JP2012503199A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2012503199A5 JP2012503199A5 JP2011527884A JP2011527884A JP2012503199A5 JP 2012503199 A5 JP2012503199 A5 JP 2012503199A5 JP 2011527884 A JP2011527884 A JP 2011527884A JP 2011527884 A JP2011527884 A JP 2011527884A JP 2012503199 A5 JP2012503199 A5 JP 2012503199A5
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- cathode
- ionization
- vacuum gauge
- emission current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims 20
- 238000009530 blood pressure measurement Methods 0.000 claims 11
- 150000002500 ions Chemical class 0.000 claims 5
- 230000006870 function Effects 0.000 claims 4
- 239000013626 chemical specie Substances 0.000 claims 2
- 230000003287 optical effect Effects 0.000 claims 2
- 230000004044 response Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US19268408P | 2008-09-19 | 2008-09-19 | |
| US61/192,684 | 2008-09-19 | ||
| PCT/US2009/056612 WO2010033427A1 (en) | 2008-09-19 | 2009-09-11 | Ionization gauge with emission current and bias potential control |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014266942A Division JP6031502B2 (ja) | 2008-09-19 | 2014-12-29 | 電離真空計および圧力測定方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012503199A JP2012503199A (ja) | 2012-02-02 |
| JP2012503199A5 true JP2012503199A5 (https=) | 2012-10-25 |
Family
ID=42039815
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011527884A Pending JP2012503199A (ja) | 2008-09-19 | 2009-09-11 | 放出電流およびバイアス電圧を制御する電離真空計 |
| JP2014266942A Active JP6031502B2 (ja) | 2008-09-19 | 2014-12-29 | 電離真空計および圧力測定方法 |
| JP2016207564A Active JP6341970B2 (ja) | 2008-09-19 | 2016-10-24 | 電離真空計および圧力測定方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014266942A Active JP6031502B2 (ja) | 2008-09-19 | 2014-12-29 | 電離真空計および圧力測定方法 |
| JP2016207564A Active JP6341970B2 (ja) | 2008-09-19 | 2016-10-24 | 電離真空計および圧力測定方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8947098B2 (https=) |
| EP (2) | EP2326931B1 (https=) |
| JP (3) | JP2012503199A (https=) |
| CN (2) | CN102159929A (https=) |
| DK (2) | DK3517921T3 (https=) |
| WO (1) | WO2010033427A1 (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2929208B2 (ja) | 1989-11-10 | 1999-08-03 | 株式会社平和 | カード式パチンコ機 |
| KR101541273B1 (ko) * | 2007-12-19 | 2015-08-03 | 엠케이에스 인스트루먼츠, 인코포레이티드 | 전자 멀티플라이어 냉 방출 소스를 갖는 이온화 게이지 |
| CN102159929A (zh) | 2008-09-19 | 2011-08-17 | 布鲁克机械公司 | 具有发射电流及偏压电位控制的电离计 |
| JP5901142B2 (ja) * | 2011-05-18 | 2016-04-06 | 株式会社アルバック | 水素またはヘリウム用の検出計及び水素またはヘリウムの検出方法並びにリークディテクタ |
| WO2013016551A1 (en) * | 2011-07-26 | 2013-01-31 | Mks Instruments, Inc. | Cold cathode gauge fast response signal circuit |
| US9593996B2 (en) | 2012-02-08 | 2017-03-14 | Mks Instruments, Inc. | Ionization gauge for high pressure operation |
| US9588004B2 (en) | 2014-11-07 | 2017-03-07 | Mks Instruments, Inc. | Long lifetime cold cathode ionization vacuum gauge design |
| TWI739300B (zh) | 2015-01-15 | 2021-09-11 | 美商Mks儀器公司 | 離子化計及其製造方法 |
| WO2016151997A1 (ja) * | 2015-03-23 | 2016-09-29 | 株式会社アルバック | 三極管型電離真空計 |
| US9726566B2 (en) * | 2015-04-29 | 2017-08-08 | Honeywell International Inc. | Vacuum pressure gauge |
| US9927317B2 (en) | 2015-07-09 | 2018-03-27 | Mks Instruments, Inc. | Ionization pressure gauge with bias voltage and emission current control and measurement |
| US10242855B1 (en) * | 2016-09-21 | 2019-03-26 | The United States of America as requested by the Secretary of the Air Force | Detector, system and method for droplet and/or cluster beam spectroscopy |
| JP6815283B2 (ja) * | 2017-06-09 | 2021-01-20 | アズビル株式会社 | 静電容量型圧力センサ |
| US10928265B2 (en) * | 2018-05-29 | 2021-02-23 | Mks Instruments, Inc. | Gas analysis with an inverted magnetron source |
| JP7314000B2 (ja) * | 2019-09-19 | 2023-07-25 | キヤノンアネルバ株式会社 | 電子発生装置および電離真空計 |
| JP2025515982A (ja) | 2021-12-16 | 2025-05-23 | インフィコン インコーポレイティド | 複数の楕円形フィラメントを備えたイオン源アセンブリ |
Family Cites Families (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2605431A (en) | 1950-03-30 | 1952-07-29 | Westinghouse Electric Corp | Ionization vacuum gauge |
| US3239715A (en) * | 1961-09-26 | 1966-03-08 | Gen Electric | Electron emission monitor for magnetron-type ionization gauge |
| US4093913A (en) * | 1976-03-24 | 1978-06-06 | Varian Associates, Inc. | Vacuum measuring ionization apparatus control |
| JPS5611332A (en) | 1979-07-09 | 1981-02-04 | Toshiba Corp | Hot-cathode ionization vacuum gauge |
| US4636680A (en) * | 1983-05-24 | 1987-01-13 | Granville-Phillips Company | Vacuum gauge |
| JPH0746074B2 (ja) | 1984-11-27 | 1995-05-17 | 日電アネルバ株式会社 | 真空計 |
| DE3768656D1 (de) * | 1986-12-12 | 1991-04-18 | Hughes Aircraft Co | Schnellaufheizungsanordnung fuer eine kathode. |
| JPS63151834A (ja) * | 1986-12-16 | 1988-06-24 | Seiko Instr & Electronics Ltd | 電離真空計のコントロ−ラ |
| US4910402A (en) * | 1987-04-10 | 1990-03-20 | Mcmillan Norman | Apparatus and method for measuring a property of a liquid |
| JPS6412450A (en) * | 1987-07-06 | 1989-01-17 | Jeol Ltd | Temperature control device for thermoelectric field radiation gun |
| US5296817A (en) * | 1990-04-11 | 1994-03-22 | Granville-Phillips Company | Ionization gauge and method of using and calibrating same |
| US5250906A (en) * | 1991-10-17 | 1993-10-05 | Granville-Phillips Company | Ionization gauge and method of using and calibrating same |
| JPH04115442A (ja) * | 1990-09-05 | 1992-04-16 | Nissin Electric Co Ltd | イオン源用フィラメント電源 |
| US5331682A (en) * | 1991-11-25 | 1994-07-19 | General Electric Company | Radiation detector offset and afterglow compensation technique |
| JPH0621025A (ja) * | 1992-06-30 | 1994-01-28 | Nippon Steel Corp | ドライエッチング方法 |
| US5310474A (en) * | 1992-07-13 | 1994-05-10 | Ford Motor Company | Workfunction based A/F sensor |
| JPH0812122B2 (ja) * | 1992-10-20 | 1996-02-07 | 日電アネルバ株式会社 | 電離真空計の制御装置 |
| US5608384A (en) * | 1992-10-23 | 1997-03-04 | Sentech Corporation | Method and apparatus for monitoring for the presence of a gas |
| JPH06150875A (ja) * | 1992-11-11 | 1994-05-31 | Ulvac Japan Ltd | 熱陰極型イオン源の保護回路装置 |
| US5475227A (en) * | 1992-12-17 | 1995-12-12 | Intevac, Inc. | Hybrid photomultiplier tube with ion deflector |
| JPH0831345A (ja) * | 1994-07-11 | 1996-02-02 | Matsushita Electric Ind Co Ltd | 画像表示装置 |
| US5801535A (en) | 1996-11-12 | 1998-09-01 | Granville-Phillips Company | Ionization gauge and method of using and calibrating same |
| JPH10213509A (ja) * | 1997-01-27 | 1998-08-11 | Ulvac Japan Ltd | 圧力測定装置 |
| JP3734913B2 (ja) * | 1997-01-27 | 2006-01-11 | 株式会社アルバック | 電離真空計制御装置 |
| JPH1183661A (ja) * | 1997-09-02 | 1999-03-26 | Anelva Corp | 電離真空計の制御装置 |
| JP3069544B2 (ja) * | 1997-12-19 | 2000-07-24 | 有限会社山本真空研究所 | 熱陰極電離真空計 |
| US6081121A (en) * | 1998-01-21 | 2000-06-27 | Helix Technology Corporation | Ionization gauge and method of using and calibrating same |
| JP3661046B2 (ja) * | 1998-05-26 | 2005-06-15 | 双葉電子工業株式会社 | 蛍光表示管のフィラメント電圧制御装置 |
| JP2001015060A (ja) | 1999-06-29 | 2001-01-19 | Japan Atom Energy Res Inst | 四極子質量分析計または熱陰極電離真空計の測定子用熱電子放出電流制御回路 |
| US6433553B1 (en) * | 1999-10-27 | 2002-08-13 | Varian Semiconductor Equipment Associates, Inc. | Method and apparatus for eliminating displacement current from current measurements in a plasma processing system |
| US6452338B1 (en) * | 1999-12-13 | 2002-09-17 | Semequip, Inc. | Electron beam ion source with integral low-temperature vaporizer |
| JP4493139B2 (ja) * | 2000-02-02 | 2010-06-30 | キヤノンアネルバ株式会社 | 電離真空計 |
| US6642641B2 (en) * | 2001-04-19 | 2003-11-04 | Inficon, Inc. | Apparatus for measuring total pressure and partial pressure with common electron beam |
| JP2003106901A (ja) * | 2001-07-11 | 2003-04-09 | Tokyo Electron Ltd | 放射温度計用安定光源、放射温度計のキャリブレーション方法及び放射温度計を用いた半導体製造装置 |
| US7351957B2 (en) * | 2002-04-29 | 2008-04-01 | Mds Inc. | Broad ion fragmentation coverage in mass spectrometry by varying the collision energy |
| KR20050058363A (ko) | 2002-08-20 | 2005-06-16 | 스미도모쥬기가이고교 가부시키가이샤 | 극저온 냉동기 |
| ITTO20030626A1 (it) * | 2003-08-08 | 2005-02-09 | Varian Spa | Vacuometro a ionizzazione. |
| US7002301B2 (en) * | 2003-10-15 | 2006-02-21 | Lutron Electronics Co., Inc. | Apparatus and methods for making capacitive measurements of cathode fall in fluorescent lamps |
| WO2005045877A1 (en) * | 2003-10-31 | 2005-05-19 | Saintech Pty Ltd | Dual filament ion source |
| US7791047B2 (en) * | 2003-12-12 | 2010-09-07 | Semequip, Inc. | Method and apparatus for extracting ions from an ion source for use in ion implantation |
| US7030619B2 (en) | 2004-02-19 | 2006-04-18 | Brooks Automation, Inc. | Ionization gauge |
| JP2006021025A (ja) | 2004-03-22 | 2006-01-26 | Asahi Sekkei Kogyo:Kk | パター |
| JP4470621B2 (ja) * | 2004-07-05 | 2010-06-02 | 株式会社島津製作所 | X線発生装置 |
| GB0423025D0 (en) * | 2004-10-15 | 2004-11-17 | Oxford Biosensors Ltd | Voltammetric ion sensor |
| JP4488204B2 (ja) * | 2004-11-30 | 2010-06-23 | 株式会社島津製作所 | 電子銃のフィラメント電流制御方法、及びフィラメント電流制御装置 |
| EP1698878A1 (en) * | 2005-03-04 | 2006-09-06 | Inficon GmbH | Electrode configuration and pressure measuring apparatus |
| EP1705684A1 (en) * | 2005-03-22 | 2006-09-27 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Stabilized emitter and method for stabilizing same |
| JP2006266854A (ja) | 2005-03-23 | 2006-10-05 | Shinku Jikkenshitsu:Kk | 全圧測定電極付き四重極質量分析計及びこれを用いる真空装置 |
| JP2007073395A (ja) * | 2005-09-08 | 2007-03-22 | Tokyo Electron Ltd | マグネトロンの制御方法、マグネトロンの寿命判定方法、マイクロ波発生装置、マグネトロンの寿命判定装置、処理装置及び記憶媒体 |
| US7429863B2 (en) * | 2006-07-18 | 2008-09-30 | Brooks Automation, Inc. | Method and apparatus for maintaining emission capabilities of hot cathodes in harsh environments |
| US7528612B2 (en) * | 2006-09-29 | 2009-05-05 | Rockwell Automation Technologies, Inc. | System and method for monitoring a motor control center |
| JP2008170175A (ja) * | 2007-01-09 | 2008-07-24 | Stanley Electric Co Ltd | 真空度推定方法 |
| DE102008011686A1 (de) * | 2008-02-28 | 2009-09-03 | Inficon Gmbh | Heliumsensor |
| CN102159929A (zh) | 2008-09-19 | 2011-08-17 | 布鲁克机械公司 | 具有发射电流及偏压电位控制的电离计 |
| JP2011083661A (ja) | 2009-10-13 | 2011-04-28 | Yoshitaka Fukushima | 板金修理方法及び板金構造 |
-
2009
- 2009-09-11 CN CN2009801370982A patent/CN102159929A/zh active Pending
- 2009-09-11 DK DK19158590.0T patent/DK3517921T3/da active
- 2009-09-11 CN CN201610282044.7A patent/CN106404277A/zh active Pending
- 2009-09-11 DK DK09815009.7T patent/DK2326931T3/da active
- 2009-09-11 EP EP09815009.7A patent/EP2326931B1/en active Active
- 2009-09-11 EP EP19158590.0A patent/EP3517921B1/en active Active
- 2009-09-11 WO PCT/US2009/056612 patent/WO2010033427A1/en not_active Ceased
- 2009-09-11 JP JP2011527884A patent/JP2012503199A/ja active Pending
-
2011
- 2011-03-18 US US13/051,430 patent/US8947098B2/en active Active
-
2014
- 2014-12-24 US US14/582,750 patent/US9383286B2/en active Active
- 2014-12-29 JP JP2014266942A patent/JP6031502B2/ja active Active
-
2016
- 2016-10-24 JP JP2016207564A patent/JP6341970B2/ja active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2012503199A5 (https=) | ||
| JP6031502B2 (ja) | 電離真空計および圧力測定方法 | |
| EP4559337A3 (en) | Aerosol generating device and method for controlling same | |
| JP2006253151A5 (https=) | ||
| JP2016521641A5 (https=) | ||
| JP5054226B2 (ja) | 酸素の検出方法,空気リークの判別方法,ガス成分検出装置,及び真空処理装置 | |
| US12033836B2 (en) | Nitriding apparatus and nitriding method | |
| JP2016521346A5 (https=) | ||
| JP2011513709A5 (https=) | ||
| JP2011515093A5 (https=) | ||
| TWI294631B (en) | Ion source device | |
| JP2021017650A (ja) | 評価方法、評価装置、評価プログラム、生成方法、通信方法、及び成膜装置 | |
| CN102808146A (zh) | 工业化自动控制的等离子体源渗氮装置及其工艺 | |
| JP6963486B2 (ja) | X線管およびx線発生装置 | |
| WO2019220741A1 (ja) | 金属酸化物半導体ガスセンサを用いるガス検出装置とガス検出方法 | |
| JPWO2020044531A1 (ja) | イオンミリング装置 | |
| CN110663289B (zh) | 用于生成x射线的装置 | |
| JP2011058015A5 (https=) | ||
| TW201719138A (zh) | 用於分析環境空氣的設備和方法 | |
| JP2010509737A5 (https=) | ||
| JP6879093B2 (ja) | 酸化性ガスセンサ、ガス警報器、制御装置、および制御方法 | |
| JPH10213509A (ja) | 圧力測定装置 | |
| JP6772391B2 (ja) | 電離真空計及び制御装置 | |
| CN103295864B (zh) | 离子束浓度的检测方法及离子束检测系统 | |
| JP5362687B2 (ja) | 酸素分圧検知方法 |