JP2008071470A5 - - Google Patents

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Publication number
JP2008071470A5
JP2008071470A5 JP2007171957A JP2007171957A JP2008071470A5 JP 2008071470 A5 JP2008071470 A5 JP 2008071470A5 JP 2007171957 A JP2007171957 A JP 2007171957A JP 2007171957 A JP2007171957 A JP 2007171957A JP 2008071470 A5 JP2008071470 A5 JP 2008071470A5
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JP
Japan
Prior art keywords
data
output
error detection
semiconductor memory
memory device
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Application number
JP2007171957A
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English (en)
Japanese (ja)
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JP5086709B2 (ja
JP2008071470A (ja
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Priority claimed from KR1020060088740A external-priority patent/KR100837802B1/ko
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Publication of JP2008071470A publication Critical patent/JP2008071470A/ja
Publication of JP2008071470A5 publication Critical patent/JP2008071470A5/ja
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Publication of JP5086709B2 publication Critical patent/JP5086709B2/ja
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JP2007171957A 2006-09-13 2007-06-29 データ入出力エラー検出機能を有する半導体メモリ装置 Active JP5086709B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2006-0088740 2006-09-13
KR1020060088740A KR100837802B1 (ko) 2006-09-13 2006-09-13 데이터 입출력 오류 검출 기능을 갖는 반도체 메모리 장치

Publications (3)

Publication Number Publication Date
JP2008071470A JP2008071470A (ja) 2008-03-27
JP2008071470A5 true JP2008071470A5 (enExample) 2010-05-20
JP5086709B2 JP5086709B2 (ja) 2012-11-28

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ID=39262462

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007171957A Active JP5086709B2 (ja) 2006-09-13 2007-06-29 データ入出力エラー検出機能を有する半導体メモリ装置

Country Status (3)

Country Link
US (1) US7877675B2 (enExample)
JP (1) JP5086709B2 (enExample)
KR (1) KR100837802B1 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008204085A (ja) * 2007-02-19 2008-09-04 Toshiba Corp 半導体記憶装置
KR100902051B1 (ko) * 2007-07-12 2009-06-15 주식회사 하이닉스반도체 오류 검사 코드 생성장치 및 방법
US7616133B2 (en) * 2008-01-16 2009-11-10 Micron Technology, Inc. Data bus inversion apparatus, systems, and methods
KR100951567B1 (ko) * 2008-02-29 2010-04-09 주식회사 하이닉스반도체 데이터 전달의 신뢰성을 보장하기 위한 반도체 메모리 장치
KR100954109B1 (ko) * 2008-08-29 2010-04-23 주식회사 하이닉스반도체 데이터 입력회로 및 이를 포함하는 반도체 메모리장치
KR100933806B1 (ko) * 2008-09-22 2009-12-24 주식회사 하이닉스반도체 반도체 메모리장치
KR101039862B1 (ko) * 2008-11-11 2011-06-13 주식회사 하이닉스반도체 클럭킹 모드를 구비하는 반도체 메모리장치 및 이의 동작방법
KR101062759B1 (ko) 2009-08-11 2011-09-06 주식회사 하이닉스반도체 반도체 메모리 장치 및 그 데이터 독출 방법
KR101897515B1 (ko) 2012-08-28 2018-09-12 에스케이하이닉스 주식회사 집적회로
KR102035108B1 (ko) 2013-05-20 2019-10-23 에스케이하이닉스 주식회사 반도체 시스템
US9583218B1 (en) * 2014-01-24 2017-02-28 Altera Corporation Configurable register circuitry for error detection and recovery
KR20150142814A (ko) 2014-06-11 2015-12-23 에스케이하이닉스 주식회사 리페어 정보 제어 기능을 갖는 반도체 장치
US11403170B2 (en) * 2014-08-05 2022-08-02 Macronix International Co., Ltd. Method and device for monitoring data error status in a memory
US10908817B2 (en) * 2017-12-08 2021-02-02 Sandisk Technologies Llc Signal reduction in a microcontroller architecture for non-volatile memory
CN112712833B (zh) * 2019-10-25 2024-10-01 长鑫存储技术(上海)有限公司 写操作电路、半导体存储器和写操作方法
US12099746B2 (en) * 2019-12-16 2024-09-24 Micron Technology, Inc. Interrupt signaling for a memory device
CN115129234B (zh) * 2021-03-26 2025-01-10 长鑫存储技术有限公司 数据传输电路、方法及存储装置
EP4198704A4 (en) * 2021-03-29 2024-05-15 Changxin Memory Technologies, Inc. DATA TRANSMISSION CIRCUIT AND METHOD AND STORAGE DEVICE
CN115775588B (zh) * 2021-09-08 2025-10-14 长鑫存储技术有限公司 一种数据路径检测方法、装置、设备及存储介质
US12182414B2 (en) 2021-09-08 2024-12-31 Changxin Memory Technologies, Inc. Method and apparatus for detecting data path, and storage medium

Family Cites Families (12)

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Publication number Priority date Publication date Assignee Title
JPS57169867A (en) 1981-04-14 1982-10-19 Nec Corp Detector for picture memory error
JPH02143991A (ja) * 1988-11-25 1990-06-01 Hitachi Ltd 半導体記憶装置
JP2554179B2 (ja) * 1989-11-20 1996-11-13 株式会社日立製作所 導通試験方法
JPH05158810A (ja) 1991-12-10 1993-06-25 Fujitsu Ltd 誤り検出回路
US6178532B1 (en) * 1998-06-11 2001-01-23 Micron Technology, Inc. On-chip circuit and method for testing memory devices
JP2002175697A (ja) 2000-12-06 2002-06-21 Toshiba Corp 半導体記憶装置及びこれを用いた情報処理装置
US6742146B2 (en) * 2001-02-14 2004-05-25 Emc Corporation Techniques for providing data within a data storage system
JP4059473B2 (ja) * 2001-08-09 2008-03-12 株式会社ルネサステクノロジ メモリカード及びメモリコントローラ
CA2366397A1 (en) 2001-12-31 2003-06-30 Tropic Networks Inc. An interface for data transfer between integrated circuits
US6898648B2 (en) 2002-02-21 2005-05-24 Micron Technology, Inc. Memory bus polarity indicator system and method for reducing the affects of simultaneous switching outputs (SSO) on memory bus timing
JP2003273840A (ja) * 2002-03-15 2003-09-26 Mitsubishi Heavy Ind Ltd 通信インターフェース装置
CN100356342C (zh) * 2003-11-18 2007-12-19 株式会社瑞萨科技 信息处理装置

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