JP2010281651A - Optical inspection apparatus - Google Patents

Optical inspection apparatus Download PDF

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Publication number
JP2010281651A
JP2010281651A JP2009134558A JP2009134558A JP2010281651A JP 2010281651 A JP2010281651 A JP 2010281651A JP 2009134558 A JP2009134558 A JP 2009134558A JP 2009134558 A JP2009134558 A JP 2009134558A JP 2010281651 A JP2010281651 A JP 2010281651A
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substrate
inspected
stage
optical system
inspection apparatus
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JP2009134558A
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JP5553532B2 (en
Inventor
Makoto Okazaki
Akihiro Sunouchi
Masayuki Umeda
Koichi Wakitani
信 岡崎
聡裕 巣之内
昌之 梅田
康一 脇谷
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Panasonic Corp
パナソニック株式会社
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an optical inspection apparatus which can enhance the floating precision of a substrate to be inspected in the optical inspection device wherein a groove part is provided to the floating stage in order to suppress that the contamination or the like of the surface of the floating stage is detected as a flaw. <P>SOLUTION: The optical inspection apparatus includes the floating stage 2 for floating the substrate 1 to be inspected having light transmittance, a feed mechanism 3 for feeding the substrate 1 to be inspected floated on the floating stage 2, an illumination optical system 4 for irradiating the surface of the substrate 1 to be inspected, which is floated to be fed to the surface of the floating stage 2, with illumination light and an imaging optical system 5 for catching the reflected light from the substrate 1 to be inspected of the illumination light emitted by the illumination optical system 4. The groove part 6 having wall surfaces 6a at both ends is formed to the floating stage 2 corresponding to the region on the floating stage 2 irradiated with the illumination light from the illumination optical system 4 transmitted through the substrate 1 to be inspected. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to an optical inspection apparatus used for inspecting a substrate having optical transparency, such as a shape inspection of a pattern formed on a display substrate used in a plasma display panel (PDP), a liquid crystal panel, an organic EL panel or the like. .

  Conventionally, as a substrate transport method in an optical inspection apparatus, a full-surface suction stage method and a roller transport method are generally used. In the full-surface suction stage method, the entire surface of the substrate to be inspected is sucked and held on the suction stage, and the suction stage or the inspection camera is moved to inspect the entire surface of the inspected substrate. In the roller transport method, the substrate to be inspected is transported by rotating the roller, and the entire surface of the substrate to be inspected is inspected.

  However, in the full-surface suction stage method, when imaging the substrate to be inspected by irradiating illumination light from above the substrate to be inspected, if the substrate material is a material that transmits light such as glass, the substrate to be inspected is placed below. Since the reflected light from the suction stage that is sucked and held from the side will also be imaged, dirt and scratches on the surface of the suction stage and surface irregularities that occur during processing will be detected as defects, so the dirt on the surface of the suction stage A huge amount of work is required to manage the above. In addition, if the height variation of the surface of the suction stage does not fall within the range of the depth of field of the imaging optical system, a focused image cannot be captured. When the inspection is performed by the whole surface suction stage method, it is necessary to suppress height variation over the entire surface of the suction stage with very high accuracy. For this reason, it is difficult to suppress the height variation as the suction stage becomes larger, so it is difficult to make the full-surface suction stage method compatible with high-precision inspection of large substrates with the recent increase in substrate size. It has become. Similarly, since it is difficult to suppress variations in roller height with high accuracy, it is difficult to cope with high-precision inspection of large substrates.

  Further, in the full-surface suction stage method and the roller transport method, the influence of charging due to the suction stage or roller coming into contact with the substrate is also a problem. In other words, in the full-surface suction stage method and the roller conveyance method, there is a possibility that circuit portions such as transistors are destroyed by charging.

  In view of the above problems, a levitation conveyance method has been proposed in which a substrate to be inspected is floated with air and conveyed. For example, Patent Document 1 proposes an optical inspection apparatus in which a floating block that blows air and floats a substrate to be inspected is arranged in an inspection region of an inspection unit. By arranging the floating block in the inspection area of the inspection unit in this way, the substrate to be inspected can be corrected with high flatness in the inspection area. However, when a floating block is arranged in the inspection area of the inspection unit, dirt on the surface of the floating block is detected as a defect as in the case of the full-surface suction stage method. Work is required.

  In view of this, an optical inspection apparatus has been proposed in which a gap portion is provided in a floating stage for levitating a substrate to be inspected, thereby suppressing the detection of dirt or the like on the surface of the floating stage as a defect (see, for example, Patent Document 2). .) Hereinafter, a conventional optical inspection apparatus in which a gap portion is provided on a floating stage will be described with reference to the drawings. 10A is a view of the floating stage of the conventional optical inspection apparatus as viewed from above, FIG. 10B is a sectional view of the floating stage of the conventional optical inspection apparatus as viewed from the side, and FIG. It is the figure which looked at the floating stage of the conventional optical inspection apparatus from the front.

  As shown in FIGS. 10A to 10C, the floating stage 102 for levitating the substrate 101 having optical transparency, except for the gap portion 103, and the suction hole 104 for ejecting air, and the air are sucked. The suction holes 105 are arranged in a staggered pattern. The ejection hole 104 communicates with the ejection pipe 106, and the suction hole 105 communicates with the suction pipe 107. By adjusting the ejection pressure for ejecting air from the ejection hole 104 and the suction pressure for drawing air into the suction hole 105, the flying height of the substrate 101 to be inspected can be kept constant.

  The transport mechanism 108 transports the inspected substrate 101 floating on the floating stage 102 while being fixed by suction or the like. The illumination optical system 109 irradiates the inspected substrate 101 that is levitated and conveyed on the levitating stage 102 with linear illumination light. The imaging optical system 110 captures an image of a region on the inspected substrate 101 irradiated with linear illumination light by the illumination optical system 109.

  The gap portion 103 is provided in a region on the floating stage 102 to which linear illumination light from the illumination optical system 109 that has passed through the substrate to be inspected 101 is irradiated. By forming the gap portion 103 deeper than the focal depth of the imaging optical system 110, for example, the reflected light from the gap portion 103 is prevented from being combined in the imaging optical system 110, and the surface of the floating stage 102 is stained. And the like can be suppressed from being detected as defects. Alternatively, the cross-sectional shape of the gap portion 103 is set to a shape in which the amount of light incident on the imaging optical system 110 of the reflected light from the gap portion 103 is suppressed, or a material having a low reflectance on the surface of the gap portion 103, for example, By applying a matte black paint, it may be possible to suppress the detection of dirt or the like on the surface of the floating stage 102 as a defect.

JP 2004-331265 A JP 2004-333198 A

  As described above, there has conventionally been proposed an optical inspection apparatus in which a gap portion is provided in the levitation stage to suppress the detection of dirt or the like on the surface of the levitation stage as a defect. However, in this optical inspection apparatus, a decrease in flying accuracy due to the gap portion is a problem in high-precision inspection.

  That is, as shown in FIG. 10B, since the bottom surface of the gap portion 103 is lower than the surface of the flying stage 102, the flying accuracy at the lower part of the imaging optical system 110 that requires a high flying height is required. There is a problem that decreases. Furthermore, if both ends of the gap portion 103 are open and air can be exchanged with the outside, the airflow for rising leaks from both ends of the gap portion 103, and the flying accuracy further decreases.

  In addition, as shown in FIG. 11, when the substrate 101 to be inspected having a width smaller than that of the levitation stage 102 is transported, the amount of airflow leakage from the gap portion 103 is further increased, and the levitation accuracy is extremely high at the substrate edge. Getting worse.

  In view of the above problems, the present invention improves the floating accuracy of a substrate to be inspected in an optical inspection apparatus in which a groove portion is provided in a floating stage in order to suppress the detection of dirt on the surface of the floating stage as a defect. An object of the present invention is to provide an optical inspection apparatus capable of performing the above.

  The optical inspection apparatus according to claim 1 of the present invention includes a floating stage for floating a substrate to be inspected having light transmittance, a transport mechanism for transporting the substrate to be inspected floating on the floating stage, and the floating An illumination optical system that irradiates illumination light onto the surface of the substrate to be inspected that is levitated and conveyed on a stage; and an imaging optical system that captures reflected light from the inspection substrate of the illumination light irradiated by the illumination optical system; , And a groove formed corresponding to a region on the floating stage irradiated with the illumination light transmitted through the substrate to be inspected has two surfaces that are perpendicular to and opposite to the formation direction of the groove. It is characterized by.

  Further, an optical inspection apparatus according to claim 2 of the present invention is a floating stage for levitating a substrate to be inspected having light transparency, a transport mechanism for conveying the substrate to be inspected that is levitated on the floating stage, An illumination optical system that irradiates illumination light onto the surface of the substrate to be inspected that is levitated and conveyed on the levitation stage, and imaging optics that captures reflected light from the inspection substrate of the illumination light irradiated by the illumination optical system A groove portion is formed corresponding to a region on the floating stage to which the illumination light transmitted through the substrate to be inspected is irradiated, and the substrate to be inspected passes in the groove forming direction. A sealing member is fitted near both ends of the region.

  An optical inspection apparatus according to claim 3 of the present invention is the optical inspection apparatus according to claim 1 or 2, wherein an ejection hole for ejecting gas is provided on the bottom side of the groove. It is characterized by being.

  An optical inspection apparatus according to a fourth aspect of the present invention is the optical inspection apparatus according to the third aspect, wherein the ejection hole is disposed at a position deviating from an imaging field of view of the imaging optical system. And

  Moreover, the optical inspection apparatus according to claim 5 of the present invention is the optical inspection apparatus according to claim 1 or 2, wherein a suction hole and a gas are sucked to the bottom side of the groove portion. It is characterized in that a suction hole is provided.

  Moreover, the optical inspection apparatus according to claim 6 of the present invention is the optical inspection apparatus according to claim 5, wherein the ejection hole and the suction hole are arranged at positions deviating from an imaging field of view of the imaging optical system. It is characterized by being.

  An optical inspection apparatus according to claim 7 of the present invention is a floating stage for levitating a substrate to be inspected having light permeability, a transport mechanism for conveying the substrate to be inspected that is levitated on the floating stage, An illumination optical system that irradiates illumination light onto the surface of the substrate to be inspected that is levitated and conveyed on the levitation stage, and imaging optics that captures reflected light from the inspection substrate of the illumination light irradiated by the illumination optical system A groove portion is formed corresponding to a region on the floating stage to which the illumination light transmitted through the substrate to be inspected is irradiated, and the substrate to be inspected passes in the groove forming direction. A low reflection member or a high reflection member is fitted in the region.

  According to a preferred embodiment of the present invention, in the optical inspection apparatus in which a groove portion is provided in the levitation stage in order to prevent the surface of the levitation stage from being detected as a defect, the levitation accuracy of the substrate to be inspected is improved. Can do.

It is a figure which shows the part of the optical inspection apparatus in Embodiment 1 of this invention, (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) was seen from the front. Figure The figure which shows the other example of the groove part in Embodiment 1 of this invention It is a figure which shows the part of the optical inspection apparatus in Embodiment 2 of this invention, Comprising: (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) was seen from the front. Figure 5A and 5B are diagrams showing a state of inspecting a substrate to be inspected having a width smaller than that of the floating stage in the optical inspection apparatus according to Embodiment 2 of the present invention, where FIG. Sectional view seen from the side, (c) is a view seen from the front It is a figure which shows the part of the optical inspection apparatus in Embodiment 3 of this invention, Comprising: (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) was seen from the front. Figure It is a figure which shows the part of the optical inspection apparatus in Embodiment 4 of this invention, Comprising: (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) was seen from the front. Figure It is a figure which shows the part of the optical inspection apparatus in Embodiment 5 of this invention, Comprising: (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) was seen from the front. Figure It is a figure which shows the part of the optical inspection apparatus in Embodiment 6 of this invention, Comprising: (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) was seen from the front. Figure It is a figure which shows the part of the optical inspection apparatus in Embodiment 7 of this invention, Comprising: (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) was seen from the front. Figure It is a figure which shows the part of the conventional optical inspection apparatus, (a) is the figure seen from upper direction, (b) is sectional drawing seen from the side, (c) is the figure seen from the front The figure which shows a mode when test | inspecting the to-be-inspected board | substrate whose width is smaller than the floating stage in the conventional optical inspection apparatus

  Hereinafter, embodiments of the optical inspection apparatus of the present invention will be described with reference to the drawings. In addition, the same code | symbol is attached | subjected to the member corresponding to the member demonstrated previously, and description is abbreviate | omitted suitably.

(Embodiment 1)
1A and 1B are diagrams showing a portion of an optical inspection apparatus according to Embodiment 1 of the present invention, in which FIG. 1A is a view of the floating stage as viewed from above, and FIG. 1B is a view of the floating stage as viewed from the side. FIG. 1C is a view of the levitation stage as viewed from the front.

  As shown in FIGS. 1A to 1C, this optical inspection apparatus includes a floating stage 2 for levitating a light-transmitting substrate 1 to be inspected and a substrate 1 to be inspected levitating on the floating stage 2. Is fixed by suction or the like, a transport mechanism 3, an illumination optical system 4 that irradiates illumination light onto the surface of the substrate 1 to be inspected that is levitated and transported on the levitation stage 2, and illumination light that is irradiated by the illumination optical system 4 An imaging optical system 5 that captures reflected light from the substrate 1 to be inspected. In addition, grooves 6 having wall surfaces 6 a at both ends are formed in the levitation stage 2 in correspondence with regions on the levitation stage 2 that are irradiated with illumination light from the illumination optical system 4 that has passed through the substrate 1 to be inspected.

  Hereinafter, the optical inspection apparatus will be described in detail. In addition, since a known technique can be applied to an image processing system that processes an image captured by the imaging optical system 5 and performs a determination process for inspecting the substrate 1 to be inspected, here, Description is omitted. Similarly, a known technique can be applied to the transport mechanism 3 and various moving mechanisms, and a control system for driving them, so that the description thereof is omitted here.

  As shown in FIG. 1, the levitation stage 2 has an ejection hole 7 for ejecting air and an adsorption hole 8 for sucking air, except for the groove 6. The ejection hole 7 communicates with the ejection pipe 9. By supplying air to the ejection pipe 9, air is ejected from the ejection hole 7, and the substrate 1 to be inspected is floated by the ejected air. On the other hand, the suction hole 8 communicates with the suction pipe 10, and air is sucked from the suction hole 8 by sucking air from the suction pipe 10. The suction hole 8 sucks air in order to suppress the flying height of the substrate 1 to be inspected. That is, the flying height of the substrate 1 to be inspected can be kept constant by adjusting the ejection pressure for ejecting air from the ejection holes 7 and the suction pressure for drawing air into the suction holes 8.

  Here, the ejection holes 7 and the suction holes 8 are arranged in a staggered manner. In this way, it is preferable to uniformly arrange the ejection holes 7 and the suction holes 8 in order to keep the flying height of the inspected substrate 1 constant. Further, the ejection pipe 9 and the suction pipe 10 may be provided, for example, for each row in which the ejection holes 7 and the suction holes 8 are alternately arranged along the transport direction of the substrate 1 to be inspected. The gas ejected from the ejection hole 7 and sucked from the suction hole 8 is not limited to air.

  For example, the illumination optical system 4 may be configured to irradiate a long linear illumination light in a direction orthogonal to the transport direction of the substrate 1 to be inspected, or scan the illumination light in a direction orthogonal to the transport direction of the substrate 1 to be inspected. A configuration may be adopted. Or it is good also as a structure which moves the illumination optical system 4 so that illumination light may be scanned in the direction orthogonal to the conveyance direction of the board | substrate 1 to be inspected. Similarly, a line sensor may be used as the imaging optical system 5, or an effective field of view of the imaging optical system 5 may be scanned in a direction orthogonal to the conveyance direction of the substrate 1 to be inspected. The imaging optical system 5 may be configured to move so that the effective visual field of the imaging optical system 5 is scanned in a direction orthogonal to the transport direction.

  The groove portion 6 is provided in the levitation stage 2 in order to suppress detection of dirt or the like on the surface of the levitation stage 2 as a defect. For example, by forming the groove 6 deeper than the focal depth of the imaging optical system 5, the reflected light from the groove 6 is prevented from being combined in the imaging optical system 5, and the reflected light from the surface of the levitation stage 2 is prevented. The influence may be suppressed.

  Further, the groove 6 is not formed up to both ends of the levitation stage 2 and has wall surfaces 6a at both ends. That is, both ends of the groove portion 6 are not open, thereby suppressing the amount of airflow leaking from the groove portion 6 for floating the substrate 1 to be inspected, and improving the floating accuracy of the substrate 1 to be inspected. Can do. The width of the groove 6 is preferably larger in all directions than the effective visual field 11 of the imaging optical system 5.

  Note that since the reflected light may be generated in the region where the groove 6 at both ends of the levitation stage 2 is not formed, the groove 6 at both ends of the levitation stage 2 is not formed in consideration that inspection of the region cannot be performed. Although it is desirable to make the region as small as possible, on the other hand, when the end of the substrate 1 to be inspected overlaps with the groove 6, air current leaks from the region where the substrate 1 to be inspected does not overlap with the groove 6. The region where the groove 6 is not formed needs to be large enough that the end of the substrate 1 to be inspected does not overlap the groove 6 due to variations in the position and size of the substrate 1 to be inspected.

  Further, FIG. 1B shows the groove portion 6 having a square cross-sectional shape, but the cross-sectional shape is not particularly limited, and may be, for example, a semicircular shape or a triangular shape. Moreover, you may incline the cross-sectional shape of the groove part 6 so that the incident light quantity to the imaging optical system 5 of the reflected light from the groove part 6 may be suppressed. For example, when illuminating light is irradiated on the substrate 1 to be inspected from the vertical direction, if the angle of the cross-sectional shape of the groove 6 is set to 45 degrees as shown in FIG. Can be reduced. Further, by applying a low reflectance material such as matte black paint on the surface of the groove 6 or roughening the surface of the groove 6, it is possible to prevent the surface of the floating stage 2 from being detected as a defect. May be. The groove 6 can be formed by, for example, digging.

(Embodiment 2)
Hereinafter, the optical inspection apparatus according to Embodiment 2 of the present invention will be described while referring to differences from Embodiment 1 described above. 3A and 3B are diagrams showing a part of the optical inspection apparatus according to Embodiment 2 of the present invention. FIG. 3A is a view of the levitation stage as viewed from above, and FIG. 3B is a view of the levitation stage as viewed from the side. FIG. 3C is a view of the levitation stage as viewed from the front.

  The optical inspection apparatus according to the second embodiment is different from the first embodiment described above in that the sealing member 12 is fitted in the vicinity of the end of the groove 6 where the substrate 1 to be inspected passes. In this way, the groove 6 is formed to both ends of the levitation stage 2 and both ends of the groove 6 can be sealed by the sealing member 12 even when both ends of the groove 6 are open. In addition, similarly to the first embodiment described above, it is possible to suppress the amount of leakage of airflow from the groove portion 6 for levitation of the substrate 1 to be inspected, and to improve the levitation accuracy of the substrate 1 to be inspected.

  Furthermore, according to the second embodiment, as shown in FIG. 4, even when the substrate 1 to be inspected having a smaller width than the levitation stage 2 is transported, according to the width of the substrate 1 to be inspected, By fitting the sealing member 12 near the end of the region through which the substrate 1 to be inspected passes, it is possible to suppress the leakage amount of the airflow from the groove portion 6 for levitation of the substrate 1 to be inspected. The flying accuracy of the substrate 1 can be improved.

  Note that the length of the sealing member 12 in the groove direction and the position where the sealing member 12 is fitted are adjusted so that the sealing member 12 does not overlap the inspected substrate 1 as much as possible. It is preferable to set so that the end of the substrate 1 to be inspected does not overlap the portion between the pair of sealing members 12 even if the size varies.

  Further, if air is not ejected and sucked in the ejection hole 7 and the suction hole 8 existing in the region where the substrate 1 to be inspected does not pass, further improvement in the flying accuracy can be expected.

(Embodiment 3)
Hereinafter, the difference between the optical inspection apparatus according to the third embodiment of the present invention and the first and second embodiments will be described. 5A and 5B are diagrams showing a part of the optical inspection apparatus according to Embodiment 3 of the present invention. FIG. 5A is a view of the levitation stage as viewed from above, and FIG. 5B is a view of the levitation stage as viewed from the side. FIG. 5C is a front view of the levitation stage.

  The optical inspection apparatus according to the third embodiment is different from the first and second embodiments described above in that the ejection hole 7 is provided on the bottom side of the groove 6. In the first and second embodiments described above, the transport mechanism 3 is provided only on one end of the substrate 1 to be inspected, but may be provided on both sides as shown in FIG.

  As in the third embodiment, by providing the ejection hole 7 on the bottom side of the groove portion 6, the groove portion 6 is provided with a drop of the substrate 1 to be inspected due to the bottom surface of the groove portion 6 being lower than the surface of the floating stage 2. This makes it possible to prevent the substrate 1 to be inspected by blowing it up with the airflow from the ejection holes 7 and to further improve the flying accuracy.

(Embodiment 4)
Hereinafter, the optical inspection apparatus according to Embodiment 4 of the present invention will be described while referring to differences from Embodiments 1 to 3 described above. 6A and 6B are diagrams showing a part of the optical inspection apparatus according to Embodiment 4 of the present invention. FIG. 6A is a view of the floating stage as viewed from above, and FIG. 6B is a view of the floating stage as viewed from the side. FIG. 6C is a front view of the levitation stage.

  The optical inspection apparatus according to the fourth embodiment is different from the first to third embodiments described above in that the ejection hole 7 and the suction hole 8 are provided on the bottom side of the groove 6. In this way, a drop of the substrate 1 to be inspected due to the bottom surface of the groove 6 being lower than the surface of the levitation stage 2 is prevented by blowing up the substrate 1 to be inspected by the airflow from the ejection holes 7 provided in the groove 6. On the other hand, it is possible to keep the flying height constant by sucking air into the suction hole 8 provided in the groove 6, and the flying accuracy can be further improved.

(Embodiment 5)
Hereinafter, the optical inspection apparatus according to Embodiment 5 of the present invention will be described while referring to differences from Embodiment 3 described above. 7A and 7B are diagrams showing a portion of the optical inspection apparatus according to Embodiment 5 of the present invention. FIG. 7A is a view of the levitation stage as viewed from above, and FIG. 7B is a view of the levitation stage as viewed from the side. FIG. 7C is a front view of the levitation stage.

  The optical inspection apparatus according to the fifth embodiment is different from the third embodiment described above in that the ejection hole 7 on the bottom side of the groove 6 is disposed at a position deviating from the effective visual field 11 of the imaging optical system 5. In this way, it is possible to improve the flying accuracy as in the third embodiment described above, and it is possible to prevent the edge portion of the hole of the ejection hole 7 from being erroneously detected as a defect. In other words, the edge of the hole is easy to shine as a processing mark, and generally it is difficult to suppress reflection at the edge, so if the injection hole enters the effective field of view of the imaging optical system, the edge of the hole of the injection hole According to the fifth embodiment, the ejection hole 7 is arranged at a position outside the effective visual field 11 of the imaging optical system 5, so that the ejection hole is formed in the imaging optical system 5. It is possible to prevent the reflected light from the edge portion of the hole 7 from entering.

(Embodiment 6)
Hereinafter, the optical inspection apparatus according to Embodiment 6 of the present invention will be described while referring to differences from Embodiment 4 described above. 8A and 8B are diagrams showing a part of the optical inspection apparatus according to Embodiment 6 of the present invention. FIG. 8A is a view of the levitation stage as viewed from above, and FIG. 8B is a view of the levitation stage as viewed from the side. FIG. 8C is a front view of the levitation stage.

  The optical inspection apparatus according to the sixth embodiment is the same as that of the fourth embodiment described above in that the ejection hole 7 and the suction hole 8 on the bottom side of the groove 6 are arranged at positions away from the effective visual field 11 of the imaging optical system 5. And different. In this way, the flying accuracy can be improved as in the above-described fourth embodiment, and the edge portions of the ejection holes 7 and the suction holes 8 are defined as defects as in the fifth embodiment described above. It is possible to prevent erroneous detection.

(Embodiment 7)
Hereinafter, the optical inspection apparatus according to Embodiment 7 of the present invention will be described while referring to differences from Embodiments 1 and 2 described above. 9A and 9B are diagrams showing a part of the optical inspection apparatus according to Embodiment 7 of the present invention. FIG. 9A is a view of the floating stage as viewed from above, and FIG. 9B is a view of the floating stage as viewed from the side. FIG. 9C is a view of the levitation stage as viewed from the front.

  The optical inspection apparatus according to the seventh embodiment is different from the first and second embodiments described above in that the low reflection member 13 is fitted in a region of the groove 6 through which the substrate 1 to be inspected passes. In this way, the amount of light incident on the imaging optical system 5 of the reflected light from the levitation stage 2 can be reduced. Further, the height of the low reflection member 13 is made lower than the surface of the flying stage 2 and is raised to a limit height that does not come into contact with the substrate 1 to be inspected. As the low reflection member, for example, a member subjected to black alumite treatment, a member coated with a light absorbing paint such as Rasha material, Macron or the like is suitable.

  Note that a transmission inspection of the substrate 1 to be inspected can be performed by fitting a high reflection member such as a mirror surface into the groove portion 6 instead of the low reflection member. Specifically, the illumination light emitted from the illumination optical system 4 passes through the substrate to be inspected 1 and is applied to the highly reflective portion material, and the light reflected by the highly reflective member again passes through the inspected substrate 1. Then, the light enters the imaging optical system 5. Therefore, it is possible to detect a defect on the inspected substrate 1 that blocks light that originally exists where light should be transmitted and a defect that transmits light that originally exists where light should be blocked. In this way, it is possible to easily perform more optical inspections without recreating the floating stage by fitting the high reflection member into the groove 6 instead of the low reflection member.

  An optical inspection apparatus according to the present invention improves the floating accuracy of a substrate to be inspected in an optical inspection apparatus in which a groove portion is provided in a floating stage in order to prevent the surface of a floating stage from being detected as a defect. It is useful not only for inspection of display substrates used for PDPs, liquid crystal panels, organic EL panels, etc., but also for all inspections of substrates having optical transparency.

DESCRIPTION OF SYMBOLS 1,101 Board | substrate 2 to be inspected 2,102 Floating stage 3,108 Transport mechanism 4,109 Illumination optical system 5,110 Imaging optical system 6 Groove 6a Wall surface 7,104 Ejection hole 8,105 Adsorption hole 9,106 Ejection pipe 10, 107 Piping for Suction 11 Effective Field of View 12 Sealing Member 13 Low Reflective Member 103 Gap

Claims (7)

  1. A levitating stage for levitating a substrate to be inspected having optical transparency;
    A transport mechanism for transporting the substrate to be inspected that is levitated on the levitating stage;
    An illumination optical system that irradiates illumination light onto the surface of the substrate to be inspected that is levitated and conveyed on the levitation stage;
    An imaging optical system that captures reflected light from the inspection substrate of the illumination light irradiated by the illumination optical system, and
    A groove formed corresponding to a region on the floating stage irradiated with the illumination light transmitted through the substrate to be inspected has two surfaces that are perpendicular to and opposite to the formation direction of the groove. Optical inspection device.
  2. A levitating stage for levitating a substrate to be inspected having optical transparency;
    A transport mechanism for transporting the substrate to be inspected that is levitated on the levitating stage;
    An illumination optical system that irradiates illumination light onto the surface of the substrate to be inspected that is levitated and conveyed on the levitation stage;
    An imaging optical system that captures reflected light from the inspection substrate of the illumination light irradiated by the illumination optical system, and
    Grooves are formed corresponding to regions on the floating stage that are irradiated with the illumination light transmitted through the substrate to be inspected, and sealed near both ends of the region through which the substrate to be inspected passes in the groove forming direction. An optical inspection device, wherein a stop member is fitted.
  3.   The optical inspection apparatus according to claim 1, wherein an ejection hole for ejecting gas is provided on a bottom side of the groove portion.
  4.   The optical inspection apparatus according to claim 3, wherein the ejection hole is disposed at a position deviating from an imaging field of view of the imaging optical system.
  5.   The optical inspection apparatus according to claim 1, wherein an ejection hole for ejecting gas and an adsorption hole for sucking the gas are provided on a bottom side of the groove portion.
  6.   The optical inspection apparatus according to claim 5, wherein the ejection hole and the suction hole are arranged at positions deviating from an imaging field of view of the imaging optical system.
  7. A levitating stage for levitating a substrate to be inspected having optical transparency;
    A transport mechanism for transporting the substrate to be inspected that is levitated on the levitating stage;
    An illumination optical system that irradiates illumination light onto the surface of the substrate to be inspected that is levitated and conveyed on the levitation stage;
    An imaging optical system that captures reflected light from the inspection substrate of the illumination light irradiated by the illumination optical system, and
    A groove portion is formed corresponding to a region on the floating stage to which the illumination light transmitted through the substrate to be inspected is irradiated, and a low reflection member or a region in the region through which the substrate to be inspected in the groove forming direction is formed. An optical inspection device, wherein a highly reflective member is fitted.
JP2009134558A 2009-06-04 2009-06-04 Optical inspection device Active JP5553532B2 (en)

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JPH1183674A (en) * 1997-09-04 1999-03-26 Dainippon Printing Co Ltd Apparatus for inspecting color filter substrate
JP2002181714A (en) * 2000-12-19 2002-06-26 Ishikawajima Harima Heavy Ind Co Ltd Thin plate inspection device
JP2004333198A (en) * 2003-05-01 2004-11-25 Olympus Corp Substrate inspection apparatus
JP2004331265A (en) * 2003-05-01 2004-11-25 Olympus Corp Floating unit and substrate inspection device
JP2006017642A (en) * 2004-07-05 2006-01-19 Ushio Inc Pattern inspecting device
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JP2006258632A (en) * 2005-03-17 2006-09-28 Olympus Corp Substrate inspection device
JP2006258631A (en) * 2005-03-17 2006-09-28 Olympus Corp Substrate inspection device
JP2006266722A (en) * 2005-03-22 2006-10-05 Olympus Corp System and method for inspecting substrate
JP2007263784A (en) * 2006-03-29 2007-10-11 Olympus Corp Substrate conveyance device
JP2008076187A (en) * 2006-09-20 2008-04-03 Oht Inc Circuit pattern inspection device
JP2009022823A (en) * 2007-07-17 2009-02-05 Dainippon Screen Mfg Co Ltd Inspection apparatus and substrate treatment system
JP2009051654A (en) * 2007-08-29 2009-03-12 Toppan Printing Co Ltd Substrate carrying device and substrate inspection device
JP2009117571A (en) * 2007-11-06 2009-05-28 Tokyo Electron Ltd Substrate processing apparatus and coating apparatus and coating method

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05282710A (en) * 1992-03-31 1993-10-29 Victor Co Of Japan Ltd Optical disk inspecting device
JPH1183674A (en) * 1997-09-04 1999-03-26 Dainippon Printing Co Ltd Apparatus for inspecting color filter substrate
JP2002181714A (en) * 2000-12-19 2002-06-26 Ishikawajima Harima Heavy Ind Co Ltd Thin plate inspection device
JP2004333198A (en) * 2003-05-01 2004-11-25 Olympus Corp Substrate inspection apparatus
JP2004331265A (en) * 2003-05-01 2004-11-25 Olympus Corp Floating unit and substrate inspection device
JP2006017642A (en) * 2004-07-05 2006-01-19 Ushio Inc Pattern inspecting device
WO2006035703A1 (en) * 2004-09-27 2006-04-06 Olympus Corporation Macro inspection apparatus and macro inspection method
JP2006258631A (en) * 2005-03-17 2006-09-28 Olympus Corp Substrate inspection device
JP2006258632A (en) * 2005-03-17 2006-09-28 Olympus Corp Substrate inspection device
JP2006266722A (en) * 2005-03-22 2006-10-05 Olympus Corp System and method for inspecting substrate
JP2007263784A (en) * 2006-03-29 2007-10-11 Olympus Corp Substrate conveyance device
JP2008076187A (en) * 2006-09-20 2008-04-03 Oht Inc Circuit pattern inspection device
JP2009022823A (en) * 2007-07-17 2009-02-05 Dainippon Screen Mfg Co Ltd Inspection apparatus and substrate treatment system
JP2009051654A (en) * 2007-08-29 2009-03-12 Toppan Printing Co Ltd Substrate carrying device and substrate inspection device
JP2009117571A (en) * 2007-11-06 2009-05-28 Tokyo Electron Ltd Substrate processing apparatus and coating apparatus and coating method

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