JP2012503880A5 - - Google Patents
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- JP2012503880A5 JP2012503880A5 JP2011529022A JP2011529022A JP2012503880A5 JP 2012503880 A5 JP2012503880 A5 JP 2012503880A5 JP 2011529022 A JP2011529022 A JP 2011529022A JP 2011529022 A JP2011529022 A JP 2011529022A JP 2012503880 A5 JP2012503880 A5 JP 2012503880A5
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- JP
- Japan
- Prior art keywords
- dispersion
- substrate
- silicon nitride
- chloride
- vinylpyridinium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000006185 dispersion Substances 0.000 claims 14
- 239000000758 substrate Substances 0.000 claims 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 8
- 229910052581 Si3N4 Inorganic materials 0.000 claims 7
- HQVNEWCFYHHQES-UHFFFAOYSA-N Silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 7
- 229920000642 polymer Polymers 0.000 claims 7
- 229910052814 silicon oxide Inorganic materials 0.000 claims 7
- 239000000178 monomer Substances 0.000 claims 5
- 238000005296 abrasive Methods 0.000 claims 4
- 125000000129 anionic group Chemical group 0.000 claims 4
- SYPXNWGMHMNKMW-UHFFFAOYSA-N 2-ethenyl-1-ethylpyridin-1-ium Chemical compound CC[N+]1=CC=CC=C1C=C SYPXNWGMHMNKMW-UHFFFAOYSA-N 0.000 claims 3
- 125000002091 cationic group Chemical group 0.000 claims 3
- 238000001246 colloidal dispersion Methods 0.000 claims 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxyl anion Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 claims 3
- 238000005498 polishing Methods 0.000 claims 3
- 239000000126 substance Substances 0.000 claims 3
- WKODDKLNZNVCSL-UHFFFAOYSA-N 1,3,2$l^{2},4$l^{2}-oxazadisiletidine Chemical compound N1[Si]O[Si]1 WKODDKLNZNVCSL-UHFFFAOYSA-N 0.000 claims 2
- 210000003229 CMP Anatomy 0.000 claims 2
- AEIXRCIKZIZYPM-UHFFFAOYSA-M hydroxy(oxo)iron Chemical compound [O][Fe]O AEIXRCIKZIZYPM-UHFFFAOYSA-M 0.000 claims 2
- 238000000034 method Methods 0.000 claims 2
- 239000000203 mixture Substances 0.000 claims 2
- UZNHKBFIBYXPDV-UHFFFAOYSA-N trimethyl-[3-(2-methylprop-2-enoylamino)propyl]azanium;chloride Chemical compound [Cl-].CC(=C)C(=O)NCCC[N+](C)(C)C UZNHKBFIBYXPDV-UHFFFAOYSA-N 0.000 claims 2
- -1 trimethylammoniomethyl Chemical group 0.000 claims 2
- CSPHGSFZFWKVDL-UHFFFAOYSA-M (3-chloro-2-hydroxypropyl)-trimethylazanium;chloride Chemical compound [Cl-].C[N+](C)(C)CC(O)CCl CSPHGSFZFWKVDL-UHFFFAOYSA-M 0.000 claims 1
- WLZPCFOGJNCCRJ-UHFFFAOYSA-M 4-ethenyl-1-ethylpyridin-1-ium;bromide Chemical compound [Br-].CC[N+]1=CC=C(C=C)C=C1 WLZPCFOGJNCCRJ-UHFFFAOYSA-M 0.000 claims 1
- AMYCWFKWUBKIDD-UHFFFAOYSA-M 4-ethenyl-1-ethylpyridin-1-ium;chloride Chemical compound [Cl-].CC[N+]1=CC=C(C=C)C=C1 AMYCWFKWUBKIDD-UHFFFAOYSA-M 0.000 claims 1
- CZCNWNDODBDUEX-UHFFFAOYSA-M 4-ethenyl-1-ethylpyridin-1-ium;methyl sulfate Chemical compound COS([O-])(=O)=O.CC[N+]1=CC=C(C=C)C=C1 CZCNWNDODBDUEX-UHFFFAOYSA-M 0.000 claims 1
- ACKOMRKOSWHRSO-UHFFFAOYSA-O 5-carbamoylhex-5-enyl(trimethyl)azanium Chemical compound C[N+](C)(C)CCCCC(=C)C(N)=O ACKOMRKOSWHRSO-UHFFFAOYSA-O 0.000 claims 1
- FLCAEMBIQVZWIF-UHFFFAOYSA-N 6-(dimethylamino)-2-methylhex-2-enamide Chemical compound CN(C)CCCC=C(C)C(N)=O FLCAEMBIQVZWIF-UHFFFAOYSA-N 0.000 claims 1
- 229910052684 Cerium Inorganic materials 0.000 claims 1
- OFJATJUUUCAKMK-UHFFFAOYSA-N Cerium(IV) oxide Chemical compound [O-2]=[Ce+4]=[O-2] OFJATJUUUCAKMK-UHFFFAOYSA-N 0.000 claims 1
- 239000005630 Diquat Substances 0.000 claims 1
- NUJOXMJBOLGQSY-UHFFFAOYSA-N Manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 claims 1
- MCMNRKCIXSYSNV-UHFFFAOYSA-N ZrO2 Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims 1
- SAGAVVTVDBUWQA-UHFFFAOYSA-L [Cl-].COS([O-])(=O)=O Chemical compound [Cl-].COS([O-])(=O)=O SAGAVVTVDBUWQA-UHFFFAOYSA-L 0.000 claims 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N al2o3 Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims 1
- 150000001450 anions Chemical class 0.000 claims 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 claims 1
- 150000001875 compounds Chemical class 0.000 claims 1
- GQOKIYDTHHZSCJ-UHFFFAOYSA-M dimethyl-bis(prop-2-enyl)azanium;chloride Chemical compound [Cl-].C=CC[N+](C)(C)CC=C GQOKIYDTHHZSCJ-UHFFFAOYSA-M 0.000 claims 1
- SYJFEGQWDCRVNX-UHFFFAOYSA-N diquat Chemical compound C1=CC=[N+]2CC[N+]3=CC=CC=C3C2=C1 SYJFEGQWDCRVNX-UHFFFAOYSA-N 0.000 claims 1
- 235000014413 iron hydroxide Nutrition 0.000 claims 1
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 claims 1
- 229910000460 iron oxide Inorganic materials 0.000 claims 1
- 229910000000 metal hydroxide Inorganic materials 0.000 claims 1
- 150000004692 metal hydroxides Chemical class 0.000 claims 1
- 229910021518 metal oxyhydroxide Inorganic materials 0.000 claims 1
- 229910052976 metal sulfide Inorganic materials 0.000 claims 1
- QFAZBWSBUULFFE-UHFFFAOYSA-N methyl hydrogen sulfate;prop-2-enamide Chemical compound NC(=O)C=C.COS(O)(=O)=O QFAZBWSBUULFFE-UHFFFAOYSA-N 0.000 claims 1
- FSQHDIAYKNDZFC-UHFFFAOYSA-N methyl sulfate;trimethyl-[3-(2-methylprop-2-enoylamino)propyl]azanium Chemical compound COS([O-])(=O)=O.CC(=C)C(=O)NCCC[N+](C)(C)C FSQHDIAYKNDZFC-UHFFFAOYSA-N 0.000 claims 1
- 125000001820 oxy group Chemical group [*:1]O[*:2] 0.000 claims 1
- 239000002245 particle Substances 0.000 claims 1
- 125000001453 quaternary ammonium group Chemical group 0.000 claims 1
- 229910052761 rare earth metal Inorganic materials 0.000 claims 1
- 229910001404 rare earth metal oxide Inorganic materials 0.000 claims 1
- 150000002910 rare earth metals Chemical class 0.000 claims 1
- 229910052718 tin Inorganic materials 0.000 claims 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N tin hydride Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims 1
- AIUAMYPYEUQVEM-UHFFFAOYSA-N trimethyl(2-prop-2-enoyloxyethyl)azanium Chemical class C[N+](C)(C)CCOC(=O)C=C AIUAMYPYEUQVEM-UHFFFAOYSA-N 0.000 claims 1
- YKGLFTQEQJSRJS-UHFFFAOYSA-N trimethyl-[2-(2-methylprop-2-enoylamino)ethyl]azanium;bromide Chemical compound [Br-].CC(=C)C(=O)NCC[N+](C)(C)C YKGLFTQEQJSRJS-UHFFFAOYSA-N 0.000 claims 1
- GXJFCAAVAPZBDY-UHFFFAOYSA-N trimethyl-[2-(2-methylprop-2-enoylamino)ethyl]azanium;chloride Chemical compound [Cl-].CC(=C)C(=O)NCC[N+](C)(C)C GXJFCAAVAPZBDY-UHFFFAOYSA-N 0.000 claims 1
- RRHXZLALVWBDKH-UHFFFAOYSA-M trimethyl-[2-(2-methylprop-2-enoyloxy)ethyl]azanium;chloride Chemical compound [Cl-].CC(=C)C(=O)OCC[N+](C)(C)C RRHXZLALVWBDKH-UHFFFAOYSA-M 0.000 claims 1
- UOASMSQZBFHQGX-UHFFFAOYSA-O trimethyl-[2-(prop-2-enoylamino)ethyl]azanium Chemical compound C[N+](C)(C)CCNC(=O)C=C UOASMSQZBFHQGX-UHFFFAOYSA-O 0.000 claims 1
- NFUDTVOYLQNLPF-UHFFFAOYSA-M trimethyl-[3-(2-methylprop-2-enoyloxy)propyl]azanium;chloride Chemical compound [Cl-].CC(=C)C(=O)OCCC[N+](C)(C)C NFUDTVOYLQNLPF-UHFFFAOYSA-M 0.000 claims 1
- OEIXGLMQZVLOQX-UHFFFAOYSA-N trimethyl-[3-(prop-2-enoylamino)propyl]azanium;chloride Chemical compound [Cl-].C[N+](C)(C)CCCNC(=O)C=C OEIXGLMQZVLOQX-UHFFFAOYSA-N 0.000 claims 1
- 229920003169 water-soluble polymer Polymers 0.000 claims 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims 1
- 229910052726 zirconium Inorganic materials 0.000 claims 1
Claims (10)
- 化学機械研磨用の安定なコロイド分散液であって:
(a)研磨剤成分、並びに
(b)研磨剤成分の0.05%〜10重量%の:
(i)1以上のカチオン性モノマー単位を含む少なくとも1つのパートB、及び
(ii)1以上のアニオン性モノマー単位を含む少なくとも1つのパートA
を含む水溶性ポリマー
を含み、1.5〜6のpHを有する、分散液。 - 前記少なくとも1つのパートBが少なくとも1つの高分子鎖Bを含み、前記少なくとも1つのパートAは前記少なくとも1つの高分子鎖Bの一端に結合し、前記高分子鎖Bが第4級アンモニウム基又はイニウム基を有する1以上のエチレン性不飽和モノマー由来であり、前記パートAが少なくとも1つのアニオン性基を含むポリマー又は非ポリマー基である、請求項1に記載の分散液。
- 前記分散液が、窒化ケイ素及び酸化ケイ素を含む基材を少なくとも50の逆選択比で研磨できる、請求項1に記載の分散液。
- 前記分散液が、窒化ケイ素及び酸化ケイ素を含む基材を30〜120の逆選択比(前記逆選択比と、酸化ケイ素の除去速度に対する窒化ケイ素の除去速度の比)で研磨できる、請求項1に記載の分散液。
- 前記1以上のエチレン性不飽和モノマーが、トリメチルアンモニオプロピルメタクリレートクロリド、トリメチルアンモニオエチルアクリルアミド、トリメチルアンモニオエチルメタクリルアミドクロリド、トリメチルアンモニオエチルメタクリルアミドブロミド、トリメチルアンモニオブチルアクリルアミド、トリメチルアンモニオメチルアクリルアミドメチルスルフェート、トリメチルアンモニオプロピルメタクリルアミドメチルスルフェート(MAPTA MeS)、(3−メタクリルアミドプロピル)トリメチルアンモニウムクロリド(MAPTAC)、(3−アクリルアミドプロピル)トリメチルアンモニウムクロリド(APTAC)、メタクリロイルオキシエチルトリメチルアンモニウムクロリド、メタクリロイルオキシエチルトリメチルアンモニウムクロリドメチルスルフェート、アクリロイルオキシエチルトリメチルアンモニウム塩(ADAMQUAT)、1−エチル−2−ビニルピリジニウム、1−エチル−4−ビニルピリジニウムブロミド、1−エチル−2−ビニルピリジニウム、1−エチル−4−ビニルピリジニウムクロリド、1−エチル−2−ビニルピリジニウム、1−エチル−4−ビニルピリジニウムメチルスルフェート、N,N−ジメチルジアリルアンモニウムクロリド(DADMAC)、ジメチルアミノプロピルメタクリルアミド、N−(3−クロロ−2−ヒドロキシプロピル)トリメチルアンモニウムクロリド(DIQUAT)、式:
- 前記研磨剤成分が:
(a)セリウム、チタン、ケイ素、ジルコニウム、マンガン、アルミニウム又は鉄の酸化物、水酸化物又はオキシ水酸化物、
(b)セリウムの酸化物、水酸化物又はオキシ水酸化物と、希土類金属又はスズから選択される少なくとも1つの他の元素との混合物、及び
(c)ジルコニウムの酸化物、水酸化物又はオキシ水酸化物と、三価希土類金属の酸化物、水酸化物又はオキシ水酸化物との混合物
からなる群から選択される粒子を含む、請求項1に記載の分散液。 - 基材を化学機械研磨する方法であって:
(a)窒化ケイ素層及び酸化ケイ素層を含む基材をコロイド分散液と接触させ(前記分散液は:
(i)研磨剤成分、及び
(ii)研磨剤成分の0.3重量%〜5重量%の:
(aa)1以上のカチオン性モノマー単位を含む少なくとも1つのパートB、及び
(bb)1以上のアニオン性モノマー単位を含む少なくとも1つのパートA
を含む水溶性両性ポリマーを含み、
前記分散液は1.5〜6のpHを有する)、そして
(b)前記基材に対してCMPプロセスを実施する
ことを含む、方法。 - 前記基材が少なくとも27の逆選択比(前記逆選択比とは、窒化ケイ素層除去速度の酸化ケイ素層除去速度に対する比である)で研磨される、請求項7に記載の方法。
- 基材を化学機械研磨するための方法であって:
(a)窒化ケイ素層及び酸化ケイ素層を含む基材をコロイド分散液と接触させ、前記分散液は窒化ケイ素層を加水分解することができ、これによって加水分解された窒化ケイ素層は機械的除去を受け易くなり、これによって基材を少なくとも27の逆選択比(前記逆選択比とは、窒化ケイ素層除去速度の酸化ケイ素層除去速度に対する比である)で研磨し、そして
(b)基材に関してCMPプロセスを実施することを含む、方法。 - 前記分散液が:
(a)研磨剤成分、並びに
(b)研磨剤成分の0.3重量%〜5重量%の:
(i)1以上のカチオン性モノマー単位を含む少なくとも1つのパートB、及び
(ii)1以上のアニオン性モノマー単位を含む少なくとも1つのパートAを含む、水性両性ポリマー
を含み、前記分散液が1.5〜6のpHを有する、請求項9に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US19449708P | 2008-09-26 | 2008-09-26 | |
US61/194,497 | 2008-09-26 | ||
PCT/US2009/005325 WO2010036358A1 (en) | 2008-09-26 | 2009-09-25 | Abrasive compositions for chemical mechanical polishing and methods for using same |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2012503880A JP2012503880A (ja) | 2012-02-09 |
JP2012503880A5 true JP2012503880A5 (ja) | 2012-11-15 |
JP5632378B2 JP5632378B2 (ja) | 2014-11-26 |
Family
ID=42057921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011529022A Expired - Fee Related JP5632378B2 (ja) | 2008-09-26 | 2009-09-25 | 化学機械研磨用研磨剤組成物及びその使用法 |
Country Status (7)
Country | Link |
---|---|
US (2) | US8366959B2 (ja) |
EP (1) | EP2329519B1 (ja) |
JP (1) | JP5632378B2 (ja) |
KR (1) | KR101678114B1 (ja) |
CN (1) | CN102165564B (ja) |
TW (1) | TW201038690A (ja) |
WO (1) | WO2010036358A1 (ja) |
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- 2009-09-25 KR KR1020117009492A patent/KR101678114B1/ko active IP Right Grant
- 2009-09-25 EP EP09816586.3A patent/EP2329519B1/en not_active Not-in-force
- 2009-09-25 CN CN200980138129.6A patent/CN102165564B/zh not_active Expired - Fee Related
- 2009-09-25 JP JP2011529022A patent/JP5632378B2/ja not_active Expired - Fee Related
- 2009-09-25 TW TW098132829A patent/TW201038690A/zh unknown
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