DK2326931T3 - Ioniseringsmåler med emissionsstrøm og forspændingspotentialstyring - Google Patents
Ioniseringsmåler med emissionsstrøm og forspændingspotentialstyringInfo
- Publication number
- DK2326931T3 DK2326931T3 DK09815009.7T DK09815009T DK2326931T3 DK 2326931 T3 DK2326931 T3 DK 2326931T3 DK 09815009 T DK09815009 T DK 09815009T DK 2326931 T3 DK2326931 T3 DK 2326931T3
- Authority
- DK
- Denmark
- Prior art keywords
- emission current
- bias potential
- potential control
- ionization meter
- ionization
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/32—Vacuum gauges by making use of ionisation effects using electric discharge tubes with thermionic cathodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J41/00—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
- H01J41/02—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Electrochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Measuring Fluid Pressure (AREA)
- Solid Thermionic Cathode (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US19268408P | 2008-09-19 | 2008-09-19 | |
PCT/US2009/056612 WO2010033427A1 (en) | 2008-09-19 | 2009-09-11 | Ionization gauge with emission current and bias potential control |
Publications (1)
Publication Number | Publication Date |
---|---|
DK2326931T3 true DK2326931T3 (da) | 2019-07-22 |
Family
ID=42039815
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK09815009.7T DK2326931T3 (da) | 2008-09-19 | 2009-09-11 | Ioniseringsmåler med emissionsstrøm og forspændingspotentialstyring |
DK19158590.0T DK3517921T3 (da) | 2008-09-19 | 2009-09-11 | Ioniseringsmåler med styring af emissionsstrøm og forspændingspotential |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK19158590.0T DK3517921T3 (da) | 2008-09-19 | 2009-09-11 | Ioniseringsmåler med styring af emissionsstrøm og forspændingspotential |
Country Status (6)
Country | Link |
---|---|
US (2) | US8947098B2 (da) |
EP (2) | EP3517921B1 (da) |
JP (3) | JP2012503199A (da) |
CN (2) | CN102159929A (da) |
DK (2) | DK2326931T3 (da) |
WO (1) | WO2010033427A1 (da) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2232224A4 (en) * | 2007-12-19 | 2015-07-01 | Mks Instr Inc | IONIZATION GAUGE HAVING A COLD EMISSION SOURCE WITH ELECTRON MULTIPLIER |
DK2326931T3 (da) | 2008-09-19 | 2019-07-22 | Mks Instr Inc | Ioniseringsmåler med emissionsstrøm og forspændingspotentialstyring |
JP5901142B2 (ja) * | 2011-05-18 | 2016-04-06 | 株式会社アルバック | 水素またはヘリウム用の検出計及び水素またはヘリウムの検出方法並びにリークディテクタ |
US8928329B2 (en) * | 2011-07-26 | 2015-01-06 | Mks Instruments, Inc. | Cold cathode gauge fast response signal circuit |
KR102082168B1 (ko) * | 2012-02-08 | 2020-02-27 | 엠케이에스 인스트루먼츠, 인코포레이티드 | 압력을 측정하는 이온화 게이지 및 이를 이용한 압력 측정 방법 |
US9588004B2 (en) | 2014-11-07 | 2017-03-07 | Mks Instruments, Inc. | Long lifetime cold cathode ionization vacuum gauge design |
TW201634219A (zh) | 2015-01-15 | 2016-10-01 | Mks儀器公司 | 聚合物複合物真空組件 |
CN107407612B (zh) * | 2015-03-23 | 2020-11-03 | 株式会社爱发科 | 三极管型电离真空计 |
US9726566B2 (en) * | 2015-04-29 | 2017-08-08 | Honeywell International Inc. | Vacuum pressure gauge |
US9927317B2 (en) | 2015-07-09 | 2018-03-27 | Mks Instruments, Inc. | Ionization pressure gauge with bias voltage and emission current control and measurement |
US10242855B1 (en) * | 2016-09-21 | 2019-03-26 | The United States of America as requested by the Secretary of the Air Force | Detector, system and method for droplet and/or cluster beam spectroscopy |
JP6815283B2 (ja) * | 2017-06-09 | 2021-01-20 | アズビル株式会社 | 静電容量型圧力センサ |
US10928265B2 (en) * | 2018-05-29 | 2021-02-23 | Mks Instruments, Inc. | Gas analysis with an inverted magnetron source |
JP7314000B2 (ja) * | 2019-09-19 | 2023-07-25 | キヤノンアネルバ株式会社 | 電子発生装置および電離真空計 |
WO2023114166A1 (en) * | 2021-12-16 | 2023-06-22 | Inficon, Inc. | Ion source assembly with multiple elliptical filaments |
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DK2326931T3 (da) | 2008-09-19 | 2019-07-22 | Mks Instr Inc | Ioniseringsmåler med emissionsstrøm og forspændingspotentialstyring |
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-
2009
- 2009-09-11 DK DK09815009.7T patent/DK2326931T3/da active
- 2009-09-11 WO PCT/US2009/056612 patent/WO2010033427A1/en active Application Filing
- 2009-09-11 EP EP19158590.0A patent/EP3517921B1/en active Active
- 2009-09-11 DK DK19158590.0T patent/DK3517921T3/da active
- 2009-09-11 JP JP2011527884A patent/JP2012503199A/ja active Pending
- 2009-09-11 CN CN2009801370982A patent/CN102159929A/zh active Pending
- 2009-09-11 CN CN201610282044.7A patent/CN106404277A/zh active Pending
- 2009-09-11 EP EP09815009.7A patent/EP2326931B1/en active Active
-
2011
- 2011-03-18 US US13/051,430 patent/US8947098B2/en active Active
-
2014
- 2014-12-24 US US14/582,750 patent/US9383286B2/en active Active
- 2014-12-29 JP JP2014266942A patent/JP6031502B2/ja active Active
-
2016
- 2016-10-24 JP JP2016207564A patent/JP6341970B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
JP2015062035A (ja) | 2015-04-02 |
JP6031502B2 (ja) | 2016-11-24 |
US9383286B2 (en) | 2016-07-05 |
JP6341970B2 (ja) | 2018-06-13 |
CN102159929A (zh) | 2011-08-17 |
JP2017015738A (ja) | 2017-01-19 |
US20150108993A1 (en) | 2015-04-23 |
EP3517921A1 (en) | 2019-07-31 |
DK3517921T3 (da) | 2021-01-18 |
CN106404277A (zh) | 2017-02-15 |
EP2326931A1 (en) | 2011-06-01 |
US20110163754A1 (en) | 2011-07-07 |
EP3517921B1 (en) | 2020-11-04 |
US8947098B2 (en) | 2015-02-03 |
WO2010033427A1 (en) | 2010-03-25 |
EP2326931B1 (en) | 2019-04-24 |
EP2326931A4 (en) | 2012-08-08 |
JP2012503199A (ja) | 2012-02-02 |
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