JP2007024884A - 半導体装置、テスト基板、半導体装置のテストシステム及び半導体装置のテスト方法 - Google Patents

半導体装置、テスト基板、半導体装置のテストシステム及び半導体装置のテスト方法 Download PDF

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Publication number
JP2007024884A
JP2007024884A JP2006190578A JP2006190578A JP2007024884A JP 2007024884 A JP2007024884 A JP 2007024884A JP 2006190578 A JP2006190578 A JP 2006190578A JP 2006190578 A JP2006190578 A JP 2006190578A JP 2007024884 A JP2007024884 A JP 2007024884A
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Japan
Prior art keywords
test
pattern data
semiconductor device
test pattern
speed
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JP2006190578A
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English (en)
Japanese (ja)
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JP2007024884A5 (https=
Inventor
Woo-Seop Kim
▲ウー▼燮 金
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of JP2007024884A publication Critical patent/JP2007024884A/ja
Publication of JP2007024884A5 publication Critical patent/JP2007024884A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56012—Timing aspects, clock generation, synchronisation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2006190578A 2005-07-11 2006-07-11 半導体装置、テスト基板、半導体装置のテストシステム及び半導体装置のテスト方法 Pending JP2007024884A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050062368A KR100714482B1 (ko) 2005-07-11 2005-07-11 반도체 장치, 테스트 기판, 반도체 장치의 테스트 시스템및 반도체 장치의 테스트 방법

Publications (2)

Publication Number Publication Date
JP2007024884A true JP2007024884A (ja) 2007-02-01
JP2007024884A5 JP2007024884A5 (https=) 2009-08-27

Family

ID=37680421

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006190578A Pending JP2007024884A (ja) 2005-07-11 2006-07-11 半導体装置、テスト基板、半導体装置のテストシステム及び半導体装置のテスト方法

Country Status (5)

Country Link
US (1) US7555686B2 (https=)
JP (1) JP2007024884A (https=)
KR (1) KR100714482B1 (https=)
DE (1) DE102006033188A1 (https=)
TW (1) TWI308964B (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9437328B2 (en) * 2012-11-30 2016-09-06 Silicon Motion Inc. Apparatus and method for applying at-speed functional test with lower-speed tester
JP6121853B2 (ja) * 2013-09-18 2017-04-26 株式会社東芝 出力装置およびその診断方法
CN105067988B (zh) * 2015-07-02 2018-03-30 英特尔公司 集成电路、集成电路测试装置以及方法
US10097341B1 (en) * 2017-08-30 2018-10-09 Keyssa Systems, Inc. Testing of clock and data recovery circuits
TWI871453B (zh) * 2020-05-14 2025-02-01 台灣積體電路製造股份有限公司 用於檢測有缺陷邏輯器件的方法和裝置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01149543A (ja) * 1987-12-04 1989-06-12 Fujitsu Ltd Ｆｉｆｏメモリ制御方法
JPH02245681A (ja) * 1989-03-17 1990-10-01 Nec Corp 複合型集積回路
JPH0481080U (https=) * 1990-11-27 1992-07-15
JPH0530778U (ja) * 1991-10-02 1993-04-23 日本電気株式会社 故障ｌｓｉ検出システム
JPH09172424A (ja) * 1995-12-20 1997-06-30 Nec Corp データハイウェイ用信号速度変換回路
JPH1073643A (ja) * 1996-09-02 1998-03-17 Mitsubishi Electric Corp 半導体装置試験治具
JP2003004809A (ja) * 2001-06-20 2003-01-08 Toshiba Microelectronics Corp 半導体集積回路及び高速テストシステム
JP2003098221A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 半導体装置、半導体装置の試験方法及び半導体装置の試験装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3453460B2 (ja) * 1994-08-29 2003-10-06 松下電器産業株式会社 半導体集積回路
JPH08262087A (ja) 1995-03-20 1996-10-11 Hitachi Shonan Denshi Co Ltd 被測定物に対する周期的バーストデータによるデータ透過性試験装置
US5633634A (en) * 1995-09-29 1997-05-27 Ag Communication Systems Corporation Data rate conversion circuit
US5677914A (en) * 1996-04-25 1997-10-14 Hughes Electronics Test vectro feed-thru
SE506817C2 (sv) 1996-06-20 1998-02-16 Ericsson Telefon Ab L M Seriell-parallell- och parallell-seriellomvandlare innefattande frekvensdelare
US5933739A (en) * 1997-09-11 1999-08-03 Vlsi Technology, Inc. Self-aligned silicidation structure and method of formation thereof
JP3145976B2 (ja) * 1998-01-05 2001-03-12 日本電気アイシーマイコンシステム株式会社 半導体集積回路
JP2001289915A (ja) 2000-04-11 2001-10-19 Matsushita Electric Ind Co Ltd 半導体装置
DE10113458C2 (de) * 2001-03-19 2003-03-20 Infineon Technologies Ag Testschaltung
JP3871676B2 (ja) * 2001-10-05 2007-01-24 松下電器産業株式会社 Ｌｓｉ検査方法および装置、並びにｌｓｉテスタ
KR20030049481A (ko) * 2001-12-15 2003-06-25 삼성전자주식회사 저속의 테스트 장비와 인터페이스할 수 있는 반도체 장치및 이를 이용한 테스트 시스템
KR100493027B1 (ko) * 2002-10-01 2005-06-07 삼성전자주식회사 외부클럭의 주파수 체배기와 테스트 데이터의 출력버퍼를 구비하는 반도체 장치 및 반도체 장치의 테스트 방법
US7401281B2 (en) * 2004-01-29 2008-07-15 International Business Machines Corporation Remote BIST high speed test and redundancy calculation
JP2005337740A (ja) * 2004-05-24 2005-12-08 Matsushita Electric Ind Co Ltd 高速インターフェース回路検査モジュール、高速インターフェース回路検査対象モジュールおよび高速インターフェース回路検査方法
US7305598B1 (en) * 2005-03-25 2007-12-04 Amit Sanghani Test clock generation for higher-speed testing of a semiconductor device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01149543A (ja) * 1987-12-04 1989-06-12 Fujitsu Ltd Ｆｉｆｏメモリ制御方法
JPH02245681A (ja) * 1989-03-17 1990-10-01 Nec Corp 複合型集積回路
JPH0481080U (https=) * 1990-11-27 1992-07-15
JPH0530778U (ja) * 1991-10-02 1993-04-23 日本電気株式会社 故障ｌｓｉ検出システム
JPH09172424A (ja) * 1995-12-20 1997-06-30 Nec Corp データハイウェイ用信号速度変換回路
JPH1073643A (ja) * 1996-09-02 1998-03-17 Mitsubishi Electric Corp 半導体装置試験治具
JP2003004809A (ja) * 2001-06-20 2003-01-08 Toshiba Microelectronics Corp 半導体集積回路及び高速テストシステム
JP2003098221A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 半導体装置、半導体装置の試験方法及び半導体装置の試験装置

Also Published As

Publication number Publication date
KR100714482B1 (ko) 2007-05-04
US7555686B2 (en) 2009-06-30
US20070022334A1 (en) 2007-01-25
DE102006033188A1 (de) 2007-02-15
KR20070007627A (ko) 2007-01-16
TWI308964B (en) 2009-04-21
TW200702678A (en) 2007-01-16

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