JP2008304497A5 - - Google Patents
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- Publication number
- JP2008304497A5 JP2008304497A5 JP2007148760A JP2007148760A JP2008304497A5 JP 2008304497 A5 JP2008304497 A5 JP 2008304497A5 JP 2007148760 A JP2007148760 A JP 2007148760A JP 2007148760 A JP2007148760 A JP 2007148760A JP 2008304497 A5 JP2008304497 A5 JP 2008304497A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- optical
- filter
- infrared cut
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 22
- 239000000758 substrate Substances 0.000 claims description 20
- 238000007740 vapor deposition Methods 0.000 claims description 3
- 238000007736 thin film deposition technique Methods 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 description 16
- 239000010409 thin film Substances 0.000 description 6
- 238000002834 transmittance Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 239000012788 optical film Substances 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000000427 thin-film deposition Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007148760A JP5295524B2 (ja) | 2007-06-05 | 2007-06-05 | 光学薄膜成膜方法 |
| CN2013100643783A CN103149617A (zh) | 2007-06-05 | 2008-05-28 | 光学薄膜的成膜方法、光学基板以及光学薄膜的成膜装置 |
| CN2008100982743A CN101319301B (zh) | 2007-06-05 | 2008-05-28 | 光学薄膜的成膜方法、光学基板以及光学薄膜的成膜装置 |
| US12/133,287 US8075947B2 (en) | 2007-06-05 | 2008-06-04 | Optical thin-film-forming methods and optical elements formed using same |
| US13/293,057 US8367191B2 (en) | 2007-06-05 | 2011-11-09 | Optical thin-films and optical elements comprising same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007148760A JP5295524B2 (ja) | 2007-06-05 | 2007-06-05 | 光学薄膜成膜方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012056791A Division JP2012145958A (ja) | 2012-03-14 | 2012-03-14 | 光学素子 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008304497A JP2008304497A (ja) | 2008-12-18 |
| JP2008304497A5 true JP2008304497A5 (https=) | 2010-03-18 |
| JP5295524B2 JP5295524B2 (ja) | 2013-09-18 |
Family
ID=40096144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007148760A Expired - Fee Related JP5295524B2 (ja) | 2007-06-05 | 2007-06-05 | 光学薄膜成膜方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US8075947B2 (https=) |
| JP (1) | JP5295524B2 (https=) |
| CN (2) | CN101319301B (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5132534B2 (ja) * | 2008-12-01 | 2013-01-30 | 日本電波工業株式会社 | 光学部品の製造方法 |
| CN101698931B (zh) * | 2009-11-18 | 2012-11-07 | 九江学院 | 一种制备超晶格热电薄膜材料的双闪蒸法装置 |
| JP2012145958A (ja) * | 2012-03-14 | 2012-08-02 | Nippon Dempa Kogyo Co Ltd | 光学素子 |
| US9371577B2 (en) * | 2013-12-31 | 2016-06-21 | Halliburton Energy Services, Inc. | Fabrication of integrated computational elements using substrate support shaped to match spatial profile of deposition plume |
| EP3366804B1 (en) * | 2017-02-22 | 2022-05-11 | Satisloh AG | Box coating apparatus for vacuum coating of substrates, in particular spectacle lenses |
| CN111139442B (zh) * | 2019-12-31 | 2024-06-25 | 中山市博顿光电科技有限公司 | 旋转夹具及真空镀膜设备 |
| CN115440919A (zh) * | 2021-06-03 | 2022-12-06 | Tcl科技集团股份有限公司 | 发光器件及其制备方法、显示器件 |
| KR102806817B1 (ko) * | 2021-07-15 | 2025-05-12 | 캐논 톡키 가부시키가이샤 | 성막 장치, 성막 방법 및 증발원 유닛 |
| JP7519139B1 (ja) * | 2023-10-10 | 2024-07-19 | 株式会社オプトラン | 蒸着装置 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02176601A (ja) * | 1988-09-28 | 1990-07-09 | Mitsubishi Electric Corp | 投影レンズおよびその製造方法 |
| JPH04143266A (ja) * | 1990-10-05 | 1992-05-18 | Nippon Telegr & Teleph Corp <Ntt> | 低応力膜形成装置 |
| US5872655A (en) * | 1991-07-10 | 1999-02-16 | Optical Coating Laboratory, Inc. | Monolithic linear variable filter and method of manufacture |
| US5308461A (en) * | 1992-01-14 | 1994-05-03 | Honeywell Inc. | Method to deposit multilayer films |
| JPH06337310A (ja) * | 1992-10-23 | 1994-12-06 | Matsushita Electric Ind Co Ltd | 光学多層膜並びにその成膜方法及びその成膜装置 |
| CN1188516A (zh) * | 1996-04-01 | 1998-07-22 | 东丽株式会社 | 带薄膜基板的制造方法和制造装置 |
| JPH10280130A (ja) | 1997-04-01 | 1998-10-20 | Nikon Corp | 真空蒸着方法及び真空蒸着装置 |
| JP2000252350A (ja) * | 1999-03-04 | 2000-09-14 | Kokusai Electric Co Ltd | 基板受け渡し装置 |
| JP3900759B2 (ja) * | 1999-10-01 | 2007-04-04 | 凸版印刷株式会社 | スパッタリング成膜用の基板ホルダー及びそれを用いたフォトマスクブランクスの製造方法 |
| US6852473B2 (en) * | 2000-01-12 | 2005-02-08 | Infineon Technologies Richmond, Lp | Anti-reflective coating conformality control |
| CN1397024A (zh) * | 2000-01-28 | 2003-02-12 | 住友电气工业株式会社 | 加热器模块和光波导模块 |
| JP2001351874A (ja) | 2000-06-09 | 2001-12-21 | Ebara Corp | 基板回転装置 |
| US7195797B2 (en) * | 2000-07-10 | 2007-03-27 | Atomic Telecom | High throughput high-yield vacuum deposition system |
| JP2002363745A (ja) * | 2001-06-08 | 2002-12-18 | Canon Inc | スパッタによる膜の形成方法、光学部材、およびスパッタ装置 |
| JP2003183821A (ja) * | 2001-12-14 | 2003-07-03 | Nikon Corp | スパッタリング装置 |
| JP2003192390A (ja) * | 2001-12-19 | 2003-07-09 | Nippon Shinku Kogaku Kk | ガラス製光学素子の製造方法及びそれに用いる固定治具 |
| US7122844B2 (en) * | 2002-05-13 | 2006-10-17 | Cree, Inc. | Susceptor for MOCVD reactor |
| US20050099611A1 (en) * | 2002-06-20 | 2005-05-12 | Nikon Corporation | Minimizing thermal distortion effects on EUV mirror |
| JP4526776B2 (ja) * | 2003-04-02 | 2010-08-18 | 株式会社半導体エネルギー研究所 | 発光装置及び電子機器 |
| JP2005010736A (ja) * | 2003-05-22 | 2005-01-13 | Fujikura Ltd | 光ファイバおよびこれを用いた導光体、導光体を用いた気体の浄化方法および液体の浄化方法 |
| US6972136B2 (en) * | 2003-05-23 | 2005-12-06 | Optima, Inc. | Ultra low residual reflection, low stress lens coating and vacuum deposition method for making the same |
| JP2005038914A (ja) * | 2003-07-16 | 2005-02-10 | Matsushita Electric Ind Co Ltd | 圧電薄膜の形成装置 |
| JP2005133110A (ja) * | 2003-10-28 | 2005-05-26 | Konica Minolta Opto Inc | スパッタリング装置 |
| EP1536036B1 (en) * | 2003-11-14 | 2007-06-20 | Sharp Kabushiki Kaisha | Thin film forming apparatus |
| JP2005320568A (ja) * | 2004-05-07 | 2005-11-17 | Olympus Corp | 薄膜形成装置及び膜厚監視方法 |
| JP3966869B2 (ja) * | 2004-05-11 | 2007-08-29 | 株式会社昭和真空 | 基板ドーム |
| JP4468867B2 (ja) * | 2005-07-08 | 2010-05-26 | 日本電信電話株式会社 | 面内閉じ込め構造を有する多層膜フィルタおよび光波長フィルタ |
| JP4675791B2 (ja) * | 2006-01-31 | 2011-04-27 | 株式会社東芝 | ディスク装置およびその製造方法 |
| US20070245955A1 (en) * | 2006-04-25 | 2007-10-25 | Jds Uniphase Corporation | Substrate holder for optical coating machines |
-
2007
- 2007-06-05 JP JP2007148760A patent/JP5295524B2/ja not_active Expired - Fee Related
-
2008
- 2008-05-28 CN CN2008100982743A patent/CN101319301B/zh not_active Expired - Fee Related
- 2008-05-28 CN CN2013100643783A patent/CN103149617A/zh active Pending
- 2008-06-04 US US12/133,287 patent/US8075947B2/en not_active Expired - Fee Related
-
2011
- 2011-11-09 US US13/293,057 patent/US8367191B2/en not_active Expired - Fee Related
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