JP2009117571A - Substrate processing apparatus and coating apparatus and coating method - Google Patents

Substrate processing apparatus and coating apparatus and coating method Download PDF

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JP2009117571A
JP2009117571A JP2007288238A JP2007288238A JP2009117571A JP 2009117571 A JP2009117571 A JP 2009117571A JP 2007288238 A JP2007288238 A JP 2007288238A JP 2007288238 A JP2007288238 A JP 2007288238A JP 2009117571 A JP2009117571 A JP 2009117571A
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substrate
unit
stage
coating
pad
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JP4495752B2 (en
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Masaya Shinozaki
賢哉 篠崎
Yoshitaka Otsuka
慶崇 大塚
Takashi Nakamitsu
孝志 中満
Daisuke Ikemoto
池本  大輔
Yosuke Mine
陽介 三根
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Priority to TW097138433A priority patent/TWI385712B/en
Priority to CN2008101747863A priority patent/CN101431008B/en
Priority to KR1020080109151A priority patent/KR101351155B1/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C13/00Means for manipulating or holding work, e.g. for separate articles
    • B05C13/02Means for manipulating or holding work, e.g. for separate articles for particular articles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C5/00Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
    • B05C5/02Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To stably float and convey a rectangular substrate to be processed on a flotation stage while holding the substrate in a fixed posture suitable for processing with simple constitution. <P>SOLUTION: First and second holding portions 106L and 106R of first (left-side) and second (right-side) conveyance portions 84L and 84R have two suction pads 108L and 108R coupled to rear surfaces (lower surfaces) of two left-side corners of the substrate and rear surfaces (lower surfaces) of two right-side corners with vacuum sucking force, a pair of pad support portions 110R etc., supporting the suction pads 108L and 108R at two places leaving a certain gap in a conveying direction (X direction) while restricting vertical displacement, and a pair of pad actuators 112R etc., elevating and moving or displacing the pair of pad support portions 110R etc., independently. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、浮上搬送方式の基板処理装置に係り、特に被処理基板をステージ上で浮上搬送しながら基板上に処理液を塗布する塗布装置および塗布方法に関する。   The present invention relates to a substrate processing apparatus of a levitation conveyance type, and more particularly to a coating apparatus and a coating method for applying a processing liquid onto a substrate while levitation and conveyance of a substrate to be processed on a stage.

LCD等のフラットパネルディスプレイ(FPD)の製造プロセスにおけるフォトリソグラフィー工程には、スリット状の吐出口を有する長尺形のレジストノズルを相対的に走査して被処理基板上にレジスト液を塗布するスピンレスの塗布法が多用されている。   In a photolithography process in a manufacturing process of a flat panel display (FPD) such as an LCD, spinless coating is performed on a substrate to be processed by relatively scanning a long resist nozzle having a slit-like discharge port. The coating method is frequently used.

このようなスピンレス塗布法の一形式として、たとえば特許文献1に開示されるように、FPD用の矩形の被処理基板(たとえばガラス基板)を支持するためのステージを浮上式に構成し、浮上ステージ上で基板を空中に浮かせたまま水平な一方向(ステージ長手方向)に搬送し、搬送途中の所定位置で浮上ステージ上方に設置した長尺形のレジストノズルに直下を通過する基板に向けてレジスト液を帯状に吐出させることにより、基板上の一端から他端までレジスト液を塗布するようにした浮上搬送方式が知られている。   As one type of such a spinless coating method, for example, as disclosed in Patent Document 1, a stage for supporting a rectangular substrate to be processed (for example, a glass substrate) for FPD is configured to be a floating type, and a floating stage The substrate is transported in one horizontal direction (stage longitudinal direction) while floating in the air above, and the resist is directed toward the substrate passing directly under the long resist nozzle installed above the floating stage at a predetermined position during transport. A levitation transport method is known in which a resist solution is applied from one end to the other end on a substrate by discharging the solution in a strip shape.

また、このような浮上搬送方式において、たとえば特許文献2に開示されるように、浮上ステージ上で、第1の搬送部が基板の左右片方の側縁部を保持して搬入位置から塗布位置を通って塗布位置と搬出位置との間に設定された第1の位置まで基板を搬送し、第2の搬送部が基板の左右他方の側縁部を保持して、搬入位置との間に設定された第2の位置から塗布位置を通って搬出位置まで基板を搬送することにより、タクトタイムの短縮を図るスピンレス塗布法も知られている。   In such a levitation conveyance method, for example, as disclosed in Patent Document 2, on the levitation stage, the first conveyance unit holds the left and right side edge portions of the substrate and changes the application position from the carry-in position. The substrate is transported to the first position set between the coating position and the unloading position, and the second transport unit holds the left and right side edges of the substrate and is set between the transport position. There is also known a spinless coating method for shortening the tact time by transporting the substrate from the second position to the unloading position through the coating position.

従来のこの種のレジスト塗布装置は、浮上式のステージ上で基板を浮上搬送するために、ステージの左右両側に配置された一対のガイドレールと、それらのガイドレールに沿って直進移動する左右一対のスライダと、基板の左右両辺部に一定間隔で着脱可能に吸着する左右一列の吸着パッドと、それら左右一列の吸着パッドを左右のスライダにそれぞれ連結し、かつ基板の浮上高さに追従して上下に変位する板ばね等の連結部材とを備える。
特開2005−244155 特開2006−237482
A conventional resist coating apparatus of this type includes a pair of guide rails disposed on both the left and right sides of the stage and a pair of left and right guides that move straight along the guide rails in order to float and convey the substrate on a floating stage. The left and right sides of the board are attached to the left and right sides of the board so that they can be detachably attached at regular intervals, and the left and right side of the suction pads are connected to the left and right sliders, respectively, and the flying height of the board is followed. And a connecting member such as a leaf spring that is displaced vertically.
JP-A-2005-244155 JP 2006-237482 A

浮上搬送式の従来のレジスト塗布法は、上記のように、浮上ステージより基板に与えられる気体の圧力によって基板の浮上高を可変制御し、基板を保持する一列の吸着パッドないし連結部材を基板の浮上高に追従して上下に変位させるようにしている。しかしながら、浮上搬送中に基板の前端部と後端部が上下に振動してばたついたり、あるいは基板が搬送方向と直交する方向で山形に撓んだりした際に、基板を保持する吸着パッドや連結部材も基板と一体に振動したり上下に変位してしまい、基板を塗布処理に適した一定の姿勢に保持または矯正することはできず、レジスト塗布膜の膜厚が変動し、塗布斑が生じやすかった。   As described above, the conventional levitation transfer type resist coating method variably controls the flying height of the substrate by the pressure of the gas applied to the substrate from the levitation stage, and a row of suction pads or connecting members for holding the substrate are arranged on the substrate. It is designed to move up and down following the flying height. However, the suction pad that holds the substrate when the front end and rear end of the substrate flutter up and down during levitation conveyance or when the substrate bends in a mountain shape perpendicular to the conveyance direction. And the connecting member vibrate together with the substrate or move up and down, and the substrate cannot be held or corrected in a certain posture suitable for the coating process, and the film thickness of the resist coating film fluctuates. It was easy to occur.

本発明は、上記のような従来技術の問題点に鑑みてなされたものであって、浮上ステージ上で矩形の被処理基板を簡易な構成でもって処理に適した一定の姿勢に保持して安定に浮上搬送できるようにした基板処理装置を提供することを目的とする。   The present invention has been made in view of the above-mentioned problems of the prior art, and is stable by holding a rectangular substrate to be processed in a fixed posture suitable for processing with a simple configuration on a floating stage. It is an object of the present invention to provide a substrate processing apparatus that can be floated and conveyed.

本発明の別の目的は、矩形の被処理基板を保持する機構を改善して塗布品質の向上とタクトタイムの向上を図る浮上搬送方式の塗布装置および塗布方法を提供することにある。   Another object of the present invention is to provide a floating conveyance type coating apparatus and coating method that improve a mechanism for holding a rectangular substrate to be processed and improve coating quality and tact time.

上記の目的を達成するために、本発明の基板処理装置は、矩形の被処理基板を気体の圧力で浮かせるステージと、前記ステージ上で浮いた状態の前記基板を着脱可能に保持する保持部を有し、前記ステージ上で所定の搬送方向に前記基板を浮上搬送するために前記基板を前記保持部と一体的に前記搬送方向に移動させる搬送部とを備え、前記保持部が、前記基板の搬送方向に対して左右片側の二隅を局所的に保持する実質的にたわまない保持部材と、前記保持部材を昇降移動または変位させるための昇降部とを有する。   In order to achieve the above object, a substrate processing apparatus of the present invention includes a stage that floats a rectangular substrate to be processed by gas pressure, and a holding unit that detachably holds the substrate that is floating on the stage. A transfer unit that moves the substrate in the transfer direction integrally with the holding unit to float and transfer the substrate in a predetermined transfer direction on the stage, and the holding unit A holding member that substantially does not bend locally holds the two corners on the left and right sides with respect to the transport direction, and an elevating unit for moving the holding member up and down or displacing the holding member.

上記の構成においては、搬送部に備わっている保持部ないし保持部材が基板の左右片側の二隅を実質的にたわまずに保持するので、搬送部がステージ上で矩形の基板を浮上搬送する際に、ステージ側から受ける浮上圧力が変動しても、保持部ないし保持部材のリジッドな保持力または拘束力によって基板の前端部または後端部のばたつきを抑制することが可能であり、基板が搬送方向と直交する方向で山形に撓むような場合も保持部のリジッドな保持力または拘束力によって基板を同方向で水平に矯正することができる。   In the above configuration, the holding unit or holding member provided in the transfer unit holds the left and right corners of the substrate substantially without bending, so the transfer unit floats and conveys the rectangular substrate on the stage. In this case, even if the floating pressure received from the stage side fluctuates, it is possible to suppress fluttering of the front end portion or the rear end portion of the substrate by the rigid holding force or restraining force of the holding portion or holding member. Even in the case of bending in a mountain shape in a direction orthogonal to the transport direction, the substrate can be horizontally corrected in the same direction by the rigid holding force or restraining force of the holding portion.

本発明の好適な一態様によれば、保持部材は、基板の左右片側二隅の裏面にそれぞれ吸着可能な2個の吸着パッドと、各々の吸着パッドを搬送方向に所定の間隔を置いた2箇所でそれぞれ鉛直方向の変位を規制して支持するパッド支持部とを有する。そして、昇降部は、第1および第2のパッド支持部をそれぞれ独立に昇降駆動する第1および第2のアクチエータと、これら第1および第2のアクチエータの駆動動作を統括的に制御する昇降制御部とを有する。この場合、第1および第2のパッド支持部間の昇降誤差を吸収するために、第1および第2のパッド支持部の双方が吸着パッドをその回りに鉛直面内で回転変位可能とする水平回転軸を有し、第1および第2のパッド支持部の片方が吸着パッドを水平方向で直動変位可能とする直動軸を有する構成が好ましい。また、好ましい一態様として、昇降部は、第1および第2のパッド支持部をそれぞれ独立に昇降駆動する第1および第2のアクチエータと、第1および第2のアクチエータの駆動動作を統括的に制御する昇降制御部とを有する。ここで、アクチエータは、モータと、このモータの回転駆動力をパッド支持部の鉛直方向の直進運動に変換する伝動機構とを有してよい。また、昇降制御部は、モータの回転角を検出するためのエンコーダを含み、パッド支持部の昇降移動距離を制御するためにエンコーダの出力信号をフィードバック信号としてモータの回転量を制御してよい。   According to a preferred aspect of the present invention, the holding member includes two suction pads that can be sucked on the back surfaces of the left and right corners of the substrate, and two suction pads that are spaced apart from each other by a predetermined distance in the transport direction. And a pad support part that supports and supports the displacement in the vertical direction at each point. The elevating unit includes first and second actuators for independently elevating and driving the first and second pad support units, and elevating control for comprehensively controlling the driving operations of the first and second actuators. Part. In this case, in order to absorb the lifting error between the first and second pad support portions, both the first and second pad support portions can horizontally rotate the suction pad around the vertical plane in the vertical plane. A configuration having a rotation shaft and one of the first and second pad support portions having a linear motion shaft that allows the suction pad to be linearly displaced in the horizontal direction is preferable. Moreover, as a preferable aspect, the elevating unit generally controls the first and second actuators that drive the first and second pad support units up and down independently, and the driving operations of the first and second actuators. And a lift control unit for controlling. Here, the actuator may include a motor and a transmission mechanism that converts the rotational driving force of the motor into a linearly moving motion in the vertical direction of the pad support portion. The lifting control unit may include an encoder for detecting the rotation angle of the motor, and may control the rotation amount of the motor using the output signal of the encoder as a feedback signal in order to control the lifting / lowering movement distance of the pad support unit.

このように各吸着パッドを2軸で支持ないし昇降移動させて基板の左右片側二隅に吸着結合させる構成においては、吸着パッドひいては基板前端部および後端部を容易かつ安定に任意の傾斜姿勢または水平度に設定または調節できる。   Thus, in the configuration in which each suction pad is supported or moved up and down by two axes and is suction-bonded to the two left and right corners of the substrate, the suction pad and thus the front end portion and the rear end portion of the substrate can be easily and stably placed in any inclined posture or Can be set or adjusted to level.

また、別の好適な一態様として、保持部材が、基板の左右片側二隅の裏面にそれぞれ吸着可能な2個の吸着パッドと、各々の吸着パッドをその鉛直方向の変位を規制して支持する単一のパッド支持部とを有し、昇降部が、パッド支持部を昇降駆動するアクチエータと、アクチエータの駆動動作を制御する昇降制御部とを有してもよい。この場合、保持部が、搬送方向の水平線に対する吸着パッドの角度を調整するための第1のパッド姿勢調整部を有するのが好ましい。このように吸着パッドを1軸(単一)のパッド支持部で支持する構成によっても、上記のように吸着パッドを一対(2軸)のパッド支持部で支持する場合と同様の基板保持機能および基板姿勢矯正機能を持たせることができる。   As another preferred embodiment, the holding member supports two suction pads that can be sucked to the back surfaces of the two left and right corners of the substrate, and supports each suction pad by restricting the displacement in the vertical direction. It has a single pad support part, and a raising / lowering part may have an actuator which raises / lowers a pad support part, and a raising / lowering control part which controls the drive operation of an actuator. In this case, it is preferable that the holding unit includes a first pad posture adjusting unit for adjusting the angle of the suction pad with respect to the horizontal line in the transport direction. Thus, even when the suction pad is supported by the uniaxial (single) pad support portion, the same substrate holding function as in the case where the suction pad is supported by the pair (biaxial) pad support portion as described above, and A substrate posture correcting function can be provided.

また、より好適な一態様として、搬送方向と直交する水平線に対する吸着パッドの吸着面の角度を調整するための第2のパッド姿勢調整部を有してもよい。   Further, as a more preferable aspect, a second pad posture adjusting unit for adjusting the angle of the suction surface of the suction pad with respect to a horizontal line orthogonal to the transport direction may be provided.

本発明の好適な一態様においては、浮上搬送中に基板の保持部に対する水平面内の回転変位を防止するための回転変位防止手段が備えられる。かかる回転変異防止手段として、たとえば、吸着パッドの上面に一体形成され、基板の上面よりも低い位置で基板の隅部の直交する両側面に係合する突部が設けられる。あるいは、好適な一態様として、浮上搬送の減速時に基板の搬送方向における前部の側面に係止して基板の前方への回転変位を防止する係止部材や、浮上搬送の加速時に基板の搬送方向における後部の側面に係止して基板の後方への回転変位を防止する係止部材が用いられる。あるいは、別の好適な一態様として、保持部材によって保持される基板の片側二隅の間で基板側縁部の裏面に吸着して基板の回転変位を防止する中間パッド部材が用いられる。   In a preferred aspect of the present invention, a rotational displacement preventing means for preventing rotational displacement in a horizontal plane with respect to the holding portion of the substrate during levitation conveyance is provided. As such rotation variation preventing means, for example, protrusions that are integrally formed on the upper surface of the suction pad and that engage with both orthogonal side surfaces of the corner of the substrate at a position lower than the upper surface of the substrate are provided. Alternatively, as a preferred aspect, a locking member that locks to the front side surface in the substrate transport direction when the floating transport is decelerated to prevent rotational displacement forward of the substrate, or a substrate transport when the floating transport is accelerated. A locking member that locks to the rear side surface in the direction to prevent the rotational displacement of the substrate rearward is used. Alternatively, as another preferred embodiment, an intermediate pad member that is attracted to the back surface of the substrate side edge between two corners on one side of the substrate held by the holding member to prevent rotational displacement of the substrate is used.

本発明の塗布装置は、矩形の被処理基板を気体の圧力で浮かせるステージと、前記ステージ上で浮く前記基板の搬送方向に対して左右片方の縁部を着脱可能に保持する第1の保持部を有し、前記ステージ上で前記基板を浮上搬送するために前記基板を前記第1の保持部と一体に搬送方向に移動させる第1の搬送部と、前記ステージ上で浮く前記基板の搬送方向に対して左右他方の縁部を着脱可能に保持する第2の保持部を有し、前記ステージ上で前記基板を浮上搬送するために前記基板を前記第2の保持部と一体に搬送方向に移動させる第2の搬送部と、前記ステージの上方に配置される長尺形のノズルを有し、前記基板上に処理液の塗布膜を形成するために前記浮上搬送で前記ノズルの直下を通過する前記基板に向けて前記ノズルより処理液を吐出させる処理液供給部とを備え、前記第1の保持部が、前記基板の搬送方向に対して左右片方の二隅を局所的に保持する実質的にたわまない第1の保持部材と、前記第1の保持部材を昇降移動または変位させるための第1の昇降部とを有し、前記第2の保持部が、前記基板の搬送方向に対して左右他方の二隅を局所的に保持する実質的にたわまない第2の保持部材と、前記第2の保持部材を昇降移動または変位させるための第2の昇降部とを有する。   A coating apparatus according to the present invention includes a stage that floats a rectangular substrate to be processed with gas pressure, and a first holding unit that detachably holds right and left edges with respect to the transport direction of the substrate that floats on the stage. A first transport unit that moves the substrate in the transport direction integrally with the first holding unit to float and transport the substrate on the stage; and a transport direction of the substrate that floats on the stage A second holding portion that detachably holds the other left and right edge portions, and in order to float and convey the substrate on the stage, the substrate is integrated with the second holding portion in the conveyance direction. A second transport unit to be moved and a long nozzle disposed above the stage, and pass directly under the nozzle in the floating transport to form a coating film of the processing liquid on the substrate. Process from the nozzle toward the substrate A first holding member that substantially holds the two corners on the left and right sides with respect to the transport direction of the substrate. And a first elevating part for moving the first holding member up and down or displacing the first holding member, and the second holding part locally places the other two corners on the left and right sides with respect to the transport direction of the substrate. A second holding member that does not flex substantially and a second elevating part for moving the second holding member up and down or displacing the second holding member.

また、本発明の塗布方法は、浮上ステージ上に搬送方向に沿って搬入位置、塗布開始位置、塗布終了位置および搬出位置を一列に設定し、前記浮上ステージ上で気体の圧力により矩形の被処理基板を所望の高さに浮かせ、前記浮上ステージ上で、前記搬入位置から前記塗布開始位置までの第1の区間では前記基板の搬送方向に対して左右片方の二隅を実質的にたわまない昇降可能な保持部材で局所的に保持して、前記塗布開始位置から前記塗布終了位置までの第2の区間では前記基板の四隅を実質的にたわまない昇降可能な保持部材で局所的に保持して、前記塗布終了位置から前記搬出位置までの第3の区間では前記基板の搬送方向に対して左右他方の二隅を実質的にたわまない昇降可能な保持部材で局所的に保持して、前記基板を前記搬送方向に搬送し、前記基板が前記第2の区間を移動する間に前記基板の上面に処理液を塗布する。   Further, the coating method of the present invention sets a loading position, a coating start position, a coating end position, and a carry-out position in a line along the transport direction on the levitation stage, and performs rectangular processing by gas pressure on the levitation stage. The substrate is floated to a desired height, and on the levitation stage, in the first section from the carry-in position to the application start position, the left and right corners are substantially bent with respect to the substrate transport direction. In the second section from the application start position to the application end position, the substrate is locally held by an elevating holding member that does not substantially deflect the four corners of the substrate. In the third section from the coating end position to the unloading position, a holding member capable of moving up and down that does not substantially deflect the other two corners on the left and right sides with respect to the transport direction of the substrate is locally used. Hold and transfer the substrate Transported countercurrent, the substrate is coated with the treatment liquid on the upper surface of the substrate while moving the second section.

本発明の塗布装置または塗布方法においては、塗布処理以外の浮上搬送では第1または第2の保持部が左右片側の二隅を保持して片軸搬送を行い、塗布処理時の浮上搬送では第1および第2の保持部が基板の左右両側の二隅を同時に保持して2軸搬送を行う。片軸搬送の際には、本発明の基板処理装置と同様に浮上ステージ上で矩形の被処理基板を一定の姿勢に保持して浮上搬送することができる。また、2軸搬送時には、基板を塗布処理に一層適した姿勢(通常は水平姿勢)に保持または矯正して浮上搬送することができる。第1および第2の搬送部の両者が協働して2軸搬送を行う区間を塗布位置付近に限定し、それ以外は各持分の区間(搬入側区間、搬出側区間)における搬送ないし移動動作を単独で個別に行うので、タクトタイムを短縮することができる。   In the coating apparatus or the coating method of the present invention, the first or second holding unit holds the two corners on the left and right sides in levitation conveyance other than the coating process, and performs uniaxial conveyance. The first and second holding units simultaneously hold the two corners on the left and right sides of the substrate to perform biaxial conveyance. In the case of single-axis transport, a rectangular substrate to be processed can be floated and transported while being held in a fixed posture on the surfacing stage in the same manner as the substrate processing apparatus of the present invention. Further, at the time of biaxial conveyance, the substrate can be floated and conveyed while being held or corrected in a posture (usually a horizontal posture) more suitable for the coating process. A section in which both the first and second transport units cooperate to perform biaxial transport is limited to the vicinity of the application position, and other than that, transport or movement operation in each share section (loading side section, unloading side section) Since the process is performed individually, the tact time can be shortened.

本発明の基板処理装置によれば、上記のような構成および作用により、浮上ステージ上で矩形の被処理基板を簡易な構成でもって処理に適した一定の姿勢に保持して安定に浮上搬送することができる。   According to the substrate processing apparatus of the present invention, with the above-described configuration and operation, a rectangular substrate to be processed can be stably floated and held on a floating stage with a simple configuration and in a fixed posture suitable for processing. be able to.

また、本発明の塗布装置および塗布方法によれば、上記のような構成および作用により、浮上搬送方式において矩形の被処理基板を保持する機構を改善して塗布品質の向上とタクトタイムの向上を図ることができる。   Further, according to the coating apparatus and the coating method of the present invention, with the above-described configuration and operation, the mechanism for holding the rectangular substrate to be processed in the floating transport method is improved to improve the coating quality and the tact time. Can be planned.

以下、添付図を参照して本発明の好適な実施形態を説明する。   Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings.

図1に、本発明の基板処理装置、塗布装置および塗布方法を適用できる一構成例としての塗布現像処理システムを示す。この塗布現像処理システム10は、クリーンルーム内に設置され、たとえば矩形のガラス基板を被処理基板Gとし、LCD製造プロセスにおいてフォトリソグラフィー工程の中の洗浄、レジスト塗布、プリベーク、現像およびポストベーク等の一連の処理を行うものである。露光処理は、このシステムに隣接して設置される外部の露光装置12で行われる。   FIG. 1 shows a coating and developing treatment system as one configuration example to which the substrate processing apparatus, coating apparatus and coating method of the present invention can be applied. The coating and developing processing system 10 is installed in a clean room. For example, a rectangular glass substrate is used as a processing target G, and a series of cleaning, resist coating, pre-baking, developing, post-baking, and the like in a photolithography process in an LCD manufacturing process. The process is performed. The exposure process is performed by an external exposure apparatus 12 installed adjacent to this system.

この塗布現像処理システム10は、中心部に横長のプロセスステーション(P/S)16を配置し、その長手方向(X方向)両端部にカセットステーション(C/S)14とインタフェースステーション(I/F)18とを配置している。   In the coating and developing system 10, a horizontally long process station (P / S) 16 is disposed at the center, and a cassette station (C / S) 14 and an interface station (I / F) are disposed at both ends in the longitudinal direction (X direction). ) 18.

カセットステーション(C/S)14は、システム10のカセット搬入出ポートであり、基板Gを多段に積み重ねるようにして複数枚収容可能なカセットCを水平な一方向(Y方向)に4個まで並べて載置可能なカセットステージ20と、このステージ20上のカセットCに対して基板Gの出し入れを行う搬送機構22とを備えている。搬送機構22は、基板Gを1枚単位または2枚単位で保持できる搬送アーム22aを有し、X,Y,Z,θの4軸で動作可能であり、隣接するプロセスステーション(P/S)16側と基板Gの受け渡しを行えるようになっている。   The cassette station (C / S) 14 is a cassette loading / unloading port of the system 10, and arranges up to four cassettes C that can accommodate a plurality of substrates C in a horizontal direction (Y direction) by stacking substrates G in multiple stages. A cassette stage 20 that can be placed, and a transport mechanism 22 that takes in and out the substrate G to and from the cassette C on the stage 20 are provided. The transport mechanism 22 has a transport arm 22a that can hold the substrate G in units of one or two, can operate on four axes of X, Y, Z, and θ, and is adjacent to a process station (P / S). The substrate G can be transferred to and from the 16 side.

プロセスステーション(P/S)16は、水平なシステム長手方向(X方向)に延在する平行かつ逆向きの一対のラインA,Bに各処理部をプロセスフローまたは工程の順に配置している。   In the process station (P / S) 16, the processing units are arranged in the order of the process flow or the process on a pair of parallel and opposite lines A and B extending in the horizontal system longitudinal direction (X direction).

より詳細には、カセットステーション(C/S)14側からインタフェースステーション(I/F)18側へ向う上流部のプロセスラインAには、搬入ユニット(IN PASS)24、洗浄プロセス部26、第1の熱的処理部28、塗布プロセス部30、第2の熱的処理部32が第1の平流し搬送路34に沿って上流側からこの順序で一列に配置されている。   More specifically, the upstream process line A from the cassette station (C / S) 14 side to the interface station (I / F) 18 side includes a carry-in unit (IN PASS) 24, a cleaning process unit 26, a first The thermal processing section 28, the coating process section 30, and the second thermal processing section 32 are arranged in a line in this order from the upstream side along the first flat flow path 34.

より詳細には、搬入ユニット(IN PASS)24はカセットステーション(C/S)14の搬送機構22から未処理の基板Gを1枚単位または2枚単位で受け取り、所定のタクトで1枚ずつ第1の平流し搬送路34に投入するように構成されている。洗浄プロセス部24は、第1の平流し搬送路34に沿って上流側から順にエキシマUV照射ユニット(E−UV)36およびスクラバ洗浄ユニット(SCR)38を設けている。第1の熱的処理部28は、上流側から順にアドヒージョンユニット(AD)40および冷却ユニット(COL)42を設けている。   More specifically, the carry-in unit (IN PASS) 24 receives the unprocessed substrates G from the transport mechanism 22 of the cassette station (C / S) 14 in units of one or two, and in a predetermined tact one by one. It is configured so as to be fed into one flat flow path 34. The cleaning process unit 24 includes an excimer UV irradiation unit (E-UV) 36 and a scrubber cleaning unit (SCR) 38 in order from the upstream side along the first flat flow path 34. The first thermal processing unit 28 includes an adhesion unit (AD) 40 and a cooling unit (COL) 42 in order from the upstream side.

塗布プロセス部30は、上流側から順にソーターユニット(SORTER)43、レジスト塗布ユニット(COT)44、ソーターユニット(SORTER)45および減圧乾燥ユニット(VD)46を設けている。第1の熱的処理部28から平流しで搬送されてきた基板Gは、ソーターユニット(SORTER)43を介して平流しでレジスト塗布ユニット(COT)44に搬入される。そして、レジスト塗布ユニット(COT)44でレジスト塗布処理の済んだ基板Gは、ソーターユニット(SORTER)45を介して平流しで減圧乾燥ユニット(VD)46に送り込まれる。減圧乾燥ユニット(VD)46は、基板Gを収容し、かつ減圧可能なチャンバと、このチャンバに平流しで基板Gを搬入出する搬送機構とを有している。   The coating process unit 30 includes a sorter unit (SORTER) 43, a resist coating unit (COT) 44, a sorter unit (SORTER) 45, and a vacuum drying unit (VD) 46 in order from the upstream side. The substrate G transported from the first thermal processing unit 28 in a flat flow is carried into a resist coating unit (COT) 44 through a sorter unit (SORTER) 43 in a flat flow. Then, the substrate G that has been subjected to the resist coating process by the resist coating unit (COT) 44 is fed through the sorter unit (SORTER) 45 and sent to the vacuum drying unit (VD) 46. The reduced-pressure drying unit (VD) 46 has a chamber in which the substrate G can be stored and depressurized, and a transfer mechanism that carries the substrate G in and out of the chamber in a flat flow.

第2の熱的処理部32は、上流側から順にプリベークユニット(PRE−BAKE)48および冷却ユニット(COL)50を設けている。第2の熱的処理部32の下流側隣に位置する第1の平流し搬送路34の終点にはパスユニット(PASS)52が設けられている。第1の平流し搬送路34上を平流しで搬送されてきた基板Gは、この終点のパスユニット(PASS)52からインタフェースステーション(I/F)18へ渡されるようになっている。   The second thermal processing unit 32 includes a pre-bake unit (PRE-BAKE) 48 and a cooling unit (COL) 50 in order from the upstream side. A pass unit (PASS) 52 is provided at the end point of the first flat flow conveyance path 34 located adjacent to the downstream side of the second thermal processing unit 32. The substrate G that has been transported in a flat flow on the first flat flow transport path 34 is transferred from the pass unit (PASS) 52 at the end point to the interface station (I / F) 18.

一方、インタフェースステーション(I/F)18側からカセットステーション(C/S)14側へ向う下流部のプロセスラインBには、現像ユニット(DEV)54、ポストベークユニット(POST−BAKE)56、冷却ユニット(COL)58、検査ユニット(AP)60および搬出ユニット(OUT−PASS)62が第2の平流し搬送路64に沿って上流側からこの順序で一列に配置されている。ここで、ポストベークユニット(POST−BAKE)56および冷却ユニット(COL)58は第3の熱的処理部66を構成する。搬出ユニット(OUT PASS)62は、第2の平流し搬送路64から処理済の基板Gを1枚ずつ受け取って、カセットステーション(C/S)14の搬送機構22に1枚単位または2枚単位で渡すように構成されている。   On the other hand, in the downstream process line B from the interface station (I / F) 18 side to the cassette station (C / S) 14 side, a development unit (DEV) 54, a post-bake unit (POST-BAKE) 56, a cooling unit are provided. A unit (COL) 58, an inspection unit (AP) 60 and a carry-out unit (OUT-PASS) 62 are arranged in a line in this order from the upstream side along the second flat flow path 64. Here, the post-bake unit (POST-BAKE) 56 and the cooling unit (COL) 58 constitute a third thermal processing unit 66. The carry-out unit (OUT PASS) 62 receives the processed substrates G one by one from the second flat-carrying transport path 64 and supplies them to the transport mechanism 22 of the cassette station (C / S) 14 in units of one or two. Configured to pass in.

両プロセスラインA,Bの間には補助搬送空間68が設けられている。なお、基板Gを1枚単位で水平に載置可能なシャトル(図示せず)が駆動機構(図示せず)によってプロセスライン方向(X方向)で双方向に移動できるようになっていてもよい。   An auxiliary transfer space 68 is provided between the process lines A and B. It should be noted that a shuttle (not shown) that can horizontally place the substrates G in units of one sheet may be moved in both directions in the process line direction (X direction) by a drive mechanism (not shown). .

インタフェースステーション(I/F)18は、上記第1および第2の平流し搬送路34,64や隣接する露光装置12と基板Gのやりとりを行うための搬送装置72を有し、この搬送装置72の周囲にロータリステージ(R/S)74および周辺装置76を配置している。ロータリステージ(R/S)74は、基板Gを水平面内で回転させるステージであり、露光装置12との受け渡しに際して長方形の基板Gの向きを変換するために用いられる。周辺装置76は、たとえばタイトラー(TITLER)や周辺露光装置(EE)等を第2の平流し搬送路64の上の階に設けている。図示省略するが、周辺装置76の下には、搬送装置72から基板Gを受け取って第2の平流し搬送路64に載せる始点のパスユニット(PASS)が設けられている。   The interface station (I / F) 18 includes a transfer device 72 for exchanging the substrate G with the first and second flat flow transfer paths 34 and 64 and the adjacent exposure device 12. A rotary stage (R / S) 74 and a peripheral device 76 are arranged around the periphery. The rotary stage (R / S) 74 is a stage that rotates the substrate G in a horizontal plane, and is used to change the orientation of the rectangular substrate G when it is transferred to the exposure apparatus 12. In the peripheral device 76, for example, a titler (TITLER), a peripheral exposure device (EE), and the like are provided on a floor above the second flat flow path 64. Although not shown, a starting point pass unit (PASS) for receiving the substrate G from the transfer device 72 and placing it on the second flat flow transfer path 64 is provided below the peripheral device 76.

図2に、この塗布現像処理システムにおける1枚の基板Gに対する全工程の処理手順を示す。先ず、カセットステーション(C/S)14において、搬送機構22が、ステージ20上のいずれか1つのカセットCから基板Gを1枚または2枚取り出し、その取り出した基板Gをプロセスステーション(P/S)16のプロセスラインA側の搬入ユニット(IN PASS)24に搬入する(ステップS1)。搬入ユニット(IN PASS)24から基板Gは所定のタクトで1枚ずつ第1の平流し搬送路34上に移載または投入される。   FIG. 2 shows a processing procedure of all steps for one substrate G in this coating and developing processing system. First, in the cassette station (C / S) 14, the transport mechanism 22 takes out one or two substrates G from any one cassette C on the stage 20, and removes the removed substrates G from the process station (P / S). ) It is carried into the carry-in unit (IN PASS) 24 on the process line A side of 16 (step S1). From the carry-in unit (IN PASS) 24, the substrates G are transferred or loaded onto the first flat flow path 34 one by one with a predetermined tact.

第1の平流し搬送路34に投入された基板Gは、最初に洗浄プロセス部26においてエキシマUV照射ユニット(E−UV)36およびスクラバ洗浄ユニット(SCR)38により紫外線洗浄処理およびスクラビング洗浄処理を順次施される(ステップS2,S3)。スクラバ洗浄ユニット(SCR)38は、平流し搬送路32上を水平に移動する基板Gに対して、ブラッシング洗浄やブロー洗浄を施すことにより基板表面から粒子状の汚れを除去し、その後にリンス処理を施し、最後にエアーナイフ等を用いて基板Gを乾燥させる。スクラバ洗浄ユニット(SCR)38における一連の洗浄処理を終えると、基板Gはそのまま第1の平流し搬送路34を下って第1の熱的処理部28を通過する。   The substrate G put into the first flat transport path 34 is first subjected to an ultraviolet cleaning process and a scrubbing cleaning process by the excimer UV irradiation unit (E-UV) 36 and the scrubber cleaning unit (SCR) 38 in the cleaning process unit 26. Sequentially applied (steps S2, S3). The scrubber cleaning unit (SCR) 38 removes particulate contamination from the substrate surface by performing brushing cleaning and blow cleaning on the substrate G that moves horizontally on the flat flow path 32, and then rinses. Finally, the substrate G is dried using an air knife or the like. When a series of cleaning processes in the scrubber cleaning unit (SCR) 38 is completed, the substrate G passes through the first thermal processing section 28 as it is down the first flat flow path 34.

第1の熱的処理部28において、基板Gは、最初にアドヒージョンユニット(AD)40で蒸気状のHMDSを用いるアドヒージョン処理を施され、被処理面を疎水化される(ステップS4)。このアドヒージョン処理の終了後に、基板Gは冷却ユニット(COL)42で所定の基板温度まで冷却される(ステップS5)。この後も、基板Gは第1の平流し搬送路34を下り、塗布プロセス部30へ搬送される。   In the first thermal processing unit 28, the substrate G is first subjected to an adhesion process using vapor HMDS in the adhesion unit (AD) 40, and the surface to be processed is hydrophobized (step S4). After the completion of this adhesion process, the substrate G is cooled to a predetermined substrate temperature by the cooling unit (COL) 42 (step S5). Thereafter, the substrate G is transported down the first flat flow transport path 34 to the coating process unit 30.

塗布プロセス部30に入ると、基板Gは、ソーターユニット(SORTER)43からレジスト塗布ユニット(COT)44に搬入され、長尺形のスリットノズルを用いる浮上搬送のスピンレス法により基板上面(被処理面)にレジスト液を塗布される。次いで、ソーターユニット(SORTER)45を介して減圧乾燥ユニット(VD)46に送られ、ここで減圧による常温の乾燥処理を受ける(ステップS6)。   When entering the coating process unit 30, the substrate G is transferred from the sorter unit (SORTER) 43 to the resist coating unit (COT) 44, and the substrate upper surface (surface to be processed) is formed by a spinless method of floating conveyance using a long slit nozzle. ) Is coated with a resist solution. Next, it is sent to a reduced pressure drying unit (VD) 46 through a sorter unit (SORTER) 45, where it is subjected to a normal temperature drying process under reduced pressure (step S6).

塗布プロセス部30を出た基板Gは、第1の平流し搬送路34を下って第2の熱的処理部32を通過する。第2の熱的処理部32において、基板Gは、最初にプリベークユニット(PRE−BAKE)48でレジスト塗布後の熱処理または露光前の熱処理としてプリベーキングを受ける(ステップS7)。このプリベーキングによって、基板G上のレジスト膜中に残留していた溶剤が蒸発して除去され、基板に対するレジスト膜の密着性が強化される。次に、基板Gは、冷却ユニット(COL)50で所定の基板温度まで冷却される(ステップS8)。しかる後、基板Gは、第1の平流し搬送路34の終点のパスユニット(PASS)52からインタフェースステーション(I/F)18の搬送装置72に引き取られる。   The substrate G that has left the coating process unit 30 passes through the second thermal processing unit 32 through the first flat flow path 34. In the second thermal processing section 32, the substrate G is first pre-baked by the pre-bake unit (PRE-BAKE) 48 as a heat treatment after resist coating or a heat treatment before exposure (step S7). By this pre-baking, the solvent remaining in the resist film on the substrate G is evaporated and removed, and the adhesion of the resist film to the substrate is enhanced. Next, the substrate G is cooled to a predetermined substrate temperature by the cooling unit (COL) 50 (step S8). Thereafter, the substrate G is taken from the pass unit (PASS) 52 at the end point of the first flat flow transport path 34 to the transport device 72 of the interface station (I / F) 18.

インタフェースステーション(I/F)18において、基板Gは、ロータリステージ74でたとえば90度の方向変換を受けてから周辺装置76の周辺露光装置(EE)に搬入され、そこで基板Gの周辺部に付着するレジストを現像時に除去するための露光を受けた後に、隣の露光装置12へ送られる(ステップS9)。   In the interface station (I / F) 18, the substrate G is subjected to, for example, a 90-degree direction change by the rotary stage 74 and then carried into the peripheral exposure device (EE) of the peripheral device 76, where it adheres to the peripheral portion of the substrate G. After receiving the exposure for removing the resist to be developed, the resist is sent to the adjacent exposure apparatus 12 (step S9).

露光装置12では基板G上のレジストに所定の回路パターンが露光される。そして、パターン露光を終えた基板Gは、露光装置12からインタフェースステーション(I/F)18に戻されると(ステップS9)、先ず周辺装置76のタイトラー(TITLER)に搬入され、そこで基板上の所定の部位に所定の情報が記される(ステップS10)。しかる後、基板Gは、搬送装置72よりプロセスステーション(P/S)16のプロセスラインB側に敷設されている第2の平流し搬送路64の始点パスユニット(PASS)に搬入される。   In the exposure apparatus 12, a predetermined circuit pattern is exposed to the resist on the substrate G. Then, when the substrate G that has undergone pattern exposure is returned from the exposure apparatus 12 to the interface station (I / F) 18 (step S9), it is first carried into a titler (TITLER) of the peripheral device 76, where there is a predetermined on the substrate. Predetermined information is written in the part (step S10). Thereafter, the substrate G is carried from the transfer device 72 to the start point path unit (PASS) of the second flat flow transfer path 64 laid on the process line B side of the process station (P / S) 16.

こうして、基板Gは、今度は第2の平流し搬送路64上をプロセスラインBの下流側に向けて搬送される。最初の現像ユニット(DEV)54において、基板Gは、平流しで搬送される間に現像、リンス、乾燥の一連の現像処理を施される(ステップS11)。   In this way, the substrate G is transferred on the second flat flow transfer path 64 toward the downstream side of the process line B. In the first development unit (DEV) 54, the substrate G is subjected to a series of development processes of development, rinsing, and drying while being conveyed in a flat flow (step S11).

現像ユニット(DEV)54で一連の現像処理を終えた基板Gは、そのまま第2の平流し搬送路64に乗せられたまま第3の熱的処理部66および検査ユニット(AP)60を順次通過する。第3の熱的処理部66において、基板Gは、最初にポストベークユニット(POST−BAKE)56で現像処理後の熱処理としてポストベーキングを受ける(ステップS12)。このポストベーキングによって、基板G上のレジスト膜に残留していた現像液や洗浄液が蒸発して除去され、基板に対するレジストパターンの密着性が強化される。次に、基板Gは、冷却ユニット(COL)58で所定の基板温度に冷却される(ステップS13)。検査ユニット(AP)60では、基板G上のレジストパターンについて非接触の線幅検査や膜質・膜厚検査等が行われる(ステップS14)。   The substrate G that has undergone a series of development processes in the development unit (DEV) 54 is sequentially passed through the third thermal processing unit 66 and the inspection unit (AP) 60 while being put on the second flat flow path 64 as it is. To do. In the third thermal processing section 66, the substrate G is first subjected to post-baking as post-development heat treatment in the post-bake unit (POST-BAKE) 56 (step S12). By this post-baking, the developing solution and the cleaning solution remaining in the resist film on the substrate G are removed by evaporation, and the adhesion of the resist pattern to the substrate is enhanced. Next, the substrate G is cooled to a predetermined substrate temperature by the cooling unit (COL) 58 (step S13). In the inspection unit (AP) 60, non-contact line width inspection, film quality / film thickness inspection, and the like are performed on the resist pattern on the substrate G (step S14).

搬出ユニット(OUT PASS)62は、第2の平流し搬送路64から全工程の処理を終えてきた基板Gを1枚ずつ受け取り、1枚単位または2枚単位でカセットステーション(C/S)14の搬送機構22へ渡す。カセットステーション(C/S)14側では、搬送機構22が、搬出ユニット(OUT PASS)62から1枚単位または2枚単位で受け取った処理済の基板Gをいずれか1つ(通常は元)のカセットCに収容する(ステップS1)。   The carry-out unit (OUT PASS) 62 receives the substrates G that have been processed in all processes from the second flat-carrying transport path 64 one by one, and the cassette station (C / S) 14 in units of one or two. To the transport mechanism 22. On the cassette station (C / S) 14 side, the transport mechanism 22 receives either one (usually the original) processed substrate G received from the carry-out unit (OUT PASS) 62 in units of one or two. Housed in cassette C (step S1).

この塗布現像処理システム10においては、塗布プロセス部30内のレジスト塗布ユニット(COT)44に本発明を適用することができる。以下、図3〜図23につき、本発明をレジスト塗布ユニット(COT)44に適用した一実施形態を詳細に説明する。   In the coating and developing treatment system 10, the present invention can be applied to the resist coating unit (COT) 44 in the coating process unit 30. Hereinafter, an embodiment in which the present invention is applied to a resist coating unit (COT) 44 will be described in detail with reference to FIGS.

図3〜図5はこの実施形態におけるレジスト塗布ユニット(COT)44の全体構成を示し、図3は略平面図、図4は斜視図、図5は略正面面である。   3 to 5 show the overall configuration of the resist coating unit (COT) 44 in this embodiment, FIG. 3 is a schematic plan view, FIG. 4 is a perspective view, and FIG. 5 is a schematic front view.

図3に示すように、レジスト塗布ユニット(COT)44は、第1の平流し搬送路34(図1)の搬送方向(X方向)に長く延びるステージ80を有している。塗布処理を受けるべき基板Gは、ソーターユニット(SORTER)43より矢印FAで示すようにステージ80の搬送上流端の領域(搬入領域M1)に搬入される。そして、ステージ80上の矢印FBで示すような浮上搬送によってスピンレス法のレジスト塗布処理を受けた基板Gは、ステージ80の搬送下流端の領域(搬出領域M3)から矢印FCで示すようにソーターユニット(SORTER)45に引き取られる。ステージ80の長手方向中心部の領域(塗布領域M3)の上方には、基板Gにレジスト液を供給するための長尺形のレジストノズル82が配置されている。 As shown in FIG. 3, the resist coating unit (COT) 44 includes a stage 80 that extends long in the transport direction (X direction) of the first flat flow transport path 34 (FIG. 1). The substrate G to be subjected to the coating process is carried from the sorter unit (SORTER) 43 into the upstream area (loading area M 1 ) of the stage 80 as indicated by the arrow F A. Then, the substrate G that has been subjected to the spinless resist coating process by the floating conveyance as shown by the arrow F B on the stage 80 is indicated by the arrow F C from the conveyance downstream end area (unloading area M 3 ) of the stage 80. To the sorter unit (SORTER) 45. A long resist nozzle 82 for supplying a resist solution to the substrate G is disposed above the central region (application region M 3 ) of the stage 80 in the longitudinal direction.

なお、搬入側のソーターユニット(SORTER)43は、図示省略するが、第1の平流し搬送路34(図1)の搬送方向(X方向)に敷設されたコロ搬送路と、このコロ搬送路上の基板に対して基板裏面の縁部にバキューム吸着可能/離脱可能な複数の吸着パッドと、それらの吸着パッドを搬送方向と平行に双方向で移動させる基板送り機構とを有している。上流側の第1の熱的処理部28で熱的処理の済んだ基板を平流しで該コロ搬送路上に受け取ると、吸着パッドが上昇して該基板の裏面縁部に吸着し、基板を吸着保持する吸着パッドを介して基板送り機構が基板をステージ80の搬入領域M1まで移送するようになっている。そして、搬入領域M1に基板を搬入した後、吸着パッドが基板から分離し、次いで基板送り機構と吸着パッドが原位置へ戻るようになっている。 Although the illustration of the sorter unit (SORTER) 43 on the carry-in side is omitted, a roller conveyance path laid in the conveyance direction (X direction) of the first flat flow conveyance path 34 (FIG. 1), and the roller conveyance path A plurality of suction pads that can be vacuum-sucked / removable at the edge of the back surface of the substrate, and a substrate feed mechanism that moves these suction pads in both directions parallel to the transport direction. When the substrate that has been thermally processed by the first thermal processing unit 28 on the upstream side is received on the roller conveyance path in a flat flow, the suction pad rises and is attracted to the rear edge of the substrate, and the substrate is attracted. The substrate feeding mechanism moves the substrate to the carry-in area M 1 of the stage 80 through the suction pad to be held. Then, after the substrate is carried into the carry-area M 1, the suction pad is separated from the substrate, then the substrate feed mechanism and the suction pad so that the return to the original position.

搬出側のソーターユニット(SORTER)45も、同様に、第1の平流し搬送路34(図1)の搬送方向(X方向)に敷設されたコロ搬送路と、このコロ搬送路上の基板に対して基板裏面の縁部にバキューム吸着可能/離脱可能な複数の吸着パッドと、それらの吸着パッドを搬送方向と平行に双方向で移動させる基板送り機構とを有している。レジスト塗布ユニット(COT)44のステージ80上でレジスト塗布処理の済んだ基板が搬出領域M3に着くと、吸着パッドが上昇して該基板の裏面縁部に吸着し、基板を吸着保持する吸着パッドを介して基板送り機構が基板を下流側隣の減圧ユニット(VD)46へ送るようになっている。そして、減圧ユニット(VD)46内の搬送部に基板を渡した後、吸着パッドが基板から分離し、次いで基板送り機構と吸着パッドが原位置へ戻るようになっている。 Similarly, the sorter unit (SORTER) 45 on the carry-out side is connected to the roller conveyance path laid in the conveyance direction (X direction) of the first flat flow conveyance path 34 (FIG. 1) and the substrate on the roller conveyance path. A plurality of suction pads that can be suctioned / removed in vacuum at the edge of the back surface of the substrate, and a substrate feed mechanism that moves these suction pads in both directions in parallel to the transport direction. When the resist-coated substrate on the stage 80 of the resist coating unit (COT) 44 arrives at the carry-out area M 3 , the suction pad rises and is sucked to the back surface edge of the substrate to suck and hold the substrate. A substrate feed mechanism feeds the substrate to the decompression unit (VD) 46 adjacent to the downstream side through the pad. And after delivering a board | substrate to the conveyance part in the decompression unit (VD) 46, a suction pad isolate | separates from a board | substrate, and a board | substrate feed mechanism and a suction pad return to an original position then.

図4に示すように、ステージ80は基板Gを気体圧力の力で空中に浮かせる浮上ステージとして構成されており、その上面には所定の気体(通常はエア)を噴出する多数の噴出口84が一面に形成されている。そして、ステージ80の左右両側に配置されている直進運動型の第1(左側)および第2(右側)の搬送部84L,84Rが、各々単独で、あるいは両者協働して、ステージ80上で浮いている基板Gを着脱可能に保持してステージ長手方向(X方向)に基板Gを搬送するようになっている。ステージ80上で基板Gは、その一対の辺が搬送方向(X方向)と平行で、他の一対の辺が搬送方向と直交するような水平姿勢をとって、浮上搬送される。   As shown in FIG. 4, the stage 80 is configured as a levitation stage that floats the substrate G in the air by the force of gas pressure, and has a number of jet outlets 84 for jetting a predetermined gas (usually air) on its upper surface. It is formed on one side. The first (left side) and second (right side) conveyance units 84L and 84R arranged on the left and right sides of the stage 80 are individually or in cooperation with each other on the stage 80. The floating substrate G is detachably held, and the substrate G is conveyed in the stage longitudinal direction (X direction). On the stage 80, the substrate G is floated and transported in a horizontal posture such that its pair of sides are parallel to the transport direction (X direction) and the other pair of sides are orthogonal to the transport direction.

ステージ80は、その長手方向(X方向)に沿って複数たとえば3つの領域M1,M2,M3に分割されている(図5)。一端の領域M1は搬入領域であり、図3につき上述したように塗布処理を受けるべき新規の基板Gはソーターユニット(SORTER)43から平流しでこの搬入領域M1に搬入される。 The stage 80 is divided into a plurality of, for example, three regions M 1 , M 2 , and M 3 along the longitudinal direction (X direction) (FIG. 5). Area M 1 at one end is carrying area, a new substrate G to be subjected to the coating process as described above per FIG 3 is carried from sorter unit (SORTER) 43 to the loading area M 1 in a flat flow.

搬入領域M1は基板Gの浮上搬送が開始される領域でもあり、この領域内のステージ上面には基板Gを搬入用の浮上高Haで浮かせるために高圧または正圧の圧縮空気を噴き出す噴出口84が一定の密度で多数設けられている。ここで、搬入領域M1における基板Gの浮上高Haは、特に高い精度を必要とせず、たとえば250〜350μmの範囲内に保たれればよい。また、搬送方向(X方向)において、搬入領域M1のサイズは基板Gのサイズを上回っているのが好ましい。さらに、搬入領域M1には、基板Gをステージ80上で位置合わせするためのアライメント部85(図10)も設けられてよい。 Loading area M 1 is also a region levitation transportation of the substrate G is started, blows compressed air pressure or positive pressure to float the substrate G on the stage upper surface of the region in flying height H a for carrying injection A number of outlets 84 are provided at a constant density. Here, the flying height H a of the substrate G in the carrying region M 1 does not require a particularly high accuracy, for example if kept in the range of 250~350Myuemu. Further, it is preferable that the size of the carry-in area M 1 exceeds the size of the substrate G in the transport direction (X direction). Further, the carrying-area M 1, the alignment unit 85 (FIG. 10) for aligning the substrate G on the stage 80 may be provided.

ステージ80の長手方向中心部に設定された領域M2はレジスト液供給領域または塗布領域であり、基板Gはこの塗布領域M2を通過する際に上方のレジストノズル82からレジスト液Rの供給を受ける。塗布領域M2における基板浮上高Hbはレジストノズル82の下端(吐出口)82aと基板上面(被処理面)との間の塗布ギャップS(たとえば200μm)を規定する。この塗布ギャップSはレジスト塗布膜の膜厚やレジスト消費量を左右する重要なパラメータであり、高い精度で一定に維持される必要がある。このことから、塗布領域M2のステージ上面には、所定の配列パターンで、基板Gを所望の浮上高Hbで安定に浮かせるために高圧または正圧の圧縮空気を噴き出す噴出口84と負圧で空気を吸い込む吸引口88とを混在させて設けている。そして、基板Gの塗布領域M2内に位置している部分に対して、噴出口84から圧縮空気による垂直上向きの力を加えると同時に、吸引口88より負圧吸引力による垂直下向きの力を加えて、相対抗する双方向の力のバランスを制御することで、塗布用の浮上高Hbを設定値(たとえば30〜50μm)付近に維持するようにしている。 A region M 2 set at the center in the longitudinal direction of the stage 80 is a resist solution supply region or a coating region, and the substrate G is supplied with the resist solution R from the upper resist nozzle 82 when passing through the coating region M 2. receive. The substrate flying height Hb in the coating region M 2 defines a coating gap S (for example, 200 μm) between the lower end (discharge port) 82a of the resist nozzle 82 and the substrate upper surface (surface to be processed). The coating gap S is an important parameter that affects the film thickness of the resist coating film and the resist consumption, and must be kept constant with high accuracy. From this, on the upper surface of the stage in the coating region M 2 , a jet 84 for ejecting high-pressure or positive-pressure compressed air and a negative pressure in order to stably float the substrate G at a desired flying height H b in a predetermined arrangement pattern. And a suction port 88 for sucking air. Then, a vertical upward force by compressed air is applied from the jet outlet 84 to the portion located in the coating region M 2 of the substrate G, and at the same time, a vertical downward force by a negative pressure suction force is applied from the suction port 88. In addition, the flying height Hb for coating is maintained in the vicinity of a set value (for example, 30 to 50 μm) by controlling the balance of the opposing forces that oppose each other.

搬送方向(X方向)における塗布領域M2のサイズは、レジストノズル82の直下に上記のような狭い塗布ギャップSを安定に形成できるほどの余裕があればよく、通常は基板Gのサイズよりも小さくてよく、たとえば1/3〜1/4程度でよい。なお、図示の例では、塗布領域M2の上面が他の領域M1,M3の上面面よりも浮上高の差(たとえば200〜300μm)に相当する分だけ一段高くなっており、基板Gは水平姿勢を保ったまま3領域M1,M2,M3を搬送方向に通過できるようになっている。 The size of the coating region M 2 in the transport direction (X direction) is sufficient if there is enough room to stably form the narrow coating gap S as described above immediately below the resist nozzle 82, and is usually larger than the size of the substrate G. It may be small, for example, about 1/3 to 1/4. In the illustrated example, the upper surface of the application region M 2 is one step higher than the upper surface of the other regions M 1 and M 3 by an amount corresponding to the difference in flying height (for example, 200 to 300 μm). Can pass through the three regions M 1 , M 2 , and M 3 in the transport direction while maintaining the horizontal posture.

塗布領域M2の下流側に位置するステージ80の他端の領域M3は搬出領域である。レジスト塗布ユニット(COT)44で塗布処理を受けた基板Gは、この搬出領域M3から平流しでソーターユニット(SORTER)45を経由して下流側の減圧乾燥ユニット(VD)46(図1)へ移送される。この搬出領域M3には、基板Gを搬出用の浮上高Hc(たとえば250〜350μm)で浮かせるための噴出口84がステージ上面に一定の密度で多数設けられている。 A region M 3 at the other end of the stage 80 located on the downstream side of the coating region M 2 is a carry-out region. The substrate G that has been subjected to the coating process by the resist coating unit (COT) 44 is flushed from the carry-out area M 3 and passes through the sorter unit (SORTER) 45 to the downstream side vacuum drying unit (VD) 46 (FIG. 1). It is transferred to. In the carry-out area M 3 , a large number of jet outlets 84 with a constant density are provided on the upper surface of the stage for floating the substrate G at a floating height H c for carry-out (for example, 250 to 350 μm).

レジストノズル82は、その長手方向(Y方向)でステージ80上の基板Gを一端から他端までカバーできるスリット状の吐出口82aを有し、門形または逆さコ字形のフレーム94(図3)に取り付けられ、たとえばボールネジ機構を有するノズル昇降部95(図10)の駆動で昇降移動可能であり、レジスト液供給部96(図10)からのレジスト液供給管98(図4)に接続されている。   The resist nozzle 82 has a slit-like discharge port 82a that can cover the substrate G on the stage 80 from one end to the other end in the longitudinal direction (Y direction), and a gate-shaped or inverted U-shaped frame 94 (FIG. 3). For example, it can be moved up and down by driving a nozzle elevating unit 95 (FIG. 10) having a ball screw mechanism, and is connected to a resist solution supply pipe 98 (FIG. 4) from a resist solution supply unit 96 (FIG. 10). Yes.

図3、図4、図6および図7に示すように、第1(左側)および第2(右側)の搬送部84L,84Rは、ステージ80の左右両側に平行に配置された第1および第2のガイドレール100L,100Rと、これらのガイドレール100L,100R上で搬送方向(X方向)に移動可能に取り付けられた第1および第2のスライダ102L,102Rと、両ガイドレール100L,100R上で両スライダ102L,102Lを同時または個別に直進移動させる第1および第2の搬送駆動部104L,104Rと、基板Gを着脱可能に保持するために両スライダ102L,102に搭載されている第1および第2の保持部106L,106Rとをそれぞれ有している。各搬送駆動部104L,104Rは、直進型の駆動機構たとえばリニアモータによって構成されている。   As shown in FIGS. 3, 4, 6, and 7, the first (left side) and second (right side) transport units 84 </ b> L and 84 </ b> R are arranged in parallel on the left and right sides of the stage 80. Two guide rails 100L and 100R, first and second sliders 102L and 102R mounted on these guide rails 100L and 100R so as to be movable in the transport direction (X direction), and both guide rails 100L and 100R The first and second transport drive units 104L and 104R that move the sliders 102L and 102L straightly or individually, and the first slider mounted on the sliders 102L and 102 to detachably hold the substrate G. And second holding portions 106L and 106R, respectively. Each of the conveyance driving units 104L and 104R is configured by a linear drive mechanism such as a linear motor.

図3、図4、図7〜図9に示すように、第1(左側)の保持部106Lは、基板Gの左側二隅の裏面(下面)にそれぞれ真空吸着力で結合する2個の吸着パッド108Lと、各吸着パッド108Lを搬送方向(X方向)に一定の間隔を置いた2箇所で鉛直方向の変位を規制して支持する一対のパッド支持部110Lと、これら一対のパッド支持部110Lをそれぞれ独立に昇降移動または昇降変位させる一対のパッドアクチエータ112Lとを有している。   As shown in FIGS. 3, 4, and 7 to 9, the first (left side) holding portion 106 </ b> L has two adsorptions that are coupled to the back surfaces (lower surfaces) of the left two corners of the substrate G by a vacuum adsorption force. The pad 108L, a pair of pad support portions 110L for supporting the suction pads 108L by restricting the displacement in the vertical direction at two places spaced apart in the transport direction (X direction), and the pair of pad support portions 110L And a pair of pad actuators 112L that can be moved up and down independently or displaced up and down independently.

第2(右側)の保持部106Rは、基板Gの右側二隅の裏面(下面)にそれぞれ真空吸着力で結合する2個の吸着パッド108Rと、各吸着パッド108Rを搬送方向(X方向)に一定の間隔を置いた2箇所で鉛直方向の変位を規制して支持する一対のパッド支持部110Rと、これら一対のパッド支持部110Rをそれぞれ独立に昇降移動または昇降変位させる一対のパッドアクチエータ112Rとを有している。   The second (right side) holding portion 106R includes two suction pads 108R that are respectively coupled to the back surfaces (lower surfaces) of the right two corners of the substrate G by a vacuum suction force, and each suction pad 108R in the transport direction (X direction). A pair of pad support portions 110R that support the displacement in the vertical direction at two positions spaced apart from each other, and a pair of pad actuators 112R that move the pair of pad support portions 110R up and down independently or move up and down independently. And have.

左右両側の各吸着パッド108L,108Rは、図8および図9に示すように、たとえばステンレス鋼(SUS)からなる直方体形状のパッド本体の上面に複数個の吸引口114を設けている。左側吸着パッド108Lの各吸引口114はパッド本体内のバキューム通路を介して外部左側のバキューム管116Lに接続され、右側吸着パッド108Rの各吸引口114はパッド本体内のバキューム通路を介して外部右側のバキューム管116Rに接続されている(図7)。両側のバキューム管116L,116Rは、第1および第2のパッド吸着制御部118(図10)の真空源(図示せず)にそれぞれ通じている。   As shown in FIGS. 8 and 9, the suction pads 108 </ b> L and 108 </ b> R on both the left and right sides are provided with a plurality of suction ports 114 on the upper surface of a rectangular parallelepiped pad body made of, for example, stainless steel (SUS). Each suction port 114 of the left suction pad 108L is connected to the external left vacuum tube 116L via a vacuum passage in the pad body, and each suction port 114 of the right suction pad 108R is connected to the external right side via a vacuum passage in the pad body. Is connected to the vacuum pipe 116R (FIG. 7). The vacuum tubes 116L and 116R on both sides communicate with vacuum sources (not shown) of the first and second pad suction control units 118 (FIG. 10), respectively.

各パッド支持部110L(R)は、たとえばステンレス鋼(SUS)からなるL字形の剛体棒であり、その下端部(基端部)が鉛直方向に延びてパッドアクチエータ112L(R)にそれぞれ結合され、その上端部が水平方向に延びて当該吸着パッド108L(R)にそれぞれ結合されている。   Each pad support portion 110L (R) is an L-shaped rigid rod made of, for example, stainless steel (SUS), and its lower end portion (base end portion) extends in the vertical direction and is coupled to the pad actuator 112L (R). The upper end portion of the suction pad 108 </ b> L extends in the horizontal direction and is coupled to the suction pad 108 </ b> L (R).

ここで、各吸着パッド108L(R)とこれを支持する前後一対の両パッド支持部110L(R)との結合関係は、両パッド支持部110L(R)間の昇降誤差を吸着パッド108L(R)側で吸収できる構成が好ましい。このためには、両パッド支持部110L(R)の双方が吸着パッド108L(R)をその回りに鉛直面内で回転変位可能とする水平回転軸を有し、両パッド支持部110L(R)の片方が吸着パッド108L(R)を水平方向で直動変位可能とする直動軸を有する構成が好ましい。この実施形態では、たとえば図9に示すように、吸着パッド108L(R)の前部にジョイント部118L(R)を介して前部軸受120L(R)を取り付けるとともに、吸着パッド108L(R)の後部にX方向の直動ガイド122L(R)を介して後部軸受124L(R)を取り付け、前部軸受120L(R)および後部軸受124L(R)に前後両パッド支持部110L(R)の水平方向に延びる上端部をそれぞれ結合させている。   Here, the connection relationship between each suction pad 108L (R) and the pair of front and rear pad support portions 110L (R) that support the suction pad 108L (R) indicates that the lifting error between the two pad support portions 110L (R) is the suction pad 108L (R). The structure which can be absorbed on the () side is preferable. For this purpose, both of the pad support portions 110L (R) have a horizontal rotation shaft that enables the suction pad 108L (R) to be rotationally displaced in the vertical plane around the pad support portions 110L (R). It is preferable that one of the two has a linear motion shaft that allows the suction pad 108L (R) to be linearly displaced in the horizontal direction. In this embodiment, for example, as shown in FIG. 9, the front bearing 120L (R) is attached to the front portion of the suction pad 108L (R) via the joint portion 118L (R), and the suction pad 108L (R) A rear bearing 124L (R) is attached to the rear portion via a linear motion guide 122L (R) in the X direction, and the front and rear pad support portions 110L (R) are horizontally mounted on the front bearing 120L (R) and the rear bearing 124L (R). The upper end portions extending in the direction are coupled to each other.

各パッドアクチエータ112L(R)は、たとえばサーボモータ126L(R)と、このサーボモータ126L(R)の回転駆動力を前部パッド支持部110L(R)の鉛直方向の直進運動に変換するたとえば直動ガイド一体型のボールねじ機構からなる伝動機構128L(R)とを有している。各サーボモータ126L(R)にはそれぞれの回転角を検出するためのロータリエンコーダ(図示せず)が取り付けられている。それらのロータリエンコーダの出力信号をフィードバック信号として両サーボモータ126L(R)の回転量をそれぞれ制御することにより、前部および後部パッド支持部110L(R)の昇降移動距離を略正確に一致させることができる。   Each pad actuator 112L (R) converts, for example, a servo motor 126L (R) and the rotational driving force of the servo motor 126L (R) into a linear motion in the vertical direction of the front pad support 110L (R). And a transmission mechanism 128L (R) including a ball screw mechanism integrated with a linear motion guide. Each servomotor 126L (R) is attached with a rotary encoder (not shown) for detecting the respective rotation angle. By controlling the amount of rotation of both servo motors 126L (R) using the output signals of these rotary encoders as feedback signals, the vertical movement distances of the front and rear pad support portions 110L (R) can be made to match substantially accurately. Can do.

さらに、この実施形態では、各パッド支持部110L(R)に対する上記のような昇降移動制御の精度を一層高めるために、図7および図8に示すように、各パッド支持部110L(R)の昇降位置または昇降移動距離をそれぞれ実測してフィードバックするリニアスケール130L(R)を設けている。各リニアスケール130L(R)は、スライダ102L(R)に取り付けられたZ方向に延びる目盛部132L(R)と、この目盛部132L(R)の目盛を光学的に読み取るために各パッド支持部110L(R)に取り付けられた目盛読取部134L(R)とを有している。   Furthermore, in this embodiment, in order to further increase the accuracy of the above-described up-and-down movement control with respect to each pad support portion 110L (R), as shown in FIGS. 7 and 8, each pad support portion 110L (R) A linear scale 130L (R) is provided for feedback by actually measuring the lift position or lift movement distance. Each linear scale 130L (R) includes a scale portion 132L (R) attached to the slider 102L (R) and extending in the Z direction, and each pad support portion for optically reading the scale of the scale portion 132L (R). And a scale reading unit 134L (R) attached to 110L (R).

この実施形態の保持部106L(R)は、上述したように、各吸着パッド108L(R)を実質的にたわまないリジッドな前後一対のパッド支持部110L(R)を介して前後一対のパッドアクチエータ112L(R)により2軸で昇降駆動するので、各吸着パッド108L(R)を一定の姿勢(水平姿勢または傾斜姿勢)を保って安定に昇降移動させることができる。   As described above, the holding portion 106L (R) of this embodiment has a pair of front and rear via a pair of rigid front and rear pad support portions 110L (R) that do not substantially deflect each suction pad 108L (R). Since the pad actuator 112L (R) is driven up and down by two axes, each suction pad 108L (R) can be moved up and down stably while maintaining a fixed posture (horizontal posture or inclined posture).

なお、搬送部84L,84Rにおいて、可動のスライダ102L,102Rに搭載されている各部と定置の制御部や用力供給源とを結ぶ電気配線や配管等は全て可撓性のケーブルベア(図示せず)に収められている。   It should be noted that in the transport sections 84L and 84R, all of the electrical wiring, piping, etc. that connect each section mounted on the movable sliders 102L and 102R to the stationary control section and utility power source are flexible cable bearers (not shown). ).

また、詳細な図解を省略するが、ステージ80の上面に形成された多数の噴出口84およびそれらに浮上力発生用の圧縮空気を供給する圧縮空気供給機構(図示せず)、さらにはステージ80の塗布領域M2内に噴出口84と混在して形成された多数の吸引口88およびそれらに真空の圧力を供給するバキューム機構(図示せず)により、搬入領域M1や搬出領域M3では基板Gを搬入出や高速搬送に適した浮上高Ha,Hcで浮かせ、塗布領域M2では基板Gを安定かつ正確なレジスト塗布走査に適した設定浮上量Hbで浮かせるためのステージ基板浮上部136(図10)が構成されている。 Although not illustrated in detail, a large number of jets 84 formed on the upper surface of the stage 80, a compressed air supply mechanism (not shown) for supplying compressed air for generating levitation force to them, and further the stage 80 In the loading area M 1 and the unloading area M 3 , there are a large number of suction ports 88 formed in the coating area M 2 and mixed with the jet outlets 84 and a vacuum mechanism (not shown) for supplying vacuum pressure to them. A stage substrate for floating the substrate G with flying heights H a and H c suitable for loading / unloading and high-speed conveyance, and for floating the substrate G with a set flying height H b suitable for stable and accurate resist coating scanning in the coating region M 2. A floating portion 136 (FIG. 10) is formed.

図10に、この実施形態のレジスト塗布ユニット(COT)44における制御系の構成を示す。コントローラ138は、マイクロコンピュータからなり、ユニット内の各部、特にステージ基板浮上部136、レジスト液供給部96、ノズル昇降部95、第1(左側)の搬送部84L(第1搬送駆動部104L,第1パッド吸着制御部118L,第1パッドアクチエータ112L)、第2(右側)の搬送部84R(第2搬送駆動部104R,第2パッド吸着制御部118R,第2パッドアクチエータ112R)等の個々の動作と全体の動作(シーケンス)を制御する。   FIG. 10 shows the configuration of the control system in the resist coating unit (COT) 44 of this embodiment. The controller 138 is composed of a microcomputer, and each part in the unit, in particular, the stage substrate floating portion 136, the resist solution supply unit 96, the nozzle lifting / lowering unit 95, the first (left side) transport unit 84L (the first transport drive unit 104L, the first transport unit). 1 pad suction control unit 118L, first pad actuator 112L), second (right side) transport unit 84R (second transport drive unit 104R, second pad suction control unit 118R, second pad actuator 112R), etc. And the overall operation (sequence) are controlled.

次に、図11、図12A〜図12Iにつき、この実施形態のレジスト塗布ユニット(COT)44における塗布処理動作を説明する。図11は、塗布処理動作の1サイクルにおけるユニット(COT)44内の各部の位置または状態をタイミングチャートで示す。図12A〜図12Iは、1サイクルの各時点における主な可動部の位置または状態を略平面図で示す。   Next, the coating processing operation in the resist coating unit (COT) 44 of this embodiment will be described with reference to FIGS. 11 and 12A to 12I. FIG. 11 is a timing chart showing the position or state of each part in the unit (COT) 44 in one cycle of the coating treatment operation. 12A to 12I are schematic plan views showing positions or states of main movable parts at each time point in one cycle.

コントローラ138は、たとえば光ディスク等の記憶媒体に格納されているレジスト塗布処理プログラムを主メモリに取り込んで実行し、プログラムされた一連の塗布処理動作を制御する。   The controller 138 fetches and executes a resist coating processing program stored in a storage medium such as an optical disk in the main memory, and controls a series of programmed coating processing operations.

図12Aは、図11の時点t0に対応し、ソーターユニット(SORTER)43(図1)より未処理の新たな基板Giがステージ80の搬入領域M1に搬入された直後の状態を示す。この時、第1(左側)の搬送部84Lは、スライダ102Lを搬入領域M1内の搬入位置に対応する搬送始点位置Paに戻したばかりである。パッド吸着制御部118Lは、この時点で吸着パッド108Lにバキュームの供給を開始する。もっとも、パッドアクチエータ112Lは吸着パッド108Lを原位置(退避位置)に下げている。一方、第2(右側)の搬送部84Rは、ステージ76上で塗布処理を終えた1つ前の基板Gi-1を搬出領域M3に届けたばかりである。スライダ102Rは搬出領域M3内の搬出位置に対応する搬送終点位置Pbに着いており、パッド吸着制御部118Rは吸着パッド108Rから真空吸着力を解除している。 Figure 12A corresponds to the time point t 0 of FIG. 11 shows a state immediately after the sorter units (SORTER) 43 new substrate G i (FIG. 1) than the untreated is carried into the carry-area M 1 stage 80 . At this time, the conveyance portion 84L of the first (left) has just returned to the conveyance start position P a corresponding slider 102L to the carrying position in the loading area M 1. The pad suction control unit 118L starts supplying vacuum to the suction pad 108L at this time. However, the pad actuator 112L lowers the suction pad 108L to the original position (retracted position). On the other hand, the second (right side) transport unit 84R has just delivered the previous substrate G i-1 that has undergone the coating process on the stage 76 to the carry - out region M 3 . The slider 102R is arrived at the transport end position P b corresponding to the unloading position in the unloading area M 3, the pad suction control unit 118R is released a vacuum suction force from the suction pads 108R.

次いで、搬入領域M1でアライメント部85が作動し、浮上状態の基板Giに四方から押圧部材(図示せず)を矢印Jで示すように押し付けて、基板Giをステージ80上で位置合わせする(図12B、図11の時点t1)。第2の搬送部84Rは、基板Gi-1をソーターユニット(SORTER)45に引き渡した後、スライダ102Rを搬送終点位置Pbから塗布開始位置に対応する搬送停止位置Pcへ高速度V1で引き返させる。ソーターユニット(SORTER)45は、受け取った基板Gi-1をステージ80の搬出領域M3から平流しで引き取るようにして搬出する(図12B、図11の時点t1)。なお、塗布開始位置は、搬入領域M1内の搬入位置とレジストノズル82直下位置つまりレジスト液供給位置Psとの間に設定されている。 Next, the alignment unit 85 operates in the carry-in area M 1 , and presses a pressing member (not shown) from four directions to the floating substrate G i as indicated by the arrow J to align the substrate G i on the stage 80. (FIG. 12B, time point t 1 in FIG. 11). The second conveying unit 84R, the substrate G after the i-1 was delivered to the sorter unit (SORTER) 45, high speed V 1 of the slider 102R from the conveying end position P b to the conveyance stop position P c corresponding to an application start position Let me return. The sorter unit (SORTER) 45 unloads the received substrate G i-1 from the unload area M 3 of the stage 80 in a flat flow (time t 1 in FIGS. 12B and 11). The application start position is set between the carry-in position in the carry-in area M 1 and the position immediately below the resist nozzle 82, that is, the resist solution supply position P s .

搬入領域M1で基板Giのアライメントが完了すると、その直後に第1の搬送部84Lにおいてパッドアクチエータ112Lが作動し、吸着パッド108Lを原位置(退避位置)から往動位置(結合位置)へ上昇(UP)させる。吸着パッド108Lは、その前からバキュームがオンしており、浮上状態の基板Giの左右片側(左側)の二隅に接触するや否や真空吸着力で結合する(図12C、図11の時点t2)。第2の搬送部84Rは、搬送停止位置Pcでスライダ102Rを待機させながら、吸着パッド108Rにバキュームの供給を開始する(図12C、図11の時点t2)。 The alignment of the substrate G i is completed in carrying area M 1, the pad activator eta 112L in the first conveying portion 84L is operated immediately after, the forward position the suction pad 108L from the original position (retracted position) (binding position) Ascend (UP). Suction pad 108L is turned on the vacuum from the previous binds with and whether or vacuum suction force in contact with the two corners of the left and right side (left side) of the substrate G i of floating state (FIG. 12C, the time of FIG. 11 t 2 ). The second conveying unit 84R is while waiting for slider 102R in the conveyance stop position P c, to start the supply of vacuum to the suction pads 108R (FIG. 12C, the time of FIG. 11 t 2).

次に、第1の搬送部84Lは、保持部106Lで基板Giの左側二隅を保持したままスライダ102Lを搬送始点位置Paから基板搬送方向(X方向)へ比較的高速の一定速度V2で直進移動させ、ステージ80上の塗布開始位置に対応する上流側の搬送停止位置Pcに着くと、そこで一時停止させる(図12D、図11の時点t3)。塗布開始位置では、基板Gi上のレジスト塗布領域の前端(塗布開始ライン)がレジストノズル82の直下に位置する。なお、搬送始点位置Paから上流側搬送停止位置Pcまでの基板搬送において、基板Giの右側縁部(特に右側二隅)は自由端になっているが、ステージ基板浮上部136による浮上力で高さ位置を拘束され、第1の搬送部84Lの保持部106Lに結合している基板Giの左側二隅とほぼ同じ高さで移動する。もっとも、基板Giの右側縁部が基板Giの左側縁部と高さが若干違っても、塗布処理前の浮上搬送なので、特に支障はない。 Next, the first transport portion 84L is relatively fast constant speed V slider 102L while maintaining the left two corners of the substrate G i at the holder 106L from the conveyance start position P a to the substrate transporting direction (X direction) It moved straight in 2, Once in feeding-stop position P c on the upstream side corresponding to the coating start position on the stage 80, where it is paused (Figure 12D, the time t 3 in Figure 11). The coating start position, the front end of the resist coating area on the substrate G i (coating start line) is located directly below the resist nozzle 82. Incidentally, in the substrate transfer from the transport start position P a to the upstream side conveyance stop position P c, the right edge of the substrate G i (in particular the right two corners) but has a free end, flying by the stage substrate floating unit 136 It is constrained to a height position by the force, to move at approximately the same height as the left two corners of the substrate G i attached to the holding portion 106L of the first conveying portion 84L. However, the right edge is the left edge and the height of the substrate G i of the substrate G i is also slightly different, so levitation transportation before the coating treatment, no particular trouble.

上記のようにして第1の搬送部84Lのスライダ102Lが上流側搬送停止位置Pcに着くと、そこで待機していた第2の搬送部84Rではパッドアクチエータ112Rが作動し、吸着パッド108Rを原位置(退避位置)から往動位置(結合位置)へ上昇(UP)させる。吸着パッド108Rは、バキュームがオンしているので、基板Giの左右他方(右側)の二隅に接触するや否や真空吸着力で結合する。こうして、ステージ80上の塗布開始位置に対応する搬送停止位置Pcで、第1および第2の搬送部84L,84Rが浮上状態の基板Giを挟んで互いに向き合い、基板Giの左右二隅(全部で四隅)をそれぞれ保持した状態となる(図12E、図11の時点t4)。一方、図示省略するが、ノズル昇降部95が作動してレジストノズル82を降ろし、レジストノズル82の吐出口82aと基板Gi間のギャップSを設定値(たとえば200μm)に合わせる。 When the slider 102L of the first conveying portion 84L as described above arrives at the upstream transport stop position P c, where the second conveyor part 84R in the pad activator mediator 112R on standby is activated, the suction pads 108R It is raised (UP) from the original position (retracted position) to the forward movement position (coupled position). Suction pads 108R, since the vacuum is turned on to bind in two corners in contact or not and the vacuum suction force of the other of the left and right (right side) of the substrate G i. Thus, the transport stop position P c corresponding to the coating start position on the stage 80, first and second conveying portions 84L, 84R are facing each other across the substrate G i of floating state, two left and right corners of the substrate G i (A total of four corners) are held (time t 4 in FIG. 12E and FIG. 11). Meanwhile, although not shown, down to the resist nozzle 82 nozzle vertical movement unit 95 is actuated, adjust the gap S between the outlets 82a and the substrate G i of the resist nozzle 82 to the set value (e.g., 200 [mu] m).

次に、第1および第2の搬送部84L,84Rは、同時にスライダ102L,102Rを搬送停止位置Pcから基板搬送方向(X方向)に比較的低速の一定速度V3で直進移動させる(図11の時点t5)。一方、レジスト液供給部95においてレジストノズル82よりレジスト液Rの吐出を開始する。こうして、レジストノズル82直下のレジスト液供給位置PsをX方向に一定速度V2で通過する基板Giの上面に向けて、Y方向に延びる長尺型レジストノズル82より帯状のレジスト液Rが一定の流量で吐出されることで、基板Giの前端から後端に向かってレジスト液の塗布膜RMが形成されていく(図12F、図11の時点t6)。 Next, the first and second conveying portions 84L, 84R causes the relatively straight movement at a slower constant speed V 3 slider 102L, 102R from the conveyance stop position P c in the substrate conveyance direction (X direction) at the same time (Fig. 11 time t 5 ). On the other hand, the resist solution supply unit 95 starts to discharge the resist solution R from the resist nozzle 82. Thus, towards the resist solution supply position P s immediately below the resist nozzle 82 on the upper surface of the substrate G i to pass at a constant speed V 2 in the X direction, the strip of the resist solution R from long resist nozzle 82 extending in the Y-direction by ejected at a constant flow rate, toward the rear end from the front end of the substrate G i will be coating film RM of the resist solution is formed (time t 6 in FIG. 12F, FIG. 11).

基板Giの後端部(塗布終了ライン)がレジストノズル82直下のレジスト液供給位置Psに着くと、このタイミングで塗布処理が終了し、レジスト液供給部96がレジストノズル82からのレジスト液Rの吐出を終了させると同時に、第1および第2の搬送部84L,84Rがそれぞれのスライダ102L,102Rを搬送終点位置Pbの手前の位置(下流側搬送停止位置)Pdで同時に停止させる(図12G、図11の時点t7)。 When the rear end portion of the substrate G i (coating end line) arrives at the resist solution supply position P s immediately below the resist nozzle 82, the timing in the coating process is completed, the resist solution in the resist solution supply unit 96 from the resist nozzle 82 at the same time to end the discharge of the R, stops simultaneously in the first and second conveying portions 84L, 84R are each slider 102L, the position of the front of the 102R to transport end position P b (downstream transport stop position) P d (FIG. 12G, time point t 7 in FIG. 11).

第1の搬送部84Lにおいては、スライダ102Lが搬送停止位置Pdに着くや否や、パッド吸着制御部118Lが吸着パッド108Lに対するバキュームの供給を止め、これと同時にパッドアクチエータ112Lが吸着パッド108Lを往動位置(結合位置)から原位置(退避位置)へ下ろし、基板Giの左側端部から吸着パッド108Lを分離させる(図12H、図11の時点t8)。この時、パッド吸着制御部118Lは吸着パッド108Lに正圧(圧縮空気)を供給し、基板Giからの分離を速める。次いで、スライダ102Lを基板搬送方向と反対の方向に高速度V5で移動させ、搬送始点位置Paまで引き返させる(図12H、図11の時点t9)。 In the first transport portion 84L, the slider 102L arrives at the feeding-stop position P d as soon as the stopping the supply of vacuum pad adsorption control unit 118L is with respect to the suction pads 108L, and at the same time pad activator eta 112L is a suction pad 108L forward down position from the (binding position) to the original position (retracted position), to separate the suction pad 108L from the left edge of the substrate G i (FIG. 12H, the time t 8 in FIG. 11). At this time, the pad suction control unit 118L supplies a positive pressure (compressed air) to the suction pad 108L, accelerate separation from the substrate G i. Then, the slider 102L is moved at a high velocity V 5 in the direction opposite to the direction of substrate conveyance, thereby turning back to the conveyance start position P a (time t 9 in FIG. 12H, FIG. 11).

一方、第2の搬送部84Rにおいては、保持部106Rで基板Giの右側二隅を保持したままスライダ102Rを下流側基板停止位置Pdから搬送終点位置Pbまで比較的高速の一定速度V4で基板搬送方向(X方向)に移動させる(図12H、図11の時点t9)。この際、基板Giの左側縁部(特に左側二隅)は自由端になっているが、やはりステージ基板浮上部136による浮上力で高さ位置を拘束され、基板Giの右側二隅とほぼ同じ高さで移動する。もっとも、基板Giの左側縁部が基板Giの右側縁部と高さが若干違っても、塗布処理後の浮上搬送なので、特に支障はない。 On the other hand, in the second conveying unit 84R, a constant velocity V relatively fast slider 102R while maintaining the right two corners from the downstream side substrate stop position P d to the transfer end position P b of the substrate G i at the holding portion 106R 4 , the substrate is moved in the substrate transport direction (X direction) (FIG. 12H, time point t 9 in FIG. 11). At this time, the left edge of the substrate G i (especially, the two left corners) is a free end, but the height position is still constrained by the flying force of the stage substrate floating portion 136, and the right two corners of the substrate G i Move at almost the same height. However, the left edge is the right edge and the height of the substrate G i of the substrate G i is also slightly different, so levitation transportation after the coating treatment, no particular trouble.

そして、スライダ102Rが搬送終点位置Pbに着くや否や、パッド吸着制御部118Rが吸着パッド108Rに対するバキュームの供給を止め、これと同時にパッドアクチエータ112Rが吸着パッド108Rを往動位置(結合位置)から原位置(退避位置)へ下ろし、基板Giの右側二隅から吸着パッド108Rを分離させる。この時、パッド吸着制御部118Bは吸着パッド108Rに正圧(圧縮空気)を供給し、基板Giからの分離を速める(図12H、図12I、図11の時点t10)。 Then, as soon as the slider 102R arrives at the conveying end position P b, stopping the supply of vacuum pad adsorption control unit 118R is with respect to the suction pads 108R, and at the same time the forward movement position of the pad activator eta 112R suction pads 108R (bonding position) down from the original position (retracted position), to separate the suction pad 108R from the right side two corners of the substrate G i. At this time, the pad suction control unit 118B supplies a positive pressure (compressed air) to the suction pad 108R, accelerate separation from the substrate G i (FIG. 12H, FIG. 12I, the time t 10 in FIG. 11).

なお、ステージ80上で基板Gの端部または縁部がステージの外へはみ出ていてもよい。特に、搬入領域M1では、搬入側ソーターユニット(SORTER)43が吸着パッドを基板Gの後端部の裏面に吸着させたままの状態で、つまり基板Gの後端部がステージの外へはみ出ている状態で、基板Gがステージ80上に搬入されてよい。また、搬出領域M3では、基板Gの前端部がステージの外へはみ出した状態で、つまり搬出側ソーターユニット(SORTER)45が吸着パッドを基板Gの前端部の裏面に吸着させやすい状態で基板Gがステージ80からソーターユニット(SORTER)45へ引き渡されてよい。 Note that the end or edge of the substrate G may protrude beyond the stage on the stage 80. In particular, in the carry-in area M 1 , the carry-in sorter unit (SORTER) 43 keeps the suction pad adsorbed to the back surface of the rear end portion of the substrate G, that is, the rear end portion of the substrate G protrudes outside the stage. In this state, the substrate G may be carried onto the stage 80. Further, in the carry-out area M 3 , the substrate G is in a state where the front end of the substrate G protrudes outside the stage, that is, in a state in which the carry-out sorter unit (SORTER) 45 easily adsorbs the suction pad to the back surface of the front end of the substrate G. G may be delivered from the stage 80 to the sorter unit (SORTER) 45.

上記のように、この実施形態においては、ステージ80上に搬入領域M1、塗布領域M2、搬出領域M3を別々に設け、それらの各領域に基板を順次転送して基板搬入動作、レジスト液供給動作、基板搬出動作を各領域で独立または並列的に行うようにしている。このようなパイプライン方式により、1枚の基板Gについてステージ80上に搬入する動作に要する時間(TIN)と、ステージ80上で搬入領域M1から搬出領域M3まで搬送するのに要する時間(TC)と、搬出領域M3から搬出するのに要する時間(TOUT)とを足し合わせた塗布処理1サイクルの所要時間(TC+TIN+TOUT)よりも、タクトタイムを大幅に短縮することができる。 As described above, in this embodiment, the carry-in area M 1 , the coating area M 2 , and the carry-out area M 3 are separately provided on the stage 80, and the substrate is sequentially transferred to each of these areas to carry out the substrate carry-in operation, resist The liquid supply operation and the substrate carry-out operation are performed independently or in parallel in each region. By such a pipeline system, a time (T IN ) required for the operation of loading a single substrate G onto the stage 80 and a time required for transferring from the loading area M 1 to the unloading area M 3 on the stage 80. The tact time is significantly shorter than the time required for one cycle of coating treatment (T C + T IN + T OUT ), which is the sum of (T C ) and the time required for unloading from the unloading area M 3 (T OUT ). can do.

そして、ステージ80上で基板Giを搬送するために、ステージ80の左右両側に配置された第1および第2の搬送部84L,84Rがそれぞれ基板の左側二隅および右側二隅のどちらかを保持しながら基板搬送方向に移動する。ここで、第1の搬送部84Lは、搬入領域M1内の搬入位置から長尺型レジストノズル82直下の塗布位置を通って塗布位置と搬出領域M3内の搬出位置との間に設定された塗布終了位置までステージ80上で浮いている基板を保持して搬送する。一方、第2の搬送部84Rは、搬入位置と塗布位置との間に設定された塗布開始位置から塗布位置を通って搬出位置までステージ80上で浮いている基板を保持して搬送する。 Then, in order to transfer the substrate G i on the stage 80, first and second conveying portions 84L disposed on the left and right sides of the stage 80, either 84R is the left two corners and right two corners of the substrate, respectively It moves in the substrate transport direction while holding. Here, the first conveying unit 84L is set between the loading position in the loading area M 1 and the coating position through a coating position directly below the long resist nozzle 82 and unloading position in the unloading area M 3 The substrate floating on the stage 80 is held and transported to the coating end position. On the other hand, the second transport unit 84R holds and transports the substrate floating on the stage 80 from the coating start position set between the carry-in position and the coating position through the coating position to the carry-out position.

第1および第2の搬送部84L,84Rが一緒に基板を保持して搬送する区間は、搬入位置から搬出位置までの全搬送区間ではなく、塗布開始位置から塗布終了位置までの中間区間である。第1の搬送部84Lは、塗布終了位置まで基板Giを搬送すると、そこで当該基板Giに対する搬送の役目を終え、直ちに搬入位置へ引き返して後続の新たな基板Gi+1の搬送にとり掛かる。一方、第2の搬送部84Rは、塗布終了位置から搬出位置まで基板Giを単独で搬送し、次いで搬入位置より手前の塗布開始位置まで引き返し、その位置まで第1の搬送部84Lが次の基板Gi+1を単独で搬送してくるのを待てばよい。 The section in which the first and second transport portions 84L and 84R hold and transport the substrate together is not the entire transport section from the carry-in position to the carry-out position, but an intermediate section from the coating start position to the coating end position. . When the first transport unit 84L transports the substrate G i to the coating end position, the first transport unit 84L finishes the role of transport to the substrate G i and immediately returns to the transport position to start transporting the subsequent new substrate G i + 1. . On the other hand, the second conveying unit 84R carries alone substrate G i to carry-out position from the coating end position, then turned back from the load position to the application start position of the front, the first conveying unit 84L is next to that position It is only necessary to wait for the substrate G i + 1 to be carried alone.

また、この実施形態は、第1および第2の搬送部84L,84Rにおいて、ステージ80上で浮いた状態の基板Gの左側二隅または右側二隅をそれぞれ2つの吸着パッド108L(R)で局所的に保持するとともに、各吸着パッド108L(R)を実質的にたわまないリジッドなパッド支持部110L(R)で支持し、かつパッドアクチエータ112L(R)の昇降駆動力により所望の高さ位置へ昇降移動または昇降変位させる構成を採っている。しかも、各一対のパッド支持部110L(R)および各一対のパッドアクチエータ112L(R)により2軸で昇降駆動し、かつサーボで制御するので、各吸着パッド108L(R)を搬送方向(X方向)の水平線に対して一定の姿勢または角度を保って安定に昇降移動または昇降変位させることができる。   Further, in this embodiment, in the first and second transport units 84L and 84R, the left two corners or the right two corners of the substrate G in a state of floating on the stage 80 are locally provided by two suction pads 108L (R). Each suction pad 108L (R) is supported by a rigid pad support portion 110L (R) that does not flex substantially, and a desired height is achieved by the lifting / lowering driving force of the pad actuator 112L (R). It is configured to be moved up and down or displaced up and down. In addition, each suction pad 108L (R) is moved in the transport direction (X) by being driven up and down by two axes by each pair of pad support portions 110L (R) and each pair of pad actuators 112L (R) and controlled by servo. It is possible to stably move up and down or move up and down while maintaining a certain posture or angle with respect to the horizontal line of (direction).

このような搬送部84L,84Rの構成によれば、ステージ80上で基板Gを浮上搬送している最中に、基板Gの前端がステージ上面の各列または各個別の噴出口84または吸引口88をほぼ完全に覆う瞬間に、あるいは基板Gの後端が各列または各個別の噴出口84または吸引口88を大気に開放する瞬間にステージ80側から受ける浮上圧力が急激に変動しても、保持部106L,106Rのリジッドな保持力または拘束力によって基板Gの前端部または後端部のばたつきを抑制することができる。   According to such a configuration of the transfer units 84L and 84R, while the substrate G is levitated and transferred on the stage 80, the front end of the substrate G is in each row on the upper surface of the stage or each individual jet port 84 or suction port. Even if the flying pressure received from the stage 80 side changes abruptly at the moment of almost completely covering 88, or at the moment when the rear end of the substrate G opens each row or each individual jet port 84 or suction port 88 to the atmosphere. The flapping of the front end portion or the rear end portion of the substrate G can be suppressed by the rigid holding force or restraining force of the holding portions 106L and 106R.

また、ステージ80の浮上特性や基板Gのサイズ、厚み等によって、ステージ80上で浮上搬送される基板G(特にその前端部あるいは後端部)が搬送方向と直交する方向(Y方向)で図13に示すように山形に湾曲することもある。このように山形に湾曲した姿勢で基板Gがレジストノズル82の直下を通過すると、基板G上に形成されるレジスト塗布膜の膜厚が湾曲形状に従ったプロファイルで変動することになる。   Further, depending on the floating characteristics of the stage 80, the size and thickness of the substrate G, etc., the substrate G that is levitated and conveyed on the stage 80 (particularly its front end or rear end) is shown in a direction (Y direction) perpendicular to the conveying direction. As shown in FIG. When the substrate G passes through the position immediately below the resist nozzle 82 in such an angle-curved posture, the film thickness of the resist coating film formed on the substrate G varies in a profile according to the curved shape.

かかる問題に対しては、各保持部106L,106Rにおいて各吸着パッド108L,108Rを図14および図15に示すように搬送方向(X方向)の水平線に対して幾らか傾斜させることが有効な解決法となる。すなわち、前部の吸着パッド108L,108Rには搬送方向(X方向)の前方を向いて所定角度の上向きの傾斜姿勢をとらせ、後部の吸着パッド108L,108Rには搬送方向(X方向)の後方を向いて所定角度の上向き傾斜姿勢をとらせる。そうすると、基板Gの前端部および後端部も吸着パッド108L,108Rの傾斜姿勢に倣って搬送方向(X方向)では同じ角度で傾斜姿勢をとり、搬送方向と直交する方向(Y方向)では山形の湾曲がとれて水平に矯正される。これにより、基板Gはレジストノズル82のライン状またはスリット状吐出口82aに対して基板の端から端まで平行な状態を保ってその直下を通過することになり、搬送方向と直交する方向(Y方向)で基板G上に均一な膜厚のレジスト塗布膜が形成される。   In order to solve such a problem, it is effective to slightly incline the suction pads 108L and 108R with respect to the horizontal line in the transport direction (X direction) as shown in FIGS. It becomes law. That is, the front suction pads 108L and 108R face the front in the transport direction (X direction) and take an upward inclined posture at a predetermined angle, and the rear suction pads 108L and 108R have the transport direction (X direction). Turn to the rear and take an upward inclined posture at a predetermined angle. Then, the front end portion and the rear end portion of the substrate G also take an inclined posture at the same angle in the transport direction (X direction) following the tilt posture of the suction pads 108L and 108R, and a mountain shape in a direction orthogonal to the transport direction (Y direction). The bend is removed and corrected horizontally. As a result, the substrate G passes through just below the line-shaped or slit-shaped discharge port 82a of the resist nozzle 82 while maintaining a state parallel to the end of the substrate, and is perpendicular to the transport direction (Y Direction), a resist coating film having a uniform film thickness is formed on the substrate G.

一方、搬送方向(X方向)では、吸着パッド108L,108Rの傾斜姿勢に伴い、基板Gの前端部および後端部でレジスト塗布膜の膜厚に変動が現れるが、製品領域の周辺部に局限された膜厚変動なので、塗布プロセスの品質(製品領域の膜厚均一性)は影響を受けずに済む。   On the other hand, in the transport direction (X direction), the film thickness of the resist coating film varies at the front end portion and the rear end portion of the substrate G with the inclination posture of the suction pads 108L and 108R. Therefore, the quality of the coating process (thickness uniformity in the product area) is not affected.

この実施形態では、各保持部106L(R)において各吸着パッド108L(R)を2軸のパッド支持部110L(R)およびパッドアクチエータ112L(R)で支持および昇降移動させるので、上記のように搬送方向(X方向)の水平線に対して各吸着パッド108L(R)が任意の角度で傾斜する姿勢を容易に実現できる。   In this embodiment, since each suction pad 108L (R) is supported and moved up and down by the biaxial pad support portion 110L (R) and the pad actuator 112L (R) in each holding portion 106L (R), as described above. In addition, it is possible to easily realize the posture in which each suction pad 108L (R) is inclined at an arbitrary angle with respect to the horizontal line in the transport direction (X direction).

一変形例として、図16に示すように、各保持部106L(R)における各吸着パッド108L(R)を1軸(単一)のパッド支持部110L(R)およびパッドアクチエータ112L(R)で支持および昇降移動させる構成を採り、かつ吸着パッド108L(R)を搬送方向(X方向)の水平線に対して任意の角度に傾斜させる構成を採ることも可能である。   As a modification, as shown in FIG. 16, each suction pad 108 </ b> L (R) in each holding portion 106 </ b> L (R) is uniaxial (single) pad support 110 </ b> L (R) and pad actuator 112 </ b> L (R). It is also possible to adopt a configuration in which the suction pad 108L (R) is inclined at an arbitrary angle with respect to a horizontal line in the transport direction (X direction).

図16の構成例は、吸着パッド108L(R)を上面に取付した上部支持ブロック140と、パッド支持部110L(R)の上端に水平に固定されたベースブロック142とを有し、搬送方向(X方向)の一端部にて軸144を介してベースブロック142に上部支持ブロック140を回転変位可能に結合するとともに、他端部にて圧縮コイルバネ146および差動ねじ148を介してベースブロック142に対する上部支持ブロック140の傾斜角を調整可能としている。   The configuration example of FIG. 16 includes an upper support block 140 with a suction pad 108L (R) attached to the upper surface, and a base block 142 that is horizontally fixed to the upper end of the pad support portion 110L (R). The upper support block 140 is rotatably coupled to the base block 142 via the shaft 144 at one end in the X direction), and is connected to the base block 142 via the compression coil spring 146 and the differential screw 148 at the other end. The inclination angle of the upper support block 140 can be adjusted.

差動ねじ148は、上部支持ブロック140のネジ孔に螺合された比較的大きなリードP1を有する太径の筒形ネジ150の内側に、ベースブロック142に固定された比較的大きなリードP2を有する細径のネジ152を螺合させている。太径のネジ150を回すと、両リードの差(P1−P2)に相当するリードで太径のネジ150が固定ナット154を介して上部支持ブロック140と一体に鉛直方向で移動(変位)し、吸着パッド108L(R)の傾斜角または水平度を調整できるようになっている。圧縮コイルバネ146は、差動ねじ148のバックラッシュを防止するように働く。   The differential screw 148 has a relatively large lead P2 fixed to the base block 142 inside a large-diameter cylindrical screw 150 having a relatively large lead P1 screwed into the screw hole of the upper support block 140. A small diameter screw 152 is screwed together. When the large-diameter screw 150 is turned, the large-diameter screw 150 moves (displaces) in the vertical direction integrally with the upper support block 140 via the fixing nut 154 at the lead corresponding to the difference between the two leads (P1-P2). The inclination angle or level of the suction pad 108L (R) can be adjusted. The compression coil spring 146 serves to prevent the backlash of the differential screw 148.

図17に、吸着パッド108L(R)に係る別の変形例を示す。この構成例は、X−Y面内(水平面内)でL字状の形状をとるL形ブロック160のX軸先端部に吸着パッド108L(R)を一体に設け、L形ブロックのX軸延長部162およびY軸延長部164のそれぞれの中間部に割り溝166,168を形成し、X軸差動ねじ170およびY軸差動軸172により割り溝166,168の幅をそれぞれ独立に可変することで、X軸およびY軸の水平線に対する吸着パッド108L(R)の傾斜角または水平度を任意に調整できるようにしている。   FIG. 17 shows another modified example related to the suction pad 108L (R). In this configuration example, the suction pad 108L (R) is integrally provided at the X-axis tip portion of the L-shaped block 160 having an L-shape in the XY plane (horizontal plane), and the X-axis extension of the L-shaped block. Split grooves 166 and 168 are formed at intermediate portions of the portion 162 and the Y-axis extension 164, and the widths of the split grooves 166 and 168 are independently varied by the X-axis differential screw 170 and the Y-axis differential shaft 172. Thus, the inclination angle or the level of the suction pad 108L (R) with respect to the X-axis and Y-axis horizontal lines can be arbitrarily adjusted.

図18〜図23に、この実施形態において第1および第2の搬送部84L,84Rが基板Gを単独搬送(片軸搬送)する際に、モーメントの力で基板Gが吸着パッド108L(R)からずれる(水平面内で回転変位する)のを十全に防止するための機構を示す。   18 to 23, in this embodiment, when the first and second transfer units 84L and 84R independently transfer the substrate G (single-axis transfer), the substrate G is attracted to the suction pad 108L (R) by the force of moment. A mechanism for fully preventing misalignment (rotational displacement in a horizontal plane) is shown.

図18に示す回転変位防止手段は、吸着パッド108L(R)の上面にL形の突部または段差部174を設けるものである。このL形突部174は、吸着パッド108L(R)の上面に保持されている基板Gの隅部の直交する両側面に係合することで、モーメントに起因する基板Gの回転変位を防止することができる。ただし、塗布処理中にL形突部174がレジストノズル82の下端に当接または摺接しないように、L形突部174の上面が基板Gの上面を超えない突出高さにする必要がある。   The rotational displacement prevention means shown in FIG. 18 is provided with an L-shaped protrusion or step 174 on the upper surface of the suction pad 108L (R). The L-shaped protrusions 174 engage the opposite sides of the corner of the substrate G held on the upper surface of the suction pad 108L (R), thereby preventing rotational displacement of the substrate G due to moment. be able to. However, it is necessary that the upper surface of the L-shaped protrusion 174 does not exceed the upper surface of the substrate G so that the L-shaped protrusion 174 does not contact or slide against the lower end of the resist nozzle 82 during the coating process. .

図19に示す回転変位防止手段は、浮上搬送の加速時に基板Gの搬送方向(X方向)における後部の側面GBに係止して基板Gの後方への回転変位を防止する係止部材176を備える構成としたものである。この係止部材176は、たとえば、水平方向に延びる棒状の支持体178の一端部に鉛直の支持軸180を介して回転可能に取付された円錐体として形成されている。水平支持体178の他端は、鉛直の支持軸182を介して直動型のアクチエータ184に結合されている。アクチエータ184はスライダ102L(R)に取付されている。 Rotational displacement preventing means shown in FIG. 19, the locking member 176 to prevent rotation displacement of the time of acceleration of the levitation transportation engages the rear side G B in the transport direction of the substrate G (X direction) to the rear of the substrate G It is set as the structure provided with. The locking member 176 is formed, for example, as a cone that is rotatably attached to one end of a bar-like support 178 extending in the horizontal direction via a vertical support shaft 180. The other end of the horizontal support 178 is coupled to a direct acting actuator 184 via a vertical support shaft 182. The actuator 184 is attached to the slider 102L (R).

浮上搬送で基板Gを加速させる時は、その直前に、アクチエータ184が往動して、係止部材176を下方の退避位置(復動位置)から図示のように基板Gの後部側面GBに係止する高さ位置(往動位置)まで上昇させる。たとえば、第2(右側)の搬送部84Rによる片軸搬送において、基板Gを加速させる時は、上方から見て左回り(反時計回り)のモーメントが基板Gに加わり、そのモーメント力により基板Gが二隅の保持部106Rの吸着パッド108Rの吸着力に抗して後方へ回転変位しようとする。しかし、係止部材176が基板Gの後部側面GBに係止して基板Gの後方への回転変位を防止するので、基板GはX−Y面内で姿勢を崩さずに搬送方向(X方向)へ移動することができる。なお、加速運動の終了後は、係止部材176を速やかに復動位置へ退避させてよい。 When accelerating the substrate G in levitation transportation is just before, actuator 184 is moved forward, the rear side G B of the substrate G, as shown the locking member 176 from the retracted position of the lower (backward position) Raise to the height position (forward movement position) to be locked. For example, in uniaxial conveyance by the second (right side) conveyance unit 84R, when the substrate G is accelerated, a counterclockwise (counterclockwise) moment is applied to the substrate G as viewed from above, and the moment force causes the substrate G Tends to rotate backward against the suction force of the suction pads 108R of the holding portions 106R at the two corners. However, since the locking member 176 to prevent rotational displacement of the rearward substrate G engaged with the rear side surface G B of the substrate G, the substrate G is conveyed direction without destroying the orientation in the X-Y plane (X Direction). Note that the locking member 176 may be quickly retracted to the backward movement position after the acceleration motion is completed.

このような係止型の回転変位防止手段は、図20および図21に示すように変形することも可能である。図20の回転変位防止手段は、棒状の係止部材186の基端部をモータ等の回転型アクチエータ188に結合し、係止部材186の先端部が基板Gの後部側面GBに係止する往動位置と、基板Gよりもずっと下方に退避する復動位置との間で係止部材186を回動させるように構成している。なお、アクチエータ188はスライダ102L(R)に取付されてよい。図21の回転変位防止手段は、直動型アクチエータ190を用いて、搬送方向(X方向)で係止部材186の先端部が基板Gの後部側面GBに係止する往動位置と、基板Gよりもずっと後方に退避する位置(復動位置)との間で棒状係止部材186を直線移動させるように構成している。 Such a locking-type rotational displacement preventing means can be modified as shown in FIGS. Rotational displacement preventing means of FIG. 20, the base end portion of the rod-shaped locking member 186 attached to the rotary actuator 188 such as a motor, the tip portion of the engaging member 186 is engaged with the rear side surface G B of the substrate G The locking member 186 is configured to rotate between the forward movement position and the backward movement position retracted far below the substrate G. The actuator 188 may be attached to the slider 102L (R). Rotational displacement prevention means of FIG. 21, the forward position with the direct-acting actuator 190, the tip portion of the engaging member 186 is engaged with the rear side surface G B of the substrate G in the conveying direction (X direction), the substrate The rod-like locking member 186 is configured to linearly move between a position (reverse movement position) that is retracted far behind G.

図19〜図21の回転変位防止手段はいずれも、浮上搬送の加速時に基板Gの搬送方向(X方向)における後部の側面GBに係止して基板Gの後方への回転変位を防止するものである。図示省略するが、浮上搬送の減速時に基板Gの搬送方向(X方向)における前部の側面に係止して基板Gの前方への回転変位を防止するための回転変位防止手段も、上記と同様に構成することができる。 Any rotational displacement prevention means 19 to 21, engagement locks to prevent rotational displacement of the rearward of the substrate G at the rear side G B in the transport direction of the substrate G at the time of acceleration of the levitation transportation (X direction) Is. Although not shown in the drawings, the rotational displacement prevention means for preventing the rotational displacement of the substrate G forward by locking with the side surface of the front portion in the transport direction (X direction) of the substrate G when the floating transportation is decelerated is also as described above. It can be configured similarly.

図22に示す回転変位防止手段192は、基板Gの片側二隅を保持する2つの保持部106L(R)の中間で基板Gの側縁部の裏面に吸着して基板Gを局所的に保持する中間吸着パッド194を備える。図22の構成例は、垂直支持部材196に軸198を介して回動可能に取付された水平支持部材200の一端部に中間吸着パッド194を一体形成または取付している。一対の直動型アクチエータ202,204を用いて水平支持部材196を回動させることにより、中間吸着パッド194の吸引口206が基板Gの側縁部裏面に接着する往動位置と、中間吸着パッド194の吸引口206が基板Gの側縁部裏面から下方に退避する復動位置との間で中間吸着パッド194を移動させることができる。   The rotational displacement prevention means 192 shown in FIG. 22 is attracted to the back surface of the side edge of the substrate G in the middle of the two holding portions 106L (R) that hold the two corners on one side of the substrate G to locally hold the substrate G. An intermediate suction pad 194 is provided. In the configuration example of FIG. 22, an intermediate suction pad 194 is integrally formed or attached to one end of a horizontal support member 200 that is rotatably attached to a vertical support member 196 via a shaft 198. By rotating the horizontal support member 196 using the pair of linear actuators 202 and 204, the forward movement position where the suction port 206 of the intermediate suction pad 194 adheres to the back surface of the side edge of the substrate G, and the intermediate suction pad The intermediate suction pad 194 can be moved between the suction port 206 of 194 and a backward movement position where the suction port 206 is retracted downward from the rear surface of the side edge of the substrate G.

図23に示すように、たとえば、第2(右側)の搬送部84Rによる片軸搬送において、基板Gの加速時には、上方から見て点線の矢印Jで示すように左回り(反時計回り)のモーメントが基板Gに加わり、そのモーメント力により基板Gが二隅の保持部106Rの吸着パッド108Rの吸着力に抗して後方へ回転変位しようとする。しかし、回転変位防止手段192の中間吸着パッド材194が基板Gの側縁部裏面に吸着して基板Gの後方への回転変位を食い止めるので、基板GはX−Y面内で姿勢を崩さずに搬送方向(X方向)へ移動することができる。また、基板Gの減速時には、上方から見て一点鎖線の矢印Kで示すように右回り(時計回り)のモーメントが基板Gに加わり、そのモーメント力により基板Gが二隅の保持部106Rの吸着パッド108Rの吸着力に抗して前方へ回転変位しようとする。しかし、この場合も、回転変位防止手段192の中間吸着パッド材194が基板Gの側縁部裏面に吸着して基板Gの前方への回転変位を食い止めるので、基板GはX−Y面内で姿勢を崩さずに搬送方向(X方向)へ移動することができる。   As shown in FIG. 23, for example, in uniaxial conveyance by the second (right) conveyance unit 84R, when the substrate G is accelerated, it is counterclockwise (counterclockwise) as indicated by a dotted arrow J when viewed from above. A moment is applied to the substrate G, and the moment force causes the substrate G to rotate and displace rearward against the suction force of the suction pads 108R of the holding portions 106R at the two corners. However, since the intermediate suction pad material 194 of the rotational displacement prevention means 192 is attracted to the back surface of the side edge of the substrate G and stops the rotational displacement of the substrate G to the rear, the substrate G does not lose its posture in the XY plane. Can be moved in the transport direction (X direction). In addition, when the substrate G is decelerated, a clockwise (clockwise) moment is applied to the substrate G as indicated by a one-dot chain line arrow K as viewed from above, and the substrate G is attracted to the holding portions 106R at the two corners by the moment force. Attempts to rotationally move forward against the suction force of the pad 108R. However, in this case as well, the intermediate suction pad material 194 of the rotational displacement prevention means 192 is attracted to the back surface of the side edge of the substrate G and stops forward rotational displacement of the substrate G, so that the substrate G is within the XY plane. It is possible to move in the transport direction (X direction) without breaking the posture.

なお、回転変位防止手段192の中間吸着パッド材194は、保持部106R(L)の吸着パッド108R(L)から十分に離れているので、たとえば図14および図15に示すような保持部106R(L)の基板姿勢矯正機能を害するような影響(干渉)を及ぼすことはない。   Note that the intermediate suction pad material 194 of the rotational displacement prevention means 192 is sufficiently separated from the suction pad 108R (L) of the holding portion 106R (L), and therefore, for example, the holding portion 106R (as shown in FIGS. 14 and 15). L) The influence (interference) that impairs the substrate posture correcting function is not exerted.

以上、本発明の好適な実施形態を説明したが、本発明は上記実施形態に限定されるものではなく、その技術的思想の範囲内で種々の変形が可能である。   The preferred embodiment of the present invention has been described above, but the present invention is not limited to the above embodiment, and various modifications can be made within the scope of the technical idea.

上記した実施形態はLCD製造の塗布現像処理システムにおけるレジスト塗布装置およびレジスト塗布方法に係るものであったが、本発明は浮上ステージを用いる浮上搬送方式であれば任意の基板処理装置やアプリケーションに適用可能である。本発明における処理液としては、レジスト液以外にも、たとえば層間絶縁材料、誘電体材料、配線材料等の塗布液も可能であり、現像液やリンス液等も可能である。本発明における被処理基板はLCD基板に限らず、他のフラットパネルディスプレイ用基板、半導体ウエハ、CD基板、ガラス基板、フォトマスク、プリント基板等も可能である。   Although the above-described embodiment relates to a resist coating apparatus and a resist coating method in a coating and developing processing system for LCD manufacturing, the present invention can be applied to any substrate processing apparatus or application as long as it is a floating conveyance method using a floating stage. Is possible. In addition to the resist solution, for example, a coating solution such as an interlayer insulating material, a dielectric material, and a wiring material can be used as the processing solution in the present invention, and a developing solution, a rinsing solution, and the like are also possible. The substrate to be processed in the present invention is not limited to an LCD substrate, and other flat panel display substrates, semiconductor wafers, CD substrates, glass substrates, photomasks, printed substrates, and the like are also possible.

本発明の適用可能な塗布現像処理システムの構成を示す平面図である。It is a top view which shows the structure of the application | coating development processing system which can apply this invention. 実施形態の塗布現像処理システムにおける処理の手順を示すフローチャートである。It is a flowchart which shows the procedure of the process in the application | coating development processing system of embodiment. 実施形態におけるレジスト塗布ユニットの全体構成を示す略平面図である。It is a schematic plan view which shows the whole structure of the resist application unit in the embodiment. 実施形態におけるレジスト塗布ユニットの全体構成を示す斜視図である。It is a perspective view which shows the whole structure of the resist coating unit in embodiment. 実施形態におけるレジスト塗布ユニットの全体構成を示す略正面図である。It is a schematic front view which shows the whole structure of the resist coating unit in embodiment. 実施形態のレジスト塗布ユニットにおける搬送部の構成を示す一部断面略側面図である。It is a partial cross section schematic side view which shows the structure of the conveyance part in the resist application unit of embodiment. 実施形態のレジスト塗布ユニットにおける保持部の構成例を示す拡大断面図である。It is an expanded sectional view showing an example of composition of a holding part in a resist application unit of an embodiment. 実施形態のレジスト塗布ユニットにおける保持部の構成例を示す斜視図である。It is a perspective view which shows the structural example of the holding | maintenance part in the resist application unit of embodiment. 上記保持部においてパッド支持部が吸着パッドを支持する好適な一構成例を示す斜視図である。It is a perspective view which shows one suitable structural example in which the pad support part supports a suction pad in the said holding | maintenance part. 実施形態のレジスト塗布ユニットにおける制御系の構成を示すブロック図である。It is a block diagram which shows the structure of the control system in the resist coating unit of embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作を説明するためのタイミングチャート図である。It is a timing chart for demonstrating the application | coating process operation | movement in the resist application | coating unit of embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 実施形態のレジスト塗布ユニットにおける塗布処理動作の一段階を示す略平面図である。It is a schematic plan view showing one stage of the coating treatment operation in the resist coating unit of the embodiment. 浮上搬送中の基板が湾曲に撓む場合を示す略斜視図である。It is a schematic perspective view which shows the case where the board | substrate in levitation conveyance is bent to a curve. 実施形態において基板の湾曲撓みを水平に矯正するための構成および方法を示す略側面図である。It is a schematic side view which shows the structure and method for correcting the curvature bending of a board | substrate horizontally in embodiment. 実施形態において基板の湾曲撓みを水平に矯正するための構成および方法を示す略斜視図である。It is a schematic perspective view which shows the structure and method for correcting the curvature bending of a board | substrate horizontally in embodiment. 実施形態における保持部の一変形例の構成を示す側面図である。It is a side view which shows the structure of the modification of the holding | maintenance part in embodiment. 実施形態における保持部の別の変形例の構成を示す斜視図である。It is a perspective view which shows the structure of another modification of the holding | maintenance part in embodiment. 実施形態における回転変位防止手段の一構成例を示す斜視図である。It is a perspective view which shows one structural example of the rotation displacement prevention means in embodiment. 実施形態における回転変位防止手段の別の構成例を示す斜視図である。It is a perspective view which shows another structural example of the rotational displacement prevention means in embodiment. 実施形態における回転変位防止手段の別の構成例を示す斜視図である。It is a perspective view which shows another structural example of the rotational displacement prevention means in embodiment. 実施形態における回転変位防止手段の別の構成例を示す斜視図である。It is a perspective view which shows another structural example of the rotational displacement prevention means in embodiment. 実施形態における回転変位防止手段の別の構成例を示す斜視図である。It is a perspective view which shows another structural example of the rotational displacement prevention means in embodiment. 図22の回転変位防止手段を作用を説明するための略平面図である。It is a schematic plan view for demonstrating an effect | action of the rotation displacement prevention means of FIG.

符号の説明Explanation of symbols

40 レジスト塗布ユニット(COT)
47 搬送装置
80 ステージ
82 レジストノズル
84L 第1(左側)の搬送部
84R 第2(右側)の搬送部
84 噴出口
88 吸引口
100L,100R 第1および第2のガイドレール
102L,102R 第1および第2のスライダ
104L,104R 第1および第2の搬送駆動部
106L,106R 第1および第2の保持部
108L,108R 第1および第2の吸着パッド
110L,110R 第1および第2のパッド支持部
112L,112R 第1および第2のパッドアクチエータ
118L,118R 第1および第2のパッド吸着制御部
136 ステージ基板浮上部
138 コントローラ
1 搬入領域
2 塗布領域
3 搬出領域
174 L形突部
176,186 係止部材
184,188,190 アクチエータ
192 回転変位防止手段
194 中間吸着パッド
40 resist coating unit (COT)
47 Conveying device 80 Stage 82 Registration nozzle 84L First (left side) conveying unit 84R Second (right side) conveying unit 84 Spout port 88 Suction port 100L, 100R First and second guide rails 102L, 102R First and second Second slider 104L, 104R First and second transport drive units 106L, 106R First and second holding units 108L, 108R First and second suction pads 110L, 110R First and second pad support units 112L , 112R first and second pads activator eta 118L, 118R first and second pad suction control unit 136 stage substrate floating unit 138 controller M 1 carrying area M 2 coating area M 3 out region 174 L-shaped projections 176, 186 Locking member 184, 188, 190 Actuator 192 Change of rotation Preventing means 194 intermediate the suction pad

Claims (15)

矩形の被処理基板を気体の圧力で浮かせるステージと、
前記ステージ上で浮いた状態の前記基板を着脱可能に保持する保持部を有し、前記ステージ上で所定の搬送方向に前記基板を浮上搬送するために前記基板を前記保持部と一体に前記搬送方向に移動させる搬送部と
を備え、
前記保持部が、前記基板の搬送方向に対して左右片側の二隅を局所的に保持する実質的にたわまない保持部材と、前記保持部材を昇降移動または変位させるための昇降部とを有する基板処理装置。
A stage for floating a rectangular substrate to be processed by gas pressure;
A holding unit that detachably holds the substrate in a floating state on the stage, and the substrate is transported integrally with the holding unit to float and transport the substrate in a predetermined transport direction on the stage. And a transport unit that moves in the direction,
A holding member that holds the two corners on the left and right sides locally with respect to the transport direction of the substrate; and a lifting unit for moving the holding member up and down or displacing the holding member. A substrate processing apparatus.
前記保持部材が、前記基板の左右片側二隅の裏面にそれぞれ吸着可能な2個の吸着パッドと、各々の前記吸着パッドを前記搬送方向に所定の間隔を置いた2箇所でそれぞれ鉛直方向の変位を規制して支持するパッド支持部とを有し、
前記昇降部が、前記第1および第2のパッド支持部をそれぞれ独立に昇降駆動する第1および第2のアクチエータと、前記第1および第2のアクチエータの駆動動作を統括的に制御する昇降制御部とを有する請求項1に記載の基板処理装置。
The holding member has two suction pads that can be sucked on the back surfaces of the two left and right corners of the substrate, and each of the suction pads is displaced in the vertical direction at a predetermined interval in the transport direction. A pad support part that regulates and supports
The elevating unit controls the first and second actuators for independently elevating and driving the first and second pad support units, and elevating control for comprehensively controlling the driving operations of the first and second actuators. The substrate processing apparatus of Claim 1 which has a part.
前記第1および第2のパッド支持部の双方が前記吸着パッドをその回りに鉛直面内で回転変位可能とする水平回転軸を有し、前記第1および第2のパッド支持部の片方が前記吸着パッドを水平方向で直動変位可能とする直動軸を有する請求項2記載の基板処理装置。   Both the first and second pad support portions have a horizontal rotation shaft that allows the suction pad to be rotationally displaced in a vertical plane around the suction pad, and one of the first and second pad support portions is the The substrate processing apparatus according to claim 2, further comprising a linear motion shaft that enables the suction pad to be linearly displaced in the horizontal direction. 前記保持部材が、前記基板の左右片側二隅の裏面にそれぞれ吸着可能な2個の吸着パッドと、各々の前記吸着パッドをその鉛直方向の変位を規制して支持する単一のパッド支持部とを有し、
前記昇降部が、前記パッド支持部を昇降駆動するアクチエータと、前記アクチエータの駆動動作を制御する昇降制御部とを有する請求項1に記載の基板処理装置。
The holding member has two suction pads that can be sucked to the back surfaces of two corners on the left and right sides of the substrate, and a single pad support portion that supports each of the suction pads while restricting displacement in the vertical direction. Have
The substrate processing apparatus according to claim 1, wherein the elevating unit includes an actuator that drives the pad support unit to move up and down, and an elevating control unit that controls a driving operation of the actuator.
前記保持部が、搬送方向の水平線に対する前記吸着パッドの吸着面の角度を調整するための第1のパッド姿勢調整部を有する請求項4に記載の基板処理装置。   The substrate processing apparatus according to claim 4, wherein the holding unit includes a first pad posture adjustment unit for adjusting an angle of the suction surface of the suction pad with respect to a horizontal line in the transport direction. 前記保持部が、搬送方向と直交する水平線に対する前記吸着パッドの吸着面の角度を調整するための第2のパッド姿勢調整部を有する請求項1〜5のいずれか一項に記載の基板処理装置。   The substrate processing apparatus according to claim 1, wherein the holding unit includes a second pad posture adjusting unit for adjusting an angle of the suction surface of the suction pad with respect to a horizontal line orthogonal to the transport direction. . 前記アクチエータが、モータと、前記モータの回転駆動力を前記パッド支持部の鉛直方向の直進運動に変換する伝動機構とを有し、
前記昇降制御部が、前記モータの回転角を検出するためのエンコーダを含み、前記パッド支持部の昇降移動距離を制御するために前記エンコーダの出力信号をフィードバック信号として前記モータの回転量を制御する請求項2〜6のいずれか一項に記載の基板処理装置。
The actuator includes a motor, and a transmission mechanism that converts the rotational driving force of the motor into a linear movement in the vertical direction of the pad support portion,
The elevating control unit includes an encoder for detecting the rotation angle of the motor, and controls the rotation amount of the motor using an output signal of the encoder as a feedback signal in order to control the elevating movement distance of the pad support unit. The substrate processing apparatus as described in any one of Claims 2-6.
前記保持部が、浮上搬送中に前記基板の前記保持部に対する水平面内の回転変位を防止するための回転変位防止手段を有する請求項1〜7のいずれか一項記載の基板処理装置。   The substrate processing apparatus according to claim 1, wherein the holding unit includes a rotation displacement preventing unit for preventing a rotational displacement of the substrate in a horizontal plane with respect to the holding unit during the floating conveyance. 前記回転変位防止手段が、前記吸着パッドの上面に一体形成され、前記基板の上面よりも低い位置で前記基板の隅部の互いに直交する両側面に係合する突部を有する請求項8に記載の基板処理装置。   9. The rotational displacement prevention means has protrusions that are integrally formed on the upper surface of the suction pad and that engage with both side surfaces orthogonal to each other at corners of the substrate at a position lower than the upper surface of the substrate. Substrate processing equipment. 前記回転変位防止手段が、浮上搬送の減速時に前記基板の搬送方向における前部の側面に係止して前記基板の前方への回転変位を防止する係止部材を有する請求項8に記載の基板処理装置。   9. The substrate according to claim 8, wherein the rotational displacement prevention means includes a locking member that is locked to a front side surface in the transport direction of the substrate when the floating transport is decelerated to prevent the rotational displacement of the substrate forward. Processing equipment. 前記回転変位防止手段が、浮上搬送の加速時に前記基板の搬送方向における後部の側面に係止して前記基板の後方への回転変位を防止する係止部材を有する請求項8または請求項10に記載の基板処理装置。   The said rotation displacement prevention means has the latching member which latches to the side surface of the rear part in the conveyance direction of the said board | substrate at the time of acceleration of floating conveyance, and prevents the rotational displacement to the back of the said board | substrate. The substrate processing apparatus as described. 前記回転変位防止手段が、前記保持部材によって保持される前記基板の片側二隅の間で基板側縁部の裏面に吸着して前記基板の回転変位を防止する中間パッド部材を有する請求項8に記載の基板処理装置。   The said rotation displacement prevention means has an intermediate | middle pad member which adsorb | sucks to the back surface of a board | substrate side edge part between the one side two corners of the said board | substrate hold | maintained by the said holding member, and prevents the rotation displacement of the said board | substrate. The substrate processing apparatus as described. 矩形の被処理基板を気体の圧力で浮かせるステージと、
前記ステージ上で浮く前記基板の搬送方向に対して左右片方の縁部を着脱可能に保持する第1の保持部を有し、前記ステージ上で前記基板を浮上搬送するために前記基板を前記第1の保持部と一体に搬送方向に移動させる第1の搬送部と、
前記ステージ上で浮く前記基板の搬送方向に対して左右他方の縁部を着脱可能に保持する第2の保持部を有し、前記ステージ上で前記基板を浮上搬送するために前記基板を前記第2の保持部と一体に搬送方向に移動させる第2の搬送部と、
前記ステージの上方に配置される長尺形のノズルを有し、前記基板上に処理液の塗布膜を形成するために前記浮上搬送で前記ノズルの直下を通過する前記基板に向けて前記ノズルより処理液を吐出させる処理液供給部と
を備え、
前記第1の保持部が、前記基板の搬送方向に対して左右片方の二隅を局所的に保持する実質的にたわまない第1の保持部材と、前記第1の保持部材を昇降移動または変位させるための第1の昇降部とを有し、
前記第2の保持部が、前記基板の搬送方向に対して左右他方の二隅を局所的に保持する実質的にたわまない第2の保持部材と、前記第2の保持部材を昇降移動または変位させるための第2の昇降部とを有する塗布装置。
A stage for floating a rectangular substrate to be processed by gas pressure;
A first holding unit that detachably holds one of the left and right edges of the substrate floating on the stage, the substrate being lifted and conveyed on the stage; A first transport unit that moves in the transport direction integrally with one holding unit;
A second holding part that detachably holds the other right and left edges with respect to the transfer direction of the substrate that floats on the stage, and the substrate is moved to float and transport the substrate on the stage; A second transport unit that moves in the transport direction integrally with the two holding units;
An elongated nozzle disposed above the stage, and from the nozzle toward the substrate that passes directly under the nozzle in the levitation conveyance to form a coating film of a processing solution on the substrate; A treatment liquid supply section for discharging the treatment liquid,
The first holding unit is configured to move up and down the first holding member that holds the two left and right corners locally with respect to the transport direction of the substrate and that does not substantially bend. Or a first lifting part for displacing,
The second holding part locally holds the other two corners on the left and right sides with respect to the transport direction of the substrate, and the second holding member that does not flex substantially moves up and down the second holding member. Or the coating device which has a 2nd raising / lowering part for making it displace.
前記ステージの一端部に設けられた搬入位置に前記基板を搬入するための搬入部と、前記ステージの他端部に設けられた搬出位置から前記基板を搬出するための搬出部とを有し、
前記第1の搬送部が、前記搬入位置から前記塗布位置を通って前記塗布位置と前記搬出位置との間に設定された第1の位置まで、前記基板を前記ステージ上で浮上搬送し、
前記第2の搬送部が、前記搬入位置と前記塗布位置との間に設定された第2の位置から前記塗布位置を通って前記搬出位置まで前記基板を前記ステージ上で浮上搬送する請求項13に記載の塗布装置。
A carry-in part for carrying the substrate into a carry-in position provided at one end of the stage; and a carry-out part for carrying out the substrate from a carry-out position provided at the other end of the stage;
The first transport unit floats and transports the substrate on the stage from the carry-in position to the first position set between the application position and the carry-out position through the application position,
The said 2nd conveyance part floats and conveys the said board | substrate on the said stage from the 2nd position set between the said carrying in position and the said coating position to the said carrying out position through the said coating position. The coating apparatus as described in.
浮上ステージ上に搬送方向に沿って搬入位置、塗布開始位置、塗布終了位置および搬出位置を一列に設定し、
前記浮上ステージ上で気体の圧力により矩形の被処理基板を所望の高さに浮かせ、
前記浮上ステージ上で、前記搬入位置から前記塗布開始位置までの第1の区間では前記基板の搬送方向に対して左右片方の二隅を実質的にたわまない昇降可能な保持部材で局所的に保持して、前記塗布開始位置から前記塗布終了位置までの第2の区間では前記基板の四隅を実質的にたわまない昇降可能な保持部材で局所的に保持して、前記塗布終了位置から前記搬出位置までの第3の区間では前記基板の搬送方向に対して左右他方の二隅を実質的にたわまない昇降可能な保持部材で局所的に保持して、前記基板を前記搬送方向に搬送し、
前記基板が前記第2の区間を移動する間に前記基板の上面に処理液を塗布する塗布方法。
Set the loading position, coating start position, coating end position and unloading position in a line along the transport direction on the levitation stage,
A rectangular target substrate is floated to a desired height by gas pressure on the levitation stage,
On the levitation stage, in a first section from the carry-in position to the coating start position, a holding member capable of moving up and down that does not substantially bend at the two left and right corners with respect to the transport direction of the substrate is locally used. In the second section from the application start position to the application end position, the four corners of the substrate are locally held by a liftable lifting member that does not substantially bend, and the application end position In the third section from the unloading position to the unloading position, the substrate is transported by holding the substrate locally by a liftable holding member that does not substantially bend the other two corners on the left and right sides with respect to the transport direction of the substrate. Transport in the direction,
A coating method in which a treatment liquid is coated on an upper surface of the substrate while the substrate moves in the second section.
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