JP2008508116A - 電子部品をカプセル封入するための金型部および方法 - Google Patents
電子部品をカプセル封入するための金型部および方法 Download PDFInfo
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- JP2008508116A JP2008508116A JP2007523500A JP2007523500A JP2008508116A JP 2008508116 A JP2008508116 A JP 2008508116A JP 2007523500 A JP2007523500 A JP 2007523500A JP 2007523500 A JP2007523500 A JP 2007523500A JP 2008508116 A JP2008508116 A JP 2008508116A
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- 238000000034 method Methods 0.000 title claims abstract description 13
- 239000008393 encapsulating agent Substances 0.000 claims abstract description 33
- 238000000605 extraction Methods 0.000 claims abstract description 32
- 239000007788 liquid Substances 0.000 claims description 7
- 238000007599 discharging Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 description 32
- 238000005538 encapsulation Methods 0.000 description 14
- 239000000463 material Substances 0.000 description 5
- 239000008188 pellet Substances 0.000 description 3
- 238000007789 sealing Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/26—Moulds
- B29C45/34—Moulds having venting means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14639—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
- B29C45/14655—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/26—Moulds
- B29C45/2669—Moulds with means for removing excess material, e.g. with overflow cavities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00011—Not relevant to the scope of the group, the symbol of which is combined with the symbol of this group
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
- Casings For Electric Apparatus (AREA)
Abstract
【解決手段】本発明は、キャリアに装着される電子部品をカプセル封入する装置で用いるための金型部に関し、該金型部は、接触側面に凹設される少なくとも一つの金型キャビティと、電子部品のキャリアへの中間気密接続のために金型キャビティを少なくとも部分的に囲む接触面と、接触面に凹設されかつ金型キャビティに連続するカプセル封入材用供給チャネルと、ガス用第1出口チャネルと、接触面に凹設される抽出空間とを含む。本発明はまた、キャリアに装着される電子部品をカプセル封入する装置、ならびにキャリアに装着される電子部品をカプセル封入する方法に関する。
【選択図】図1A
Description
Claims (13)
- キャリアに装着される電子部品をカプセル封入する装置で用いるための金型部であって、
・接触側面に凹設され、キャリア上に載置される少なくとも一つの電子部品を囲むための少なくとも一つの金型キャビティと、
・前記電子部品の前記キャリア上への中間気密接続のために前記金型キャビティを少なくとも部分的に囲む接触面と、
・前記接触面に凹設されかつ前記金型キャビティに連続するカプセル封入材用供給チャネルと、
・前記接触面に凹設されかつ前記金型キャビティからのガスの放出のために前記金型キャビティに連続する第1出口チャネルと、
・前記接触面に凹設されかつ前記金型キャビティからのガスの放出用の前記第1出口チャネルに連続する抽出空間とを含む、金型部において、
前記抽出空間は第2出口チャネルに連続し、該第2出口チャネルは、前記金型部を通過するように前記接触面からある距離をおいて位置することを特徴とする、金型部。 - 前記接触面は、前記接触面に凹設される少なくとも一つのカプセル封入材用供給チャネルを除いては、前記金型キャビティ、前記第1出口チャネルおよび前記抽出空間のアセンブリを十分囲むことを特徴とする、請求項1に記載の金型部。
- 前記金型キャビティからのガスの放出用の前記第1出口チャネルは、前記抽出空間ほど深くなく前記接触面に凹設されることを特徴とする、請求項1または2に記載の金型部。
- 前記第2出口チャネルは、吸引手段に連続することを特徴とする、請求項1〜3のいずれか一項に記載の金型部。
- 前記第2出口チャネルは、ガス用供給手段に連続することを特徴とする、請求項1〜4のいずれか一項に記載の金型部。
- 複数の第1出口チャネルは、一つの金型キャビティに連続することを特徴とする、請求項1〜5のいずれか一項に記載の金型部。
- 複数の第1出口チャネルは、一つの抽出空間に連続することを特徴とする、請求項1〜6のいずれか一項に記載の金型部。
- キャリアに装着される電子部品をカプセル封入する装置であって、
・互いに対して変位可能であり、かつ閉鎖位置では、電子部品を囲むための少なくとも一つの金型キャビティを画定する金型部と、
・前記金型キャビティに連続する液体カプセル封入材用供給手段とを含み、
前記金型部の少なくとも一つは、請求項1〜7のいずれか一項に記載の金型部によって形成される、装置。 - 前記装置には、前記金型キャビティから離れた前記側面上で前記第2出口チャネルに連続するガス用吸引手段が設けられることを特徴とする、請求項8に記載の装置。
- 前記装置には、前記金型キャビティから離れた前記側面上で前記第2出口チャネルに連続するガス用供給手段が設けられることを特徴とする、請求項8または9に記載の装置。
- キャリアに装着される電子部品をカプセル封入する方法であって、
A)金型部間に電子部品を有する前記キャリアを、金型部に凹設される金型キャビティがキャリア上に載置される少なくとも一つの電子部品を囲むように、閉鎖力でクランプする処理ステップと、
B)液体カプセル封入材を前記金型キャビティに供給する処理ステップと、
C)前記金型キャビティに供給される前記カプセル封入材を少なくとも部分的に硬化させる処理ステップと、
D)前記カプセル封入電子部品を前記金型キャビティから除去する処理ステップとによって順次行い、
処理ステップB)の少なくとも一部の間、ガスは、前記金型キャビティに連続しかつ前記金型キャビティが少なくとも実質的にカプセル封入材で充填されるようになった後、前記金型部の前記閉鎖力を増すことによって閉鎖される第1出口チャネルを通して前記金型キャビティから放出される、方法。 - 前記閉鎖力は、処理ステップB)の間、前記金型部の前記接触面の中へ前記金型キャビティと共に割り当てられる第1出口チャネルが、液体カプセル封入材の通過に対して閉鎖されるように増大されることを特徴とする、請求項11に記載の方法。
- 前記第1出口チャネルは、前記増大された閉鎖力の結果として前記キャリア上を封止することを特徴とする、請求項11または12に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL1026739A NL1026739C2 (nl) | 2004-07-29 | 2004-07-29 | Maldeel voor het omhullen van elektronische componenten. |
NL1026739 | 2004-07-29 | ||
PCT/NL2005/000543 WO2006011790A2 (en) | 2004-07-29 | 2005-07-26 | Mould part and method for encapsulating electronic components |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008508116A true JP2008508116A (ja) | 2008-03-21 |
JP4741592B2 JP4741592B2 (ja) | 2011-08-03 |
Family
ID=34973075
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007523500A Active JP4741592B2 (ja) | 2004-07-29 | 2005-07-26 | 電子部品をカプセル封入するための金型部および方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US20090115098A1 (ja) |
JP (1) | JP4741592B2 (ja) |
KR (1) | KR101177588B1 (ja) |
CN (1) | CN100524671C (ja) |
MY (1) | MY149335A (ja) |
NL (1) | NL1026739C2 (ja) |
TW (1) | TWI362321B (ja) |
WO (1) | WO2006011790A2 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL2001818C2 (nl) * | 2008-07-17 | 2010-01-19 | Fico Bv | Werkwijze voor het met een beheersbare sluitkracht omhullen van elektronische componenten. |
JP4491041B1 (ja) | 2009-05-11 | 2010-06-30 | 日本省力機械株式会社 | 樹脂製品製造システム及び製造方法 |
CN101992514B (zh) * | 2009-08-19 | 2013-08-28 | 鸿富锦精密工业(深圳)有限公司 | 导光板成型模具 |
CN102209448B (zh) * | 2010-03-29 | 2015-03-25 | 奥托立夫开发公司 | 电路板保护盒及其安装方法 |
JP5744788B2 (ja) * | 2012-04-25 | 2015-07-08 | Towa株式会社 | 成形型、基板吸着型、樹脂封止装置および樹脂封止電子部品の製造方法 |
NL2013978B1 (en) * | 2014-12-15 | 2016-10-11 | Besi Netherlands Bv | Device and method for controlled moulding and degating of a carrier with electronic components and moulded product. |
JP6499105B2 (ja) * | 2016-03-11 | 2019-04-10 | 東芝メモリ株式会社 | 金型 |
CN110103364A (zh) * | 2019-04-26 | 2019-08-09 | 科耐特输变电科技股份有限公司 | 一种gis应力锥的生产模具 |
US11114313B2 (en) * | 2019-05-16 | 2021-09-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wafer level mold chase |
JP7466857B2 (ja) | 2020-01-28 | 2024-04-15 | 国立大学法人東北大学 | バイオ電池及びこれを用いた通電パッチ |
DE102020209584B4 (de) | 2020-07-30 | 2022-03-03 | Vitesco Technologies Germany Gmbh | Spritzgußpressvorrichtung zur Umspritzung von Halbleiterbauelementen und Verfahren zum Umspritzen von Halbleiterbauelementen |
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JPS60182142A (ja) * | 1984-02-28 | 1985-09-17 | Toshiba Corp | 半導体装置の樹脂封止用金型 |
JPH0788901A (ja) * | 1993-09-28 | 1995-04-04 | Nec Corp | 樹脂封止用金型 |
JPH08281720A (ja) * | 1995-04-10 | 1996-10-29 | Eikichi Yamaharu | 樹脂成形装置および樹脂成形方法 |
JPH09290443A (ja) * | 1996-04-26 | 1997-11-11 | Towa Kk | 電子部品の樹脂封止成形方法及び装置 |
JPH10225953A (ja) * | 1997-02-13 | 1998-08-25 | Apic Yamada Kk | 樹脂モールド金型 |
JPH11121488A (ja) * | 1997-10-15 | 1999-04-30 | Toshiba Corp | 半導体装置の製造方法及び樹脂封止装置 |
JP2000263603A (ja) * | 1999-03-18 | 2000-09-26 | Nec Corp | 樹脂成形装置及び成形品の離型方法 |
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US6610560B2 (en) * | 2001-05-11 | 2003-08-26 | Siliconware Precision Industries Co., Ltd. | Chip-on-chip based multi-chip module with molded underfill and method of fabricating the same |
JP2003145594A (ja) * | 2001-11-14 | 2003-05-20 | Towa Corp | エジェクト機構及びエジェクト方法 |
TW533560B (en) * | 2002-01-07 | 2003-05-21 | Advanced Semiconductor Eng | Semiconductor package mold |
-
2004
- 2004-07-29 NL NL1026739A patent/NL1026739C2/nl not_active IP Right Cessation
-
2005
- 2005-07-26 US US11/658,711 patent/US20090115098A1/en not_active Abandoned
- 2005-07-26 WO PCT/NL2005/000543 patent/WO2006011790A2/en active Application Filing
- 2005-07-26 CN CNB2005800314544A patent/CN100524671C/zh active Active
- 2005-07-26 JP JP2007523500A patent/JP4741592B2/ja active Active
- 2005-07-26 KR KR1020077003516A patent/KR101177588B1/ko active IP Right Grant
- 2005-07-28 MY MYPI20053478A patent/MY149335A/en unknown
- 2005-07-28 TW TW094125563A patent/TWI362321B/zh active
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Publication number | Priority date | Publication date | Assignee | Title |
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JPS60182142A (ja) * | 1984-02-28 | 1985-09-17 | Toshiba Corp | 半導体装置の樹脂封止用金型 |
JPH0788901A (ja) * | 1993-09-28 | 1995-04-04 | Nec Corp | 樹脂封止用金型 |
JPH08281720A (ja) * | 1995-04-10 | 1996-10-29 | Eikichi Yamaharu | 樹脂成形装置および樹脂成形方法 |
JPH09290443A (ja) * | 1996-04-26 | 1997-11-11 | Towa Kk | 電子部品の樹脂封止成形方法及び装置 |
JPH10225953A (ja) * | 1997-02-13 | 1998-08-25 | Apic Yamada Kk | 樹脂モールド金型 |
JPH11121488A (ja) * | 1997-10-15 | 1999-04-30 | Toshiba Corp | 半導体装置の製造方法及び樹脂封止装置 |
JP2000263603A (ja) * | 1999-03-18 | 2000-09-26 | Nec Corp | 樹脂成形装置及び成形品の離型方法 |
Also Published As
Publication number | Publication date |
---|---|
CN100524671C (zh) | 2009-08-05 |
WO2006011790A3 (en) | 2006-05-04 |
JP4741592B2 (ja) | 2011-08-03 |
KR20070045252A (ko) | 2007-05-02 |
TWI362321B (en) | 2012-04-21 |
NL1026739C2 (nl) | 2006-01-31 |
WO2006011790A2 (en) | 2006-02-02 |
CN101023521A (zh) | 2007-08-22 |
US20090115098A1 (en) | 2009-05-07 |
TW200618987A (en) | 2006-06-16 |
MY149335A (en) | 2013-08-30 |
KR101177588B1 (ko) | 2012-08-27 |
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