DE102006033188A1 - Halbleiterbauelement, Testplatine, Testsystem, und Testverfahren - Google Patents

Halbleiterbauelement, Testplatine, Testsystem, und Testverfahren Download PDF

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Publication number
DE102006033188A1
DE102006033188A1 DE102006033188A DE102006033188A DE102006033188A1 DE 102006033188 A1 DE102006033188 A1 DE 102006033188A1 DE 102006033188 A DE102006033188 A DE 102006033188A DE 102006033188 A DE102006033188 A DE 102006033188A DE 102006033188 A1 DE102006033188 A1 DE 102006033188A1
Authority
DE
Germany
Prior art keywords
pattern data
test pattern
test
speed
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102006033188A
Other languages
German (de)
English (en)
Inventor
Woo-Seop Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of DE102006033188A1 publication Critical patent/DE102006033188A1/de
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56012—Timing aspects, clock generation, synchronisation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE102006033188A 2005-07-11 2006-07-11 Halbleiterbauelement, Testplatine, Testsystem, und Testverfahren Withdrawn DE102006033188A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2005-0062368 2005-07-11
KR1020050062368A KR100714482B1 (ko) 2005-07-11 2005-07-11 반도체 장치, 테스트 기판, 반도체 장치의 테스트 시스템및 반도체 장치의 테스트 방법

Publications (1)

Publication Number Publication Date
DE102006033188A1 true DE102006033188A1 (de) 2007-02-15

Family

ID=37680421

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102006033188A Withdrawn DE102006033188A1 (de) 2005-07-11 2006-07-11 Halbleiterbauelement, Testplatine, Testsystem, und Testverfahren

Country Status (5)

Country Link
US (1) US7555686B2 (https=)
JP (1) JP2007024884A (https=)
KR (1) KR100714482B1 (https=)
DE (1) DE102006033188A1 (https=)
TW (1) TWI308964B (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9437328B2 (en) * 2012-11-30 2016-09-06 Silicon Motion Inc. Apparatus and method for applying at-speed functional test with lower-speed tester
JP6121853B2 (ja) * 2013-09-18 2017-04-26 株式会社東芝 出力装置およびその診断方法
CN105067988B (zh) * 2015-07-02 2018-03-30 英特尔公司 集成电路、集成电路测试装置以及方法
US10097341B1 (en) * 2017-08-30 2018-10-09 Keyssa Systems, Inc. Testing of clock and data recovery circuits
TWI871453B (zh) * 2020-05-14 2025-02-01 台灣積體電路製造股份有限公司 用於檢測有缺陷邏輯器件的方法和裝置

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01149543A (ja) * 1987-12-04 1989-06-12 Fujitsu Ltd Ｆｉｆｏメモリ制御方法
JPH02245681A (ja) * 1989-03-17 1990-10-01 Nec Corp 複合型集積回路
JPH0481080U (https=) * 1990-11-27 1992-07-15
JPH0530778U (ja) * 1991-10-02 1993-04-23 日本電気株式会社 故障ｌｓｉ検出システム
JP3453460B2 (ja) * 1994-08-29 2003-10-06 松下電器産業株式会社 半導体集積回路
JPH08262087A (ja) 1995-03-20 1996-10-11 Hitachi Shonan Denshi Co Ltd 被測定物に対する周期的バーストデータによるデータ透過性試験装置
US5633634A (en) * 1995-09-29 1997-05-27 Ag Communication Systems Corporation Data rate conversion circuit
JP2850817B2 (ja) * 1995-12-20 1999-01-27 日本電気株式会社 データハイウェイ用信号速度変換回路
US5677914A (en) * 1996-04-25 1997-10-14 Hughes Electronics Test vectro feed-thru
SE506817C2 (sv) 1996-06-20 1998-02-16 Ericsson Telefon Ab L M Seriell-parallell- och parallell-seriellomvandlare innefattande frekvensdelare
JPH1073643A (ja) * 1996-09-02 1998-03-17 Mitsubishi Electric Corp 半導体装置試験治具
US5933739A (en) * 1997-09-11 1999-08-03 Vlsi Technology, Inc. Self-aligned silicidation structure and method of formation thereof
JP3145976B2 (ja) * 1998-01-05 2001-03-12 日本電気アイシーマイコンシステム株式会社 半導体集積回路
JP2001289915A (ja) 2000-04-11 2001-10-19 Matsushita Electric Ind Co Ltd 半導体装置
DE10113458C2 (de) * 2001-03-19 2003-03-20 Infineon Technologies Ag Testschaltung
JP2003004809A (ja) 2001-06-20 2003-01-08 Toshiba Microelectronics Corp 半導体集積回路及び高速テストシステム
JP2003098221A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 半導体装置、半導体装置の試験方法及び半導体装置の試験装置
JP3871676B2 (ja) * 2001-10-05 2007-01-24 松下電器産業株式会社 Ｌｓｉ検査方法および装置、並びにｌｓｉテスタ
KR20030049481A (ko) * 2001-12-15 2003-06-25 삼성전자주식회사 저속의 테스트 장비와 인터페이스할 수 있는 반도체 장치및 이를 이용한 테스트 시스템
KR100493027B1 (ko) * 2002-10-01 2005-06-07 삼성전자주식회사 외부클럭의 주파수 체배기와 테스트 데이터의 출력버퍼를 구비하는 반도체 장치 및 반도체 장치의 테스트 방법
US7401281B2 (en) * 2004-01-29 2008-07-15 International Business Machines Corporation Remote BIST high speed test and redundancy calculation
JP2005337740A (ja) * 2004-05-24 2005-12-08 Matsushita Electric Ind Co Ltd 高速インターフェース回路検査モジュール、高速インターフェース回路検査対象モジュールおよび高速インターフェース回路検査方法
US7305598B1 (en) * 2005-03-25 2007-12-04 Amit Sanghani Test clock generation for higher-speed testing of a semiconductor device

Also Published As

Publication number Publication date
JP2007024884A (ja) 2007-02-01
KR100714482B1 (ko) 2007-05-04
US7555686B2 (en) 2009-06-30
US20070022334A1 (en) 2007-01-25
KR20070007627A (ko) 2007-01-16
TWI308964B (en) 2009-04-21
TW200702678A (en) 2007-01-16

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee

Effective date: 20150203