領域の前記第3絶縁膜を覆う膜を形成し、その後、前記膜をマスクとして前記第1領域の前記第3絶縁膜を一部除去し、前記第1ゲート電極および前記第2ゲート電極のそれぞれの側壁に、前記第2絶縁膜を介して自己整合的に前記第3絶縁膜を残し、
(h2)前記(e)工程の後であって、前記(g)工程の前に、前記膜を除去する工程と、
(i2)前記(g)工程の後、前記第2領域の前記第3絶縁膜および前記第2絶縁膜を一部除去して前記半導体基板の上面を露出させ、前記第2ゲート電極の側壁に前記第2絶縁膜を介して自己整合的に前記第3絶縁膜を残す工程と、
(j2)前記(i2)工程の後、前記第3絶縁膜を除去する工程と、
(k2)前記(j2)工程の後、前記第1ゲート電極の側壁に、第4絶縁膜を含み、前記第1ゲート電極に近い方の前記エピタキシャル層の端部の上面を覆う第1サイドウォールを形成し、
前記第2ゲート電極の側壁に、前記第4絶縁膜を含む第2サイドウォールを形成する工程と、
(l2)前記(k2)工程の後、前記エピタキシャル層に不純物を導入して第1ソース・ドレイン領域を形成し、前記第2領域の前記半導体基板の上面に不純物を導入して第2ソース・ドレイン領域を形成する工程と、
(m2)前記第1ゲート電極、前記第2ゲート電極、前記第1ソース・ドレイン領域および前記第2ソース・ドレイン領域のそれぞれの上面にシリサイド層を形成する工程と、
をさらに有する、請求項9記載の半導体装置の製造方法。 - 前記エピタキシャル層の端部は、前記エピタキシャル層の中央部より膜厚が薄く、
前記第1サイドウォールは、前記エピタキシャル層の前記端部の上面を覆っている、請求項13記載の半導体装置の製造方法。 - 前記(l2)工程では、前記半導体層の上方から、前記第1サイドウォールをマスクとして、前記エピタキシャル層に不純物を打ち込むことで、前記第1ソース・ドレイン領域を形成する、請求項13記載の半導体装置の製造方法。
- 前記第2ゲート絶縁膜は、前記第1ゲート絶縁膜よりも膜厚が大きい、請求項9記載の半導体装置の製造方法。
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JP2016004845A (ja) * | 2014-06-13 | 2016-01-12 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
US9806165B2 (en) | 2016-02-02 | 2017-10-31 | Renesas Electronics Corporation | Manufacturing method of semiconductor device and semiconductor device |
US10014385B2 (en) | 2016-02-02 | 2018-07-03 | Renesas Electronics Corporation | Manufacturing method of semiconductor device and semiconductor device |
KR102416132B1 (ko) | 2017-05-29 | 2022-07-04 | 르네사스 일렉트로닉스 가부시키가이샤 | 반도체 장치의 제조 방법 |
EP3410467A1 (en) | 2017-05-29 | 2018-12-05 | Renesas Electronics Corporation | Method of manufacturing semiconductor device |
KR20180130434A (ko) | 2017-05-29 | 2018-12-07 | 르네사스 일렉트로닉스 가부시키가이샤 | 반도체 장치의 제조 방법 |
US10283527B2 (en) | 2017-05-29 | 2019-05-07 | Renesas Electronics Corporation | Method of manufacturing semiconductor device |
JP2017208560A (ja) * | 2017-07-07 | 2017-11-24 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
US11049869B2 (en) | 2018-03-07 | 2021-06-29 | Renesas Electronics Corporation | Semiconductor device with recess and method of manufacturing the same |
US11217605B2 (en) | 2019-10-10 | 2022-01-04 | Renesas Electronics Corporation | Semiconductor device and method of manufacturing the same |
KR20210043465A (ko) | 2019-10-10 | 2021-04-21 | 르네사스 일렉트로닉스 가부시키가이샤 | 반도체 장치 및 그 제조 방법 |
US11264244B2 (en) | 2020-02-18 | 2022-03-01 | Renesas Electronics Corporation | Method of manufacturing semiconductor device |
KR20220030907A (ko) | 2020-09-03 | 2022-03-11 | 르네사스 일렉트로닉스 가부시키가이샤 | 반도체 장치의 제조 방법 |
US11705361B2 (en) | 2020-09-03 | 2023-07-18 | Renesas Electronics Corporation | Method of manufacturing semiconductor device |
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US11695012B2 (en) | 2023-07-04 |
US20180019260A1 (en) | 2018-01-18 |
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